10EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMThe electro-optical modulator based <strong>on</strong> Pockels effect implementsthe transiti<strong>on</strong> from electrical signal to optical signal. This makesusing optical fiber in EMC measurements come true. This paperdescribes the principle of modulators based <strong>on</strong> Pockels effect, designsthe modulator with high precisi<strong>on</strong>, calculates the electric field in themodulator, discusses the parameters of the modulator, and gives theequivalent electrical circuit.The Development of Integrated Electro-optic Sensor forIntensive Electric Field MeasurementR<strong>on</strong>g Zeng; Weiyuan Chen; Jinliang He; Puxua Zhu; Xiaolin Li; and QiWang, — Department of Electrical Engineering, Tsinghua UniversityIn order to meet the special demands of impulse electric field measurementsimultaneously, such as intensive signal, fine insulati<strong>on</strong>,transient, wide frequency band, and small size, three kinds of opticalelectric integrated electric field sensor were designed and fabricated.The output/input character and frequency resp<strong>on</strong>se of the sensorswere examined carefully. It can be found that the measurable amplitudeof two traditi<strong>on</strong>ally designed sensors is less than 80 kV/m,which is not suitable for intensive electric field measurement. But anovel sensor designed here is suitable for insulated, intensive (about300kV/m) electric field measurement. And the applicati<strong>on</strong> of which,in the lightning impulse experiment up<strong>on</strong> air gap, ensures that thesensor can be expected to be in widespread use in transient intensiveelectric field measurement investigati<strong>on</strong>s.Basis for a Wireless Network for EMC Measurements inElectric Substati<strong>on</strong>sW. H. Siew, University of Strathclyde; Karl Liu, N/A; Bukar Musa, N/A;Yu Wang, N/A; and Faheem Mir, N/ASwitching operati<strong>on</strong>s of power equipment, such as disc<strong>on</strong>nect switchand circuit breakers in high voltage substati<strong>on</strong>s, produce high frequencytransient currents which propagates al<strong>on</strong>g the busbars. Thebusbars then act as antennae, producing transient <strong>electromagnetic</strong>fields in the switchyards. In <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC)c<strong>on</strong>siderati<strong>on</strong>s, the resulting fields are important sources of <strong>electromagnetic</strong>interference (EMI); moreover, highly sophisticated, newtechnology equipments are being introduced into the substati<strong>on</strong>senvir<strong>on</strong>ment for measurement, c<strong>on</strong>trol, protecti<strong>on</strong>, and communicati<strong>on</strong>purposes. These equipments are located close to the switchingequipments in the switchyards, hence to establish the EMC of theequipment it is desirable to quantify this high voltage envir<strong>on</strong>ment.This paper describes a new digital wireless measurement systemwhich is based <strong>on</strong> Bluetooth technology that can be used in powerstati<strong>on</strong>s or other similar harsh envir<strong>on</strong>ments. It comprises a RemoteAcquisiti<strong>on</strong> Unit (RAU), a Wireless Data Communicati<strong>on</strong> Network(WDCN) and a PC-based C<strong>on</strong>trol Platform. The performance andcapability of the system is assessed against another measurement systembased <strong>on</strong> fiber optics technology and found to be more portable,easier to install, and cheaper than the latter. The limitati<strong>on</strong>s of thewireless system are c<strong>on</strong>sidered and ways of addressing them in furtherresearch are discussed.On the Selecti<strong>on</strong> of Telecommunicati<strong>on</strong> Port ImpedanceStabilizati<strong>on</strong> Networks (ISNs)David Arnett, Hewlett Packard Company; and Edward Blankenship,Hewlett Packard CompanyWhen measuring telecommunicati<strong>on</strong> port c<strong>on</strong>ducted disturbances <strong>on</strong>10BaseT or 100BaseT Ethernet, test labs will find different testresults based <strong>on</strong> whether they select an ISN