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2007 ieee international symposium on electromagnetic compatibility

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EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 19efficient way to reveal the presence of unstirred comp<strong>on</strong>ents at frequenciesabove the lowest usable frequency. To reduce the risk ofhaving an unstirred comp<strong>on</strong>ent, in RS-testing, the transmittingantenna has to be directed towards the stirrer. The distance betweenthe transmitting antenna and the stirrer has to be so close that themain lobe of the antenna is enclosed by the geometry of the stirrer.In RE testing this will hold also for the reference antenna. Unstirredcomp<strong>on</strong>ents are not possible to reveal and correct for in RS- and REtesting,which might lead to err<strong>on</strong>eous testing.Measuring Shielding Effectiveness of SmallEnclosures/Cavities with a Reverberati<strong>on</strong> ChamberChris Holloway, Nati<strong>on</strong>al Institute of Standards and Technology (NIST)For various applicati<strong>on</strong>s, there is a growing need to determine theshielding effectiveness of physically small (but electrically large)enclosures or cavities. This paper presents a reverberati<strong>on</strong> chambertechnique for measuring the SE of such enclosures. Data is presentedfrom four different reverberati<strong>on</strong> chamber approaches obtainedfrom various enclosure c<strong>on</strong>figurati<strong>on</strong>s. These four different sets ofmeasurements are used to validate the proposed approach.TEM CELL MEASUREMENTSA Field Uniformity Study of a TEM Cell by Using a ShortWire ScattererTakehiro Morioka, Nati<strong>on</strong>al Institute of Advanced Industrial Science andTechnology (AIST); Robert Johnk, Nati<strong>on</strong>al Institute of Standard andTechnology; and David Novotny, Nati<strong>on</strong>al Institute of Standard andTechnologyTEM cells are widely used for EMC/EMI measurements. However,the electric field strength <strong>on</strong>ly at the center point of the cell is roughlyestimated. By introducing a passive scatterer into the cell, such asa straight wire, the echo fields can be detected by the deviati<strong>on</strong> of thereflecti<strong>on</strong> coefficient from that of the empty cell. This deviati<strong>on</strong> isrelated to the incident electric field at the locati<strong>on</strong> of the scatterer. Inthis paper, the electric field uniformity of a TEM cell for the dominantand orthog<strong>on</strong>al polarizati<strong>on</strong>s is investigated by measurement.New Test Method for the Pulse Immunity of Microc<strong>on</strong>trollersThomas Steinecke, Infine<strong>on</strong> Technologies AGThis paper presents a new test method for pulse susceptibility ofmicroc<strong>on</strong>trollers which reflects the <strong>electromagnetic</strong> envir<strong>on</strong>ment ofmicroc<strong>on</strong>trollers in practical applicati<strong>on</strong>s. The method includes a setof <strong>electromagnetic</strong> interference pulses and their injecti<strong>on</strong> networks.The waveforms of the pulses are deduced from measurements <strong>on</strong> realapplicati<strong>on</strong> boards of microc<strong>on</strong>trollers.Mode Suppressed TEM Cell Design For High Frequency ICMeasurementsShaowei Deng, University of Missouri-Rolla; David Pommerenke,University of Missouri-Rolla; Todd Hubing, Clems<strong>on</strong> University; JamesDrewniak, University of Missouri-Rolla; Daryl Beetner, University ofMissouri-Rolla; Sungnam Kim, LG Electr<strong>on</strong>ics; D<strong>on</strong>gshik Shin, LGElectr<strong>on</strong>ics; and Hocheol Kwak, LG Electr<strong>on</strong>icsTEM cells or GTEM cells can be used to evaluate the radiated emissi<strong>on</strong>sof integrated circuits (ICs). The applicable frequency bandwidthof a TEM cell is limited due to the res<strong>on</strong>ances of higher order modes.This paper describes how a TEM cell can be modified to extend thefrequency range without changing the test topology. Several methodsare proposed and implemented to suppress the higher order modes.The