for two differential pairsor for four differential pairs. This paper discusses the reas<strong>on</strong> why testdata from the two ISN designs will sometimes agree and sometimesdiverge.Electromagnetic Compatibility Lack in Measuring Devicesand Quick Passive Detecti<strong>on</strong> MethodMarian Soinski; Roman Rygal; and Wojciech Pluta, — CzestochowaUniversity of Technology; and Piotr Kepski, Research & Development OfficeStr<strong>on</strong>g stati<strong>on</strong>ary magnetic fields from permanent magnet, or str<strong>on</strong>g<strong>electromagnetic</strong> fields from many different sources, when used in awr<strong>on</strong>g way, can change a proper behavior in already optimized technicalequipment. For example, many electr<strong>on</strong>ic electrical energymeters do not correctly count the c<strong>on</strong>sumpti<strong>on</strong> of electrical energy, orlow-voltage current transformers do not indicate proper levels of outputsignal. This is evidence of a lack of <strong>electromagnetic</strong> <strong>compatibility</strong>(EMC). To prevent the described situati<strong>on</strong> from happening, someacti<strong>on</strong>s have to be taken. This paper outlines the problem and proposesa possible soluti<strong>on</strong> to the phenomen<strong>on</strong> of illegal use of thedescribed lack of EMC.EMC TEST FACILITIES AND ANTENNASA Critique <strong>on</strong> Traceability in Site Validati<strong>on</strong> MeasurementsZh<strong>on</strong>g Chen, ETS-Lindgren; and Achim Enders, Technical University atBraunschweigSite validati<strong>on</strong> measurement procedures are specified in ANSI C63.4and ANSI C63.5 in the U.S., and CISPR 16 <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>ly. The metricsfor site performance for both standards is the site attenuati<strong>on</strong> deviati<strong>on</strong>or normalized site attenuati<strong>on</strong> deviati<strong>on</strong>. However, the (normalized)site attenuati<strong>on</strong> deviati<strong>on</strong>s measured according to these standardsfor the same site-under-test are n<strong>on</strong>-unique, leading to ambiguitiesin the reference for traceability. Because the antennas used for siteattenuati<strong>on</strong> measurements are not specified, the variety of allowedantennas have a n<strong>on</strong>-negligible effect <strong>on</strong> site-attenuati<strong>on</strong> deviati<strong>on</strong>s.The main variable antenna characteristics which directly influence theapparent site resp<strong>on</strong>se are different antenna balun impedances, differentnear-field coupling effects for different antenna elements, and differentfar-field radiati<strong>on</strong> patterns. Results are presented for theseinfluencing factors to show that several dB variati<strong>on</strong>s in site attenuati<strong>on</strong>deviati<strong>on</strong>s can be obtained for the same site. C<strong>on</strong>sequently, standardsdevelopment organizati<strong>on</strong>s are suggested to (re-)c<strong>on</strong>sider specifyingand adopting some type(s) of reference antenna(s).Extracting Useful Informati<strong>on</strong> from Radiated Emissi<strong>on</strong> TestSite NSA and VNSA Data SetsEd Blankenship; David Arnett; and Gary Town; Hewlett-PackardCompany; Derick Skouby; and Henry Benitez, — ElectroMagneticInvestigati<strong>on</strong>s, LLCThis paper explores historical and technical details of the radiatedemissi<strong>on</strong> site attenuati<strong>on</strong> techniques. We give an example of additi<strong>on</strong>alinformati<strong>on</strong> bey<strong>on</strong>d pass/fail that can be gleaned from theresults. Our research dem<strong>on</strong>strates two ways to investigate test siteanomalies, using variati<strong>on</strong>s <strong>on</strong> the standard site attenuati<strong>on</strong> method.Verificati<strong>on</strong> of an EMC Facility Retro-Fit using Time-Domainand Field Uniformity MeasurementsDennis Camell, Nati<strong>on</strong>al Institute of Standards and Technology (NIST);Michael Taylor, Hach Co.; Robert Johnk, NIST; and Ben Davis, NISTThis paper summarizes a joint NIST-Industry measurement effort.Time-domain and field uniformity measurements are used to verify aretro-fit of RF absorber in an EMC Compliance Chamber from 30MHz to 6 GHz. Time gating and dense frequency packing of inser-©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org
EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM11ti<strong>on</strong> data was used to compare before and after measurements of thechamber surfaces. A free space reference provided improved datafidelity. After the update a standard IEC 61000-4-3(A1) test volumeuniformity assessment was performed. These results show that theRF absorber retro-fit resulted in improved radiated emissi<strong>on</strong>s andimmunity performance.Rod Antenna Interacti<strong>on</strong> Inside a Shielded ChamberDennis Swans<strong>on</strong>, Lockheed Martin MS2This paper investigates the interacti<strong>on</strong> of a rod antenna with the testsetup in which it is installed. Historically, the rod antenna has beenwidely used for radiated emissi<strong>on</strong>s testing. Anecdotal rumors exist tohint that there can be c<strong>on</strong>siderable variati<strong>on</strong> in measurements takenwith a rod antenna. To investigate these alleged variati<strong>on</strong>s, simulati<strong>on</strong>software was used to model rod antenna test setups. The softwarecalculated the coupled voltage received by the rod antenna froma simulated wire harness. Calculati<strong>on</strong>s were compiled as a functi<strong>on</strong>of the shield room size and the size of the test bench. Simulati<strong>on</strong>salso included comparis<strong>on</strong>s to outdoor test sites. The results of thisanalysis should be c<strong>on</strong>sidered when revising standards that employthe use of a rod antenna (e.g. CISPR 25, MIL-STD-461E, etc.).Free Space Antenna Factors Through the Use of Time-Domain Signal ProcessingDennis Camell; Robert Johnk; David Novotny; and Chriss Grosvenor, —Nati<strong>on</strong>al Institute of Standards and Technology (NIST)This paper dem<strong>on</strong>strates the usefulness of time domain processing todetermine free-space antenna factors (FSAF) for EMC antennas.Procedures are explained and data is provided from 30 MHz to 9GHz. We investigate time gating of dense frequency packed inserti<strong>on</strong>loss data obtained with an ultra-wideband measurement system.These results show the advantage of time-domain gating to providereliable results for free space antenna factors of EMC antennas.EMC MANAGEMENTThe Role of EMC Standards in Product QualityWayne A. Hunter, Agilent Technologies, Inc.This paper provides the reader with a representati<strong>on</strong> of how the mostcomm<strong>on</strong> <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> EMC standards created by the IEC for commercialelectr<strong>on</strong>ic equipment are created, why it is important to usestandards, and how these standards can actually increase the qualityof the product. The paper attempts to also provide the reader with abackground for the <strong>electromagnetic</strong> c<strong>on</strong>diti<strong>on</strong>s the standards attemptto simulate. It attempts to provide the reader with some reference towhat is mandatory, what is opti<strong>on</strong>al, and suggested levels for a productbased up<strong>on</strong> the intended operating envir<strong>on</strong>ment. The paper willmainly reference <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> standards created by the IEC andCISPR for simplicity. Since nati<strong>on</strong>al or local standards may be different,the paper is a good guidance, but not a substitute for theapplicati<strong>on</strong> of due diligence.A Hierarchical Model for Prescribing EMC Design Targets tothe Comp<strong>on</strong>ents of a SystemHirayr Kudyan, Alcatel-LucentComp<strong>on</strong>ents of a system (i.e., units, shelves, or modules) cannotmeaningfully be tested for system-level emissi<strong>on</strong>s compliance bythemselves. The lack of EMC design objectives for emissi<strong>on</strong>s at thesub-system level makes it ambiguous for comp<strong>on</strong>ent designers to©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org