magnetic field coupling and electric field coupling are evaluatedfor the new design. The frequency bandwidth of the modified TEMcell is extended from the original 1 GHz to 2.5 GHz.Evaluati<strong>on</strong> of Electromagnetic Interference Between a UWBSystem and a Wireless LAN Using a GTEM CellMasashi Yamada, Musashi Institute of Technology; Kaoru Gotoh, Nati<strong>on</strong>alInstitute of Informati<strong>on</strong> and Communicati<strong>on</strong>s Technology (NICT); ShinobuIshigami, NICT; Yasushi Matsumoto, NICT; and Masamitsu Tokuda,Musashi Institute of TechnologyIn this paper we propose a method of evaluating interference betweenthe UWB and the wireless LAN by using the GTEM cell that cantest the receiver with the built-in type of antenna. We show that theGTEM cell can be used in the frequency band of DS-UWB by theevaluati<strong>on</strong> of the frequency resp<strong>on</strong>se. The interference evaluati<strong>on</strong> wasc<strong>on</strong>ducted between a wireless LAN IEEE802.11a and a DS-UWB.As a result, even if the UWB signal is smaller than the receiver noiseof the wireless LAN, the through put deteriorates more than that inthe case of n<strong>on</strong>-interference. Moreover, the signal of the DS-UWBwas equivalent to the AWGN in a case of the through put variati<strong>on</strong>of 64QAM. Finally, we evaluated the separati<strong>on</strong> distances within theregulati<strong>on</strong> limits of the FCC and Japan.SPECIAL SESSION: EMERGING EMC TECHNOLOGIES IN JAPANNew Radiated Immunity/Susceptibility Test Method Using aFour-Septum TEM Cell: Measurements and Field AnalysisKimitoshi Murano, Tokai University; Hiroko Kawahara, University ofElectro-Communicati<strong>on</strong>s; Majid Tayarani, Iran University of Science andTechnology; Fengchao Xiao, University of Electro-Communicati<strong>on</strong>s; andYoshio Kami, University of Electro-Communicati<strong>on</strong>sA four-septum TEM cell has been proposed as a new radiated radiofrequencyimmunity/susceptibility test device. The cell provides<strong>electromagnetic</strong> fields rotating at a very low rate by generating a setof two orthog<strong>on</strong>al balanced-mode fields. In this paper, a test methodusing the cell is clarified, and susceptibility characteristics of twotypes of microstripline models are investigated to verify the effectivenessof the cell and the role of the dielectric material is madeclear. In additi<strong>on</strong>, an analysis method of the internal <strong>electromagnetic</strong>fields, which are different from those used in an ordinary TEM cell,is discussed using an image method.Methods of Evaluating Informati<strong>on</strong> Leakage from PC DisplaysToshihide Tosaka, Nati<strong>on</strong>al Institute of Informati<strong>on</strong> and Communicati<strong>on</strong>sTechnology (NICT); Kaori Fukunaga, NICT; Yukio Yamanaka, NICT;Ryo Ishikawa, NTT Advanced Technology Co.; and Mitsuo Hattori, NTTAdvanced Technology Co.To evaluate the possibility of informati<strong>on</strong> leakage (tapping) byobserving <strong>electromagnetic</strong> disturbance radiated from a PC display,the most straightforward way is to rec<strong>on</strong>struct the displayed imagefrom the measured signal using a special receiver. However, such areceiver is neither popular nor commercially available. Therefore, wepropose two types of evaluati<strong>on</strong> methods that are based <strong>on</strong> 1) themeasurement of the difference in level when different images are displayed,and 2) the measurement of the frequency comp<strong>on</strong>ent of thehoriz<strong>on</strong>tal sync signal within the <strong>electromagnetic</strong> disturbance. Inboth proposed methods, we <strong>on</strong>ly need a spectrum analyzer that iscomm<strong>on</strong>ly used for EMI measurement.Electromagnetic Field Distributi<strong>on</strong> Measurements using anOptically Scanning Probe SystemMasanori Takahashi, NICT; Katsumi Kawasaki, NICT; Hiroyuki Ohba,NICT; Hiroyasu Ota, NICT; Tatsuru Orikasa, Advantest Laboratories©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org

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