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2007 ieee international symposium on electromagnetic compatibility

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WELCOME FROM THE CHAIRJanet O’Neil, ETS-LindgrenChair, EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Symposium CommitteeSpecial <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE EMC Symposium Secti<strong>on</strong> 3ALOHA!On behalf of the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> <str<strong>on</strong>g>symposium</str<strong>on</strong>g>steering committee, we hope you will joinus in H<strong>on</strong>olulu, Hawai’i, this July for the<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium <strong>on</strong>Electromagnetic Compatibility. The EMCSociety Board of Directors approved thisunique locati<strong>on</strong> years ago, as a special locati<strong>on</strong>was deemed necessary for a very specialcelebrati<strong>on</strong>: the 50th Anniversary ofthe formati<strong>on</strong> of the EMC Society!The locati<strong>on</strong> of Hawai’i also reflects thisyear’s <str<strong>on</strong>g>symposium</str<strong>on</strong>g> theme of “East Meets West”as engineers from around the world will comefrom the East and the West to c<strong>on</strong>vene in themid-Pacific for a week devoted to the study ofEMC science. We’ve found the locati<strong>on</strong> toindeed be a central meeting point as the demographicsof our technical paper authors isapproximately 30% from Asia, 31% from theU.S. and 39% from Europe and the MiddleEast. This appears to be the first time we’ve seensuch a balanced representati<strong>on</strong> of <str<strong>on</strong>g>symposium</str<strong>on</strong>g>authors from around the world. That’s exciting!Our record number of technical papers,workshops, and tutorials submitted promisea record attendance. We are sure every<strong>on</strong>ewill benefit from this increased attendance;there will be many great technicalsessi<strong>on</strong>s to attend, and many potential customersin the exhibit hall. Surely the networkingwill be great in Hawai’i!With the anniversary this year, theschedule for the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> week wasaltered slightly. The workshops and tutorialswill be held <strong>on</strong> Sunday and M<strong>on</strong>day.The technical papers and the exhibits willoccur in the traditi<strong>on</strong>al Tuesday throughThursday timeframe. On Friday, we willc<strong>on</strong>clude the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> with the “official”50th Anniversary Celebrati<strong>on</strong> lunche<strong>on</strong>and island tour. After all, <strong>on</strong>e can’tcome to Hawai’i and spend the entire timein the big city of H<strong>on</strong>olulu. One needs tosee the “real” Hawai’i of l<strong>on</strong>g ago, the endlessfields of sugar cane and pineapples, thestunning sun-bleached beaches, and theincredibly lush landscape. For <strong>on</strong>e day, youare invited to join the 50th AnniversaryCommittee for a special lunche<strong>on</strong> and tour.You can read more about this in the followingpages.We are also launching the Global EMCUniversity at the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> this year.This dedicated track is targeted to thosepeople who are relatively new to EMC andincludes a well-planned curriculum taughtby world-renowned EMC experts.Nowhere else can <strong>on</strong>e receive this level ofEMC educati<strong>on</strong> from instructors all overthe world in <strong>on</strong>e place at <strong>on</strong>e time. If youare new to EMC, this track is for you!Please register early if this interests you, asattendance is limited to ensure interacti<strong>on</strong>with the instructors. CEUs are awarded tocandidates who successfully complete thecourse.In closing, I would like to thank theentire EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> steering committee fortheir excellent work <strong>on</strong> this <str<strong>on</strong>g>symposium</str<strong>on</strong>g>.Their names and areas of work <strong>on</strong> the committeeare shown below. I tallied up theexperience of this committee and was humbledwhen I realized we have <strong>on</strong> the committeefive past EMC <str<strong>on</strong>g>symposium</str<strong>on</strong>g> chairs,five IEEE Fellows, four past-Presidents ofthe EMC Society, and several current EMCSociety Board members. Every member ofthe committee has been involved in pastEMC symposia or has organized regi<strong>on</strong>alevents. Our committee members thus arenot <strong>on</strong>ly experienced, but they are frommany different countries and regi<strong>on</strong>s withinthe IEEE. I would be remiss if I did notalso recognize and thank the TechnicalCommittees of the EMC Society for theirsupport of the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. This dedicatedgroup reviewed close to 400 papers!Collectively, the members of the EMC<str<strong>on</strong>g>2007</str<strong>on</strong>g> steering committee and theTechnical Committees have brought theirtime and talent to this <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. Youwill reap the rewards of their dedicati<strong>on</strong> inH<strong>on</strong>olulu, Hawai’i, over July 8-13, <str<strong>on</strong>g>2007</str<strong>on</strong>g>.We hope to see you there.Mahalo!EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> SYMPOSIUM COMMITTEEVice ChairR. Barry WallenANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>sTreasurerBenoit NadeauMatroxSecretaryFrank SabathFederal Armed Forces Research InstituteTechnical Program Co-ChairsTodd HubingClems<strong>on</strong> UniversityD<strong>on</strong>ald N. HeirmanD<strong>on</strong> HEIRMAN C<strong>on</strong>sultantsSpecial Sessi<strong>on</strong> and Keynote SpeakerDave StaggsGlobal EMC UniversityClayt<strong>on</strong> PaulMercer UniversityFlavio CanaveroPolitecnico di TorinoWorkshopsJohn MaasIBM Rochester EMC LabDem<strong>on</strong>strati<strong>on</strong>sColin BrenchHewlett PackardAndy DrozdANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>sHistory Sessi<strong>on</strong>Mark SteffkaGeneral Motors - Milford Proving GroundLocal ArrangementsRichard GeorgerianNewsFlex Ltd.Registrati<strong>on</strong>Ghery PettitIntel Corporati<strong>on</strong>ExhibitsFred HeatherNavy Pax RiverPublicati<strong>on</strong>sRay AdamsFischer Custom Communicati<strong>on</strong>sPublicati<strong>on</strong>s EditorBr<strong>on</strong>wyn BrenchC<strong>on</strong>sultantPublicityJames BlahaIngenium Testing Services, Inc.Public Relati<strong>on</strong>s EuropeFrancescaromana MaradeiUniversity of Rome “La Sapienza”Public Relati<strong>on</strong>s JapanShuichi NittaSalesiar PolytechnicPublic Relati<strong>on</strong>s SingaporeErping LiInstitute of High Performance ComputingPublic Relati<strong>on</strong>s KoreaJoungho KimKorea Advanced Institute of Science andTechnology50th Anniversary Special ActivitiesDan HoolihanHoolihan EMC C<strong>on</strong>sultingSocial EventsMarti WallenHospitalityBarbara StaggsVolunteer CoordinatorsKimball WilliamsDenso Internati<strong>on</strong>al America Inc.Magdy IskanderUniversity of Hawai’iWebmasterJames Sakamoto©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


4EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMSYMPOSIUM AT A GLANCEThe informati<strong>on</strong> below is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>; visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updates.Note: For <str<strong>on</strong>g>2007</str<strong>on</strong>g>, the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> week starts <strong>on</strong> SUNDAY and c<strong>on</strong>cludes <strong>on</strong> FRIDAY (except for NARTEExams <strong>on</strong> Saturday, 14 July).SATURDAY, 7 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 5:00pmExhibitor Set Up9:00am to 5:00pmEMC Society Board of DirectorsMeeting2:00pm to 6:00pmRegistrati<strong>on</strong> OpenSUNDAY, 8 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>7:00am to 5:00pmRegistrati<strong>on</strong> Open7:00am to 8:30amEMCS Committee Meetings8:30am to 12:00pmWorkshops and Tutorials8:00am to 5:00pmExhibitor Set Up9:00am to 4:00pmIEEE EMC Chapter Retreat10:00am to 10:30amMorning Break12:00pm to 1:30pmLunch1:30pm to 5:00pmGlobal EMC University Trackc<strong>on</strong>tinues10:00am to 10:30amMorning Break12:00pm to 1:30pmLunch1:30pm to 5:30pmTechnical Program3:00pm to 3:30pmAfterno<strong>on</strong> Break6:30pm to 8:30pmIEEE EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>Welcome Recepti<strong>on</strong>Rooftop Garden, Hilt<strong>on</strong> HawaiianVillageTHURSDAY, 12 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>7:00am to 11:00amRegistrati<strong>on</strong> Open7:00am to 8:30amEMCS Committee Meetings7:30am to 8:15amSpeaker Breakfast8:00am to 12:00pmGlobal EMC University Track8:30am to 12:00pmTechnical Program8:30am to 1:00pmExhibits Open7:30am to 8:15amSpeaker Breakfast8:30am to 12:00pmEMC Fundamentals TutorialPart 18:30am to 12:00pmWorkshops and Tutorials8:00am to 5:00pmExhibitor Set Up10:00am to 10:30amMorning Break1:30pm to 5:30pmWorkshops and Tutorials3:00pm to 3:30pmAfterno<strong>on</strong> Break5:30pm to 7:00pmSpecial IEC AdvisoryCommittee <strong>on</strong> EMC (ACEC)Tutorial <strong>on</strong> IEC EMC StandardsTUESDAY, 10 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>7:00am to 5:00pmRegistrati<strong>on</strong> OpenWEDNESDAY, 11 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>7:00am to 5:00pmRegistrati<strong>on</strong> Open7:00am to 8:30amEMCS Committee Meetings7:30am to 8:15amSpeaker Breakfast8:00am to 12:00pmGlobal EMC University Track8:30am to 12:00pmTechnical Program8:30am to 1:00pmDem<strong>on</strong>strati<strong>on</strong>s in Exhibit Hall8:30am to 1:00pmNew Product Applicati<strong>on</strong>sPresentati<strong>on</strong>s10:00am to 10:30amMorning Break1:00pm to 2:30pmAwards Lunche<strong>on</strong>1:00pm to 11:59pmExhibitor Tear DownLunch12:00pm to 1:30pm7:00am to 8:30amEMCS Committee Meetings8:30am to 5:30pmExhibits Open2:45pm to 5:30pmTechnical Program1:30pm to 5:30pmEMC Fundamentals TutorialPart 2 (Includes NARTE prepexam lecture)1:30pm to 5:30pmWorkshops and Tutorials3:00pm to 3:30pmAfterno<strong>on</strong> BreakMONDAY, 9 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>7:00am to 5:00pmRegistrati<strong>on</strong> Open7:00am to 8:30amEMCS Committee Meetings7:30am to 8:15amSpeaker Breakfast8:00am to 12:00pmGlobal EMC University Track7:30am to 8:15amSpeaker Breakfast8:00am to 12:00pmGlobal EMC University Track8:30am to 9:30amKeynote Address by IEEEPresident Leah Jamies<strong>on</strong>8:30am to 5:30pmExhibits Open8:30am to 5:30pmDem<strong>on</strong>strati<strong>on</strong>s in Exhibit Hall8:30am to 5:30pmNew Product Applicati<strong>on</strong>sPresentati<strong>on</strong>s9:30am to 12:00pmTechnical Program8:30am to 5:30pmDem<strong>on</strong>strati<strong>on</strong>s in Exhibit Hall8:30am to 5:30pmNew Product Applicati<strong>on</strong>sPresentati<strong>on</strong>s10:00am to 10:30amMorning Break12:00pm to 1:30pmLunch1:30pm to 5:30pmTechnical Program3:00pm to 3:30pmAfterno<strong>on</strong> Break6:30pm to 10:30pmIEEE EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Gala Event:Traditi<strong>on</strong>al Hawaiian Luauat the World Famous RoyalHawaiian Hotel3:45pm to 4:00pmAfterno<strong>on</strong> BreakFRIDAY, 13 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 12:00pmExhibitor Tear Down9:30am to 4:00pmEMC Society 50th AnniversaryCelebrati<strong>on</strong>Lunche<strong>on</strong> & Island TourSATURDAY, 14 JULY <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 5:00pmNARTE ExamsHilt<strong>on</strong> Hawaiian Village Hotel©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


Why Meet The StandardsWhen You Can Exceed Them.WATTSWATTS1.61.41.210.80.60.40.202220181614121086421S4G11Linear @ 3dB Compressi<strong>on</strong>Linear @ 1dB Compressi<strong>on</strong>2 4 6 8 10 12FREQUENCY (GHz)15S4G8Linear @ 3dB Compressi<strong>on</strong>Linear @ 1dB Compressi<strong>on</strong>3 4 5 6 7 8 9FREQUENCY (GHz)WATTSWATTS161412108642858075706560555045403510S4G11Linear @ 1dB Compressi<strong>on</strong>60S4G8Linear @ 3dB Compressi<strong>on</strong>Linear @ 1dB Compressi<strong>on</strong>Linear @ 3dB Compressi<strong>on</strong>2 4 6 8 10 12FREQUENCY (GHz)3 4 5 6 7 8 9FREQUENCY (GHz)WATTS160150120S4G8140140Linear @ 1dB Compressi<strong>on</strong>1201101009080703 4 5 678 9FREQUENCY (GHz)WATTS140130120110100908070605040302080S4G11Linear @ 1dB Compressi<strong>on</strong>Linear @ 3dB Compressi<strong>on</strong>2 4 6 8 10 12FREQUENCY (GHz)Linear @ 3dB Compressi<strong>on</strong>AR’s family of 4G11 broadband, solid-state amplifiers are designed and built to give you the flexibility to test bey<strong>on</strong>d the specs.And to meet or exceed new higher standards as they emerge.The 4G11 amplifiers cover the 4 – 10.6 GHz frequency spectrum with available power ranging from 1 – 80 watts.They offer 100% mismatch capability, excellent linearity, low noise level, and outstanding harm<strong>on</strong>ic c<strong>on</strong>tent. But that’s not all.Our new 4G8 family is specially designed to deliver excellent performance across the 4 - 8 GHz frequency range, with 15, 35, 60and 120 watt amplifiers.With wireless devices multiplying so rapidly, it’s no w<strong>on</strong>der that the microwave spectrum is getting more and more crowded.That’s why an increasing number of new and proposed EMC standards are pushing test limits higher in frequency and field strength.Even these new standards d<strong>on</strong>’t take all potential threats into account. Nor do EMC standards allow for the possibility oftransmitters operating in close proximity, which can produce RF fields far greater than those mandated in the standards.So it’s becoming more critical to test bey<strong>on</strong>d the specs. Better to prevent equipment problems now then to try and fix them later.AR supplies a multitude of unique RF soluti<strong>on</strong>s – and provides a competitive edge – to some of the best-known companiesworldwide. Our products are backed by the str<strong>on</strong>gest, most comprehensive warranty in the industry, and a global support networkthat’s sec<strong>on</strong>d to n<strong>on</strong>e.To learn more, visit www.ar-worldwide.com or call us at 215-723-8181.Visit Us At Booths: 402-413, IEEE EMC Sympoisum <str<strong>on</strong>g>2007</str<strong>on</strong>g>, Hawaii C<strong>on</strong>venti<strong>on</strong> CenterH<strong>on</strong>olulu, Hawaii, July 9-12, <str<strong>on</strong>g>2007</str<strong>on</strong>g>ISO 9001:2000Certifiedrf/microwave instrumentati<strong>on</strong>Other ar divisi<strong>on</strong>s: modular rf • receiver systems • ar europeUSA 215-723-8181. For an applicati<strong>on</strong>s engineer, call 800-933-8181.In Europe, call ar emv United Kingdom 441-908-282766 • ar emv France 33 -1-47-91-75-30 • emv Germany 89-614-1710 • emv Netherlands 31-172-423-000Copyright© <str<strong>on</strong>g>2007</str<strong>on</strong>g> AR. The orange stripe <strong>on</strong> AR products is Reg. U.S. Pat. & TM. Off.


6PLENARY SESSIONTuesday, 10 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:30am – 9:30amHawai’i C<strong>on</strong>venti<strong>on</strong> CenterEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMThe <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium <strong>on</strong> EMC steering committee is pleased to announce that IEEE President Leah Jamies<strong>on</strong> will be thekeynote speaker to officially open the technical sessi<strong>on</strong>s of the EMC Society’s 50th Anniversary Symposium. Ms. Jamies<strong>on</strong> will also present theprestigious <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Electromagnetics Award to Carl Baum, the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Undergraduate Teaching Award to Clayt<strong>on</strong> R. Paul, and thisyear’s Fellow Awards. To c<strong>on</strong>clude the plenary sessi<strong>on</strong>, in recogniti<strong>on</strong> of the 50th Anniversary of the EMC Society and its rich historical legacy, invitedspeaker Tapan Sarkar will give a presentati<strong>on</strong> <strong>on</strong> James Clerk Maxwell and his numerous c<strong>on</strong>tributi<strong>on</strong>s to EMC science. This talk, based <strong>on</strong> a bookco-written by him <strong>on</strong> the history of wireless technology, will discuss Maxwell from a historical perspective focusing <strong>on</strong> some of his works that manyare not familiar with bey<strong>on</strong>d his classical <strong>electromagnetic</strong> equati<strong>on</strong>s.SYMPOSIUM KEYNOTE ADDRESS“Engineering in the Changing World”Leah Jamies<strong>on</strong>, <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE PresidentAbstractGlobal and technological trends are driving change both in the engineeringprofessi<strong>on</strong> and in engineering educati<strong>on</strong>. What grand challenges andtechnological trends will shape engineering endeavors over the next 20years? What attributes will define success in 21st century careers? Howdo we prepare students for careers where traits such as innovati<strong>on</strong> and flexibilityare as crucial as math, science, and engineering fundamentals?What role might professi<strong>on</strong>al societies play in this changing landscape?What unexpected opportunities might result from the broadening ofengineering bey<strong>on</strong>d its traditi<strong>on</strong>al scope? We need nothing short of a revoluti<strong>on</strong>in how we think about 21st century educati<strong>on</strong> and careers.BiographyLeah H. Jamies<strong>on</strong> received the S.B. degree in mathematics from MIT andthe Ph.D. degree from the Department of Electrical Engineering andComputer Science, Princet<strong>on</strong> University. In 1976 she joined the faculty atPurdue University, West Lafayette, Indiana, USA, where she is theRansburg Distinguished Professor of Electrical and ComputerEngineering and John A. Edwards<strong>on</strong> Dean of Engineering.Jamies<strong>on</strong> is co-founder and past director of the EngineeringProjects in Community Service (EPICS), an engineering design programthat operates in a service-learning c<strong>on</strong>text. Initiated at Purduein 1995, EPICS programs have been created at sixteen additi<strong>on</strong>al universitiesand <strong>on</strong>e high school. EPICS co-founders were awarded theU.S. Nati<strong>on</strong>al Academy of Engineering’s 2005 Bernard M. Gord<strong>on</strong>Prize for Innovati<strong>on</strong> in Engineering and Technology Educati<strong>on</strong>.EPICS was featured in the PBS documentary Communities BuildingCommunity, produced by WFYI Indianapolis in 2003.Jamies<strong>on</strong>’s research interests include speech analysis and recogniti<strong>on</strong>;the design and analysis of parallel processing algorithms; andthe applicati<strong>on</strong> of parallel processing to the areas of digital speech,image, and signal processing. She has authored over 160 journal andc<strong>on</strong>ference papers and has co-edited books in these areas. She has beenan IEEE Signal Processing Society Distinguished Lecturer and anIEEE Computer Society Distinguished Visitor.Jamies<strong>on</strong> has been an active volunteer in the 365,000-memberInstitute of Electrical and Electr<strong>on</strong>ics Engineers (IEEE) for manyyears and was recently elected to be the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE President. Shewas awarded an IEEE Third Millennium Medal (2000) and the IEEESignal Processing Society’s 2003 Meritorious Service Award.Jamies<strong>on</strong> is a Fellow of the IEEE and a member of the U.S. Nati<strong>on</strong>alAcademy of Engineering.“WHO WAS JAMES CLERK MAXWELL AND WHATIS/WAS HIS ELECTROMAGNETIC THEORY?”Tapan Sarkar of Syracuse UniversityAccording to Dr. Sarkar, Maxwell can be c<strong>on</strong>sidered as <strong>on</strong>e of theworld’s greatest scientists even if he had never worked <strong>on</strong> electricityand magnetism. His influence is everywhere, which surprisinglyis quite unknown to most scientists and engineers. The talkwill describe some of that research including for example, the ophthalmoscopeand the Maxwell’s yellow spot test for macular degenerati<strong>on</strong>,the three colors used in color televisi<strong>on</strong>, as inventor of the c<strong>on</strong>cept ofensemble averaging and the developer of the c<strong>on</strong>cept of entropy whichwas expounded by Leo Szilard and others as informati<strong>on</strong> theory. Hetook the first color photograph, laid the basic foundati<strong>on</strong> <strong>on</strong> the choiceof three primary colors in characterizing any color, and developed accessoriesfor colorblind people, which are still used today. He developedgeneral laws of optical instruments and even developed a theory <strong>on</strong> thecompositi<strong>on</strong> of Saturn’s rings. He created a standard for electrical resistance.He also wrote the first paper <strong>on</strong> negative feedback that was thecornerst<strong>on</strong>e of Norbert Wiener’s work <strong>on</strong> cybernetics. Additi<strong>on</strong>ally, heimproved the system of dimensi<strong>on</strong>al analysis which led him to predictthat light was <strong>electromagnetic</strong> in nature and surprisingly the method ofsolving the loop currents as the ratio of determinants, to name a few. Hedeveloped a coherent set of units of measurement of electricity and magnetism,which became misleadingly known as the Gaussian system.Even though Maxwell has influenced development in many areas of thephysical sciences and had started a revoluti<strong>on</strong> in the way physicists lookat the world, he is not very well known for these accomplishments,unfortunately, outside some selected scientific communities. The reas<strong>on</strong>sfor that will also be described.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


Come see us at theIEEE EMC Symposium <str<strong>on</strong>g>2007</str<strong>on</strong>g>July 10-12, H<strong>on</strong>oluluBooth #608


8EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMDO WE HAVE A TECHNICAL PROGRAMFOR YOU AT EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>!D<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultantsTodd Hubing, Clems<strong>on</strong> UniversityTechnical Program Co-chairsOver 300 (yes 300!) papers weresubmitted for this year’s <str<strong>on</strong>g>symposium</str<strong>on</strong>g>in Hawai‘i. That’s more thandouble the number submitted for last year’s<str<strong>on</strong>g>symposium</str<strong>on</strong>g> and by far the largest numbersubmitted for any EMC <str<strong>on</strong>g>symposium</str<strong>on</strong>g> that wecould recall. As indicated in the advanceprogram <strong>on</strong> the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> web site, justunder 250 papers were accepted - anotherrecord. But records d<strong>on</strong>’t mean as much asthe quality of the accepted papers, whichthis year was noticeably higher than previousyears. Your Society technical committeeswent out of their way to ensure thatpapers were of the highest caliber. Onetechnique that was employed to make thishappen was to institute a system thatallowed the authors to get the reviewers’comments for improvements, make the necessarychanges, and resubmit for a sec<strong>on</strong>dround of reviews. Those papers that wereresubmitted for the sec<strong>on</strong>d round were usuallysignificantly improved and met thehigh standard of quality required to beincluded in the technical program.This year, many of the papers are associatedwith “technical area tracks” to allow anattendee the opportunity to follow a specifictechnical area throughout the week. Thetechnical tracks that have been identifiedfor this program are:• Automotive EMC• EM Modeling Techniques• New EMC Measurement Technologies• Printed Circuit Board Design• PCB and System Modeling• Signal Integrity• System EMC Test• System EMC Design.In additi<strong>on</strong> to the wealth of technical papersubmissi<strong>on</strong>s, we had over two dozen proposalsfor workshops and tutorials, again arecord number. Twenty workshops/tutorialswill be offered <strong>on</strong> Sunday and M<strong>on</strong>day of the<str<strong>on</strong>g>symposium</str<strong>on</strong>g> week, covering such topics as:• EMC and EM Modeling Fundamentals• Test Site Validati<strong>on</strong> Above 1 GHz• Advanced EMC Materials and Designs• Power and Signal Integrity• EMC and Wireless Devices• Managing Regulatory Access to the Asia-Pacific MarketsA very special workshop given by the IECAdvisory Committee <strong>on</strong> EMC (ACEC)focusing <strong>on</strong> “a c<strong>on</strong>versati<strong>on</strong> with ACEC” <strong>on</strong>their work and the work of IEC TC77(immunity focus) and IEC/CISPR (emissi<strong>on</strong>focus).The ACEC workshop will be held <strong>on</strong>M<strong>on</strong>day evening where there will not be anyparallel workshop/tutorial activity so thatmany who are not familiar with the <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>EMC standardizati<strong>on</strong> program cancome and hear what that is all about.Since this is also the 50th anniversary ofthe Society, we have set aside a special sessi<strong>on</strong>that will focus <strong>on</strong> historical papers,including the following topics:• System Level Electromagnetic Envir<strong>on</strong>mentSimulati<strong>on</strong>s• Military Aircraft EMC in the UnitedKingdom• EMC Absorbers Through the Years andTheir Impact <strong>on</strong> New Site Validati<strong>on</strong>Techniques• The History of Integrated Circuit EMC• 50 Years of EMC at Georgia Institute ofTechnologyAnother exciting area is our invited speakerspecial sessi<strong>on</strong>s. This year is especiallyimportant since special sessi<strong>on</strong> papers werepeer reviewed in the same manner as theopen call for papers. So key technical expertswill present the cream of the crop of specialsessi<strong>on</strong> papers. Here is a partial list ofspecial sessi<strong>on</strong> topics:• Power Integrity/Signal Integrity for NextGenerati<strong>on</strong> Systems• Industry Standard Cables and ShieldingPerformance• Emerging EMC Technologies in Japan• Automotive EMC• EMC/EM Effects in Waveform DiversityApplicati<strong>on</strong>s• Advanced EMC MeasurementsA new additi<strong>on</strong> to the technical programthis year is the Global EMC University. Theobjective of this special track is to provide acomprehensive discussi<strong>on</strong> of the basic c<strong>on</strong>ceptsand skills that are used in the EMCprofessi<strong>on</strong>. Clayt<strong>on</strong> Paul and FlavioCanavero are in charge of this event, whichis open to a limited number of attendeeswho sign up ahead of the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. Moreinformati<strong>on</strong> <strong>on</strong> the Global EMC Universityand the rest of the technical program can befound in the following pages and <strong>on</strong> the c<strong>on</strong>ferencewebsite at http://www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org.In summary this is a “can’t miss” <str<strong>on</strong>g>symposium</str<strong>on</strong>g>,not <strong>on</strong>ly for the outstanding technicalprogram, but to also celebrate a halfcenturyof our EMC Society. We are lookingforward to seeing you in Hawai’i!Carl Baum, recipient of the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Electromagnetics Award, will present a speciallecture <strong>on</strong> Wednesday, July 11, from 12:30 - 1:30 pm at the Hawai'i C<strong>on</strong>venti<strong>on</strong> Centertitled: Low- and High-Frequency Soluti<strong>on</strong>s of the Telegrapher Equati<strong>on</strong>s for N<strong>on</strong>uniformMultic<strong>on</strong>ductor Transmissi<strong>on</strong> Lines. All <str<strong>on</strong>g>symposium</str<strong>on</strong>g> registrants are invited to attend.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 9EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> TECHNICAL PAPER ABSTRACTS10-12 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>, visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updates.Note: N/A after an author name indicates “no affiliati<strong>on</strong>;” informati<strong>on</strong> was not provided by author.SPECIAL SESSION: HISTORYEstablishing EMC Educati<strong>on</strong>: The Ten-Year C<strong>on</strong>tributi<strong>on</strong> ofthe University Grant ProgramThomas Jerse, The Citadel; and Mark Steffka, University of Michigan-DearbornThe University Grant Program was first funded by the IEEE EMCSociety in 1997. Over the past 10 years it has provided seed m<strong>on</strong>eyfor the establishment of eight courses in the basic principles of <strong>electromagnetic</strong><strong>compatibility</strong> at academic instituti<strong>on</strong>s <strong>on</strong> two c<strong>on</strong>tinents.All past recipients were surveyed, and the collected data wasused to assess the impact and excepti<strong>on</strong>al return <strong>on</strong> investment of theprogram. Brief descripti<strong>on</strong>s of some of the experiments developed arealso included.A Historical Perspective of System-Level TDFD EME Simulati<strong>on</strong>Rodney Perala, Electro Magnetic Applicati<strong>on</strong>s, Inc.Computati<strong>on</strong>al <strong>electromagnetic</strong>s (CEM) and particularly the timedomainfinite-difference method (TDFD), began to be used for system-levelsimulati<strong>on</strong>s of <strong>electromagnetic</strong> effects (EME) in the 1970s.From that time until now, there have been dramatic advances resultingin large capability growth with simultaneous reducti<strong>on</strong>s in computingcost. The net result is that the TDFD method can form thecore of a powerful simulati<strong>on</strong> capability, useful for virtual EME system-levelverificati<strong>on</strong> and dem<strong>on</strong>strati<strong>on</strong>.EMC Absorbers Through the Years with Respect to the NewSite Validati<strong>on</strong> Procedure in the Frequency Range from 1 to18 GHz — A Practical ApproachFriedrich-Wilhelm Trautnitz, Albatross Projects GmbHThis paper describes the development of EMC absorbers and EMCchambers until today. The first anechoic chamber in Europe was builtin the mid sixties. Due to the fact that absorber chambers were notnecessary in the early sixties, EMC measurements were easily possible<strong>on</strong> open area test sites (OATS). This project was for many years the<strong>on</strong>ly EMC chamber in Europe. The market for EMC chambersincreased with increasing radio services because of ambient noise. Inthe mid eighties the market for EMC chambers again awoke. Thetechnical requirement for EMC chambers was to fulfill the VDE 0871.At the end of the eighties VDE founded a special committee discussingthe requirements of alternate test sites. The volume methodfor validating test sites first was integrated in ANSI C 63.4 – 1988.In Cenelec – the European committee – a working group was alsofounded for establishing an EN standard for alternate test sites. Theresult was the EN 50147-1 (shielding) and -2 (NSA site validati<strong>on</strong>).The volume method was integrated in CISPR 16 in the mid nineties.Meanwhile the volume method for NSA measurement of alternate testsites is well established. The technical development of EMC absorberswill be described discussing pyramidal foam absorbers, hollow pyramidalfoam absorbers, and hybrid absorbers – a combinati<strong>on</strong> of severalabsorbers (ferrite and foam absorber). New inventi<strong>on</strong>s like pyramidalfoil absorbers will also be discussed. The new site validati<strong>on</strong> (siteVSWR) procedure from 1 to 18 GHz is shown.Fifty Years of EMC Research at Georgia TechHugh Denny, Georgia Tech Research InstituteResearch studies in <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) have beenunderway at GTRI since 1953. Investigati<strong>on</strong>s have ranged fromstudies of the n<strong>on</strong>linear properties of solid state juncti<strong>on</strong>s to thedevelopment of c<strong>on</strong>trol methods for widely dispersed systems.Highlights of accomplishments and c<strong>on</strong>tributi<strong>on</strong>s during this halfcenturyplus are presented.EMC of Integrated Circuits: A Historical ReviewEtienne Sicard, Institut Nati<strong>on</strong>al des Sciences Appliquées (INSA) of ToulouseThis paper provides a n<strong>on</strong> exhaustive review of the research work c<strong>on</strong>ductedin the field of integrated circuit <strong>electromagnetic</strong> <strong>compatibility</strong>over the past 40+ years.Military Aircraft Electromagnetic Compatibility: Release toService Testing in the United Kingdom, Past, Present and FutureTimothy J. Duggan, Systems Evaluati<strong>on</strong> Services, QinetiQRelease to Service (RTS) Electromagnetic Compatibility (EMC) testingof military aircraft in the United Kingdom (UK), can be tracedback as far as 1932 c<strong>on</strong>cerning the effect of engine interference <strong>on</strong> anaircraft’s communicati<strong>on</strong> systems. However, it was interference seento aircraft weap<strong>on</strong>s and electrical systems during operati<strong>on</strong>s from aircraftcarriers in the 1960s that resulted in the significant expansi<strong>on</strong>of the EMC assessment and test capabilities by QinetiQ (and its predecessororganizati<strong>on</strong>s) at Boscombe Down, Farnborough, and by aircraftprime c<strong>on</strong>tractors. This paper describes the evoluti<strong>on</strong> of EMCtest methods and facilities used to assess UK military aircraft fromthe 1960s to the present and into the future, taking into account theadvances in avi<strong>on</strong>ics technology and the associated challenges inassessing their suitability for RTS.EMC MEASUREMENTS IDevelopment and Applicati<strong>on</strong> of a High-Resoluti<strong>on</strong> Thin-Film ProbeKuifeng Hu, University of Missouri-RollaA high-resoluti<strong>on</strong> thin film probe was developed and compared to ac<strong>on</strong>venti<strong>on</strong>al single loop probe, and showed a 250 µm spatialimprovement measured at a height of 250 µm over 118 µm differentialtraces. A 180 degree hybrid juncti<strong>on</strong> was used in the measurementcircuit to separate the electric and magnetic coupling from theprobe. A network analyzer with narrow band filtering was used todetect the weak signal from the probe and further determine thephase. The developed thin-film probe was successfully used to detectthe package pin current with phase informati<strong>on</strong> at clock frequencyharm<strong>on</strong>ics.The Design of an Electro-optical Modulator Used in EMCMeasurementsYinan Geng; R<strong>on</strong>g Zeng; Jinliang He; Shuiming Chen; and Bo Zhang, —Department of Electrical Engineering, Tsinghua University©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


10EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMThe electro-optical modulator based <strong>on</strong> Pockels effect implementsthe transiti<strong>on</strong> from electrical signal to optical signal. This makesusing optical fiber in EMC measurements come true. This paperdescribes the principle of modulators based <strong>on</strong> Pockels effect, designsthe modulator with high precisi<strong>on</strong>, calculates the electric field in themodulator, discusses the parameters of the modulator, and gives theequivalent electrical circuit.The Development of Integrated Electro-optic Sensor forIntensive Electric Field MeasurementR<strong>on</strong>g Zeng; Weiyuan Chen; Jinliang He; Puxua Zhu; Xiaolin Li; and QiWang, — Department of Electrical Engineering, Tsinghua UniversityIn order to meet the special demands of impulse electric field measurementsimultaneously, such as intensive signal, fine insulati<strong>on</strong>,transient, wide frequency band, and small size, three kinds of opticalelectric integrated electric field sensor were designed and fabricated.The output/input character and frequency resp<strong>on</strong>se of the sensorswere examined carefully. It can be found that the measurable amplitudeof two traditi<strong>on</strong>ally designed sensors is less than 80 kV/m,which is not suitable for intensive electric field measurement. But anovel sensor designed here is suitable for insulated, intensive (about300kV/m) electric field measurement. And the applicati<strong>on</strong> of which,in the lightning impulse experiment up<strong>on</strong> air gap, ensures that thesensor can be expected to be in widespread use in transient intensiveelectric field measurement investigati<strong>on</strong>s.Basis for a Wireless Network for EMC Measurements inElectric Substati<strong>on</strong>sW. H. Siew, University of Strathclyde; Karl Liu, N/A; Bukar Musa, N/A;Yu Wang, N/A; and Faheem Mir, N/ASwitching operati<strong>on</strong>s of power equipment, such as disc<strong>on</strong>nect switchand circuit breakers in high voltage substati<strong>on</strong>s, produce high frequencytransient currents which propagates al<strong>on</strong>g the busbars. Thebusbars then act as antennae, producing transient <strong>electromagnetic</strong>fields in the switchyards. In <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC)c<strong>on</strong>siderati<strong>on</strong>s, the resulting fields are important sources of <strong>electromagnetic</strong>interference (EMI); moreover, highly sophisticated, newtechnology equipments are being introduced into the substati<strong>on</strong>senvir<strong>on</strong>ment for measurement, c<strong>on</strong>trol, protecti<strong>on</strong>, and communicati<strong>on</strong>purposes. These equipments are located close to the switchingequipments in the switchyards, hence to establish the EMC of theequipment it is desirable to quantify this high voltage envir<strong>on</strong>ment.This paper describes a new digital wireless measurement systemwhich is based <strong>on</strong> Bluetooth technology that can be used in powerstati<strong>on</strong>s or other similar harsh envir<strong>on</strong>ments. It comprises a RemoteAcquisiti<strong>on</strong> Unit (RAU), a Wireless Data Communicati<strong>on</strong> Network(WDCN) and a PC-based C<strong>on</strong>trol Platform. The performance andcapability of the system is assessed against another measurement systembased <strong>on</strong> fiber optics technology and found to be more portable,easier to install, and cheaper than the latter. The limitati<strong>on</strong>s of thewireless system are c<strong>on</strong>sidered and ways of addressing them in furtherresearch are discussed.On the Selecti<strong>on</strong> of Telecommunicati<strong>on</strong> Port ImpedanceStabilizati<strong>on</strong> Networks (ISNs)David Arnett, Hewlett Packard Company; and Edward Blankenship,Hewlett Packard CompanyWhen measuring telecommunicati<strong>on</strong> port c<strong>on</strong>ducted disturbances <strong>on</strong>10BaseT or 100BaseT Ethernet, test labs will find different testresults based <strong>on</strong> whether they select an ISN for two differential pairsor for four differential pairs. This paper discusses the reas<strong>on</strong> why testdata from the two ISN designs will sometimes agree and sometimesdiverge.Electromagnetic Compatibility Lack in Measuring Devicesand Quick Passive Detecti<strong>on</strong> MethodMarian Soinski; Roman Rygal; and Wojciech Pluta, — CzestochowaUniversity of Technology; and Piotr Kepski, Research & Development OfficeStr<strong>on</strong>g stati<strong>on</strong>ary magnetic fields from permanent magnet, or str<strong>on</strong>g<strong>electromagnetic</strong> fields from many different sources, when used in awr<strong>on</strong>g way, can change a proper behavior in already optimized technicalequipment. For example, many electr<strong>on</strong>ic electrical energymeters do not correctly count the c<strong>on</strong>sumpti<strong>on</strong> of electrical energy, orlow-voltage current transformers do not indicate proper levels of outputsignal. This is evidence of a lack of <strong>electromagnetic</strong> <strong>compatibility</strong>(EMC). To prevent the described situati<strong>on</strong> from happening, someacti<strong>on</strong>s have to be taken. This paper outlines the problem and proposesa possible soluti<strong>on</strong> to the phenomen<strong>on</strong> of illegal use of thedescribed lack of EMC.EMC TEST FACILITIES AND ANTENNASA Critique <strong>on</strong> Traceability in Site Validati<strong>on</strong> MeasurementsZh<strong>on</strong>g Chen, ETS-Lindgren; and Achim Enders, Technical University atBraunschweigSite validati<strong>on</strong> measurement procedures are specified in ANSI C63.4and ANSI C63.5 in the U.S., and CISPR 16 <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>ly. The metricsfor site performance for both standards is the site attenuati<strong>on</strong> deviati<strong>on</strong>or normalized site attenuati<strong>on</strong> deviati<strong>on</strong>. However, the (normalized)site attenuati<strong>on</strong> deviati<strong>on</strong>s measured according to these standardsfor the same site-under-test are n<strong>on</strong>-unique, leading to ambiguitiesin the reference for traceability. Because the antennas used for siteattenuati<strong>on</strong> measurements are not specified, the variety of allowedantennas have a n<strong>on</strong>-negligible effect <strong>on</strong> site-attenuati<strong>on</strong> deviati<strong>on</strong>s.The main variable antenna characteristics which directly influence theapparent site resp<strong>on</strong>se are different antenna balun impedances, differentnear-field coupling effects for different antenna elements, and differentfar-field radiati<strong>on</strong> patterns. Results are presented for theseinfluencing factors to show that several dB variati<strong>on</strong>s in site attenuati<strong>on</strong>deviati<strong>on</strong>s can be obtained for the same site. C<strong>on</strong>sequently, standardsdevelopment organizati<strong>on</strong>s are suggested to (re-)c<strong>on</strong>sider specifyingand adopting some type(s) of reference antenna(s).Extracting Useful Informati<strong>on</strong> from Radiated Emissi<strong>on</strong> TestSite NSA and VNSA Data SetsEd Blankenship; David Arnett; and Gary Town; Hewlett-PackardCompany; Derick Skouby; and Henry Benitez, — ElectroMagneticInvestigati<strong>on</strong>s, LLCThis paper explores historical and technical details of the radiatedemissi<strong>on</strong> site attenuati<strong>on</strong> techniques. We give an example of additi<strong>on</strong>alinformati<strong>on</strong> bey<strong>on</strong>d pass/fail that can be gleaned from theresults. Our research dem<strong>on</strong>strates two ways to investigate test siteanomalies, using variati<strong>on</strong>s <strong>on</strong> the standard site attenuati<strong>on</strong> method.Verificati<strong>on</strong> of an EMC Facility Retro-Fit using Time-Domainand Field Uniformity MeasurementsDennis Camell, Nati<strong>on</strong>al Institute of Standards and Technology (NIST);Michael Taylor, Hach Co.; Robert Johnk, NIST; and Ben Davis, NISTThis paper summarizes a joint NIST-Industry measurement effort.Time-domain and field uniformity measurements are used to verify aretro-fit of RF absorber in an EMC Compliance Chamber from 30MHz to 6 GHz. Time gating and dense frequency packing of inser-©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM11ti<strong>on</strong> data was used to compare before and after measurements of thechamber surfaces. A free space reference provided improved datafidelity. After the update a standard IEC 61000-4-3(A1) test volumeuniformity assessment was performed. These results show that theRF absorber retro-fit resulted in improved radiated emissi<strong>on</strong>s andimmunity performance.Rod Antenna Interacti<strong>on</strong> Inside a Shielded ChamberDennis Swans<strong>on</strong>, Lockheed Martin MS2This paper investigates the interacti<strong>on</strong> of a rod antenna with the testsetup in which it is installed. Historically, the rod antenna has beenwidely used for radiated emissi<strong>on</strong>s testing. Anecdotal rumors exist tohint that there can be c<strong>on</strong>siderable variati<strong>on</strong> in measurements takenwith a rod antenna. To investigate these alleged variati<strong>on</strong>s, simulati<strong>on</strong>software was used to model rod antenna test setups. The softwarecalculated the coupled voltage received by the rod antenna froma simulated wire harness. Calculati<strong>on</strong>s were compiled as a functi<strong>on</strong>of the shield room size and the size of the test bench. Simulati<strong>on</strong>salso included comparis<strong>on</strong>s to outdoor test sites. The results of thisanalysis should be c<strong>on</strong>sidered when revising standards that employthe use of a rod antenna (e.g. CISPR 25, MIL-STD-461E, etc.).Free Space Antenna Factors Through the Use of Time-Domain Signal ProcessingDennis Camell; Robert Johnk; David Novotny; and Chriss Grosvenor, —Nati<strong>on</strong>al Institute of Standards and Technology (NIST)This paper dem<strong>on</strong>strates the usefulness of time domain processing todetermine free-space antenna factors (FSAF) for EMC antennas.Procedures are explained and data is provided from 30 MHz to 9GHz. We investigate time gating of dense frequency packed inserti<strong>on</strong>loss data obtained with an ultra-wideband measurement system.These results show the advantage of time-domain gating to providereliable results for free space antenna factors of EMC antennas.EMC MANAGEMENTThe Role of EMC Standards in Product QualityWayne A. Hunter, Agilent Technologies, Inc.This paper provides the reader with a representati<strong>on</strong> of how the mostcomm<strong>on</strong> <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> EMC standards created by the IEC for commercialelectr<strong>on</strong>ic equipment are created, why it is important to usestandards, and how these standards can actually increase the qualityof the product. The paper attempts to also provide the reader with abackground for the <strong>electromagnetic</strong> c<strong>on</strong>diti<strong>on</strong>s the standards attemptto simulate. It attempts to provide the reader with some reference towhat is mandatory, what is opti<strong>on</strong>al, and suggested levels for a productbased up<strong>on</strong> the intended operating envir<strong>on</strong>ment. The paper willmainly reference <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> standards created by the IEC andCISPR for simplicity. Since nati<strong>on</strong>al or local standards may be different,the paper is a good guidance, but not a substitute for theapplicati<strong>on</strong> of due diligence.A Hierarchical Model for Prescribing EMC Design Targets tothe Comp<strong>on</strong>ents of a SystemHirayr Kudyan, Alcatel-LucentComp<strong>on</strong>ents of a system (i.e., units, shelves, or modules) cannotmeaningfully be tested for system-level emissi<strong>on</strong>s compliance bythemselves. The lack of EMC design objectives for emissi<strong>on</strong>s at thesub-system level makes it ambiguous for comp<strong>on</strong>ent designers to©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


12EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMdecide whether a given comp<strong>on</strong>ent design is EMC sufficient. Thepurpose of this paper is to discuss and present a qualitative schemefor defining practical EMC design targets for the comp<strong>on</strong>ents of asystem for producti<strong>on</strong> purposes. This is a preliminary step inattempting to address this need, using a combinati<strong>on</strong> of comm<strong>on</strong>sense, stand-al<strong>on</strong>e comp<strong>on</strong>ent level emissi<strong>on</strong>s testing strategy, andperiodic design reviews of comp<strong>on</strong>ents during their design cycle.Uncertainty Analysis and Novel Test Procedures Performedwith a Real-Time Time-Domain EMI Measurement SystemStephan Braun; and Peter Russer, — Institute for High FrequencyEngineering (TU-Munich)Time-domain EMI measurement systems allow for the reducti<strong>on</strong> ofthe measurement time by several orders of magnitude. In this papernovel test procedures for radiated emissi<strong>on</strong> measurements based <strong>on</strong> areal-time time-domain EMI measurement system are presented.Those test procedures take advantage of the parallel calculati<strong>on</strong> of thespectrum at several thousand frequency bins. By a full maximizati<strong>on</strong>procedure, fully automated measurements can be performed. By anenhanced pre- and final scan, a test procedure is presented thatreduces test time by at least <strong>on</strong>e order of magnitude. The proposedtest reduces the critical parameters that have to be selected by theoperator. Measurements have been performed in the frequency range30 MHz to 1 GHz and compared with the results obtained by anEMI receiver. The l<strong>on</strong>g term stability of the emissi<strong>on</strong> of a brushmotor is investigated. A measurement uncertainty analysis is based<strong>on</strong> a reliable statistic of about 200,000 quasipeak values. The standarddeviati<strong>on</strong> as well as the histogram of the probability densityfuncti<strong>on</strong> is calculated and evaluated.SIGNAL INTEGRITY INoise Isolati<strong>on</strong> Modeling and Experimental Validati<strong>on</strong> ofPower Distributi<strong>on</strong> Network in Chip-PackageHyunje<strong>on</strong>g Park; Joungho Kim; and Changwook Yo<strong>on</strong>, — Korea AdvancedInstitute of Science and Technology (KAIST)This paper models a chip and package power distributi<strong>on</strong> network inthe simplified SPICE-level. The model is successfully validated byexperiment using a Vector Network Analyzer. By using the SPICElevelmodel, the noise isolati<strong>on</strong> between the noise current source atthe chip and power distributi<strong>on</strong> network at the package is analyzedfrom 1 MHz to 3 GHz. The c<strong>on</strong>tributi<strong>on</strong> of each part in the powerdistributi<strong>on</strong> network is also analyzed by experiments. The transferimpedances are simulated and measured between the chip and packagepower distributi<strong>on</strong> network varying with the wire-b<strong>on</strong>d and the<strong>on</strong> package decoupling capacitor, case by case.Improvements of Time-Domain Transmissi<strong>on</strong> Waveform inSerpentine Delay Line with Guard TracesGuang-Hwa Shiue; Chia-Ying Chao; Wei-Da Guo; and Ruey-Beei Wu,— Nati<strong>on</strong>al Taiwan UniversityAs the signal frequency goes higher, the crosstalk noise has become themajor signal integrity c<strong>on</strong>cern for the design of various delay lines.Since the guard trace is increasingly adopted to alleviate the mutualcoupling effect in modern highspeed digital systems, this paper qualitativelyinvestigates its effects <strong>on</strong> the time-domain transmissi<strong>on</strong> (TDT)waveform and eye diagram of the serpentine delay line. Based <strong>on</strong>HSPICE simulati<strong>on</strong>, it is dem<strong>on</strong>strated that the utilizati<strong>on</strong> of theguard traces can reduce the original TDT crosstalk level by more than50%, thereby greatly improving the eye opening and jitter. Finally,the time-domain measurement is also performed to validate the proposedanalyses.Multimodal Analysis of Guard TracesPablo Rodriguez-Cepeda; Miquel Ribó; Francisco-Javier Pajares; Joan-Ram<strong>on</strong> Regué; Albert-Miquel Sánchez; and Ant<strong>on</strong>io Pérez, — EnginyeriaLa Salle - Universitat Ram<strong>on</strong> LlullIn this paper a new multimodal model, useful to analyze thebehavior of two signal lines separated by a guard trace, is presented.A multimodal point of view allows a simple interpretati<strong>on</strong> ofthe phenomena involved in the coupling and transmissi<strong>on</strong> of signalspropagating through the three traces. Three guard trace c<strong>on</strong>figurati<strong>on</strong>sare analyzed using the model and measured in order totest the adequacy of the multimodal approach. The results show agood agreement between the measurements and the model, therebyvalidating it.Stripline Simulati<strong>on</strong> Model with Tapered Cross Secti<strong>on</strong> andC<strong>on</strong>ductor Surface ProfileAnt<strong>on</strong>io Ciccomancini, CST of AmericaThis paper investigates the sensitivity of <strong>on</strong> wafer interc<strong>on</strong>nect tothe Si CMOS process parameters. In particular the tapered (trapezoid)etching and the c<strong>on</strong>ductor surface profile (Rrms) of copper foilsare numerically analyzed in order to quantify their effect <strong>on</strong> the electricalperformance of a stripline structure. Line impedance, inserti<strong>on</strong>loss, and time signal attenuati<strong>on</strong> are evaluated by means ofthree dimensi<strong>on</strong>al (3-D) <strong>electromagnetic</strong> (EM) simulati<strong>on</strong>s. TheHammerstad and Jensen analytical model is implemented andresults are compared with those coming from the full 3-D EM simulati<strong>on</strong>model. Good agreement in the frequency range 0 to 50 GHzis observed.An Improved Cavity Model for the Analysis of the VoltageBounce in Power-Bus StructuresGiulio Ant<strong>on</strong>ini, University of L’Aquila; Mauro Lai, Intel Corporati<strong>on</strong>;and Todd Bermensolo, Intel Corporati<strong>on</strong>This paper presents an improved cavity model for the analysis of transientvoltage bounces in power / ground structures. Firstly, accuratemodels from DC to the maximum frequency of interest are adoptedto describe c<strong>on</strong>ductor and dielectric losses; and sec<strong>on</strong>dly, the VectorFitting technique is used to generate a rati<strong>on</strong>al model which is c<strong>on</strong>vertedin a state-space macromodel, well suited for transient analysis.The numerical results dem<strong>on</strong>strate the high efficiency and good accuracyof the proposed method.Power and Signal Integrity and Electromagnetic Emissi<strong>on</strong>:The Balancing Act of Decoupling, Planes and TracksFrank Leferink, Thales NederlandThe noise voltage in the reference or ground of a printed circuitboard is often the cause of unwanted radiated emissi<strong>on</strong>. Powersupply planes attribute to the noise voltage. By replacing thepower supply planes with tracks, the noise voltage in the referenceor ground can be c<strong>on</strong>siderably reduced, which leads to a dramaticreducti<strong>on</strong> of the radiated <strong>electromagnetic</strong> fields. This has beenshown using transmissi<strong>on</strong> line equati<strong>on</strong>s for a general two-c<strong>on</strong>ductorline. Simulati<strong>on</strong> and measurements results c<strong>on</strong>firm the beneficialeffect of removing power planes. A reducti<strong>on</strong> of 50 dB inradiated <strong>electromagnetic</strong> field strength was obtained. The questi<strong>on</strong>was raised whether (or not) the signal integrity is negativelyinfluenced by using power tracks instead of planes. Several printedcircuit boards have been built and measured, showing that signalintegrity remains while reducti<strong>on</strong> of radiated emissi<strong>on</strong> isachieved.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


14EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMcoupling occurs both horiz<strong>on</strong>tally as well as vertically across layers.Thus, to catch SI and PI problems at an early stage of design requiresfast signal and power co-simulati<strong>on</strong> methodologies. In this paper, weoutline the multi-layer finite-difference method and how the accuracyof the technique can be enhanced with models for fringe and gapeffects. We then briefly describe a method for integrating the signaldistributi<strong>on</strong> network with the power distributi<strong>on</strong> network to enableco-simulati<strong>on</strong>. The method is then applied to a mixed signal boardc<strong>on</strong>taining split planes, and numerical results are compared to fullwavesimulati<strong>on</strong>s.N<strong>on</strong>linear Identificati<strong>on</strong> of Complex Systems Using RadialBasis Functi<strong>on</strong> Networks and Model Order Reducti<strong>on</strong>Werner John; Christopher Wiegand; Ljubica Radic-Weissenfeld; ChristianHedayat; and Ulrich Hilleringmann, — Fraunhofer Institute of Reliabilityand Microintegrati<strong>on</strong>, Advanced System Engineering (FhG IZM ASE),Paderborn, GermanyAs wiring density increases with integrati<strong>on</strong> and miniaturizati<strong>on</strong> ofpackages (SIP) and PCB, the ability to simulate precisely the signalintegrity (SI) behaviour of complex systems becomes decisive, whilethe simulati<strong>on</strong> time increases dramatically. Therefore it is essentialthat the design of such complex systems is supported by accuratesimulati<strong>on</strong> models. This paper proposes a methodology for the identificati<strong>on</strong>and the fast simulati<strong>on</strong> of n<strong>on</strong>-linear complex HDI/HDPsystems and integrated circuits by means of radial basis functi<strong>on</strong>(RBF) nets. For this purpose a specific modelling technique is presentedwith a complete flow that leads to the development of a blackbox model (BBM). This approach is then combined with the modelorder reduced (MOR) attempt and allows accelerated simulati<strong>on</strong> of awhole transmissi<strong>on</strong> line-buffer set.Transmissi<strong>on</strong> Line Model for the Gapped Power Bus StructureJoe Trinkle; and Ant<strong>on</strong>io Cant<strong>on</strong>i, — The Universtity of Western AustraliaA transmissi<strong>on</strong> line model is developed for the computati<strong>on</strong> of thetransfer impedance between gapped supply z<strong>on</strong>es. The model isshown to be accurate to high frequencies by validati<strong>on</strong> with full wavesimulati<strong>on</strong>.Fast Macromodel-based Signal Integrity Assessment for RFand Mixed-Signal ModulesPietro Brenner, Infine<strong>on</strong> Technologies AG, Germany; Flavio Canavero,Politecnico di Torino; and Stefano Grivet-Talocia, Politecnico di TorinoThis paper presents a macromodel-based approach for fast signalintegrity assessment for highly integrated Radio Frequency (RF) andMixed-Signal System <strong>on</strong> Chip (SoC) applicati<strong>on</strong>s. In particular, weintroduce a complexity reducti<strong>on</strong> process that enables the signalintegrity verificati<strong>on</strong> via analog circuit simulati<strong>on</strong>s, and we apply themethodology to complex radio transceiver chips in order to characterizethe influence of parasitic elements <strong>on</strong> the signal processing performanceof the system. Some preliminary tests show that the proposedmethodology leads to significant simulati<strong>on</strong> speed-up factorswith respect to standard approaches for the specific applicati<strong>on</strong> herewithc<strong>on</strong>sidered.Determinati<strong>on</strong> of Propagati<strong>on</strong> of Fast Induced TransientImpulses <strong>on</strong> PCB-LevelWerner John; and Mohamed Taki, — Fraunhofer Institute of Reliabilityand Microintegrati<strong>on</strong>, Advanced System Engineering (FhG IZM ASE),Paderborn, GermanyIn this c<strong>on</strong>tributi<strong>on</strong>, an extended approach to determine the flow ofinduced transient noise injected into a system of interc<strong>on</strong>nects will bepresented. It is now possible to create subcircuits for detailed analysisand use more than <strong>on</strong>e noise source. Dominant and critical signaltraces that transfer significant noise, form multiple noise sources thatcouple with digital device input ports and are determined in the frequencydomain using advanced graph searching algorithms. Thetime domain simulati<strong>on</strong> of the whole signal paths, including devicedrivers and receivers, is performed using a hybrid analysis in HSpiceenvir<strong>on</strong>ment. The approach is applied to an interc<strong>on</strong>nect systemdriven by two sensitive inverter gates. The scattering parameters andthe waveform of the propagating impulses c<strong>on</strong>sidering dominant signalpaths show good agreement with the total system resp<strong>on</strong>se.SPECIAL SESSION: POWER INTEGRITY / SIGNAL INTEGRITYFOR NEXT GENERATION SYSTEMSBroadband Noise Suppressi<strong>on</strong> Using a Hybrid Phot<strong>on</strong>icCrystal Power/Ground Plane SubstrateTz<strong>on</strong>g-Lin Wu, Nati<strong>on</strong>al Taiwan University; Yi-Che Chen, Nati<strong>on</strong>alTaiwan University; Ting-Kuang Wang, Nati<strong>on</strong>al Taiwan University; AlexLu, N/A; and Lexus Lan, N/AA novel hybrid phot<strong>on</strong>ic crystal power/ground layer (H-PCPL) c<strong>on</strong>ceptis proposed with broadband power noise isolati<strong>on</strong> (or suppressi<strong>on</strong>)performance. Two different hybrid approaches are investigated;<strong>on</strong>e is fixed radius but varied pitch for the high-DK disc, and theother <strong>on</strong>e is varied radius and pitch for the disc. It is found the firstapproach can enhance the bandwidth of the noise rejecti<strong>on</strong> but cannot obtain a c<strong>on</strong>tinuous and wide stopband because there is anabsolute passband between two gaps. However, the sec<strong>on</strong>d approachcan obtain a c<strong>on</strong>tinuous and wide stopband by mixing two radius ofthe disc. Gap map of the phot<strong>on</strong>ic crystal lattice is employed to synthesizethe stopband profile in both approaches. As an example, awide stopband ranging from 2.8 GHz to 7.9 GHz can be achievedbased <strong>on</strong> two kinds of radius, 2 mm and 1.45 mm, under the samedisc pitch 10 mm, the effective series inductance of the capacitors.Load Current Funneling Examinati<strong>on</strong> for Power Distributi<strong>on</strong>in High Performance Multi-core Silic<strong>on</strong> DevicesJoseph T. DiBene, II, Intel Corporati<strong>on</strong>Powering silic<strong>on</strong> devices today are challenging due to the increasing c<strong>on</strong>centrati<strong>on</strong>of current into the load at the silic<strong>on</strong>. As multi-core processingbecomes more available, larger numbers of computati<strong>on</strong>al units areplaced <strong>on</strong> a single piece of silic<strong>on</strong> allowing more processing and higherbandwidth in our computer systems. However, as the devices becomesmaller, the current density also increases which raises some fundamentalquesti<strong>on</strong>s <strong>on</strong> the impacts at the interc<strong>on</strong>nect level and the performance ofthe power distributi<strong>on</strong> network in general. This paper discusses the issueof current funneling into high density devices particularly around theadvent of multi-core processing and discusses some of the issues andeffects <strong>on</strong>e may see as the technology moves forward into the future.Power Delivery for High Performance Processor Packages,Part IDavid Hockans<strong>on</strong>, Sun Microsystems, Inc.; and Joseph T.Dibene II, IntelCorporati<strong>on</strong>The c<strong>on</strong>tinued reducti<strong>on</strong> in processor core voltage, increases in currentrequired, and chip density and size place more pressure <strong>on</strong> effectivelyc<strong>on</strong>trolling the impedance of a CPU power distributi<strong>on</strong> system.Voltage fluctuati<strong>on</strong>s across the die limit functi<strong>on</strong>ality andspeed. The core-power path from the die to the voltage regulator isdiscussed herein. The path is separated into segments, and a <strong>on</strong>edimensi<strong>on</strong>alcircuit model is created to aid in the discussi<strong>on</strong>.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM15Multi-Gigabit I/O Link Circuit Design Challenges andTechniquesJoe Wu, Intel Corporati<strong>on</strong>; and Joseph T. DiBene, II, Intel Corporati<strong>on</strong>This paper describes the major challenges in designing multi-Gigabit I/O link CMOS circuits. Techniques to overcome thechallenges are presented, including transceiver design, discrete andc<strong>on</strong>tinuous time equalizati<strong>on</strong>, terminati<strong>on</strong> c<strong>on</strong>trol, and clockingcircuits.Get Ready For TheNext WaveIn EMI ReceiversIntegrated Circuit Architecture Impacts <strong>on</strong> Applicati<strong>on</strong>Signal IntegrityRoss Carlt<strong>on</strong>, FreescaleIncreasing operati<strong>on</strong>al and data frequencies of integrated circuitsis making system design more costly and challenging as designerscope with signal integrity impacts. An understanding of thearchitecture and design of integrated circuit input/output circuitsand packaging technology can prevent undesired performancedegradati<strong>on</strong> and maximize reliability. This presentati<strong>on</strong> will discussa few of the aspects of IC and package design that impact signalintegrity.Early Time Charge Replenishment of the Power DeliveryNetwork in Multi-Layer PCBsGiuseppe Selli, University of Missouri-Rolla; Matteo Cocchini, University ofMissouri-Rolla; James Knighten, NCR Corporati<strong>on</strong>; Bruce Archambeault,IBM Corporati<strong>on</strong>; Jun Fan, NCR Corporati<strong>on</strong>; Samuel C<strong>on</strong>nor, IBMCorporati<strong>on</strong>; Ant<strong>on</strong>io Orlandi, University of L'Aquila; and JamesDrewniak, University of Missouri-RollaThe investigati<strong>on</strong> of decoupling issues has been extensively treated inthe literature in both the frequency and the time domain. The twodomains describe from different perspectives the same physical phenomen<strong>on</strong>,being related by a Fourier transform. In this paper, wellknown decoupling issues usually addressed in the frequency domainare discussed in the time domain. Moreover, some modeling issuesrelated to the cavity model approach are discussed and, in particular,the circuit extracti<strong>on</strong> feature associated with this methodology is utilizedthroughout the paper to carry out the time domain simulati<strong>on</strong>swithin a SPICE based tool. The depleti<strong>on</strong> of charges stored betweenthe power bus is investigated in the time domain as a functi<strong>on</strong> of theplane thickness, SMT decoupling closeness, and interc<strong>on</strong>nect inductancevalues.SPECIAL SESSION: ELECTRONIC PACKAGING EMC ANDSIGNAL INTEGRITYNoise Isolati<strong>on</strong> in LTCC-based X/Ku-band Transceiver SiPUsing a Double-Stacked Electromagnetic Bandgap StructureJ<strong>on</strong>gbae Park, Korea Advanced Institute of Science and Technology (KAIST);Junchul Kim, N/A; Albert Chee W. Lu, N/A; Yuje<strong>on</strong>g Shim, KAIST; andJoungho Kim, KAISTWe experimentally investigate the isolati<strong>on</strong> effect of the noisecoupling in an X/Ku-band transceiver SiP fabricated <strong>on</strong> a lowtemperatureco-fired-ceramic (LTCC) multilayer substrate, usinga double-stacked <strong>electromagnetic</strong> bandgap (DS-EBG) structure.The fabricated transceiver SiP is composed of a Ku-band transmitterand X/Ku-band receiver. To prevent the simultaneousswitching noise coupling from digital circuits, a DS-EBG structurewas designed and implemented to the transceiver SiP. Theeffect of the DS-EBG, which gives a 30 dB stopband over X/Kubandranges, was dem<strong>on</strong>strated through frequency and timedomain measurements.The CER2018 Compliant Emissi<strong>on</strong>s Receiveris here. And in many ways it’s unlike any receiver thatcame before it.This complete EMI test soluti<strong>on</strong> offers c<strong>on</strong>tinuouscoverage from 20 Hz to 18 GHz with expandability to110 GHz. And to ensure the highest accuracy, itself-calibrates <strong>on</strong>-demand at every frequency scan.It includes a built-in computer that operates underWindows XP. Software is also included free al<strong>on</strong>g with a19” flat screen m<strong>on</strong>itor, keyboard and mouse.Programmed-in test formats include CISPR 16-1-1,MIL-STD 461/462, ANSI C63 and FCC. Allfuncti<strong>on</strong>s are menu-driven. There is no need to fiddlewith switches, butt<strong>on</strong>s or sliders.Like all AR products, the CER2018 is backed by thebest and most comprehensive warranty in the business.AR is here to help you – today, tomorrow and always.To learn more, visit us at www.ar-worldwide.comor for technical support: call 800-964-1424 (within U.S.)or 818-700-0330.receiver systemsOther ar divisi<strong>on</strong>s: rf/microwave instrumentati<strong>on</strong> • modular rf • ar europeCopyright© <str<strong>on</strong>g>2007</str<strong>on</strong>g> AR. The orange stripe <strong>on</strong> AR products is Reg. U.S. Pat. & TM. Off.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


16EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMDesign of UWB Transceiver SiP for Short RangeCommunicati<strong>on</strong>Changwook Yo<strong>on</strong>, Korea Advanced Institute of Science and Technology(KAIST); Hyunje<strong>on</strong>g Park, KAIST; Junwoo Lee, Hynix Semic<strong>on</strong>ductor Inc.;Youngjin Park, Korea Electrotechnology Research Institute; and JounghoKim, KAISTSince a UWB system uses a wide frequency range from 3.1 GHz to5.1 GHz, package parasitic effects have been a hot issue which affectssystem malfuncti<strong>on</strong>. To prevent such malfuncti<strong>on</strong>s, SiP technologyis adjusted c<strong>on</strong>sidering not <strong>on</strong>ly a circuit performance but variousdesign issues in a package from viewpoints of signal integrity andpower integrity. Furthermore, a UWB band-pass filter is embeddedinto a package to reduce the complexity of a transmitter circuit andthe power c<strong>on</strong>sumpti<strong>on</strong>. Designed UWB SiP performance is verifiedby the measurement in time domain.A Systematic Semi-Numerical Approach for Modeling ofSignal and Power Integrity of Electr<strong>on</strong>ic PackagesEn-xiao Liu, Institute of High Performance Computing, Nati<strong>on</strong>alUniversity of Singapore; Yao Jiang Zhang, EMC Laboratory, University ofMissouri-Rolla; and Erping Li, Institute of High Performance Computing,Nati<strong>on</strong>al University of SingaporeA novel method for system-level modeling of advanced electr<strong>on</strong>ic packagesis presented which is able to provide fast yet accurate simulati<strong>on</strong> forsignal and power integrity analysis of the multilayered electr<strong>on</strong>ic packages.The method is a semi-numerical approach based <strong>on</strong> the combinati<strong>on</strong>of the moment method and the scattering matrix method.Modeling and Verificati<strong>on</strong> to Analyze the Effect of Power/Ground Noises <strong>on</strong> a CMOS Feedback Operati<strong>on</strong>al AmplifierYuje<strong>on</strong>g Shim; J<strong>on</strong>gbae Park; and J<strong>on</strong>gjoo Shim, — Korea AdvancedInstitute of Science and Technology (KAIST)The operati<strong>on</strong>al amplifier is <strong>on</strong>e of the most important circuits tocompose ADCs, DACs and active filters. Now, there are many papersto analyze the noise characters of op amps. Most studies are to analyzeeffects of input signal noises which flow into circuits. However,an analysis of power/ground noises becomes important because thereare power integrity issues <strong>on</strong> System in Package (SiPs) as the operatingclock speed increases. Additi<strong>on</strong>ally, the magnitude and phase ofdigital noises flowing into circuits are not the same as generated noisesfrom digital chips. For these reas<strong>on</strong>s, in this paper, we analyze themechanism of power/ground noises flowing into the op amp andeffects of the noises <strong>on</strong> the op amp as chip-package PDN co-modelingand circuit modeling are proposed. Furthermore, the models areverified by experimental measurement.Modeling of Signal and Power Integrity in System <strong>on</strong>Package Applicati<strong>on</strong>sArif Engin; and Madhavan Swaminathan, — Georgia Institute ofTechnologyWe present a method for fast analysis of signal and power integrity insystem-<strong>on</strong>-package applicati<strong>on</strong>s based <strong>on</strong> a recently developed, multilayered,finite-difference method (MFDM). First we present a rapidsolver that can be used to extract materials properties of dielectrics.The extracted frequency-dependent dielectric c<strong>on</strong>stant and loss tangentcan then be used in any field simulator for improved accuracy.Then we present MFDM for simulati<strong>on</strong>s of system-<strong>on</strong>-package applicati<strong>on</strong>s.In order to accurately model multilayered planar structures,which are three dimensi<strong>on</strong>al, MFDM combines two-dimensi<strong>on</strong>almodels for power/ground planes using a multilayered unit cellapproach. In this way, noise coupling can be c<strong>on</strong>sidered not <strong>on</strong>ly inthe transversal directi<strong>on</strong> between two planes, but also vertically from<strong>on</strong>e plane pair to another through the apertures and via holes. For aco-simulati<strong>on</strong> of signal and power integrity, transmissi<strong>on</strong> line modelsalso need to be included. The interacti<strong>on</strong> between the signaltransmissi<strong>on</strong> and power distributi<strong>on</strong> modes is taken into accountusing a modal decompositi<strong>on</strong> technique. An equivalent circuitmodel becomes available based <strong>on</strong> this finite-difference approximati<strong>on</strong>as well. Based <strong>on</strong> this network representati<strong>on</strong>, sec<strong>on</strong>d ordereffects such as fringe and gap fields can be included in MFDM usingequivalent circuit models for these fields. This results in a very accuratemethod that can be used for fast analysis of signal and powerintegrity in arbitrary package and board designs having any stack-upc<strong>on</strong>figurati<strong>on</strong> and number of layers.Accurate Characterizati<strong>on</strong> of Package and Board Comp<strong>on</strong>entsfor Efficient System Level Signal Integrity AnalysisIvan Ndip, Fraunhofer IZM Berlin; Stephan Guttowski, N/A; and HerbertReichl, N/AIn order to prevent or minimize signal integrity (SI) and <strong>electromagnetic</strong><strong>compatibility</strong> (EMC) problems in high-speed microelectr<strong>on</strong>icsystems, efficient system-level analyses must be carried out at thepre-layout stage, so as to develop reliable design measures. For theseanalyses, an accurate characterizati<strong>on</strong> of package and board comp<strong>on</strong>entsis required to extract realistic circuit models within the frequencyrange of interest. In this c<strong>on</strong>tributi<strong>on</strong>, novel techniques forthe extracti<strong>on</strong> of such models are presented.SPECIAL SESSION: INDUSTRY STANDARD CABLES ANDSHIELDING PERFORMANCEThe Shielding Performance of Industry Standard CableAssembliesDana Bergey; and Nathan Altland, — FCIShielded cables are a comm<strong>on</strong> comp<strong>on</strong>ent in today’s standard electr<strong>on</strong>icsystems that transmit high-speed video and data. However, industrystandard cables d<strong>on</strong>’t necessarily exhibit standard shielding performance.This paper is a survey of the shielding performance actually measured<strong>on</strong> commercially available cable assemblies. When significant differencesin performance were discovered, autopsies were performed inorder to determine, where possible, the cause of the difference.Cable Shielding Test MethodsJoachim Mueller, W. L. Gore & Associates GmbHThis paper presents a comparis<strong>on</strong> between different cable shieldingtest methods. Examples of cable shielding measurements using thewire injecti<strong>on</strong> and absorbing clamp method will compare both methods.The limitati<strong>on</strong> of simple methods like the close field probe willbe illustrated. For frequencies from 1 to 18 GHz, the reverberati<strong>on</strong>chamber is applied to characterize cable shields. It will be shownhow the combinati<strong>on</strong> of the Wire Injecti<strong>on</strong> method with a reverberati<strong>on</strong>chamber can provide a seamless cable shielding characterizati<strong>on</strong>from DC to 18 GHz. Finally, a correlati<strong>on</strong> between the reverberati<strong>on</strong>chamber results with far field measurements in an anechoic chamberwill illustrate the correlati<strong>on</strong> of the presented measurement methodsto radiated emissi<strong>on</strong> testing.Predictive Modeling of the Effects of Skew and Imbalance<strong>on</strong> Radiated EMI from CablesJue Chen, University of Missouri-RollaThis paper provides an approach for predicting the effects of skew and©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 17imbalance <strong>on</strong> radiated emissi<strong>on</strong> of cables inside a commercial 19-inchrack-based cabinet. Scattering parameters (S-parameters) for two setsof cable assembly are measured with a four-port vector network analyzer(VNA) and c<strong>on</strong>verted into mixed mode S-parameters. Timedomaininput signals with different slew rates and different amountof skew are transferred into frequency-domain using fast Fouriertransform (FFT). The spectra of radiati<strong>on</strong> emissi<strong>on</strong> associated withdifferent inputs are then estimated.EMI Emissi<strong>on</strong>s from Mismatches in High Speed DifferentialSignal Traces and CablesBruce Archambeault; Jay Diepenbrock; and Sam C<strong>on</strong>nor, — IBMCorporati<strong>on</strong>The use of so-called differential signaling for high speed signals hasbecome very comm<strong>on</strong> in today’s high speed system designs. While thissignal strategy allows better data quality and signal integrity, there aresome significant EMC and signal integrity issues that are not readilyapparent. This paper dem<strong>on</strong>strates that a significant amount of comm<strong>on</strong>-modecurrent can be created when the two legs of the differentialsignal are skewed in time, or if the rise and fall times of the signals differ.These comm<strong>on</strong> mode currents can impact the EMC performance,causing significant levels of emissi<strong>on</strong>s unless careful design c<strong>on</strong>siderati<strong>on</strong>is given to shielding and comm<strong>on</strong>-mode (ground) current return.EMI Design of Shielded Cable AssembliesJim Nadolny, SamtecMost discussi<strong>on</strong>s <strong>on</strong> shielding for EMC address the shielding of enclosuresand give rules of thumb regarding the size of slots and holes.These recommendati<strong>on</strong>s are not applicable in general to the design ofshielded cable assemblies. Because there exists a gap in publishedinformati<strong>on</strong> <strong>on</strong> the unique shielding requirements for cable assemblies,this document was generated. The scope of this document isthat it will apply to low cost, shielded multic<strong>on</strong>ductor, cable assemblies.While some of this informati<strong>on</strong> will be applicable to coaxial RFcable assemblies, this is not the main focus of this document.EMC MEASUREMENTS IIAnalysis of Radiated Emissi<strong>on</strong>s and Shielding Effectivenessfor a Metallic Enclosure with Shielding SpringsGiulio Ant<strong>on</strong>ini, University of L’Aquila; Ant<strong>on</strong>io Orlandi, University ofL’Aquila; and Ant<strong>on</strong>io Ciccomancini, CST of AmericaThe high speed digital processing in modern electr<strong>on</strong>ic products hasmade more difficult the achievement of c<strong>on</strong>formity about limits emissi<strong>on</strong>s.To verify the requirements of standards <strong>on</strong> these emissi<strong>on</strong>s theuse of a metallic enclosure is often necessary; in this way the powerradiated by the system is reduced. In this paper the radiated emissi<strong>on</strong>sand the shielding performance of a metallic rack with shielding springsare studied both by dedicated experiments and by simulati<strong>on</strong>s. Aninternal source represented by a loaded m<strong>on</strong>opole antenna is used toinvestigate the radiated emissi<strong>on</strong>s 3 meters from the box. A simplifiedmodel of the antenna source is proposed in the numerical model and agood agreement over a frequency range up to 1 GHz is achievedbetween measured results and simulated results. Shielding effectivenessis finally evaluated by means of two different kinds of sources: 1)near field (internal source) and 2) far field (plane wave source).Logistic Regressi<strong>on</strong> in Immunity TestingGiorgio Giunta; and Bruno Aud<strong>on</strong>e, — Oerlik<strong>on</strong> C<strong>on</strong>travesLogistic Regressi<strong>on</strong>, a statistical analysis tool used for epidemiologicalstudies, can be successfully exploited to interpret susceptibilitytest results with the twofold aim of understanding which are themost significant causes affecting the Device under Test (DUT) and ofproviding a technique to define a global figure of safety margin whenmany test parameters are involved. The background of LogisticRegressi<strong>on</strong> is briefly summarized and then a graphical interpretati<strong>on</strong>of test results is provided. Finally, the experimental validati<strong>on</strong> of themethod is described.The Proposal of a New Approach to Immunity TestingMichela Aud<strong>on</strong>e, Centro Ricerche Fiat; and Bruno Aud<strong>on</strong>e, Oerlik<strong>on</strong>C<strong>on</strong>travesThe need of performing immunity tests with the aim of meeting therequirements of Functi<strong>on</strong>al Safety is addressed proposing severalapproaches based up<strong>on</strong> the data processing of test results. This representsa clear improvement with respect to the present situati<strong>on</strong> ofEMC standards based up<strong>on</strong> simple qualitative checks, which do notoffer any warranty of safety. Even if the equipment under test (EUT)is declared immune in normal operative c<strong>on</strong>diti<strong>on</strong>s, it may happenthat a simple envir<strong>on</strong>mental effect such as temperature variati<strong>on</strong> hascatastrophic c<strong>on</strong>sequences. The test results of radiated immunitytests performed <strong>on</strong> a DC/DC c<strong>on</strong>verter are processed according to theAnova model, which is <strong>on</strong>e of the proposed approaches.REVERBERATION CHAMBER MEASUREMENTS IReverberati<strong>on</strong> Chamber Calibrati<strong>on</strong>: Differences in ResultsWhen Using a Slot Instead of a Dipole AntennaTobias Aurand; John Daws<strong>on</strong>; Andrew Marvin; and Martin Robins<strong>on</strong>, —University of YorkThis paper c<strong>on</strong>siders the use of a slot antenna in the calibrati<strong>on</strong> of areverberati<strong>on</strong> chamber. In using a slot antenna the need for a balunis reduced which simplifies antenna c<strong>on</strong>structi<strong>on</strong>. The behaviour ofa slot antenna is compared to a dipole antenna and it is found that thefield uniformity results obtained with a slot are more pessimisticthan the <strong>on</strong>es with a dipole. Whilst the slot is usable for calibrati<strong>on</strong>of a reverberati<strong>on</strong> chamber, it seems that the slot is more sensitive tosome field n<strong>on</strong>uniformities than the dipole.Pulsed Power 3 GHz Feasibility Study for a 36.7 m3 ModeStirred Reverberati<strong>on</strong> ChamberOlof Lunden, FOI; and Mats Bäckström, Saab Communicati<strong>on</strong>A feasibility study was c<strong>on</strong>ducted to investigate the field build upprocess in a 36.7 m3 reverberati<strong>on</strong> chamber. The time to get a steadyfield state in the unloaded chamber will normally be about 10 to 20µs. However, it is of great interest to investigate what field levels canbe expected for an ordinary radar source. The particular 700 kW S-band radar we have at our disposal has a typical pulse durati<strong>on</strong> of 1µs. A maximum field strength of approximately 35 kV/m wasachieved for 309 kW of input power. The voltage ratio, VR, betweenthe ensemble maxima, with a chamber time c<strong>on</strong>stant equal to about10 µs and the magnetr<strong>on</strong> pulse of <strong>on</strong>ly 1 µs, was found to be 0.54 or-5.4 dB. The pulse characteristics have also been investigated whenloading the chamber according to the aviati<strong>on</strong> test standard RTCADO-160.Enhanced Backscatter in a Reverberati<strong>on</strong> Chamber: Inside EveryComplex Problem is a Simple Soluti<strong>on</strong> Struggling to Get OutJohn Ladbury; and David Hill, — Nati<strong>on</strong>al Institute of Standards andTechnology (NIST)We encountered problems when we attempted to model the behaviorof a transmitting antenna in a reverberati<strong>on</strong> chamber. Our model©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


18EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMpredicted the general statistical distributi<strong>on</strong> of the complex reflecti<strong>on</strong>coefficient S11 of a test port c<strong>on</strong>nected to a transmitting antenna, but<strong>on</strong>e measure of the variati<strong>on</strong> was off by a factor of two. We eventuallytraced the increased variability to enhanced backscatter, in whichreflecti<strong>on</strong>s back in the directi<strong>on</strong> of the source antenna tend to be largerthan reflecti<strong>on</strong>s in any other directi<strong>on</strong>. Enhanced backscatter is aphenomen<strong>on</strong> generally associated with remote sensing, especiallyrelated to random media. We give general explanati<strong>on</strong>s of this effectbased <strong>on</strong> a simple ray-optics model.New Hybrid Mode-stirring Technique for Shielding EffectivenessMeasurement of Enclosures Using Reverberati<strong>on</strong> ChambersSandra Greco; and Maria Sabrina Sarto, — University of Rome “LaSapienza”This paper presents a new method for the measurement of the shieldingeffectiveness of “small” enclosures. The technique implements ahybrid mode-stirring technique <strong>on</strong> nested reverberati<strong>on</strong> chambers.The mismatching of the antenna radiating inside the enclosure undertest is taken into account.Sensitivity Analysis of a Reverberati<strong>on</strong> Chamber WithRespect to Tuner SpeedsVignesh Rajamani; Charles Bunting; and James West, — Oklahoma StateUniversityThe energy distributi<strong>on</strong> am<strong>on</strong>g the modes in an overmoded reverberati<strong>on</strong>chamber operating at a particular frequency is studied forvarying tuner speeds. The understanding of this spread is importantin quantifying upsets of equipment in the chamber. The spectralcharacterizati<strong>on</strong> of a time varying <strong>electromagnetic</strong> field is d<strong>on</strong>e usingthe averaged periodogram approach. The complex inserti<strong>on</strong> loss S21is the measured quantity and an estimati<strong>on</strong> of the power inserti<strong>on</strong>loss that will be used in the determinati<strong>on</strong> of Q factor, is obtainedfrom the sampling data for varying angular positi<strong>on</strong>s of the tuner.The same procedure is followed for varying tuner speeds and the Q isreported. The autocovariance for this random process can be foundby taking a Fourier transform of the spectral density functi<strong>on</strong>. Theautocovariance functi<strong>on</strong> helps in determining the number of independentsamples of the field. The field experienced by an EUT in theusable volume due to a c<strong>on</strong>tinuous rotati<strong>on</strong> of the tuner is analyzed.Evaluati<strong>on</strong> of Test Reproducibility of Calibrati<strong>on</strong> inReverberati<strong>on</strong> ChamberJinliang He; R<strong>on</strong>g Zeng; Shuiming Chen; and Bo Zhang, —Electromagnetic Envir<strong>on</strong>ment Research Group; Fan Wu, High Frequency &Microwave Divisi<strong>on</strong>; and Zhiy<strong>on</strong>g Yuan, Electromagnetic Envir<strong>on</strong>mentResearch GroupThe positi<strong>on</strong> of the transmit antenna is analyzed and evaluated accordingto the measurement data in our developed reverberati<strong>on</strong> chamber.The calibrati<strong>on</strong> parameters of the reverberati<strong>on</strong> chamber are also evaluatedfor different working volumes. The key parameters such as theaverage normalized electric field and the receive antenna calibrati<strong>on</strong>factor are analyzed in detail. It is indicated that the definiti<strong>on</strong> of theworking volume and the different positi<strong>on</strong> of the transmit antenna hasa little influence <strong>on</strong> the test reproducibility of calibrati<strong>on</strong>s.REVERBERATION CHAMBER MEASUREMENTS IIAn Investigati<strong>on</strong> of the Shielding Performance of PCB-levelEnclosures using a Reverberati<strong>on</strong> ChamberYuhui He; and Andrew Marvin, — University of YorkPCB-level shielding enclosures differ from the other shielding productsin several aspects due to their small volume and therefore posenew challenges to the evaluati<strong>on</strong> of performance. This paperdescribes several possible approaches and issues about using a reverberati<strong>on</strong>chamber to accomplish a fast and reliable measurement.The interacti<strong>on</strong> between the internal source and the enclosure is alsoinvestigated. In additi<strong>on</strong>, the performance of the enclosure in isolatingnear-field interference in a high-Q envir<strong>on</strong>ment, which is generalin practical applicati<strong>on</strong>s, is compared with the measurement resultfrom the proposed reverberati<strong>on</strong> chamber method. An approach isalso introduced to indicate the impact of changing envir<strong>on</strong>ment tothe near-field coupling.In-situ High Field Strength Testing Using a TransportableReverberati<strong>on</strong> ChamberFrank Leferink, Thales NederlandA reverberati<strong>on</strong> chamber can create a very high field strength withmoderate input power. Existing chambers are making use of a paddlewheel to change the res<strong>on</strong>ant modes in the chamber. In the caseof a stepper motor, the field is stable for some time, and this type ofreverberati<strong>on</strong> chamber is called a mode tuned reverberati<strong>on</strong> chamber.If the paddle wheel is c<strong>on</strong>tinuously rotating we call it a mode stirredreverberati<strong>on</strong> chamber. The mode stirred is much faster in measuringthan the mode tuned, but for some applicati<strong>on</strong>s where theequipment under test has a l<strong>on</strong>g dwell time the mode tuned is preferred.A transportable reverberati<strong>on</strong> chamber with varying anglesbetween wall, floor and ceiling and with vibrating walls has beenused for in-situ testing of a large radar antenna system. Inside thisVibrating Intrinsic Reverberati<strong>on</strong> Chamber (VIRC) a diffuse, statisticallyuniform, <strong>electromagnetic</strong> field is created without the use of amechanical, rotating, mode stirrer. This chamber results in a betterhomogeneity and increased field strength compared to c<strong>on</strong>venti<strong>on</strong>almode stirred reverberati<strong>on</strong> chambers. But the VIRC has a disadvantagebecause it cannot be used for mode tuning. In this paper, aTuneable Intrinsic Reverberati<strong>on</strong> Chamber (TIRC) is presented. Thechamber is still made of flexible material and thus transportable, butthe modes are changed using either a paddle wheel or by moving thewalls in small incremental stepsComparis<strong>on</strong> of Different Definiti<strong>on</strong>s of Field Strength Usedin Reverberati<strong>on</strong> Chamber StandardsLuk Arnaut, Nati<strong>on</strong>al Physical Laboratory; Hans Georg Krauthaueser,Otto-v<strong>on</strong>-Guericke-Universitaet Magdeburg; and Magnus Hoeijer, FOISwedish Defence Research AgencyIn different standards involving reverberati<strong>on</strong> chambers, the fieldstrength is defined either using the vector magnitude (total) electricfield, or the magnitude of a Cartesian (rectilinear) comp<strong>on</strong>ent. Wecompare these methods for determining the maximum field strength.The ratio of the maximum of the total field to the maximum of aCartesian comp<strong>on</strong>ent is a random variable whose probability distributi<strong>on</strong>and statistics are derived and investigated. The mean value of thisratio is compared with the ratio of the respective mean values. Its standarddeviati<strong>on</strong> enables the estimati<strong>on</strong> of c<strong>on</strong>fidence levels when comparingor c<strong>on</strong>verting between single measurements of the maximumtotal and maximum rectangular field. Theoretical results are comparedwith measured results obtained in different reverberati<strong>on</strong> chambers.How to Avoid Unstirred High Frequency Comp<strong>on</strong>ents inMode Stirred Reverberati<strong>on</strong> ChambersOlof Lunden, FOI; and Mats Bäckström, Saab Communicati<strong>on</strong>sA goodness of fit test of the assumed Chi- Squared distributi<strong>on</strong>, ofthe power received by an antenna in a reverberati<strong>on</strong> chamber, is a very©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 19efficient way to reveal the presence of unstirred comp<strong>on</strong>ents at frequenciesabove the lowest usable frequency. To reduce the risk ofhaving an unstirred comp<strong>on</strong>ent, in RS-testing, the transmittingantenna has to be directed towards the stirrer. The distance betweenthe transmitting antenna and the stirrer has to be so close that themain lobe of the antenna is enclosed by the geometry of the stirrer.In RE testing this will hold also for the reference antenna. Unstirredcomp<strong>on</strong>ents are not possible to reveal and correct for in RS- and REtesting,which might lead to err<strong>on</strong>eous testing.Measuring Shielding Effectiveness of SmallEnclosures/Cavities with a Reverberati<strong>on</strong> ChamberChris Holloway, Nati<strong>on</strong>al Institute of Standards and Technology (NIST)For various applicati<strong>on</strong>s, there is a growing need to determine theshielding effectiveness of physically small (but electrically large)enclosures or cavities. This paper presents a reverberati<strong>on</strong> chambertechnique for measuring the SE of such enclosures. Data is presentedfrom four different reverberati<strong>on</strong> chamber approaches obtainedfrom various enclosure c<strong>on</strong>figurati<strong>on</strong>s. These four different sets ofmeasurements are used to validate the proposed approach.TEM CELL MEASUREMENTSA Field Uniformity Study of a TEM Cell by Using a ShortWire ScattererTakehiro Morioka, Nati<strong>on</strong>al Institute of Advanced Industrial Science andTechnology (AIST); Robert Johnk, Nati<strong>on</strong>al Institute of Standard andTechnology; and David Novotny, Nati<strong>on</strong>al Institute of Standard andTechnologyTEM cells are widely used for EMC/EMI measurements. However,the electric field strength <strong>on</strong>ly at the center point of the cell is roughlyestimated. By introducing a passive scatterer into the cell, such asa straight wire, the echo fields can be detected by the deviati<strong>on</strong> of thereflecti<strong>on</strong> coefficient from that of the empty cell. This deviati<strong>on</strong> isrelated to the incident electric field at the locati<strong>on</strong> of the scatterer. Inthis paper, the electric field uniformity of a TEM cell for the dominantand orthog<strong>on</strong>al polarizati<strong>on</strong>s is investigated by measurement.New Test Method for the Pulse Immunity of Microc<strong>on</strong>trollersThomas Steinecke, Infine<strong>on</strong> Technologies AGThis paper presents a new test method for pulse susceptibility ofmicroc<strong>on</strong>trollers which reflects the <strong>electromagnetic</strong> envir<strong>on</strong>ment ofmicroc<strong>on</strong>trollers in practical applicati<strong>on</strong>s. The method includes a setof <strong>electromagnetic</strong> interference pulses and their injecti<strong>on</strong> networks.The waveforms of the pulses are deduced from measurements <strong>on</strong> realapplicati<strong>on</strong> boards of microc<strong>on</strong>trollers.Mode Suppressed TEM Cell Design For High Frequency ICMeasurementsShaowei Deng, University of Missouri-Rolla; David Pommerenke,University of Missouri-Rolla; Todd Hubing, Clems<strong>on</strong> University; JamesDrewniak, University of Missouri-Rolla; Daryl Beetner, University ofMissouri-Rolla; Sungnam Kim, LG Electr<strong>on</strong>ics; D<strong>on</strong>gshik Shin, LGElectr<strong>on</strong>ics; and Hocheol Kwak, LG Electr<strong>on</strong>icsTEM cells or GTEM cells can be used to evaluate the radiated emissi<strong>on</strong>sof integrated circuits (ICs). The applicable frequency bandwidthof a TEM cell is limited due to the res<strong>on</strong>ances of higher order modes.This paper describes how a TEM cell can be modified to extend thefrequency range without changing the test topology. Several methodsare proposed and implemented to suppress the higher order modes.The magnetic field coupling and electric field coupling are evaluatedfor the new design. The frequency bandwidth of the modified TEMcell is extended from the original 1 GHz to 2.5 GHz.Evaluati<strong>on</strong> of Electromagnetic Interference Between a UWBSystem and a Wireless LAN Using a GTEM CellMasashi Yamada, Musashi Institute of Technology; Kaoru Gotoh, Nati<strong>on</strong>alInstitute of Informati<strong>on</strong> and Communicati<strong>on</strong>s Technology (NICT); ShinobuIshigami, NICT; Yasushi Matsumoto, NICT; and Masamitsu Tokuda,Musashi Institute of TechnologyIn this paper we propose a method of evaluating interference betweenthe UWB and the wireless LAN by using the GTEM cell that cantest the receiver with the built-in type of antenna. We show that theGTEM cell can be used in the frequency band of DS-UWB by theevaluati<strong>on</strong> of the frequency resp<strong>on</strong>se. The interference evaluati<strong>on</strong> wasc<strong>on</strong>ducted between a wireless LAN IEEE802.11a and a DS-UWB.As a result, even if the UWB signal is smaller than the receiver noiseof the wireless LAN, the through put deteriorates more than that inthe case of n<strong>on</strong>-interference. Moreover, the signal of the DS-UWBwas equivalent to the AWGN in a case of the through put variati<strong>on</strong>of 64QAM. Finally, we evaluated the separati<strong>on</strong> distances within theregulati<strong>on</strong> limits of the FCC and Japan.SPECIAL SESSION: EMERGING EMC TECHNOLOGIES IN JAPANNew Radiated Immunity/Susceptibility Test Method Using aFour-Septum TEM Cell: Measurements and Field AnalysisKimitoshi Murano, Tokai University; Hiroko Kawahara, University ofElectro-Communicati<strong>on</strong>s; Majid Tayarani, Iran University of Science andTechnology; Fengchao Xiao, University of Electro-Communicati<strong>on</strong>s; andYoshio Kami, University of Electro-Communicati<strong>on</strong>sA four-septum TEM cell has been proposed as a new radiated radiofrequencyimmunity/susceptibility test device. The cell provides<strong>electromagnetic</strong> fields rotating at a very low rate by generating a setof two orthog<strong>on</strong>al balanced-mode fields. In this paper, a test methodusing the cell is clarified, and susceptibility characteristics of twotypes of microstripline models are investigated to verify the effectivenessof the cell and the role of the dielectric material is madeclear. In additi<strong>on</strong>, an analysis method of the internal <strong>electromagnetic</strong>fields, which are different from those used in an ordinary TEM cell,is discussed using an image method.Methods of Evaluating Informati<strong>on</strong> Leakage from PC DisplaysToshihide Tosaka, Nati<strong>on</strong>al Institute of Informati<strong>on</strong> and Communicati<strong>on</strong>sTechnology (NICT); Kaori Fukunaga, NICT; Yukio Yamanaka, NICT;Ryo Ishikawa, NTT Advanced Technology Co.; and Mitsuo Hattori, NTTAdvanced Technology Co.To evaluate the possibility of informati<strong>on</strong> leakage (tapping) byobserving <strong>electromagnetic</strong> disturbance radiated from a PC display,the most straightforward way is to rec<strong>on</strong>struct the displayed imagefrom the measured signal using a special receiver. However, such areceiver is neither popular nor commercially available. Therefore, wepropose two types of evaluati<strong>on</strong> methods that are based <strong>on</strong> 1) themeasurement of the difference in level when different images are displayed,and 2) the measurement of the frequency comp<strong>on</strong>ent of thehoriz<strong>on</strong>tal sync signal within the <strong>electromagnetic</strong> disturbance. Inboth proposed methods, we <strong>on</strong>ly need a spectrum analyzer that iscomm<strong>on</strong>ly used for EMI measurement.Electromagnetic Field Distributi<strong>on</strong> Measurements using anOptically Scanning Probe SystemMasanori Takahashi, NICT; Katsumi Kawasaki, NICT; Hiroyuki Ohba,NICT; Hiroyasu Ota, NICT; Tatsuru Orikasa, Advantest Laboratories©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 21ously, for analyzing the auto-jamming issue in digital wireless communicati<strong>on</strong>equipment.Comm<strong>on</strong> Mode Voltage Evaluati<strong>on</strong> for Choosing Quiet MCUand Optimizing PCB DesignAtsushi Nakamura, Renesas Technology Corporati<strong>on</strong>Similar to the fact that the differential signaling interfaces radiateless than the typical single ended interfaces, radiati<strong>on</strong> from a wireharness c<strong>on</strong>nected to electr<strong>on</strong>ic c<strong>on</strong>trol units using single chip microcomputers can be reduced by adjusting the comm<strong>on</strong> mode voltagefluctuati<strong>on</strong>s of supply lines. The radiati<strong>on</strong> from a wire harness can beminimized when the Vcc and the Vss fluctuate with same magnitude,but in opposite phase. Using simulati<strong>on</strong> techniques to estimatethese fluctuati<strong>on</strong>s from real products that utilize hundreds of comp<strong>on</strong>ents<strong>on</strong> complex PCB layouts is currently quite difficult, so alternativesoluti<strong>on</strong>s using measurement techniques to investigate the comm<strong>on</strong>mode voltage fluctuati<strong>on</strong>s were examined. By the Faraday cagework bench method, and the more advanced use of it with the hybridbalun, comm<strong>on</strong> mode voltage fluctuati<strong>on</strong>s of Vcc and Vss can bem<strong>on</strong>itored. Examples of this measurement method are discussed anda way of reducing comm<strong>on</strong> mode radiati<strong>on</strong> from the wire harness isexplained in this paper.EM ENVIRONMENTAirborne RF Measurement System and Analysis ofRepresentative Flight RF Envir<strong>on</strong>mentSandra Koppen; Jay Ely; Laura Smith; Richard J<strong>on</strong>es; and Vincent Fleck,— NASA Langley Research Center; Maria Salud; and John Mielnik, —Lockheed Martin Corporati<strong>on</strong>Envir<strong>on</strong>mental radio frequency (RF) data over a broad band of frequencieswere needed to evaluate the airspace around several airports.An RF signal measurement system was designed using a spectrum analyzerc<strong>on</strong>nected to an aircraft VHF/UHF navigati<strong>on</strong> antenna installed<strong>on</strong> a small aircraft. This paper presents an overview of the RF measurementsystem and provides an analysis of a sample of RF signal measurementdata over a frequency range of 30 MHz to 1000 MHz.Small Aircraft RF Interference Path LossTru<strong>on</strong>g Nguyen; Sandra Koppen; Jay Ely; and George Szatkowski, —NASA Langley Research Center; John Mielnik; and Maria Theresa Salud,— Lockheed Martin Corporati<strong>on</strong>Interference to aircraft radio receivers is an increasing c<strong>on</strong>cern asmore portable electr<strong>on</strong>ic devices are allowed <strong>on</strong>board. Interferencesignals are attenuated as they propagate from inside the cabin to aircraftradio antennas mounted <strong>on</strong> the outside of the aircraft. Theattenuati<strong>on</strong> level is referred to as the interference path loss (IPL)value. Significant published IPL data exists for transport and regi<strong>on</strong>alcategory airplanes. This report fills a void by providing data forsmall business/corporate and general aviati<strong>on</strong> aircraft. In this effort,IPL measurements are performed <strong>on</strong> ten small aircraft of differentdesigns and manufacturers. Multiple radio systems are addressed.Al<strong>on</strong>g with the typical worst-case coupling values, statistical distributi<strong>on</strong>sare also reported that could lead to better interference riskassessment.Electromagnetic Envir<strong>on</strong>ment Generated by Pulsed PlasmaThrustersAndrey Plokhikh; Garri Popov; Nikolay Antropov; Nikolay Vazhenin;Gennady Shishkin; and Galina Soganova, — RIAMEThis paper deals with the issues of analysis for the <strong>electromagnetic</strong>envir<strong>on</strong>ment created <strong>on</strong> board spacecraft by electric propulsi<strong>on</strong>s asapplied to the EMC problems. Electric propulsi<strong>on</strong> systems <strong>on</strong> thebasis of pulsed plasma thrusters, that are used for the orbit correcti<strong>on</strong>and attitude c<strong>on</strong>trol of small satellites, are c<strong>on</strong>sidered as the sourcesof unintended noise of artificial origin. Test results for the spectralcharacteristics of emissi<strong>on</strong> for the PPT model, with the dischargeenergy of 50 J obtained under ground c<strong>on</strong>diti<strong>on</strong>s, and their discussi<strong>on</strong>are presented in this paper.Properties of Fields in Reverberant Envir<strong>on</strong>ments and itsImplicati<strong>on</strong>sPatrick Perini, EFR, Inc.; and Jose PeriniThis paper addresses fields in reverberant envir<strong>on</strong>ments, where manyreflecti<strong>on</strong>s exist, showing that they are elliptically polarized. To calculatethe correct peak fields from measurements or simulati<strong>on</strong>s, it isnecessary to know the amplitudes and phases of the fields of CartesianComp<strong>on</strong>ents (CCs). Since today’s field probes do not have phaseinformati<strong>on</strong> it is not possible to measure the correct peak exposures!The usual sum of the squares of the CCs magnitudes may be as muchas 50% off. Yet this is comm<strong>on</strong>ly used with no qualificati<strong>on</strong>s. As anexample, in the statistical characterizati<strong>on</strong> of these fields, the CCs areassumed to be statistically independent variables with normal distributi<strong>on</strong>leading to the Rayleigh distributi<strong>on</strong> for the peak far field andthe Exp<strong>on</strong>ential distributi<strong>on</strong> for the peak square near field. In bothcases the wr<strong>on</strong>g variable, the sum of the appropriate CCs square magnitudes,is used. The paper also shows that the CCs are not statisticallyindependent variables. The correct equati<strong>on</strong>s to calculate thepeak values are derived. A suggesti<strong>on</strong> of how to modify the presentday probes to measure the CCs phases is also presented. All thesequesti<strong>on</strong>s are discussed in detail.PRINTED CIRCUIT BOARD EMC IA Study <strong>on</strong> the Correlati<strong>on</strong> Between the PCB Layout andEMI from the ChassisHiroki Funato; and Takashi Suga, — Hitachi, Ltd.Investigati<strong>on</strong>s of radiated emissi<strong>on</strong>s from a c<strong>on</strong>ductive chassis c<strong>on</strong>nectedto the GND of a PCB with ICs showed higher emissi<strong>on</strong>s froma PCB mounted to a chassis than <strong>on</strong>e without a chassis. The resultsalso showed that the locati<strong>on</strong> of the ground c<strong>on</strong>necti<strong>on</strong> between theGND plane <strong>on</strong> the PCB and the chassis can affect emissi<strong>on</strong> levels byup to 9 dB. To determine the path of the noise current from the PCBto the chassis, we measured the current at their juncti<strong>on</strong> with a thincurrent-probe.The positi<strong>on</strong> dependence of the juncti<strong>on</strong> current frequencyspectra correlated with that of the radiated emissi<strong>on</strong> spectra.Moreover, EMI levels correlated with the distance from the screw tothe nearest bypass capacitor.EMI Resulting from Printed Circuit Boards Interc<strong>on</strong>nectedby a Coaxial CableYoshiki Kayano; and Hiroshi Inoue, — Department of Electrical andElectr<strong>on</strong>ic Engineering, Akita UniversityTo provide basic c<strong>on</strong>siderati<strong>on</strong>s for the realizati<strong>on</strong> of methods for predictingthe <strong>electromagnetic</strong> (EM) radiati<strong>on</strong> from interc<strong>on</strong>nectedprinted circuit boards (PCBs) by a coaxial cable, the characteristics ofthe EM interference of a test model PCB are investigated in thispaper by experiment and numerical modeling. Comparing the caseswith and without the interc<strong>on</strong>necti<strong>on</strong>, the ground plane of the interc<strong>on</strong>nectedPCBs and the interc<strong>on</strong>necti<strong>on</strong> cable are dominant radiati<strong>on</strong>factor in the lower frequencies. These factors c<strong>on</strong>struct a largecomm<strong>on</strong>-mode (CM) antenna. On the other hand, the total EM radiati<strong>on</strong>at GHz frequencies is simply determined by the differential-©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


22EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMmode (DM) current <strong>on</strong> the signal trace, and cross-talk current <strong>on</strong> thevictim traces. C<strong>on</strong>sequently, correct predicti<strong>on</strong>s of CM current atlower frequencies and cross-talk are keys to the predicti<strong>on</strong> of the totalEMI behavior of the interc<strong>on</strong>nected PCBs, because the DM current<strong>on</strong> the signal trace can be predicted by transmissi<strong>on</strong> line theory.Power and Ground Bounce Effects <strong>on</strong> Comp<strong>on</strong>ent PerformanceBased <strong>on</strong> Printed Circuit Board Edge Terminati<strong>on</strong> MethodologiesMark M<strong>on</strong>trose, M<strong>on</strong>trose Compliance Services, Inc.; and En-Xiao Liu,Institute of High Performance ComputingPrinted circuit boards (PCBs) are <strong>on</strong>e source of radiated EMI withdigital comp<strong>on</strong>ents being the culprits. To minimize the developmentof comm<strong>on</strong>-mode currents within the silic<strong>on</strong> package of largecurrent c<strong>on</strong>suming circuits, a stable power distributi<strong>on</strong> network(PDN) is required. Any noise (bounce) <strong>on</strong> either the power or 0 Vreference (ground) plane may cause, simultaneously, switching noise(SSN) or signal integrity (SI) problems, as well as EMI. In additi<strong>on</strong>,if planar bounce exceeds margin levels, comp<strong>on</strong>ents may not functi<strong>on</strong>.To ensure a stable PDN is present, decoupling capacitors andburied capacitive structures are mandatory, al<strong>on</strong>g with minimizingloop inductance. The uniqueness of this research lies in analyzingplanar bounce that may exceed voltage margin levels from reflectedEM waves that propagate back to comp<strong>on</strong>ents from the physical edgeof the PCB. The edges of a PCB are in reality a high-impedance,n<strong>on</strong>-terminated signal transmissi<strong>on</strong> line stub. With each reflecti<strong>on</strong>,ringing occurs. The magnitude of this ringing may cause digitalcomp<strong>on</strong>ents to have SSN and/or EMI problems. Popular board edgeterminati<strong>on</strong> techniques are investigated to determine if a designershould be c<strong>on</strong>cerned with reflected wave switching noise <strong>on</strong> either apower or 0 V reference plane, which cannot be removed by capacitivestructures or decoupling.Analysis of Emissi<strong>on</strong>s from a Printed Circuit Board with aC<strong>on</strong>ducting Wire Directed in Various Directi<strong>on</strong>sMasahiro Takashima; Teruo Tobana; Takayuki Sasamori; and Kohshi Abe,— Department of Electr<strong>on</strong>ics and Informati<strong>on</strong> Systems, Akita PrefecturalUniversityEmissi<strong>on</strong>s from a printed circuit board (PCB) with a finite sizebecomes serious when the comm<strong>on</strong> mode current is excited <strong>on</strong> it.The comm<strong>on</strong> mode current can occur at c<strong>on</strong>necti<strong>on</strong>s of c<strong>on</strong>ductingwires or at a disc<strong>on</strong>tinuity of a line or ground plane <strong>on</strong> a PCB. Inorder to clarify the relati<strong>on</strong> between a juncti<strong>on</strong> of c<strong>on</strong>ducting wiresto its emissi<strong>on</strong>, the authors analyzed emissi<strong>on</strong>s from a PCB with c<strong>on</strong>ductingwires directed in the upper directi<strong>on</strong> and the lower directi<strong>on</strong>at the ground edge using the Finite-Difference Time-Domain(FDTD) method. From numerical results, it is shown that in the caseof a c<strong>on</strong>ducting wire c<strong>on</strong>nected to the upper directi<strong>on</strong>, the radiati<strong>on</strong>power is the largest. Moreover, for the positi<strong>on</strong> of a microstrip line,the radiati<strong>on</strong> power is the largest when the distance between themicrostrip line and the wire is small. Further, the experimentalresults of radiati<strong>on</strong> power show the validity of the numerical results.Radiated Emissi<strong>on</strong>s from Proximity Coupled OversizedHeat-SinksDheena Mo<strong>on</strong>gilan, AT&T Bell LaboratoriesRadiated emissi<strong>on</strong> characteristics of oversized heat sinks that have asurface area substantially larger than the top c<strong>on</strong>tact surface of the ICpackage are investigated. The heat sinks are found to radiate at higherlevels when coupled in proximity to the package than the frequenciesc<strong>on</strong>tained within the IC package. In this paper oversizedheat sinks are modeled as proximately coupled patch antennas with ashort-circuited Stub. Patch antenna characteristics such as inputimpedance that varies with the feed positi<strong>on</strong>s, and the patch res<strong>on</strong>ancefrequencies are applied in the analysis of the radiated emissi<strong>on</strong>scharacteristics of oversized heat sinks. Radiated emissi<strong>on</strong> measurmentsfrom a physical proximity coupled patch antenna model and ahighly integrated PCB with oversized heat sink are presented and theresults discussed.Modeling and Measurement of Mutual Coupling Resultingfrom Arbitrary 3-D Structures within Printed Circuit BoardDesignsLeigh Cornock; and Ian Dilworth, — University of EssexWe report measurements and modeling of mutual coupling resultingfrom closely spaced copper plated through holes <strong>on</strong> printed circuitboards (PCB), known as vias. When the magnetic flux generated bya primary system couples with the inductance of a sec<strong>on</strong>dary system,a ‘reflected impedance’ is induced in series with the primary inductance.Our investigati<strong>on</strong> includes practical measurements and <strong>electromagnetic</strong>(EM) modeling using the Transmissi<strong>on</strong> Line Matrix(TLM) code in order to establish the change in coupling and ‘reflectedimpedance’ as a functi<strong>on</strong> of distance between quasi res<strong>on</strong>ant structures.With significant numbers of coupled vias, possible couplingpermutati<strong>on</strong>s are large. We report models for 2, 3, and 4 via coupling,the results from which are extendable to arbitrary 3D structures.PRINTED CIRCUIT BOARD EMC IIPPW Noise Mitigati<strong>on</strong> in Multilayer PCBs by Means ofVirtual Island and/or Array of Shorting ViasAnt<strong>on</strong>io Ciccomancini, CST of AmericaThis paper describes the parallel-plate waveguide (PPW) noise mitigati<strong>on</strong>by means of shorting vias and/or virtual islands. The proposedmethod is already know in literature, nevertheless importantc<strong>on</strong>siderati<strong>on</strong>s are addressed here: 1) the same noise mitigati<strong>on</strong> levelcan be achieved by using <strong>on</strong>ly shorting vias or virtual island in combinati<strong>on</strong>with shorting vias, 2) the noise mitigati<strong>on</strong> is strictly relatedto the number of shorting vias, the positi<strong>on</strong> and the distance fromthe signal via, and 3) the PPW noise suppressi<strong>on</strong> is effective <strong>on</strong>ly ifan array of shorting vias is used. The mitigati<strong>on</strong> level is investigatedboth in the time domain and frequency domain. Different c<strong>on</strong>figurati<strong>on</strong>sare studied and the impact of the power plane withetched slots due to virtual islands <strong>on</strong> the signal quality is also analyzed(TDR and inserti<strong>on</strong> loss).Suppressi<strong>on</strong> Effect of Emissi<strong>on</strong>s from a Printed CircuitBoard Using a C<strong>on</strong>ducting PlateTeruo Tobana; Takayuki Sasamori; and Kohshi Abe, — Akita PrefecturalUniversityFor emissi<strong>on</strong>s caused by the comm<strong>on</strong>-mode current <strong>on</strong> a printedcircuit board (PCB), a suppressi<strong>on</strong> method based <strong>on</strong> the image theoryof placing a c<strong>on</strong>ducting plate under the PCB is presented. Inorder to evaluate the suppressi<strong>on</strong> effect by this method, the radiati<strong>on</strong>power from the PCB is calculated using the FDTD method.The numerical results show that by placing the c<strong>on</strong>ducting platenear the ground side of the PCB, the emissi<strong>on</strong>s from the comm<strong>on</strong>modecurrent are effectively suppressed. Especially, using the c<strong>on</strong>ductingplate with bent sides, it is possible to suppress the emissi<strong>on</strong>sby the small c<strong>on</strong>ducting plate. Moreover, the method ofbending the edges of the PCB is presented and it is shown that alarge suppressi<strong>on</strong> effect is obtained using this method. Further, theexperimental results of a maximum electric field intensity show thevalidity of the numerical results.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 23Numerical and Experimental Investigati<strong>on</strong> of Power SupplyNoise Decoupling Strategies <strong>on</strong> Single-Sided PrintedCircuit BoardsBruce Archambeault, IBM; Cyrous Rostamzadeh, Bosch; and SamuelC<strong>on</strong>nor, IBMIn the high-volume and low manufacturing budget of the automotiveworld, printed circuit boards are designed without the use of a dedicatedpower or ground plane. Decoupling capacitors <strong>on</strong> single-sidedprinted circuit boards are c<strong>on</strong>nected between Vcc and return traces.In this paper, we evaluate a number of practical decoupling capacitormounting strategies for these single-sided printed circuit boards usedin the design of automotive c<strong>on</strong>trol modules. The Partial ElementEquivalent Circuit numerical modeling technique is used to validatemeasured data and to explore additi<strong>on</strong>al design opti<strong>on</strong>s.INTEGRATED CIRCUIT EMCThermal Influence <strong>on</strong> 16 Bits Microc<strong>on</strong>troller Emissi<strong>on</strong>S<strong>on</strong>ia Ben Dhia; Etienne Sicard; Alexandre Boyer; and Yoan Mequign<strong>on</strong>,— Institut Nati<strong>on</strong>al des Sciences Appliquées (INSA) of Toulouse; and JeanMarc Dienot, IUT TarbesThis paper deals with the thermal influence <strong>on</strong> integrated circuit performancesin terms of parasitic emissi<strong>on</strong>. Emissi<strong>on</strong> measurementresults c<strong>on</strong>ducted <strong>on</strong> a 16-bit microc<strong>on</strong>troller at extreme temperaturec<strong>on</strong>diti<strong>on</strong>s are provided, showing a difference of 10 dB between -40°C and 125°C. We detail a predictive approach for modeling theemissi<strong>on</strong> level variati<strong>on</strong> with temperature. The simulati<strong>on</strong> takes intoaccount temperature-dependant passive and active device models. Itis shown that the silic<strong>on</strong> substrate, drivers, and <strong>on</strong>-chip capacitanceplay significant roles in the increase in emissi<strong>on</strong> levels when loweringthe operating temperature.Comparis<strong>on</strong> of Radiati<strong>on</strong> from Two Microprocessor TestPackagesXiaopeng D<strong>on</strong>g; Kevin Daniel; and Kevin Slattery, — Intel Corporati<strong>on</strong>Radiati<strong>on</strong> directly from integrated circuits (ICs) packages is c<strong>on</strong>venti<strong>on</strong>allynot c<strong>on</strong>sidered significant since the size of the package iselectrically small and not c<strong>on</strong>sidered as an efficient antenna.However, as the technology evolves and operating frequency increases,the size of the microprocessor package is no l<strong>on</strong>ger electricallysmall. Moreover, in todays and in future mobile platforms such asnotebooks and ultra-mobile devices (UMDs), the high performancewireless communicati<strong>on</strong> system and powerful computing system areintegrated together. It is not necessary to have an efficient antennato couple energy from the noise source to the wireless system anddegrade its performance because of the sensitivity level of the wirelessreceiver. In this paper, the radiati<strong>on</strong> from two microprocessortest packages is compared. The results show that the package designhas significant impact <strong>on</strong> the radiati<strong>on</strong> from the package.Assessment of the DPI Standard for Immunity Simulati<strong>on</strong>of Integrated CircuitsJohan Loeckx; and Georges Gielen, — K. U. LeuvenEnsuring immunity to <strong>electromagnetic</strong> interference (EMI) is a majorchallenge in present designs. Making integrated circuits intrinsicallyless susceptible to interference by adapted circuit design canreduce costs substantially in later stages. It is shown that smallchanges in the circuit topology can increase the immunity of IC’s byseveral orders of magnitude. Being able to predict whether a chipwill pass susceptibility tests before fabricati<strong>on</strong> is essential in order toreduce costs. For this reas<strong>on</strong>, accurate simulati<strong>on</strong> of the standard testmethods is needed. In this paper, a simulati<strong>on</strong> framework is presentedthat allows accurate simulati<strong>on</strong> and predicti<strong>on</strong> of theIEC62132- 4 DPI standard.Efficiency of Embedded On-Chip EMI Protecti<strong>on</strong>s toC<strong>on</strong>tinuous Harm<strong>on</strong>ic and Fast Transient Pulses withRespect to Substrate Injecti<strong>on</strong>Ali Alaeldine, ESEO; Nicolas Lacrampe, LAAS-CNRS; Jean-Luc Levant,ATMEL Nantes; Richard Perdriau, ESEO; Mohamed Ramdani, ESEO;Fabrice Caignet, LAAS-CNRS; Marise Bafleur, LAAS-CNRS; EtienneSicard, LESIA-INSA Toulouse; and M'hamed Drissi, IETR-INSA RennesThis paper presents a comparative study of the efficiency of severalembedded EMI protecti<strong>on</strong>s for integrated circuits (ICs) with respectto direct power injecti<strong>on</strong> (DPI) and very fast transmissi<strong>on</strong>-line pulsing(VF-TLP) into the substrate of the IC. This study involves threefuncti<strong>on</strong>ally identical cores, differing <strong>on</strong>ly by their EMI protecti<strong>on</strong>strategies (RC protecti<strong>on</strong>, isolated substrate, meshed power supplynetwork) which were initially designed for low-emissi<strong>on</strong> designguidelines. Through extensive measurements, a classificati<strong>on</strong>between these strategies is established for both injecti<strong>on</strong> methods,leading to the introducti<strong>on</strong> of design guidelines for the minimizati<strong>on</strong>of c<strong>on</strong>ducted susceptibility to substrate injecti<strong>on</strong>.Investigati<strong>on</strong> <strong>on</strong> ESD Transient Immunity of Integrated CircuitNicolas Lacrampe, LAAS-CNRS; Ali Alaeldine, ESEO; Fabrice Caignet,LAAS-CNRS; Richard Perdriau, ESEO; Marise Bafleur, LAAS-CNRS;Nicolas Nolhier, LAAS-CNRS; and Mohamed Ramadani, ESEOThis paper presents a measurement methodology aimed at predictingthe susceptibility of integrated circuits against electrostatic discharge(ESD) stresses. In our applicati<strong>on</strong>, a Very Fast Transmissi<strong>on</strong> LinePulsing (VF-TLP) test bench is used to inject a disturbance into anIC under operati<strong>on</strong>. For simulati<strong>on</strong> purposes, each part of the testbench is modeled separately, and these models are assembled in orderto obtain a complete model representing both the injecti<strong>on</strong> set-upand the IC itself. The suggested injecti<strong>on</strong> model is validated thanksto correlati<strong>on</strong>s between measurements and simulati<strong>on</strong>s <strong>on</strong> a full custom0.18 µm CMOS IC.Latch-up Like Failure of Power Rail ESD Clamp Circuits inCMOS Integrated Circuits Under System-Level ESD TestMing-Dou Ker; and Cheng-Cheng Yen, — Nati<strong>on</strong>al Chiao-TungUniversity, Hsinchu, TaiwanTwo different <strong>on</strong>-chip power-rail electrostatic discharge (ESD) protecti<strong>on</strong>circuits, <strong>on</strong>e with NMOS and PMOS feedback; and twowith cascaded PMOS feedback, have been designed and fabricatedin a 0.18-μm CMOS technology to investigate their susceptibilityto a system-level ESD test. The main purpose for adopting thefeedback loop into the power-rail ESD clamp circuits is to avoid thefalse triggering during a fast power-up operati<strong>on</strong>. However, duringthe system-level ESD test, where the ICs in a microelectr<strong>on</strong>ics systemhave been powered up, the feedback loop used in the power-railESD clamp circuit provides the lock functi<strong>on</strong> to keep the main ESDdevice in a “latch-<strong>on</strong>” state. The latch-<strong>on</strong> ESD device, which isoften designed with a larger device dimensi<strong>on</strong> to sustain high ESDlevel, c<strong>on</strong>ducts a huge current between the power lines to performa latch-up like failure after the system level ESD test. The susceptibilityof power-rail ESD clamp circuits with the additi<strong>on</strong>al boardlevel noise filter to the system level ESD test is also investigated.To meet high system level ESD specificati<strong>on</strong>s, the chip level ESDprotecti<strong>on</strong> design should be c<strong>on</strong>sidered with the transient noiseduring system level ESD stress. The power-rail ESD clamp circuit©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


24EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMwith feedback technique is also evaluated with the board level filternetwork.SHIELDINGShielding Specificati<strong>on</strong> Techniques and MeasurementMethods for AircraftWilliam Prather, U. S. Air Force Research LaboratoryIf properly implemented, <strong>electromagnetic</strong> shielding can protect aircraftelectr<strong>on</strong>ics from harmful interference over a wide range of frequencies.The first step is to create a properly written set of specificati<strong>on</strong>sin measurable engineering units. If this is d<strong>on</strong>e, then theshielding system can be analyzed and measured in the laboratory and<strong>on</strong> board the aircraft. Using large aircraft as an example, this paperdiscusses shielding element specificati<strong>on</strong>s and the measurementmethods that can be used to verify them. Illustrative examples ofmeasured data are presented.Shielding Effectiveness of a Wire MeshHans A. Wolfsperger, Emscreen GmbHThis paper describes an analytic soluti<strong>on</strong> to determine the shieldingeffectiveness (SE) of an infinite wire mesh. The <strong>electromagnetic</strong> couplingthrough the holes is represented by electric and magneticdipoles, according to Bethe’s theory. The dipoles are interacting witheach other. They are rearranged in a way that allows calculating thereactive field strength as an infinite sum. Finally, the SE is calculatedunder c<strong>on</strong>siderati<strong>on</strong> of the mesh’s c<strong>on</strong>ductivity.Evaluati<strong>on</strong> of the Electromagnetic Penetrati<strong>on</strong> of the NASASpace Shuttle Endeavour Using an Ultra-WidebandMeasurement SystemRobert Johnk, Nati<strong>on</strong>al Institute of Standards and Technology (NIST);Robert Scully, NASA; David Novotny, NIST; Chriss Grosvenor, NIST; NinoCanales, NIST Emeritus; Dennis Camell, NIST; and Galen Koepke, NISTThis paper summarizes a joint NIST-NASA measurement effort toevaluate the <strong>electromagnetic</strong> penetrati<strong>on</strong> of the shuttle Endeavour.NASA is c<strong>on</strong>cerned about the effects that microwave imaging radarsystems might have <strong>on</strong> critical avi<strong>on</strong>ics systems <strong>on</strong> its fleet of spaceshuttles. As part of a multifaceted effort, a portable, NIST-developed,ultra-wideband measurement system was deployed at theKennedy Space Center to evaluate <strong>electromagnetic</strong> penetrati<strong>on</strong> overthe frequency range of 30 MHz to 6 GHz at selected locati<strong>on</strong>s insideEndeavour. The measurements were carried out inside a large metalhangar, which exhibited robust reverberant behavior. A combinati<strong>on</strong>of reverb chamber techniques and time/frequency signal processingpermitted the evaluati<strong>on</strong> of <strong>electromagnetic</strong> penetrati<strong>on</strong> at six differentlocati<strong>on</strong>s inside the orbiter.Engineering of Absorbing Gaskets Between Metal PlatesMarina Koledintseva; Sandeep Chandra; and James Drewniak, —University of Missouri-Rolla; and James Lenn, General Dynamics LandSystemsEngineering of absorbing material for gaskets that would be usedbetween two metal plates to reduce <strong>electromagnetic</strong> emissi<strong>on</strong>s andimprove immunity of electr<strong>on</strong>ic equipment is c<strong>on</strong>sidered. An analyticalmodel of a composite based <strong>on</strong> the Maxwell Garnett formulati<strong>on</strong>for multiphase mixtures, as well as the shielding effectiveness ofthis material, are presented. The full-wave numerical computati<strong>on</strong>alresults for the structure c<strong>on</strong>sisting of two overlapping metal platesand an engineered gasket composite material in the place of the overlapare presented.Protective Properties of a Generic Missile Enclosure toDifferent Electromagnetic InfluencesSven Fisahn, University of Hannover; Heyno Garbe, University ofHannover; and Frank Sabath, WISElectr<strong>on</strong>ic comp<strong>on</strong>ents and subsystems of a time critical system (e.g.an aircraft) must be highly unsusceptible to <strong>electromagnetic</strong> influences.In order to predict the immunity of a generic missile(GENEC) against <strong>electromagnetic</strong> influences, not <strong>on</strong>ly the electr<strong>on</strong>icsystem but also the enclosure has to be taken into c<strong>on</strong>siderati<strong>on</strong>.Assuming a sufficient c<strong>on</strong>ductivity of the metallic enclosure, aperturesin this enclosure effect a substantial reducti<strong>on</strong> of the shieldingeffectiveness. The shielding properties of the generic missile could beinvestigated by means of a metallic hollow cylinder equipped withdifferent apertures. Numerical simulati<strong>on</strong>s and measurements of thiscylinder will be carried out and analyzed.Rethinking Shielding TheoryDavid Larrabee, East Stoudsburg UniversityThe traditi<strong>on</strong>al “shielding theory” for the shielding effectiveness ofenclosures is examined. It is shown that there can be significanteffects which are not included within a simple barrier based theory athigh frequencies. It is shown that a 1-dimensi<strong>on</strong>al box (using the fullMaxwell’s equati<strong>on</strong>s soluti<strong>on</strong>) has 1-D res<strong>on</strong>ances that can significantlyaffect the accuracy of a barrier based shielding calculati<strong>on</strong>.Treating the enclosure as a res<strong>on</strong>ant cavity with perturbati<strong>on</strong>s <strong>on</strong> thewalls is a better approach to the analysis of radiated emissi<strong>on</strong>s andradiated susceptibility problems at high frequencies (at and above thefirst res<strong>on</strong>ance). This has the added advantage of having been workedout quite thoroughly for wave guides and res<strong>on</strong>ant cavities.CABLES AND TRANSMISSION LINESOn Eliminating Crosstalk in a Multic<strong>on</strong>ductorTelecommunicati<strong>on</strong> CableRoblot Sandrine; and Zeddam Ahmed, — France Telecom R&DThis paper presents a method of crosstalk reducti<strong>on</strong> in a telecommunicati<strong>on</strong>cable composed of multiple c<strong>on</strong>ductors. Initially, an <strong>electromagnetic</strong>and topologic code is implemented to simulate themulti c<strong>on</strong>ductor transmissi<strong>on</strong> line when injecting the different signalsfollowing a particular combinati<strong>on</strong> of modes. Then, the far endcrosstalk voltage is determined. To picture those results, thecrosstalk results obtained by simulati<strong>on</strong> will finally be injected <strong>on</strong> areal line transmitting VDSL signal. With such a method, it appearsthat is possible to decrease crosstalk <strong>on</strong> the line, and c<strong>on</strong>sequently toincrease the bit rate level and reach of xDSL transmissi<strong>on</strong>s. Somestudies have already been undertaken to minimize crosstalk. Theseapproaches have been experimented <strong>on</strong> printed circuits, microstrip,etc. but rarely <strong>on</strong> telecommunicati<strong>on</strong> cables, which require a differentialmode transmissi<strong>on</strong> of signals and use a frequency band thatextends from 12 kHz to 30 MHz.A Study <strong>on</strong> Suppressi<strong>on</strong> of Crosstalk Between ParallelTransmissi<strong>on</strong> Lines in the High Frequency BandTakashi Kasuga, Nagano Nati<strong>on</strong>al College of Technology; and HiroshiInoue, Akita UniversityAs the parallel transmissi<strong>on</strong> line is used in the high frequency range,it is necessary to decrease the crosstalk S41 between transmissi<strong>on</strong>lines (TLs). This study shows the basic idea of some effective structureswhich can suppress the S41. When the distance between TLsis significantly varied, the S41 is also varied at the res<strong>on</strong>ance frequency.As the crosstalk S41 are measured and calculated for four©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 25kinds of the multi layer structures, the S41 of the strip and shieldstructure are found to be -6dB smaller than that of MSL and embedded.To suppress the S41, the strip and shield structure are useful.SYSTEM LEVEL EMCElectromagnetic Topology: a Modular Juncti<strong>on</strong> Approachfor a System Level Interacti<strong>on</strong> ProblemPhumin Kirawanich, University of Missouri-Columbia; ChristosChristodoulou, University of New Mexico; Justin Wils<strong>on</strong>, University ofMissouri-Columbia; S. Yakura, U. S. Air Force Research Laboratory; andN. Islam, University of Missouri-ColumbiaA new approach to perform <strong>electromagnetic</strong> topology based simulati<strong>on</strong>is proposed by incorporating a modular scattering juncti<strong>on</strong> c<strong>on</strong>cept.This method substitutes the multistep computati<strong>on</strong> techniqueand is c<strong>on</strong>venient to implement. The method also allows for incorporatingsubstructural modificati<strong>on</strong>s and does not require repeatingsoluti<strong>on</strong>s to the entire system. The overall simulati<strong>on</strong> utilizes thetransmissi<strong>on</strong> line matrix compacti<strong>on</strong>, finite-difference time-domainmethod, and reciprocity theorem to simulate the system interacti<strong>on</strong>.Results are compared with experiments c<strong>on</strong>ducted in the laboratory.A good agreement is shown for the simulated and experimental data.Electromagnetic Coupling Inside Enclosures with CloselyCoupled Electric M<strong>on</strong>opoles and C<strong>on</strong>ducting PlanesLe<strong>on</strong>ardo Sandrolini, University of Bologna; Ugo Reggiani, University ofBologna; David W. P. Thomas, The University of Nottingham; and ChristosChristopoulos, The University of NottinghamThe efficiency and reliability of the multiple-mode transmissi<strong>on</strong> theoryapplied to predict the <strong>electromagnetic</strong> coupling between electricm<strong>on</strong>opoles with c<strong>on</strong>ducting planes inside a metallic enclosure isassessed in this paper. The planes are represented with an equivalentimpedance through a transmissi<strong>on</strong> line analogy. Particularly criticalcoupling c<strong>on</strong>figurati<strong>on</strong>s, such as close m<strong>on</strong>opole-to-plane and planeto-planec<strong>on</strong>figurati<strong>on</strong>s are tested. The results obtained with the proposedmethod are compared to experimental measurements andtransmissi<strong>on</strong>-line modelling (TLM) numerical simulati<strong>on</strong>s. The proposedmodel is attractive due to its rapidity and good accuracy in predictingthe coupling c<strong>on</strong>figurati<strong>on</strong>s examined.Design Philosophy for a Satellite with Extremely LowRadiated Emissi<strong>on</strong>s RequirementsGregory Tettemer; William Elkman; and Steven Hungate, — BoeingSatellite Development CenterTrends in RF performance requirements for c<strong>on</strong>temporary spacecraft aredriving vehicle design to achieve extremely low RF emissi<strong>on</strong>s levels dueto unintenti<strong>on</strong>al sources. This paper describes an approach to achievingvery low spurious RF emissi<strong>on</strong>s in spacecraft by identifying, predictingand c<strong>on</strong>trolling emissi<strong>on</strong>s sources during architecture development.The approach incorporates detailed tailored analysis and test methodsused to verify performance compliance. Specific test results are discussedin the c<strong>on</strong>text of showing the effectiveness of this designapproach in meeting tailored MIL-STD-461E radiated emissi<strong>on</strong>s limits.Reducti<strong>on</strong> of Radiated Emissi<strong>on</strong>s from a PLC System byStudying Electrical Unbalance of the PLC Device and T-ISNMitsuhiko Kanda, Mitsubishi Electric Corporati<strong>on</strong>; Yoshihiko K<strong>on</strong>ishi,Mitsubishi Electric Corporati<strong>on</strong>; Atsushi Morita, N/A; Masataka Kato,N/A; Shuichi Nitta, N/A; and Naoto Oka, Mitsubishi Electric Corporati<strong>on</strong>The relati<strong>on</strong> of the comm<strong>on</strong>-mode current generated by a PLC, l<strong>on</strong>gitudinalc<strong>on</strong>versi<strong>on</strong> loss (LCL) and comm<strong>on</strong>-mode impedance (Zcm)of the T-ISN, and electrical unbalance that exists in the PLC device,is investigated in order to use it for the development of a low emissi<strong>on</strong>PLC device. It is necessary to decrease the comm<strong>on</strong>-mode currentto decrease the radiated emissi<strong>on</strong> that is generated by the PLC.In this case, LCL and the comm<strong>on</strong>-mode impedance of the outlet areexamined. For this examinati<strong>on</strong>, the relati<strong>on</strong>al expressi<strong>on</strong> of comm<strong>on</strong>-modecurrent, LCL, and comm<strong>on</strong>-mode impedance that is thecomm<strong>on</strong>-mode current is obtained. First of all, the relati<strong>on</strong> betweenthe comm<strong>on</strong>-mode current and LCL and comm<strong>on</strong>-mode impedance isshown. Next, the effect of c<strong>on</strong>trolling the comm<strong>on</strong>-mode currentaccording to the electrical balancing of the PLC device is shown. Theeffectiveness of improving balancing <strong>on</strong> the inside of the PLC deviceis shown.Simulati<strong>on</strong> of an Indoor Power Cable Network for PLCApplicati<strong>on</strong>sC<strong>on</strong>cettina Buccella; Valerio De Santis; and Mauro Feliziani, —University of LaquilaA simulati<strong>on</strong> model is proposed to evaluate the performances ofpower line communicati<strong>on</strong> (PLC) in an indoor envir<strong>on</strong>ment. Thepower cable used as the PLC transmissi<strong>on</strong> vector is modelled by themultic<strong>on</strong>ductor transmissi<strong>on</strong> line (MTL) theory and the MTL electricalparameters are obtained by the finite element method (FEM)analysis of the cable cross-secti<strong>on</strong>. The MTL network c<strong>on</strong>figurati<strong>on</strong>is analysed by a CAD circuit simulator. Particular attenti<strong>on</strong> isfocused <strong>on</strong> the characterizati<strong>on</strong> of juncti<strong>on</strong>s. Comparis<strong>on</strong>s of calculatedresults with measurements are presented in the frequency range1 to 30 MHz for different c<strong>on</strong>figurati<strong>on</strong>s of the power cable network.POWER LINES AND POWER LINE FILTERSExtending Winding Capacitance Cancellati<strong>on</strong> to Three-Phase Power Filter NetworksMarcelo Heldwein; and Johann Kolar, — Swiss Federal Institute ofTechnology (ETH) ZurichTechniques have been presented in the literature for canceling straycapacitances for inductors in single-phase power filters. With thesame aim, the alternatives provided by three-phase systems areexplored here. A thorough theoretical analysis is presented, wherepros and c<strong>on</strong>s of parasitic capacitance cancellati<strong>on</strong> networks are highlightedand improvements are proposed. A systematic mathematicalprocedure to evaluate impedances for different noise modes in threephasecircuits is presented. The influence of parasitic effects isaccessed and asymmetrical capacitance cancellati<strong>on</strong> is proposed, facilitatingapplicati<strong>on</strong>s in switched power circuits. Experimental resultsare presented and shall be extended for the final versi<strong>on</strong> of this work.Analysis and Design of an EMI Filter for Inducti<strong>on</strong> MotorDrives Using the Butterworth Functi<strong>on</strong>Vuttip<strong>on</strong> Tarateeraseth, Srinakharinwirot University; Werachet Khanngern,King M<strong>on</strong>gkut’s Institute of Technology Ladkrabang, Thailand;Chanthea Khun, King M<strong>on</strong>gkut’s Institute of Technology Ladkrabang,Thailand; and Masaaki Kando, Tokai UniversityThis paper deals with a passive EMI filter designed for inducti<strong>on</strong>motor drives to mitigate the comm<strong>on</strong> mode (CM) and differentialmode (DM) noise c<strong>on</strong>firmed by the EN 55022 Class B. The proposeddesign procedure of the EMI filter uses an approximati<strong>on</strong> functi<strong>on</strong>based <strong>on</strong> a high order Butterworth functi<strong>on</strong> to achieve not <strong>on</strong>ly thecomplied c<strong>on</strong>ducted noise but also the transfer functi<strong>on</strong> of filters.This procedure is also based <strong>on</strong> the knowledge of the base-line of theCM and DM noise. The measuring current probe is <strong>on</strong>ly used to separatethe total c<strong>on</strong>ducted EMI into CM and DM comp<strong>on</strong>ents without©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


26EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMusing a noise separator. A design example is carried out experimentally<strong>on</strong> the implemented filter according to EN 55022 Class B toverify the validity of the design procedure.SPECIAL SESSION: AUTOMOTIVE EMC DESIGN AND MODELINGCircuit Board Layout for Automotive Electr<strong>on</strong>icsTodd Hubing, Clems<strong>on</strong> UniversityEMC and envir<strong>on</strong>mental requirements placed <strong>on</strong> automotive electr<strong>on</strong>icspresent unique board layout challenges. This paper discussescomp<strong>on</strong>ent placement and trace routing strategies for circuit boardsthat will be used in automotive applicati<strong>on</strong>s.Modeling Coax Cable EMI Shielding Performance forAutomotive AM Broadcast Band Applicati<strong>on</strong>sRichard Wiese, General MotorsAutomotive broadcast recepti<strong>on</strong> systems typically use comm<strong>on</strong> coaxcable to c<strong>on</strong>vey RF energy from the antenna to the broadcast receiver.In special cases a modified low capacitance coax is used for crossvehicle runs to enhance performance in the AM band. Coax is specifiedby characteristic impedance, optical coverage, DC resistance perunit length, and RF loss versus frequency per unit length. Opticalcoverage and DC resistance serve to provide a gauge for relativeshielding performance to EMI. EMI currents <strong>on</strong> the shield translateto an impressed voltage at the receiver via the transfer impedance ofthe coax. This paper examines the near-field magnetic shieldingeffectiveness of coax and the relati<strong>on</strong>ship to standard methods forshielding effectiveness. A 2-D quasi-static solver applicati<strong>on</strong> is usedfor the analysis.Validati<strong>on</strong> of Worst-Case and Statistical Models for anAutomotive EMC Expert SystemDaryl Beetner, University of Missouri-Rolla; Haixiao Weng, TexasInstruments; Todd Hubing, Clems<strong>on</strong> University; and Meilin Wu, Universityof Missouri-RollaAn EMC expert system has been developed to predict potential<strong>electromagnetic</strong> <strong>compatibility</strong> problems in a vehicle early in thedesign process. Here, the accuracy of inductive and capacitivecoupling algorithms are verified through representative measurementsof crosstalk within an automobile. Worst-case estimatesused by the algorithms are compared to measured valuesand are compared to values estimated using statistical methods.While an approximate statistical approach is feasible even forsophisticated designs, worst-case estimates better ensure thatproblems will not be missed even in the absence of complete systeminformati<strong>on</strong>.Impact of Intra-Vehicular Electromagnetic Interference <strong>on</strong>Tire Pressure M<strong>on</strong>itoring SystemsVikas Kukshya, HRL Laboratories; Hyok S<strong>on</strong>g, N/A; Hui P. Hsu, N/A;and Richard Wiese, General MotorsThe next generati<strong>on</strong> of vehicles will use a wide range of electr<strong>on</strong>icsensors and systems to m<strong>on</strong>itor and regulate various vehicular performanceand safety functi<strong>on</strong>s. However, before such systems canbe formally introduced in the vehicles, it is crucial that the potentialimpact of vehicular <strong>electromagnetic</strong> interference <strong>on</strong> these systemsbe evaluated thoroughly. In this paper, we use an end-to-endsystem simulator to quantify the impact of various levels and typesof <strong>electromagnetic</strong> interference in a typical vehicular envir<strong>on</strong>ment<strong>on</strong> the performance of a direct measurement Tire PressureM<strong>on</strong>itoring System.Internati<strong>on</strong>al Electrotechnical Commissi<strong>on</strong> DocumentsCISPR 12 and CISPR 25: An OverviewPoul Andersen, C<strong>on</strong>sultantThis document presents an overview of CISPR 12 and CISPR 25 anddiscusses some of the changes being made in the new editi<strong>on</strong> of eachdocument currently in the balloting process.Vehicle EMI Integrati<strong>on</strong> Issues Identified by PrecomplianceTest MethodsScott Mee; Sreeniwas Ranganathan; Craig Harder; and Steve Mainville, —Johns<strong>on</strong> C<strong>on</strong>trols Inc.Automotive electr<strong>on</strong>ics systems are becoming increasingly complexeach year. At the same time, interior styling and exterior body trendsare causing these sophisticated electr<strong>on</strong>ics to be packaged in smallerspaces. As a result, vehicle integrati<strong>on</strong> testing has been a focus areafor Original Equipment Manufacturers (OEMs) to ensure there isadequate evaluati<strong>on</strong> of such systems prior to mass producti<strong>on</strong>.Vehicle level integrati<strong>on</strong> testing requires time and extensiveresources to perform. The need for performing additi<strong>on</strong>al vehicletesting and correcting integrati<strong>on</strong> issues can be avoided by performingearly precompliance testing. This paper discusses five uniqueprecompliance test methods that correlate to the vehicle that identifyEMC issues.Evaluating Cell Ph<strong>on</strong>e and Pers<strong>on</strong>al Communicati<strong>on</strong>sEquipment and Their EMC Effects <strong>on</strong> Automotive Audio andIn-Cabin Comp<strong>on</strong>entsCraig Fanning, Elite Electr<strong>on</strong>ic Engineering IncThe purpose of this R&D project was to evaluate current andfuture pers<strong>on</strong>al communicati<strong>on</strong>s technologies and their potentialeffect <strong>on</strong> vehicle comp<strong>on</strong>ents. Al<strong>on</strong>g with the increase in cellph<strong>on</strong>e use in automobiles, the newer and smaller cell ph<strong>on</strong>es canbe placed virtually anywhere within the cabin of the vehicle. As aresult, cell ph<strong>on</strong>es now are being placed in unforeseen locati<strong>on</strong>sand often in close proximity to various electr<strong>on</strong>ic comp<strong>on</strong>ents,giving rise to potential interference and <strong>compatibility</strong> issues.This study focused <strong>on</strong> the frequency range of 800 MHz to 2.5GHz. The analysis generated a summary of the frequency spectrums,modulati<strong>on</strong>s and output power levels used by these technologies.Following completi<strong>on</strong> of the technology evaluati<strong>on</strong>,various types of radiated immunity tests were performed <strong>on</strong> automotivecomp<strong>on</strong>ent samples provided by a variety of manufacturers.The samples had known <strong>compatibility</strong> issues with cell ph<strong>on</strong>eswhen installed in the vehicle. The testing was performed todetermine what type of test, test levels, and carrier signal modulati<strong>on</strong>s,could be used during comp<strong>on</strong>ent level evaluati<strong>on</strong> in orderto identify these potential <strong>compatibility</strong> issues before they reachthe vehicle.AUTOMOTIVE EMC MEASUREMENTSVehicle Active Antennas Face EMC and RF Recepti<strong>on</strong> ChallengesJean-Roger K. Kuvedu-Libla, N/APresently, the vehicle active antennas are facing two big challenges.One of them is to meet the requirements of radio frequency (RF)recepti<strong>on</strong> and the next <strong>on</strong>e is to resp<strong>on</strong>d to <strong>electromagnetic</strong> <strong>compatibility</strong>(EMC) demands at the same time. For that, the questi<strong>on</strong>s thispaper answers are: 1) incorrect c<strong>on</strong>siderati<strong>on</strong> / definiti<strong>on</strong> of theseantennas; 2) influencing parts of the passive antenna structures, forexample the ground influence; and 3) the specificati<strong>on</strong> of necessaryamplifier noise floors and gains.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM27Automotive EMC: Key C<strong>on</strong>cepts for Immunity TestingHeri Rakouth, Delphi Steering Systems; Clane Cammin, DelphiCorporati<strong>on</strong>; and Luke Comstock, Delphi Corporati<strong>on</strong>This paper is aimed at providing the rati<strong>on</strong>ales that gave birth tounique test methods used for both radiated and c<strong>on</strong>ducted immunitytesting. This paper singles out three c<strong>on</strong>cepts: 1) the C<strong>on</strong>stantPeak Amplitude method applied to AM testing, 2) the 4-probe averagingcalibrati<strong>on</strong> method for the Vehicle Radiated Immunity (VRI)test, and 3) the variable injecti<strong>on</strong> probe locati<strong>on</strong> for Bulk CurrentInjecti<strong>on</strong> (BCI) measurements. Derived benefits are harm<strong>on</strong>ic reducti<strong>on</strong>for AM testing, over and under testing avoidance in BCI, andVRI. They are part of the ISO-11451, ISO-11452, and SAE J1113standards since their publicati<strong>on</strong>s in the 1990’s.Development and Evaluati<strong>on</strong> of a Realtime Time-DomainEMI Measurement System for Automotive TestingStephan Braun, Institute for High Frequency Engineering; Martin Aidam,Daimler Chrysler AG; and Peter Russer, Institute for High FrequencyEngineeringTime-Domain EMI measurement systems allow the measurementtime to be reduced by several orders of magnitude. In this paper areal time time-domain EMI measurement system for automotivetesting is presented. Automotive tests require smaller frequency binsand a smaller IF-Bandwidth. In the frequency domain, such measurementstake an extremely l<strong>on</strong>g time, and sometimes they exceedthe life-time of a comp<strong>on</strong>ent. A novel, real-time, time-domain EMImeasurement system is presented that reduces the time for automotivemeasurements by a factor of 8000. By a numerical oscillator inthe signal processing unit, the picket fence effect is reduced.Measurements have been performed <strong>on</strong> comp<strong>on</strong>ents and <strong>on</strong> a completevehicle in the frequency range 30 MHz to 1 GHz. The realtimetime-domain EMI measurement system has been evaluated andassessed in an automotive test envir<strong>on</strong>ment.Improving Automotive Radiated Emissi<strong>on</strong>s RepeatabilityWhen Using Optic Link Bus C<strong>on</strong>vertersFerran Silva; and Marc Arag<strong>on</strong>, — Technical University of Catal<strong>on</strong>iaThis paper analyzes the effect of using an optic link bus c<strong>on</strong>verter inEMC tests. Although the optic link is used to avoid an additi<strong>on</strong>alc<strong>on</strong>ductive c<strong>on</strong>necti<strong>on</strong> to the EUT, the interface could disturb the<strong>electromagnetic</strong> behavior of the EUT bus secti<strong>on</strong>. After showing severalsituati<strong>on</strong>s where the repeatability is compromised in automotiveEMC tests, the paper analyzes the problem with several measurementsand proposes a model to evaluate the effect. A proper positi<strong>on</strong><strong>on</strong> a commercial optic bus link c<strong>on</strong>verter is discussed.AUTOMOTIVE EMC MODELINGTransient Electromagnetic Field Computati<strong>on</strong> in AutomotiveEnvir<strong>on</strong>ments using FDTDPere Riu; Ricardo Jauregui; Ferran Silva; and Mireya Fernandez, —Universitat Politecnica CatalunyaNumerical <strong>electromagnetic</strong> computati<strong>on</strong> at high frequencies in automotiveenvir<strong>on</strong>ments is a challenging problem because of the dimensi<strong>on</strong>sof the problem compared to the wavelength. Results obtainedso far have been presented in the frequency domain. We are presentingcomparis<strong>on</strong>s between calculated and measured transient waveforms,in the time domain, by using a model of a realistic car bodyframe. Results are presented for different settings of grid parametersin the simulati<strong>on</strong>. The agreement of the signals in time and also inthe frequency domain allows us to c<strong>on</strong>clude that such computati<strong>on</strong>sare feasible up to the GHz frequency band and using modest computati<strong>on</strong>resources.EMI Modeling in an Automotive Data Communicati<strong>on</strong>StructureFrank Li, Youngstown State University; Tamer Taher, Youngstown StateUniversity; Jalal Jalali, Youngstown State University; Fred Esenwein,Delphi Packard; Nick Lockard, Youngstown State University; and AndrewPtichkin, Youngstown State UniversityData links are facing more internal and external <strong>electromagnetic</strong>noises due to high speed data communicati<strong>on</strong>s in the automobileindustry. A mathematical model is presented to predicate the EMIin automotive data link circuitries. This model is a useful mechanismthat facilitates the future automotive cable designs in EMIreducti<strong>on</strong>s. Experimental results indicate that the model accuratelypredicts crosstalk-couplings of three, 1.7 meter, standard unshielded,multi-c<strong>on</strong>ductor cables up to 80 MHz where the signal wavelengthis at least two times l<strong>on</strong>ger than the cable length. All experimentaldata are collected inside a fully enclosed NoiseKen tent. The tent isa shielded envir<strong>on</strong>ment that minimizes background noises.Electromagnetic C<strong>on</strong>ductive Interference Characteristics inthe Driving System of a Fuel Cell BusJinliang He; Bo Zhang; Shaofeng Yu; Wei Li; Shuiming Chen; and Y<strong>on</strong>gHuang, — Tsinghua University; Jae-bok Lee; and Sug-hun Chang, —Korea Electrotechnology Research InstituteBased <strong>on</strong> the multic<strong>on</strong>ductor transmissi<strong>on</strong> line model, this paper analyzedthe <strong>electromagnetic</strong> c<strong>on</strong>ductive interference in the driving systemof a fuel cell bus by calculati<strong>on</strong>. Firstly, the propagati<strong>on</strong> characteristicsof the c<strong>on</strong>ductive interference in the cable were analyzed.Then, the comm<strong>on</strong> mode current and its coupling effect were investigated.Finally, the coupling between the driving system and thelow voltage system was researched. The results will be useful forrestricting the <strong>electromagnetic</strong> c<strong>on</strong>ductive interference in the fuelcell bus.A Statistical Model of Noises at the Input Port of an Inverterand its Coupling to a Low Voltage Cable <strong>on</strong> a Fuel Cell BusWei Li; Shaofeng Yu; Bo Zhang; Jinliang He; Y<strong>on</strong>g Huang; ShuimingChen; and R<strong>on</strong>g Zeng, — Tsinghua UniversityThe hybrid electric Bus has some serious EMC problems. A normaldistributi<strong>on</strong> is proved suitable to describe the noise fluctuati<strong>on</strong> <strong>on</strong>the input port of an inverter. Typical noise patterns are summarizedwith seven key parameters. Then crosstalk between the power cablesand nearby signal cables is analyzed with an injecti<strong>on</strong> of these typicalnoises. Time parameters of noises are observed that can influence thecrosstalk significantly. It is c<strong>on</strong>cluded that an update should be madein the present standards for the c<strong>on</strong>ducted emissi<strong>on</strong> limitati<strong>on</strong> <strong>on</strong>vehicles due to their neglect of the time parameters of noise sources.HIGH-VOLTAGE EMCCor<strong>on</strong>a Onset Voltage at High Frequency for an Isolated,Cylindrical ElectrodeWilliam Price, The Boeing Company; John Drapala, The Boeing Company;David Thiel, Griffith University; and Robert Olsen, Washingt<strong>on</strong> StateUniversityCor<strong>on</strong>a <strong>on</strong> antennas or transmissi<strong>on</strong> lines is a significant source of<strong>electromagnetic</strong> interference <strong>on</strong> aircraft. A cor<strong>on</strong>a <strong>on</strong>set criteri<strong>on</strong>,which describes breakdown in n<strong>on</strong>uniform RF fields, is derived fromthe Boltzmann transport equati<strong>on</strong>. Predicti<strong>on</strong>s of cor<strong>on</strong>a <strong>on</strong>set are©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


28EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMmade using recent formulae for net i<strong>on</strong>izati<strong>on</strong>. Measurements of 300MHz cor<strong>on</strong>a <strong>on</strong>set for an isolated, cylindrical electrode were madeand are compared with predicti<strong>on</strong>s. The results c<strong>on</strong>firm that thederived breakdown criteri<strong>on</strong> is a good predictor of RF cor<strong>on</strong>a <strong>on</strong>set at300 MHz for cylindrical geometries where diffusi<strong>on</strong> is the dominantelectr<strong>on</strong> loss mechanism in the range 0.1 < 10 rp


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM29mode interference obtained adopting different discharge points and differentgrounding c<strong>on</strong>figurati<strong>on</strong>s are presented. The influence of positiveand negative discharges <strong>on</strong> the measured interference is verified.Susceptibility of Electr<strong>on</strong>ic Devices to Variable TransientSpectraSven Korte; and Heyno Garbe, — University of HannoverThe subject of this paper is to investigate the susceptibility of microc<strong>on</strong>trollersto single transient signals. It is shown that the principlecoupling of transient field pulses into electr<strong>on</strong>ic systems is limited inbandwidth. In order to investigate the different resulting pulseformsand to estimate the effect <strong>on</strong> the susceptibility of the electr<strong>on</strong>icdevices, a setup is presented that gives the opportunity to emulate thefield coupling in systems with different coupling sizes. The degenerati<strong>on</strong>of the disturbing signals by the input impedance of the chip isgiven attenti<strong>on</strong> as well as <strong>on</strong> the susceptibility of the chip itself.Methodology for the HEMP Clearance of a Modern Air FighterFrank Sabath, WIS; Anth<strong>on</strong>y Wraight, QinetiQ; Alfred Brenner, EADS;and Chris J<strong>on</strong>es, BAE SystemsIn this paper, we will discuss the route to High-altitudeElectromagnetic Pulse (HEMP) qualificati<strong>on</strong> of a modern fighter aircraft.We will describe the clearance process of the EurofighterTypho<strong>on</strong> program and discuss particular aspects due to technical c<strong>on</strong>siderati<strong>on</strong>sand in regard to cost efficiency. The systematic structureof the HEMP clearance process and the overall clearance philosophywill be presented. In order to get relevant informati<strong>on</strong> as early as possiblethe chosen clearance process is based <strong>on</strong> three essential measurementsteps (equipment level qualificati<strong>on</strong>, coupling measurements,and system level test) that are linked together by a predicti<strong>on</strong>algorithm for induced currents and data analysis. The final assessmentprocess employs a set of resp<strong>on</strong>se norms to compare the aircraftresp<strong>on</strong>se with the results of equipment level qualificati<strong>on</strong> testing.Systematic Descripti<strong>on</strong> of the Protecti<strong>on</strong> Capability ofProtecti<strong>on</strong> ElementsRoland Krzikalla, Hamburg University of Technology; Frank Sabath, WIS;and Jan ter Haseborg, Hamburg University of TechnologyHigher demands <strong>on</strong> the safety and stability of electr<strong>on</strong>ic systemsrequire the further development of protecti<strong>on</strong> c<strong>on</strong>cepts against <strong>electromagnetic</strong>interferences. Especially, interferences with an extremelybroad frequency bandwidth combined with very high voltageamplitudes are a serious threat against sensitive electr<strong>on</strong>ic systems.Due to the very high frequency parts of the interference, the behaviorof the n<strong>on</strong>linear protecti<strong>on</strong> circuits that are used depends moreand more <strong>on</strong> parasitic linear comp<strong>on</strong>ents. Therefore it is of specialinterest to know in which circumstances a system can be declared asprotected against <strong>electromagnetic</strong> interferences. For that, a definiti<strong>on</strong>of the term “is protected” has to be discussed due to a definiti<strong>on</strong>of different success levels. These success levels are correlated witheffects that can occur in the system which can also be classified.Together with a descripti<strong>on</strong> of the predicti<strong>on</strong> of effect threshold levelsin complex systems, this paper describes a method for determiningthe protecti<strong>on</strong> capability of possible protecti<strong>on</strong> elements.SPECTRUM MANAGEMENTWireless Mobile Communicati<strong>on</strong> Systems with HighFrequency Efficiency — Without Pilot SignalsMichael Bank, HIT; Jakob Gavan, HIT; and Miriam Bank, N/AMultipath propagati<strong>on</strong> has always been a c<strong>on</strong>siderable technical challengein radio communicati<strong>on</strong> systems with a mobile transmitter ormobile receiver. One of possible opti<strong>on</strong>s to overcome the corresp<strong>on</strong>dingdifficulties is the OFDMA method of data transmissi<strong>on</strong>. It providesrather good performance for the point-to-multipoint transmissi<strong>on</strong>in systems without c<strong>on</strong>siderable Doppler frequency offset.However, increasing of the used frequency band and permanentgrowing of the traffic make Doppler shift influence more and more acritical point in radio modem designs. Here a principally newmethod of multiple access — so called Frequency Bank Signal (FBS)— is proposed. FBS combines the phase shift compensati<strong>on</strong> used inthe PAL-TV system, OFDMA principle, and spread spectrum ideawith Walsh functi<strong>on</strong>s.Ultra Wideband EMI To Legacy ReceiversWilliam Duff, SEMTASThe applicati<strong>on</strong> of FBL technologies to industrial c<strong>on</strong>trols is a logicalstep in the war <strong>on</strong> terrorism. Petroleum plants, chemical plants,mines and other automated industrial c<strong>on</strong>trols are susceptible to <strong>electromagnetic</strong>interference, <strong>electromagnetic</strong> intrusi<strong>on</strong>, and <strong>electromagnetic</strong>pulse (EMP) weap<strong>on</strong>s. C<strong>on</strong>trol of industrial elements such asvalves and pumps cannot be hijacked or impeded by terrorists with<strong>electromagnetic</strong> weap<strong>on</strong>s from outside of the facility if the industrialelements are c<strong>on</strong>trolled via optically switched actuators and passiveoptical sensors <strong>on</strong> inherently EMI immune fiber-optic networks.Interference Characterizati<strong>on</strong> and Mitigati<strong>on</strong> of 5.5 MbpsCCK Wi-Fi SignalsAyham Z. Al-Banna; Xiaoguang Zhou; Tae Ri Lee; Joseph L. LoCicero;and D<strong>on</strong>ald R. Ucci, — ECE Department, Illinois Institute of TechnologyAn exact Power Spectral Density (PSD) expressi<strong>on</strong> is derived forIEEE 802.11b 5.5 Mbps signals using Complementary Code Keying(CCK). The analytical result obtained is verified through computersimulati<strong>on</strong>. The spectral signature of the 5.5 Mbps CCK – modulatedsignal is compared to the PSD of the Barker-spread Wi-Fi signals.The adjacent channel interference power resulting from the 5.5Mbps CCK interferer is introduced and compared to that caused byBarker-spread signals. Adaptive antennas with tapped delay lines areused to mitigate the effect of these interference signals. Optimalranges of the tapped delay lines are found such that performance isrestored at minimum cost.SPECIAL SESSION: WAVEFORM DIVERSITYWhy and What is Waveform Diversity, and How Does itAffect Electromagnetics?John Garnham; and Jaime Roman, — SAICThis paper provides a general overview of the new research area calledwaveform diversity (WD), and it’s potential impact to the EMC community.The scope of research that is c<strong>on</strong>sidered WD is broad in bothtechnical c<strong>on</strong>tent and applicati<strong>on</strong>. The two main applicati<strong>on</strong> areasare radar and communicati<strong>on</strong>s across the RF spectrum. As WDbegins to transiti<strong>on</strong> from theory, to hardware experiments, to testing,and to operati<strong>on</strong>al systems, the effect <strong>on</strong> RF design and EMC analysismay be significant. This paper describes the broad area of WD,why people are researching it, and potential effects <strong>on</strong> EMC. A systemcan perform better in a multi-path fading envir<strong>on</strong>ment than ac<strong>on</strong>venti<strong>on</strong>al (single-channel) communicati<strong>on</strong> system without anymulti-path fading.Waveform Diversity and Electromagnetic CompatibilityGerard Capraro, Capraro Technologies, Inc.; Ivan Bradaric, CapraroTechnologies, Inc.; and Michael Wicks, U. S. Air Force Research Lab©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


30EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMWaveform diversity in multistatic radar systems can enhance distributedradar system performance. Dynamically changing the <strong>electromagnetic</strong>emanati<strong>on</strong>s of radar and communicati<strong>on</strong>s systems, however,poses an <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) challenge. Dataare provided illustrating how waveform diversity improves multistaticradar system performance. An approach for maintaining EMC ina dynamically changing envir<strong>on</strong>ment is also provided.Detecti<strong>on</strong>/Imaging of Buried Objects: Using Spatial/AngularDiversity with Distributed/Embedded Sub-Surface Sensorsfor Reduced Mutual Coupling and Suppressed EMEmissi<strong>on</strong>sJohn Norgard, U. S. Air Force Research Lab/SNRT; Kevin Magde, U. S.Air Force Research Lab/Sensors Directorate; Michael Wicks, U. S. Air ForceResearch Lab/Sensors Directorate; Andrew Drozd, ANDRO Computati<strong>on</strong>alSoluti<strong>on</strong>s, LLC; and Randall Musselman, U. S. Air Force AcademyThe proliferati<strong>on</strong> of strategic subsurface sanctuaries has increased theneed for enhanced remote sensing techniques providing for the accuratedetecti<strong>on</strong> and identificati<strong>on</strong> of deeply buried objects. A new RFTomographic Technique is proposed in this c<strong>on</strong>cept paper for developingRF CAT Scans of buried objects using spectral, spatial/angular,and polarizati<strong>on</strong> diversity. This imaging technique uses an embeddedring of subsurface radiators, delivered by earth-penetrating, n<strong>on</strong>explosive,electr<strong>on</strong>ic “e-bombs”, as the source of str<strong>on</strong>g undergroundradiated transmissi<strong>on</strong>s and uses distributed surface-c<strong>on</strong>tact sensors tocollect the tomographic data for relay to a circling UAV and transmissi<strong>on</strong>to a remote c<strong>on</strong>trol site (using layered sensing). Threedimensi<strong>on</strong>alimaging algorithms are being developed to detect,image, and characterize deeply buried targets. Distributed transmittersand receivers significantly increase unwanted mutual couplingand EM emissi<strong>on</strong>s that interfere with signal recepti<strong>on</strong>. However, byembedding the transmitters underground, reduced mutual couplingand EM emissi<strong>on</strong>s (and improved signal-to-noise ratios) can beachieved. Simple surface SAR experiments over deep mine shaftshave been performed to validate the 3D processing algorithms using2D surface SAR sensor data. WIPL-D models have also been used tosimulate the embedded and distributed sensors and to verify the significantenhancement in the received signal-to-noise ratio obtainedby burying the radiating ring under the surface sensors.Electromagentic Diversity and EMI Implicati<strong>on</strong>s for MultipleCo-Sited Radars and Targeting Applicati<strong>on</strong>sAndrew Drozd, ANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>s, LLC; IrinaKasperovich, ANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>s, LLC; Ruixin Niu,Syracuse University; and Pramod Varshney, Syracuse UniversityReal-time fusi<strong>on</strong> of data collected from a variety of co-located radarsthat acquire informati<strong>on</strong> in a cooperative manner from multiple perspectivesand/or different frequencies, is being shown to provide amore accurate and effective way of tracking complex targets in amulti-target scenario. This is more advantageous than employing asingle radar or a group of radars operating independently. This paperdescribes a cooperative multi-sensor approach in which multipleradars operate together in a n<strong>on</strong>-interference limited manner. Athree-fold approach is presented: (i) applying multiobjective jointoptimizati<strong>on</strong> algorithms to set limits <strong>on</strong> the operati<strong>on</strong>al parametersof the radars to preclude <strong>electromagnetic</strong> interference; (ii) measuringand processing radar returns in a shared manner for target featureextracti<strong>on</strong> based <strong>on</strong> <strong>electromagnetic</strong> diversity principles in c<strong>on</strong>juncti<strong>on</strong>with target scattering cross secti<strong>on</strong>s; and (iii) employing featureaidedtrack/fusi<strong>on</strong> algorithms to detect, discriminate, and follow realtargets from clutter noise. The results of computer simulati<strong>on</strong>s areprovided that dem<strong>on</strong>strate the advantages of this approach.The True Meaning of Electromagnetic Diversity SeenThrough the First Principles of Fundamental PhysicsTapan K. Sarkar, Department of Electrical Engineering and ComputerScience, Syracuse UniversityThe word Diversity in the dicti<strong>on</strong>ary implies variety in form. Andthe basic c<strong>on</strong>cept derived from these principles is that if <strong>on</strong>e has multiplecopies of the same system, presumably <strong>on</strong>e would have a betterchance of achieving the desired goals. The fundamental problemwith this simplistic way of reas<strong>on</strong>ing is that <strong>on</strong>e needs to understandthe physical envir<strong>on</strong>ment where such an experiment needs to be carriedout and how <strong>on</strong>e should interpret the final result. The currentstate of the art applies some statistical framework to the physicalscene to explain the added advantage of diversity. To appreciate thetrue physical significance of diversity we have to go back to the roots!We need to understand first, what the statistical framework impliesand sec<strong>on</strong>dly, how it relates to the problem at hand.Distributed and Layered Sensing: Relevant EMC IssuesMichael Wicks; and William Moore, — U. S. Air Force ResearchLab/Sensors DirectorateOne can easily envisi<strong>on</strong> future military operati<strong>on</strong>s and emergingcivilian requirements (e.g. intelligent unmanned vehicles for urbanwarfare, and intelligent manufacturing plants) that will be both complexand stressing and will demand innovative sensors and sensorc<strong>on</strong>figurati<strong>on</strong>s. The goal of our research into Distributed and LayeredSensing is to develop a cost effective and extendable approach for providingsurveillance for a variety of applicati<strong>on</strong>s in dynamically changingmilitary and civilian envir<strong>on</strong>ments. Within Distributed andLayered sensing, we foresee a new sensor archetype. In this paradigm,sensors and algorithms will be aut<strong>on</strong>omously altered depending <strong>on</strong>the envir<strong>on</strong>ment. Radars will use the same returns to perform detecti<strong>on</strong>and discriminati<strong>on</strong>, to adjust the platform flight path, andchange missi<strong>on</strong> priorities. The sensors will dynamically and automaticallychange waveform parameters to accomplish these goals.Disparate sensors will communicate and share data and instructi<strong>on</strong>sin real-time. Intelligent sensor systems will operate within andbetween sensor platforms such that the integrati<strong>on</strong> of multiple sensordata provides informati<strong>on</strong> needed to achieve dynamic goals andavoid <strong>electromagnetic</strong> fratricide. Intelligent sensor platforms workingin partnership will increase informati<strong>on</strong> flow, minimize ambiguities,and dynamically change multiple sensors’ operati<strong>on</strong>s basedup<strong>on</strong> a changing envir<strong>on</strong>ment. C<strong>on</strong>comitant with the current emphasis<strong>on</strong> more flexible defense structures, Distributed and Layered sensingwill allow the appropriate incremental applicati<strong>on</strong> of remotesensing assets by matching resources to the situati<strong>on</strong> at hand.Effect of In-Band Intermodulati<strong>on</strong> Interference <strong>on</strong> Direct-Sequence Spread Spectrum (DSSS) Communicati<strong>on</strong>Systems for Electromagnetically Diverse Applicati<strong>on</strong>sIlteris Demirkiran, Embry-Riddle Aer<strong>on</strong>autical University; D<strong>on</strong>ald Weiner,Syracuse University; and Andrew Drozd, ANDRO Computati<strong>on</strong>alSoluti<strong>on</strong>s, LLCThe goal of this paper is to analyze the effect of n<strong>on</strong>linearities <strong>on</strong> theperformance of direct-sequence spread spectrum systems in the c<strong>on</strong>textof <strong>electromagnetic</strong>ally diverse applicati<strong>on</strong>s. Inter-modulati<strong>on</strong>products due to n<strong>on</strong>linear amplificati<strong>on</strong> are analyzed and the effect ofn<strong>on</strong>linearities is illustrated by means of a computer simulati<strong>on</strong> result.For the performance measure, bit-error rate (BER) is c<strong>on</strong>sidered toassess the effect of in-band intermodulati<strong>on</strong> interference. The findingsof this study will be of benefit to the waveform diversity community.This community is c<strong>on</strong>cerned with assessing the effects of©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 31multiple RF sensor and communicati<strong>on</strong> systems used for enhancingcooperative target tracking and engagement. This involves multipleradars and communicati<strong>on</strong> systems that process acquired informati<strong>on</strong>in real time. The optimum performance, operati<strong>on</strong>, and availabilityof these systems are assured through the applicati<strong>on</strong> of adaptivespread spectrum waveforms and <strong>electromagnetic</strong> diversity schemesderived for the RF communicati<strong>on</strong>s problem.Polarizati<strong>on</strong> Diversity for Detecting Targets in HeavyInhomogeneous ClutterMartin Hurtado; and Arye Nehorai, — Department of Electrical andSystems Engineering, Washingt<strong>on</strong> University in St. LouisPolarizati<strong>on</strong> diversity has proved to be a useful tool for radar detecti<strong>on</strong>,especially when discriminati<strong>on</strong> by Doppler Effect is not possible. Inthis paper, we address the problem of improving the performance ofpolarimetric detectors for targets in heavy inhomogeneous clutter.First, we develop a polarimetric detecti<strong>on</strong> test that is robust to inhomogeneousclutter. We run this polarimetric test against syntheticand real data to assess its performance in comparis<strong>on</strong> with existingpolarimetric detectors. Then, we propose a polarimetric waveformdesignalgorithm to further improve the target-detecti<strong>on</strong> performance.A numerical analysis is presented to dem<strong>on</strong>strate the potentialperformance improvement that can be achieved with this algorithm.EM MATERIALSMethod of Measuring Permittivity of Composite Materialswith Hexag<strong>on</strong>al Ferrite Inclusi<strong>on</strong>sAlexander Kitaitsev, Moscow Power Engineering Institute (TechnicalUniversity); Gylnara Zhumabaeva, Moscow Power Engineering Institute(Technical University); and Marina Koledintseva, University of Missouri-RollaAn <strong>electromagnetic</strong> shielding of objects using ferrite-graphite compositesis c<strong>on</strong>sidered. An analytical model using the Maxwell Garnettformulati<strong>on</strong> for multiphase mixtures was made, and the results ofcomputati<strong>on</strong>s based <strong>on</strong> this model and plane-wave formulati<strong>on</strong>, andalso some experimental results, are represented.Effective Properties of Carb<strong>on</strong> Fiber Composites: EMModeling Versus Experimental TestingIgor De Rosa; Fabrizio Sarasini; and Maria Sabrina Sarto, — Universityof Rome “La Sapienza”This paper discusses the critical issues related to the practical applicati<strong>on</strong>of the Maxwell-Garnett approach to the <strong>electromagnetic</strong> modelingof the effective electric permittivity of diluted carb<strong>on</strong> fiber reinforcedcomposites. In fact, recent studies have highlighted the interestin the use of such composites as a lossy sheet in broad-band dielectricabsorbing screen in the gigahertz range. The a.c. electrical c<strong>on</strong>ductivityof the carb<strong>on</strong> fibers embedded in epoxy resin is determined from thebest-fit between the data obtained from the experimental tests and the<strong>on</strong>es obtained from the <strong>electromagnetic</strong> modeling. Two different manufacturingprocesses of the test samples are investigated: pouring anddipping. Results show that, in the frequency range from 9 GHz to 12GHz, carb<strong>on</strong> fibers having a length of a few millimeters embedded inepoxy resin are characterized by a c<strong>on</strong>stant value of the a.c. electricalc<strong>on</strong>ductivity <strong>on</strong>ly in the case of the sample preparati<strong>on</strong> by pouring.Shielding Effectiveness of a Metamaterial SlabGiampiero Lovat; and Paolo Burghignoli, — University of Rome “LaSapienza”A study of the shielding properties of a metamaterial slab is presented.The metamaterial nature of the slab arises from the negative values of itseffective scalar dielectric permittivity in the c<strong>on</strong>sidered low frequencyregi<strong>on</strong> of operati<strong>on</strong>. Such an effective permittivity is the result of ahomogenizati<strong>on</strong> process of an actual periodic structure which c<strong>on</strong>sists ofa finite number of periodic layers of thin c<strong>on</strong>ducting cylinders embeddedin a dielectric matrix, screening an E-polarized plane wave. Whenthe incident plane wave is arbitrarily polarized, a more sophisticatedmodel for the effective permittivity has to be employed which takes intoaccount anisotropy and spatial dispersi<strong>on</strong>. Comparis<strong>on</strong>s with c<strong>on</strong>venti<strong>on</strong>alplanar metal screens show that the proposed structure can bedesigned to be advantageous in terms of low density and weight savings.Development of Lightweight Solid Phantom Composed ofSilic<strong>on</strong>e Rubber and Carb<strong>on</strong> NanotubesTakashi Hikage; Toshio Nojima; and Yuki Sakaguchi, — HokkaidoUniversity; and Yuji Koyamashita, Fine Rubber Laboratories Co., Ltd.A lightweight human phantom material that has a specific gravity below1.0 is newly developed and a full sized realistic shaped human phantommodel is c<strong>on</strong>structed using this material. Fundamental material compositesare carb<strong>on</strong> nanotubes and silic<strong>on</strong>e rubber. The carb<strong>on</strong> nanotubesenable this material to simulate various biological tissues with less specificgravity values than those of original <strong>on</strong>es. In additi<strong>on</strong>, using the silic<strong>on</strong>erubber allows us to c<strong>on</strong>struct phantom models of various shapes.This paper describes the design principle and estimates the relati<strong>on</strong>between complex permittivity and compositi<strong>on</strong> ratio of the materialexperimentally. Finally, a full sized realistically shaped human phantommodel is c<strong>on</strong>structed to show the features of the proposed material.Broad Band Electromagnetic Absorpti<strong>on</strong> of Flexible Foils inthe High Frequency RangePeter Goernert; Petra Payer; Oleksiy Surzhenko; and Lothar Michalowsky,— Innovent e.V.; Hanspeter Heegn; and Ernst Madai, — UVR-FIAFoils filled with c<strong>on</strong>ductive and magnetic materials are developed forabsorpti<strong>on</strong> of microwaves. The foils have a thickness of 0.5 to 1.5 mmand a basic compositi<strong>on</strong> of 25 wt.% polyethylene, 9 wt.% carb<strong>on</strong>, and66 wt.% inorganic filler of a very different nature. The absorbedpower is determined from measurements of reflexi<strong>on</strong> and transmissi<strong>on</strong>with a closed coaxial measuring technique in the frequency range of40 MHz to 1 GHz. Transmissi<strong>on</strong> measurements are carried out from700 MHz to 18 GHz and 50 to 75 GHz. Foils with thicknesses ofabout 1 mm absorb more than 30% of the incident power.Res<strong>on</strong>ance Suppressi<strong>on</strong> in Enclosures with a Metallic-Lossy Dielectric Layer by Means of Genetic AlgorithmsAnt<strong>on</strong>io Lozano, Universidad Politécnica de Cartagena; Alejandro Diaz-Morcillo, UPCT; and Juan Balbastre-Tejedor, UPVC<strong>on</strong>ductive plastics have become an alternative to traditi<strong>on</strong>al metalliccabinets for shielding boxes from <strong>electromagnetic</strong> interferences. Thesematerials allow a wide range of c<strong>on</strong>ductivities that can satisfy any particulardesign. A design with an outer metallic layer and an inner layer ofc<strong>on</strong>ductive dielectric can obtain advantages from both materials. In thispaper the damping of res<strong>on</strong>ances in enclosures with an aperture throughc<strong>on</strong>ductive dielectrics is evaluated by means of Genetic Algorithms withthe aid of a three dimensi<strong>on</strong>al simulati<strong>on</strong> tool. Genetic Algorithms area general purpose optimizati<strong>on</strong> technique widely used in the last years for<strong>electromagnetic</strong> design. The relati<strong>on</strong>ship between obtained soluti<strong>on</strong>sand skin depth parameter is shown to help in design procedures.ELECTROMAGNETIC BANDGAP STRUCTURESMiniaturizati<strong>on</strong> of Electromagnetic Bandgap (EBG)Structures with High-Permeability Magnetic Metal FilmYoshitaka Toyota; Kengo Iokibe; and Ryuji Koga, — Okayama University;©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


32EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMArif Ege Engin; Tae H<strong>on</strong>g Kim; and Madhavan Swaminathan, — GeorgiaInstitute of TechnologyElectromagnetic bandgap (EBG) structures in a parallel plane pair arequite effective for suppressing simultaneous switching noise, buttheir size is large to apply to compact electr<strong>on</strong>ic devices. The authorshave so far investigated the miniaturizati<strong>on</strong> of EBG structures by twoapproaches: 1) two narrow slits <strong>on</strong> each patch; and 2) use of a high-Kmaterial for a thin dielectric layer. In this paper, furthermore, a thirdapproach was investigated: the inserti<strong>on</strong> of a high-permeability magneticmetal sheet between the parallel plane pair. As a result, theminiaturizati<strong>on</strong> of 10 % was achieved by performing these threeapproaches simultaneously.EMI Suppressi<strong>on</strong> in Microprocessor Packages UsingMiniaturized Electromagnetic Bandgap Structures withHigh-k DielectricsBaharak Mohajer Iravani, University of Maryland; and Omar Ramahi,University of WaterlooA novel miniaturized planar <strong>electromagnetic</strong> bandgap (EBG)structure is proposed for microprocessor packages. The design ofthe proposed EBG structure c<strong>on</strong>sisting of meander lines andpatches are based <strong>on</strong> the use of high-k dielectric material with arelative permeability greater than or equal to 100. High-k dielectricmaterial increases the effective capacitance of the EBG cell incomparis<strong>on</strong> to comm<strong>on</strong>ly used materials with a much lowerdielectric c<strong>on</strong>stant. Simulati<strong>on</strong> results are provided to show thatusing the proposed EBGs with periodicities less than 2 mm; it ispossible to obtain a very wide stop band (~10 GHz) in additi<strong>on</strong>to more than 10 times in unit cell size reducti<strong>on</strong>. This widebandgap can cover the operating frequency of current processorsand a wide range of the res<strong>on</strong>ant frequencies of a typical package.Simplified Computati<strong>on</strong> of Electromagnetic Band-GapProperties of Via-Holed Metal PatchesJens Bornemann, University of Victoria; Karumudi Rambabu, N/A; andMarjan Mokhtaari, University of VictoriaAn extended analytical method for the analysis and design of <strong>electromagnetic</strong>band-gap (EBG) structures formed by via-holed metalpatches is presented. C<strong>on</strong>trary to a known approach, this techniquecorrectly predicts the first stopband, which is often utilized in printedantenna applicati<strong>on</strong>s and, therefore, significantly extends the frequencyrange of applicati<strong>on</strong>. The approach is verified by comparis<strong>on</strong>with results of commercially available software.Noise Suppressi<strong>on</strong> in High Speed Digital Circuits by Meansof a Novel EBG Structure with Triangle Patches andHexag<strong>on</strong>al ArraysAnt<strong>on</strong>io Ciccomancini, CST of AmericaThe aim of this paper is to describe the simultaneous switchingnoise (SSN) mitigati<strong>on</strong> by means of a novel <strong>electromagnetic</strong> bandgap (EBG) structure with triangle patches and hexag<strong>on</strong>al arrays.The proposed EBG achieves -40 dB of stop band in the range 6.5to 9 GHz. Parametric studies including the radius effect of themetal plated vias and the substrate thickness are performed bymeans of full wave simulati<strong>on</strong>s. The impact of the proposed design<strong>on</strong> the signal integrity is also investigated both in time (eye-diagramsand TDR) and frequency domain (S-parameters). Finally,dispersi<strong>on</strong> diagram and mode pattern distributi<strong>on</strong> of the singularunit EBG cell are analyzed by means of eigenmode solver and periodicboundary c<strong>on</strong>diti<strong>on</strong>s.PRODUCT SAFETY TESTINGHow to Perform EMI Testing within an Existing EMI Chamber<strong>on</strong> an EUT with Low Particle Count Cleanliness RequirementsLarry Freeman, Harris Corporati<strong>on</strong>The ability to perform EMI measurements <strong>on</strong> an EUT having cleanlinessrequirements has represented a significant obstacle for manycompliance testing agencies. Whether due to inexperience or c<strong>on</strong>cernwith overly restrictive requirements, many agencies simplydecline the opportunity outright. This paper details the approachand techniques used to gauge viability of performing EMI measurementtesting <strong>on</strong> high reliability hardware with low particle count,clean room requirements. The main emphasis is <strong>on</strong> exploring variousopti<strong>on</strong>s, outlining and weighing the benefits of each technique,as well as determining the pertinent parameters involved with makinga clean envir<strong>on</strong>ment within an EMI chamber capable of performingEMI measurements.Medical Equipment Immunity Assessment by Time DomainAnalysis Applicati<strong>on</strong> to GSM SignalsMireya Fernandez Chimeno, GCEM-UPC; Miguel Angel GarciaG<strong>on</strong>zalez, UPC; and Ferran Silva, GCEM-UPCThis paper presents a measurement method to assess the immunity ofmedical equipment (bioelectrical signal recording systems) to shortdurati<strong>on</strong> interferences, like that of a GSM signal during the callestablishment and ringing phase. Frequency domain measurementmethods do not allow the analysis of these signals due to their shortdurati<strong>on</strong> and transient nature. To measure these interferences we usethe intermediate frequency (IF) signal output of a spectrum analyzerworking in “zero span” to obtain a signal in the time domain, and wec<strong>on</strong>nect it to the input of a digital oscilloscope. Then, we demodulatethe IF signal to obtain the interference in base band. The combinati<strong>on</strong>of the characteristics of both instruments allow us to measurethe interfering signal and to assess the effect of these kinds of signalsin medical systems that record low-level, low-frequency signals.Sensor Development and Data Collecti<strong>on</strong> for Hero TestingJohn Chavarria, White Sands Missile RangeThis paper provides a method for assembling Hazards ofElectromagnetic Radiati<strong>on</strong> to Ordnance (HERO) testing instrumentati<strong>on</strong>and data collecti<strong>on</strong>. During HERO testing, inert ordnance isexposed to high <strong>electromagnetic</strong> fields based <strong>on</strong> criteria set by militarystandards. Specialized sensors are developed using fiber-opticthermocouples and unique molding methods to m<strong>on</strong>itor critical areasfor induced currents. The sensor is calibrated against a known currentto provide a calibrati<strong>on</strong> curve used during test data collecti<strong>on</strong>.Frequency, field intensities, and current levels are used to calculatemaximum exposure levels and safety factors. The data is then formattedinto a table suitable for inclusi<strong>on</strong> in the test report based <strong>on</strong>military standards. This document will discuss the aspects of thistesting to include equipment utilized, the development of sensors,calibrati<strong>on</strong>, test setup, data collecti<strong>on</strong>, and display format.Recent Developments in Standardizati<strong>on</strong> Related to EMCand Functi<strong>on</strong>al SafetyBernd Jaekel, Siemens AGIssues related to <strong>electromagnetic</strong> <strong>compatibility</strong> are dealt with in abroad range of standards, whereas the main focus lies in the IEC61000-X-Y series of EMC documents, and this series is furtheraccompanied by a lot of product specific standards. For several years,the topic of functi<strong>on</strong>al safety of electrical and electr<strong>on</strong>ic systems has©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 33become more and more important. This topic is related to EMCinsofar as an adequate immunity against <strong>electromagnetic</strong> phenomenais required to prevent safety-related systems, and the equipment usedin them from being harmfully affected, i.e. the need to avoid anunsafe behavior of such systems when being exposed to <strong>electromagnetic</strong>phenomena. Hence, the need was identified to merge the topicsof EMC and functi<strong>on</strong>al safety, respectively, not <strong>on</strong>ly from a technicalpoint of view, but also in terms of standardizati<strong>on</strong>. This paperdescribes the current situati<strong>on</strong> regarding standards dealing with bothareas and discusses the challenges that appear in the frame of workingout standards c<strong>on</strong>sidering the approaches in both the areas appropriately.Validati<strong>on</strong>, Verificati<strong>on</strong> and Immunity Testing Techniquesfor EMC for Functi<strong>on</strong>al SafetyKeith Armstr<strong>on</strong>g, Cherry Clough C<strong>on</strong>sultantsSafety systems must maintain low risks over their lifetimes. Where<strong>electromagnetic</strong> interference (EMI) could affect risks, an adequatelevel of <strong>electromagnetic</strong> (EM) performance is required. This isknown as “<strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) for Functi<strong>on</strong>alSafety”. It is not practical to prove that systems are safe enough solelyby EM testing. In all technical areas (including software) safetyrequires appropriate design, validati<strong>on</strong>, and verificati<strong>on</strong> techniques,including testing. This paper briefly describes validati<strong>on</strong>, verificati<strong>on</strong>,and immunity testing techniques for EMC Functi<strong>on</strong>al Safety.Many of these techniques can also help c<strong>on</strong>trol envir<strong>on</strong>mental, financial,or security risks in high-reliability, missi<strong>on</strong>-critical, or legalmetrology systems.A Novel Assessment Methodology for the EMI Occurrencein Implantable Medical Devices Based Up<strong>on</strong> Magnetic FluxDistributi<strong>on</strong> of RFIDShunichi Futatsumori; Takashi Hikage; and Toshio Nojima, — GraduateSchool of Informati<strong>on</strong> Science and Technology, Hokkaido University; BenKoike, Japan Automatic Identificati<strong>on</strong> Systems Associati<strong>on</strong>; HiroshiFujimoto; and Takeshi Toyoshima, — Medtr<strong>on</strong>ic Japan Co., Ltd.With respect to the EMI affecting implantable medical devicescaused by Radio Frequency Identificati<strong>on</strong> Reader/Writers (RFIDR/W), experimental investigati<strong>on</strong>s are c<strong>on</strong>ducted to develop a riskassessment methodology based up<strong>on</strong> the measurement of the EMFdistributi<strong>on</strong> around RFID R/W. First, fundamental EMI occurrencemechanisms of implantable cardiac pacemakers and implantable cardioverter-defibrillators(ICD) are described. Sec<strong>on</strong>d, the characteristicsof the radio wave emitted by the RFID R/W are described. Next,EMI test experiments and measurements of the field distributi<strong>on</strong>s areperformed. Then, a novel experimental assessment methodology isproposed. The EMI characteristics derived from magnetic flux distributi<strong>on</strong>sare compared with the experimental results to c<strong>on</strong>firm theeffectiveness of the proposed methodology. Finally, it is shown thatthe probability of EMI occurrence can be estimated using the statisticalprocessing of the proposed methodology.Noise Immunity in Electroencephalogram (EEG) Recordingsat High-Field Magnetic Res<strong>on</strong>ance Imaging (MRI)Giorgio B<strong>on</strong>massar; Hernan Millan; Patrick Purd<strong>on</strong>; and John Belliveau,— Harvard Medical SchoolMedical instruments designed specifically for Magnetic Res<strong>on</strong>anceImaging (MRI) often require very high noise immunity levels toavoid any interference with the MRI system. Specifically, an MRIartifact or inappropriate object-like noise in a regi<strong>on</strong> of the imageshould be avoided since it may be misdiagnosed as pathology. In thispaper we describe a system for recording electroencephalogram(EEG) and Electrophysiology signals for artifact free images at highfieldMRI. The EEG/MRI System includes a 1 GHz shield that hasbeen tested <strong>on</strong> humans with fields up to 7 Tesla.SAR MEASUREMENTS AND MODELSStudy of Using Fracti<strong>on</strong>al Spherical Phantom <strong>on</strong> SAR Evaluati<strong>on</strong>K. H. Chan; L. C. Fung; C. K. Tang; W. K. Lam; S. W. Leung; and Y.M. Siu, — City University of H<strong>on</strong>g K<strong>on</strong>gA fracti<strong>on</strong>al head model can effectively reduce the computati<strong>on</strong>aleffort of Specific Absorpti<strong>on</strong> Rate (SAR) calculati<strong>on</strong>s, which are usuallyextremely complicated and time demanding. This paper studiesthe uses of a reduced-size fracti<strong>on</strong>al phantom head model for SARevaluati<strong>on</strong>. The effect of the fracti<strong>on</strong>al spherical phantom heads <strong>on</strong>the antenna performance and the SAR value are studied by using theFinite- Difference Time-Domain (FDTD) method. Results haveshown that both the return loss and the radiati<strong>on</strong> pattern of themobile ph<strong>on</strong>e antenna are <strong>on</strong>ly slightly affected by the fracti<strong>on</strong>al headmodel for almost all cases when the phantom head is truncated to notmore than 25% in volume. Results have also indicated that the percentagedifference in the SAR value for the full head model and thefracti<strong>on</strong>al head model is less than 5%.Relati<strong>on</strong>ship Between Temperature Elevati<strong>on</strong> and SpatialAverage SAR in Japanese Human Head Model Due toDipole AntennaAkimasa Hirata; Kazuyuki Shirai; and Osamu Fujiwara, — Departmentof Computer Science and Engineering, Nagoya Institute of TechnologyThis study investigated the relati<strong>on</strong>ship between temperature elevati<strong>on</strong>and spatial average SAR (specific absorpti<strong>on</strong> rate) in a Japanesehead model due to a dipole antenna. Much attenti<strong>on</strong> is paid to theeffect of averaging mass <strong>on</strong> the relati<strong>on</strong>ship. As a main result, SARaveraged over 10g of tissue, and was better than that of 1g for correlatingwith temperature elevati<strong>on</strong>. The rati<strong>on</strong>ale for this wasexplained in terms of Green’s functi<strong>on</strong> for the bioheat equati<strong>on</strong>.Numerical Predicti<strong>on</strong> of SAR and Thermal Elevati<strong>on</strong> in a0.25-mm 3-D Model of the Human EyeC<strong>on</strong>cettina Buccella; Valerio De Santis; and Mauro Feliziani, —University of L’AquilaA numerical study is proposed to compute the specific absorpti<strong>on</strong>rate (SAR) and maximum temperature increase in the human eye dueto RF fields. A very accurate procedure is proposed using a very finediscretizati<strong>on</strong> in the calculati<strong>on</strong>s. The human eye is discretized by0.25 mm cubic cells so that many eye tissues can be c<strong>on</strong>sidered. The3-D model permits the predicti<strong>on</strong> of the SAR and thermal elevati<strong>on</strong>according to the ICNIRP limits for occupati<strong>on</strong>al and general publicexposures.SA/SAR Analysis for UWB PulseJianqing Wang, Nagoya Institute of TechnologyWith the rapid progress of electr<strong>on</strong>ic and informati<strong>on</strong> technology, anexpectati<strong>on</strong> for the realizati<strong>on</strong> of body area network (BAN) by meansof ultra wide band (UWB) techniques has risen. Although the signalfrom a single UWB device is very low, the energy absorpti<strong>on</strong> mayincrease significantly when many UWB devices are simultaneouslyadorned to a human body. An analysis method is therefore requiredfrom the point of view of biological safety evaluati<strong>on</strong>. In this study,we proposed two approaches, <strong>on</strong>e was in the time domain and theother was in the frequency domain, for the specific energy absorpti<strong>on</strong>©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


34EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM(SA) and specific absorpti<strong>on</strong> rate (SAR) calculati<strong>on</strong>. We dem<strong>on</strong>stratedthat the two approaches have the same accuracy but the timedomainapproach is more straightforward in the numerical analysis.We also showed some SA/SAR calculati<strong>on</strong> results for a UWB pulseexposure to an anatomical human body model.BIOLOGICAL EFFECTSEnabling the Use of Broadband Tissue Equivalent Liquidsfor Specific Absorpti<strong>on</strong> Rate MeasurementsMark Douglas; and Chung-Kwang Chou, — Motorola LabsThe aim of this study is to determine a robust predicti<strong>on</strong> algorithmfor the change in SAR due to deviati<strong>on</strong>s in the complex permittivityof a homogeneous phantom from standardized reference values.Several antenna sizes and distances to the phantom are investigatedso as to study a large range of SAR distributi<strong>on</strong>s. Simulati<strong>on</strong>s usingthe Moment Method are presented. Results are analyzed over a frequencyrange of 30 to 6000 MHz. It is dem<strong>on</strong>strated that the predicti<strong>on</strong>algorithm, while developed using dipole antennas, worksequally well for realistic wireless devices. Employing the predicti<strong>on</strong>algorithm reduces the SAR measurement uncertainty due to permittivitychanges, thereby improving the reproducibility of SAR complianceassessment between laboratories. Another benefit of the algorithmis that it enables SAR measurement standards committees torelax their tolerances <strong>on</strong> the complex permittivity from defined targets,which allows for the use of broadband tissue equivalent liquids,thus reducing the cost of SAR measurement. The method presentedin this paper has been adopted for inclusi<strong>on</strong> in the next revisi<strong>on</strong>s ofthe IEEE 1528 and IEC 62209 measurement standards.Electromagnetic Field Radiati<strong>on</strong> of Mobile Ph<strong>on</strong>e Inside aMetallic EnclsoureC. K. Tang; W. K. Lam; K. H. Chan; L. C. Fung; S. W. Leung; and Y.M. Siu, — City University of H<strong>on</strong>g K<strong>on</strong>gA numerical study <strong>on</strong> the <strong>electromagnetic</strong> (EM) field radiati<strong>on</strong> of amobile ph<strong>on</strong>e inside a metallic enclosure, from the human safetyaspect, is presented in this paper. The study <strong>on</strong> the effects of a numberof human bodies and their positi<strong>on</strong>s inside the metallic enclosure<strong>on</strong> the induced E-field was carried out. Results have shown that theE-field induced <strong>on</strong> the human head of a mobile ph<strong>on</strong>e user is not sensitiveto the loadings of human bodies inside the metallic enclosure.However, the E-field induced away from the mobile ph<strong>on</strong>e user thatc<strong>on</strong>tributes to the E-field exposure of other people nearby is significantlychanged for different human capacities inside the metallicenclosure. Results have also indicated that the E-field induced <strong>on</strong> thehuman head of a mobile ph<strong>on</strong>e user would be increased by 34% whenother people using mobile ph<strong>on</strong>es are in proximity to the c<strong>on</strong>ductingwalls of the metallic enclosure.Inter-Laboratory Comparis<strong>on</strong> Results of the ProficiencyTesting Program of EMI Test Sites in JapanKunihiro Osabe, Voluntary EMC Laboratory Accreditati<strong>on</strong> Center, Inc.Recently, an inter-laboratory comparis<strong>on</strong> of the proficiency testingprogram based <strong>on</strong> the ISO/IEC Guide 43-1 was performed at EMItest sites in Japan by VLAC (Voluntary EMC LaboratoryAccreditati<strong>on</strong> Center Inc.), the Japanese Accreditati<strong>on</strong> Body for EMCtest laboratories. A comb generator operated by AC mains was usedfor the artifact, since the technical proficiency of EMI measurementcannot be evaluated unless both of the c<strong>on</strong>ducted emissi<strong>on</strong>s and theradiated emissi<strong>on</strong>s are measured am<strong>on</strong>g the EMI test laboratories.This program, therefore, was performed to measure the c<strong>on</strong>ductedemissi<strong>on</strong> noise from the switching regulator incorporated into thepower supply circuit of the artifact, and to measure the radiated noiseemitted from the comb generator itself through the enclosure and ACmains cable. For the radiated emissi<strong>on</strong>s measurements, the artifactwas c<strong>on</strong>nected through the VHF-Line Impedance Stabilizati<strong>on</strong>Network (LISN) to the supply and the AC mains. That is, the comm<strong>on</strong>mode impedance of of the mains power supply was specified toall participating test sites for the radiated emissi<strong>on</strong>s measurements.As a result of this program, the distributi<strong>on</strong> width of the collecteddata from the group was kept from 6 dB to 10 dB, therefore it waseasy to find the laboratory which had isolated data from the group.Testing Large Industrial Systems, Preparati<strong>on</strong>s andTechniquesKenneth Bost<strong>on</strong>, L S Research LLCThe success of EMC tests of large systems, machines which cannot beaccommodated within the typical EMC laboratory envir<strong>on</strong>ment,depends <strong>on</strong> several factors, which will require careful planning in theinitial stages of the project. Several of the issues surrounding theplanning, staging, and testing of these types of systems will be discussed,and various observati<strong>on</strong>s and c<strong>on</strong>clusi<strong>on</strong>s reached throughstudy and experience will be presented. Some of these issues are regulatory,and some are technical in nature. With the current EMCdirective being replaced in the summer of <str<strong>on</strong>g>2007</str<strong>on</strong>g>, the regulatory envir<strong>on</strong>mentfor most of these systems will also be changing.PRINTED CIRCUIT BOARD MODELINGThe Effects of Signal Trace’s Terminati<strong>on</strong> <strong>on</strong> GroundBounce and Comm<strong>on</strong>-Mode Radiati<strong>on</strong>Eng Kee Chua, Institute of High Performance Computing; Kye Yak See,Nanyang Technological University; Weng Yew Chang, Nanyang TechnologicalUniversity; and Er Ping Li, Institute of High Performance ComputingBased <strong>on</strong> the Method of Moments (MoM), the ground bounce <strong>on</strong> anyarbitrary printed circuit structure as well as the comm<strong>on</strong> mode current<strong>on</strong> any c<strong>on</strong>ductor that attached to the printed circuit structure arepredicted. The MoM is applied to obtain the impedance matrix,which could be used to determine the unknown current vector as wellas the inductance matrix. With the inductance matrix and currentvector, the potential difference between any two adjacent nodes is predicted.The effects of the signal trace’s terminati<strong>on</strong> <strong>on</strong> ground bounceand comm<strong>on</strong>-mode radiati<strong>on</strong> are discussed through numerical results.Capacitance of an Open Circuit Via PortFranz Schlagenhaufer; and Matthew Wood, — The University of WesternAustraliaThe via capacitance as part of a power plane structure is defined andcalculated using a series expansi<strong>on</strong> for the electrostatic field. Then bychoosing a suitable surface surrounding the via, Gauss’s Law isapplied to obtain a numerically stable expressi<strong>on</strong> for the capacitance,written in series form. Attenti<strong>on</strong> is paid to the influence of dimensi<strong>on</strong>sand material <strong>on</strong> the capacitance value, and comparis<strong>on</strong>s withMethod-of-Moment based simulati<strong>on</strong> packages are made.Coupling Analysis of PCB-Chassis Systems with SignalLines and Via Structures Using SPICENaoki Kobayashi, NEC Jisso and Producti<strong>on</strong> Technologies ResearchLaboratories; Todd Hubing, Clems<strong>on</strong> University; Ken Morishita; ManabuKusumoto; and Takashi Harada, — Jisso and Producti<strong>on</strong> TechnologiesResearch LaboratoriesThis paper describes the SPICE modeling of printed circuit boards(PCBs) with signal lines and via structures electrically c<strong>on</strong>nected to a©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM35metal chassis. First, a PCB model is proposed, c<strong>on</strong>sidering the couplingbetween signal lines and the power bus due to via structures.Next, the model is expanded to include the chassis and groundingposts. The calculated results using SPICE are shown to be c<strong>on</strong>sistentwith experimental data. Furthermore, positi<strong>on</strong>ing of the groundingposts near the edges of the PCB is shown experimentally and numericallyto reduce radiated emissi<strong>on</strong>s.High-Accuracy Emissi<strong>on</strong> Simulati<strong>on</strong> Models for VLSI ChipsIncluding Package and Printed Circuit BoardThomas Steinecke, Infine<strong>on</strong> Technologies AGThe <strong>electromagnetic</strong> emissi<strong>on</strong>s of complex, very large scale, integratedcircuits is determined by their operati<strong>on</strong>al activity plus the manifoldnoise propagati<strong>on</strong> paths through the <strong>on</strong>-chip power routing, the packagetraces, and the planes and traces <strong>on</strong> the printed circuit board. Thedesign of any emissi<strong>on</strong> test board influences the emissi<strong>on</strong>s finally measuredat defined c<strong>on</strong>nector probes. The emissi<strong>on</strong>s to be expected from amicroc<strong>on</strong>troller plugged <strong>on</strong>to applicati<strong>on</strong> boards are determined by themicroc<strong>on</strong>troller’s noise characteristics and the board’s propagati<strong>on</strong> characteristics.Good simulati<strong>on</strong> models have to serve two main interests:1) identificati<strong>on</strong> of emissi<strong>on</strong>-related IC design weaknesses and estimati<strong>on</strong>of measured emissi<strong>on</strong>s from the IC manufacturer’s point of view,and 2) identificati<strong>on</strong> of emissi<strong>on</strong>-related applicati<strong>on</strong> board design weaknessesand estimati<strong>on</strong> of measured emissi<strong>on</strong>s from the system manufacturer’spoint of view. This paper presents a target-leading approach fora full system emissi<strong>on</strong> simulati<strong>on</strong> model which serves both the IC andsystem manufacturer’s interests. The simulati<strong>on</strong> model has been c<strong>on</strong>ductedfor a 30-milli<strong>on</strong> transistor 32-bit automotive microc<strong>on</strong>troller.SPICE-Compatible Cavity and Transmissi<strong>on</strong> Line Model forPower Bus with Narrow SlotsYao Jiang Zhang, N/ASegmental lumped circuits are derived from a coupled transmissi<strong>on</strong>line model for a narrow slot <strong>on</strong> the power bus. Both electric andmagnetic coupling are taken into account by distributed inductancesand capacitances. Then a SPICE compatible circuit model for thepower bus with the narrow slot is proposed by c<strong>on</strong>necting the segmentallumped circuits to the equivalent circuit derived by a hybridcavity model and segmentati<strong>on</strong> method for irregular power/groundplanes. The model is validated by comparing it with the finite elementmethod (FEM) for the self or mutual impedances calculati<strong>on</strong> oftwo ports located in the power bus.Modeling of a Mixed Signal Processor Susceptibility toNear-Field Aggressi<strong>on</strong>Alexandre Boyer; S<strong>on</strong>ia Bendhia; and Etienne Sicard, — Institut Nati<strong>on</strong>aldes Sciences Appliquées (INSA) of ToulouseThis paper deals with the measurement and modelling of the susceptibilityof an integrated analog-to-digital c<strong>on</strong>verter of a 16 bit microc<strong>on</strong>trollerto near-field localized aggressi<strong>on</strong> using a miniature near-field probe. A predictivesimulati<strong>on</strong> of the susceptibility threshold is detailed. Comparis<strong>on</strong>between experimental and simulati<strong>on</strong> results shows interesting correlati<strong>on</strong>sbetween measured and simulated susceptibility thresholds.EM MODELING IEMI Predicti<strong>on</strong> Under a Different Program BehaviorShih-Yi Yuan, Feng Chia University; Chi-Feng Yang, Feng ChiaUniversity; Etienne Sicard, INSA of Toulouse; Chiu-Kuo Chen, M.O.E.A;and Shry-Sann Liao, Feng Chia UniversityThis paper discusses the estimati<strong>on</strong>, measurement, and predicti<strong>on</strong> ofthe EMI behaviors of a simple PIC c<strong>on</strong>troller under different programc<strong>on</strong>siderati<strong>on</strong>s. Using the “instructi<strong>on</strong> current” c<strong>on</strong>cept, this workcan predict, in the time domain, a very accurate current behavior ofthe c<strong>on</strong>duct emissi<strong>on</strong>s. This paper also proposes a way to modify anICEM model to achieve a good predicti<strong>on</strong> of the impact of EMI bydifferent program behavior. Predicti<strong>on</strong> improvement can be d<strong>on</strong>e iffurther c<strong>on</strong>siderati<strong>on</strong>s are made of other effects. Various kinds ofeffects can also be applied to the adapted ICEM model with furtherstudies. This work will be of great help to reduce parasitic emissi<strong>on</strong>sby SW technology and may propose another dimensi<strong>on</strong> of techniquesfor embedded system software design, software design methodology,driver design, and compiler optimizati<strong>on</strong>.Patch Antenna Modeling Issues Using CommercialSoftwareWilliam Coburn; Canh Ly; and Steven Weiss, — U. S. Army ResearchLaboratoryThe Method of Moments, implemented in 2.5-D for multilayerantenna structures, or implemented as a fully 3-D soluti<strong>on</strong> ofMaxwell’s equati<strong>on</strong>s, is a popular method for microwave antenna simulati<strong>on</strong>s.Commercial software was used to simulate an aperture-coupledpatch and a pin-fed patch antenna element. The simulati<strong>on</strong>results are compared with experimental data measured for antennaprototypes having finite substrate and ground plane dimensi<strong>on</strong>s. Theaperture coupled patch has a microstrip feed line extending to theedge of the substrate where a coaxial c<strong>on</strong>nector is installed betweenthe microstrip and ground plane. The pinfed patch has a coaxial c<strong>on</strong>nectorfeed with a finite size ground plane and radome withoutdielectric substrates. We use a 3-D simulati<strong>on</strong> to capture the effectof a finite ground plane compared to a 2.5-D model. We compare thecalculated and measured antenna performance and c<strong>on</strong>clude that the2.5-D simulati<strong>on</strong>s are sufficient for the design of c<strong>on</strong>venti<strong>on</strong>al patchantennas but detailed analysis or novel designs may require a fully 3-D model.EM Fields Between Two Parallel Plates Supported byC<strong>on</strong>ductive Multi-PolesHiroshi Echigo, Tohoku Gakuin UniversityIn c<strong>on</strong>ductive multi-plates like printed circuit boards (PCBs) or pingrid array (PGA) c<strong>on</strong>nectors of CPU ICs, EM fields should be analyzedbecause undesired coupling between the vias and pins will occur.Adding them, the shield effectiveness of the pin-array to prevent theleakage of EM field should be estimated. In this paper, some examplesare shown to prove that the analysis method for the scattering of amulti-wire system is effective. Some calculated results giving the electricnear-field images are given for the thin wire systems and the multiplatec<strong>on</strong>ductors. They clearly give the field pattern scattering outfrom the pole c<strong>on</strong>ductors. These results will give the estimati<strong>on</strong>s of theEMI intuitively and it leads to better treatments in the design.EM MODELING IIMeasurement of a Point Source Radiator Using a MagneticProbeKevin Slattery; and Xiaopeng D<strong>on</strong>g, — Intel Corporati<strong>on</strong>A set of measurements have been performed <strong>on</strong> a test point sourceradiator. The near field, here assumed to be less than 0.01 m, wasmeasured with a near field scanning system using a simple magneticloop probe. This paper develops the analysis of those measurementsand shows that the loop probe measures the far field comp<strong>on</strong>ent ofthe near radiated fields of a point source radiator when magneticdipole equati<strong>on</strong>s are assumed to describe the radiati<strong>on</strong> characteristics.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


36EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMEfficient Low-Frequency Modal Analysis of an AnechoicChamberLuis Nuno, N/A; Juan Balbastre, N/A; and Ignacio M<strong>on</strong>terde, PolytechnicUniversity of ValenciaAn efficient method to analyze the <strong>electromagnetic</strong> fields inside rectangularanechoic and semianechoic chambers from 30 to 100 MHz isshown. A modal expansi<strong>on</strong> is employed to develop the homogeneousand the inhomogeneous field. This is combined with circuital techniquesto compute the effect of the layers of ferrite and dielectrics inthe walls of the chamber. Several numerical results of the Free SpaceTransmissi<strong>on</strong> Loss (FSTL) of an anechoic chamber and the NormalizedSite Attenuati<strong>on</strong> (NSA) of a semianechoic chamber are provided.Calculati<strong>on</strong> of the H-Plane Pattern Influence to the SiteVSWR Result Using the M<strong>on</strong>te Carlo MethodWolfgang Müllner; and Alexander Kriz, — Austrian Research CentersGmbH - ARCIn this paper the error in site VSWR measurements caused by imperfectomnidirecti<strong>on</strong>al transmit antennas is investigated. On the basis of the H-plane pattern published by the manufacturer, the distributi<strong>on</strong> of the erroris calculated by means of the M<strong>on</strong>te Carlo Method. There are large differencesbetween the products from the Austrian Research Centers GmbHand from Schwarzbeck GmbH. In the frequency range from 1 to 18 GHz,the systematic error is less than 0.5 dB for the PODs and more than 2 dBfor the SBAs. The maximum deviati<strong>on</strong> is -0.5 dB / +1 dB and -4 dB / +2dB respectively. The c<strong>on</strong>tributi<strong>on</strong> to the measurement uncertainty, thevariance, is less than 0.1 dB and 1.4 dB respectively.Predicting Electromagnetic Coupling between HF, VHF, andUHF Antennas Using NECWilliam Duff, SEMTASThere are many applicati<strong>on</strong>s where it is desirable for transmit andreceive antennas operating in adjacent frequency bands (e.g. HF,VHF, and UHF) to be co-located. In order to avoid EMI, it is necessaryto provide adequate isolati<strong>on</strong> between the co-located antennas.This paper presents the results obtained by using NEC to calculatethe coupling for different geometric arrangements of the antennas.EMI Analysis of a GSM 900 MHz Antenna for a Large WindTurbine Hub with Method-of-MomentsBastian Lewke, Technische Universität München; Florian Krug, duringresearch work: GE Global Research; and Josef Kindersberger, TechnischeUniversität MünchenElectro-magnetic fields resulting from a GSM transmitter mounted <strong>on</strong>a large wind turbine will be analyzed. This cellular system operates asa novel communicati<strong>on</strong>s back-up in case the standard communicati<strong>on</strong>between the operator and hub c<strong>on</strong>trol systems is interrupted. Themethod-of-moments is used to analytically describe the electro-magneticfields caused by a GSM 900 MHz transmitter mounted <strong>on</strong> the hubof a wind turbine. Using a commercial simulati<strong>on</strong> tool, the <strong>electromagnetic</strong>field distributi<strong>on</strong> will be analyzed to determine an optimizedwireless communicati<strong>on</strong> link to a base stati<strong>on</strong>. Different transmitterpositi<strong>on</strong>s are evaluated based <strong>on</strong> their radiati<strong>on</strong> patterns. Scattering anddiffracti<strong>on</strong> by the turbine’s rotati<strong>on</strong> is taken into account.Ultra-Wideband Printed Circuit Antenna in Coplanar TechnologyHarry Lam; and Jens Bornemann, — University of VictoriaA printed circuit antenna in coplanar waveguide technology forultra-wideband measurements is introduced. The frequency of operati<strong>on</strong>is 4 to 12 GHz with the VSWR less than 2 except for a verysmall band around 5.3 GHz. Omni-directi<strong>on</strong>al characteristics in verticalpolarizati<strong>on</strong> are dem<strong>on</strong>strated at two selected frequencies. Theanalysis method is verified against previous measurements.COMPUTATIONAL ELECTROMAGNETIC MODELING IAn Extended-Hybrid-Method: A Combinati<strong>on</strong> of MoM, GMTand UTDStefan Balling; Dirk Plettemeier; and Karl-Heinz G<strong>on</strong>schorek, —Technische Universität DresdenA new Extended-Hybrid-Method (EHM) is proposed. It unites thewell known Method of Moments (MoM), the Generalized MultipoleTechnique (GMT), and the Uniform Geometrical Theory ofDiffracti<strong>on</strong> (UTD). With this EHM, it is possible to calculate specialarrangements more efficiently in comparis<strong>on</strong> to other standardcomputati<strong>on</strong> methods. This is achieved by using the advantages ofeach method. As an example, the EHM is used to examine an antennanext to a human head model and a metallic door.Razor Blade Functi<strong>on</strong>s in the PEEC MethodVolker Vahrenholt, Institute of Electromagnetic Theory; Heinz-DietrichBrüns, Technical University Hamburg-Harburg; and Hermann Singer,Technical University Hamburg-HarburgModern electrical devices are of particular c<strong>on</strong>cern in terms of <strong>electromagnetic</strong><strong>compatibility</strong> (EMC). Various numerical methods havebeen developed for EMC problems. One of those numerical methodsis the partial element equivalent circuit (PEEC) approach, which wasbasically developed in order to combine electrical circuits and <strong>electromagnetic</strong>problems, because a circuit formulati<strong>on</strong> of the electricaldevices can be achieved. The standard PEEC formulati<strong>on</strong> uses theGalerkin method in order to transform the EFIE into an equati<strong>on</strong> system,and rectangular source functi<strong>on</strong>s are taken in order to apply analyticalintegrati<strong>on</strong> formulas. In this paper, the new possibility ofapplying razor blade functi<strong>on</strong>s is presented in order to allow the applicati<strong>on</strong>of numerical integrati<strong>on</strong> within nearly the same computati<strong>on</strong>time as the analytical way. In additi<strong>on</strong>, a higher accuracy is achieved,because Green’s functi<strong>on</strong> can totally be integrated including the retardati<strong>on</strong>term. Examples are presented within this paper in order toshow that a good agreement is obtained between the Galerkin PEEC,the PEEC based <strong>on</strong> razor blade testing, and a Method of Momentssimulati<strong>on</strong> (MoM), which is applied for validati<strong>on</strong>.Extended MagPEEC Model Including Dispersive MediumXiao Zhang; Haibo L<strong>on</strong>g; Wenhua Chen; Yaqin Chen; and Zhenghe Feng,— Department of Electr<strong>on</strong>ic Engineering, Tsinghua UniversityThis paper presents an extended MagPEEC modeling technique usedto simulate arbitrary three-dimensi<strong>on</strong>al structures including a dispersivemedia. It remains the high precisi<strong>on</strong> of modeling with anacceptable increase in total computati<strong>on</strong>al complexity. This approachis verified by modeling a coaxial transmissi<strong>on</strong> line and magneticallyenhanced RFIC inductors up to multi-GHz, including the significantfrequency dependence of the permeability of the magnetic core inthis band. The efficiency of the proposed method is validated bycomparing its results with some commercial EM simulating software.The Error Reduced ADI-CPML Method for EMC Simulati<strong>on</strong>Iftikhar Ahmed; and Erping Li, — Institute of High PerformanceComputingIn this paper, c<strong>on</strong>voluti<strong>on</strong>al perfectly matched layer (CPML) is developedfor the recently proposed error reduced (ER) ADI-FDTD©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 37method to solve <strong>electromagnetic</strong> <strong>compatibility</strong> problems efficiently.Its numerical results are examined and compared with the c<strong>on</strong>venti<strong>on</strong>alADI-CPML method. It is found that for a CFL number equalto 5, the reflecti<strong>on</strong> error of the ERADI- CPML is approximately 12dB better than the c<strong>on</strong>venti<strong>on</strong>al ADI-CPML method.Efficient 3D Simulati<strong>on</strong> of Thin C<strong>on</strong>ducting Layers ofArbitrary ThicknessGöran Erikss<strong>on</strong>, Saab Communicati<strong>on</strong>, Saab ABIn this paper it is dem<strong>on</strong>strated how a class of relatively complexEMC simulati<strong>on</strong>s can be performed at a low cost, both in terms oftime and m<strong>on</strong>ey. Using a symmetric, two-way boundary c<strong>on</strong>diti<strong>on</strong>formulati<strong>on</strong>, shielding metal layers can be included in a global <strong>electromagnetic</strong>simulati<strong>on</strong>, without the need to resolve in detail theinterior of the layer. This formulati<strong>on</strong>, which has been previouslyused for some specific microwave and EMC problems, has no restricti<strong>on</strong>s<strong>on</strong> the ratio of layer thickness to the skin depth. It is implementedin a commercial finite element method (FEM) solverinstalled <strong>on</strong> a standard PC, and no source-code programming isrequired. The method is validated and its usefulness dem<strong>on</strong>stratedby applying it to a number of 3D examples of general EMC relevance.Wide-Band Hybrid MM-PO Computati<strong>on</strong>al ElectromagneticsTechnique Using [Z] Matrix Interpolati<strong>on</strong> and AdaptiveFrequency SamplingAndrzej Karwowski; and Artur Noga, — Silesian University of TechnologyIn this paper, we present a highly efficient computati<strong>on</strong>al <strong>electromagnetic</strong>stechnique for wide-band analysis of antennas radiating inthe presence of electrically large c<strong>on</strong>ducting bodies (platforms). Thetechnique is based up<strong>on</strong> the well known Moment Method–PhysicalOptics (MM-PO) hybrid formulati<strong>on</strong> combined with the impedancematrix interpolati<strong>on</strong> and a dynamic adaptive frequency sampling ofthe desired observable. Numerical examples are given to dem<strong>on</strong>stratec<strong>on</strong>siderable savings in both computer memory and CPU timeoffered by the proposed approach.COMPUTATIONAL ELECTROMAGNETIC MODELING IIFast FDTD Simulati<strong>on</strong> Using Laguerre Polynomials in MNAFrameworkKrishna Srinivasan; Ege Engin; and Madhavan Swaminathan, — GeorgiaInstitute of TechnologyIn this paper, a fast transient simulati<strong>on</strong> scheme using Laguerre polynomials,called Laguerre-MNA, has been developed for FDTD andcircuit simulati<strong>on</strong>. Compani<strong>on</strong> models for the Yee cells and circuitcomp<strong>on</strong>ents have been derived, permitting the use of MNA analysisto perform FDTD/transient circuit simulati<strong>on</strong>s using the Laguerremethod. Compani<strong>on</strong> models help simplify the matrix setup andreduce the matrix dimensi<strong>on</strong> that needs to be solved without employingl<strong>on</strong>g cumbersome equati<strong>on</strong>s. The FDTD simulati<strong>on</strong> usingLaguerre polynomials is unc<strong>on</strong>diti<strong>on</strong>ally stable and has shown to bemuch faster than the c<strong>on</strong>venti<strong>on</strong>al FDTD scheme. Prior work <strong>on</strong> transient<strong>electromagnetic</strong> simulati<strong>on</strong>s using Laguerre polynomials has adrawback of being able to simulate <strong>on</strong>ly for a certain time-durati<strong>on</strong>.A memory/time efficient soluti<strong>on</strong> has been proposed by which simulati<strong>on</strong>can be d<strong>on</strong>e for all time.Applicati<strong>on</strong> of a Hierarchical SVD/ACA Compressi<strong>on</strong>Technique to Near-Field Calculati<strong>on</strong>s of M<strong>on</strong>opole AntennasMiguel Astner, TU Hamburg-Harburg; Heinz-D. Brüns, TU Hamburg-Harburg; Guido Bürger, HVB Systems GmbH; and Hermann Singer, TUHamburg-HarburgThis paper describes the c<strong>on</strong>cept of hierarchical matrices and theapplicati<strong>on</strong> to near-field calculati<strong>on</strong>s of voltage or power drivenantennas. The hierarchical matrix structure is based up<strong>on</strong> a binarypartiti<strong>on</strong> of the structure to be analyzed, where blocks of the matrixcan be represented as full matrices or R(k)-matrices, the latter yieldinga data reduced representati<strong>on</strong> of the initial block. It has beenfound that the applicati<strong>on</strong> of <strong>on</strong>ly the adaptive cross-approximati<strong>on</strong>(ACA) matrix reducti<strong>on</strong> technique gave bad results in many practical3D cases and failed to predict the physical current distributi<strong>on</strong>. Theway out of this dilemma is to combine ACA with singular valuedecompositi<strong>on</strong> (SVD), yielding reliable results again. The new compressi<strong>on</strong>scheme turns out to be efficient and stable, and will bedescribed in detail. By means of examples, the validity of theapproach is dem<strong>on</strong>strated, where especially near-field investigati<strong>on</strong>sare carried out.Efficient Evaluati<strong>on</strong> of Equivalent-Principle Sources inMoM-FDTD Hybrid Method by Employing SpatialInterpolati<strong>on</strong> and Adaptive SamplingAndrzej Karwowski; and Tomasz Topa, — Silesian University ofTechnologyThe MoM-FDTD hybrid approach requires the informati<strong>on</strong> to beexchanged back and forth between the MoM-regi<strong>on</strong>s and the FDTDregi<strong>on</strong>scoupled through the Huygens’ surfaces. For electrically largestructures, evaluati<strong>on</strong> of the electric and magnetic field comp<strong>on</strong>entsand the related equivalence-principle sources <strong>on</strong> the Huygens’ surfacescan represent a significant (even dominant) fracti<strong>on</strong> of the totalsoluti<strong>on</strong> time required for the problem. In this paper, we dem<strong>on</strong>stratea possibility of increasing the computati<strong>on</strong>al efficiency of theMoM-FDTD hybrid method by employing a spatial interpolati<strong>on</strong>combined with adaptive sampling in calculating the electric andmagnetic field comp<strong>on</strong>ents and the effective sources <strong>on</strong> the Huygens’surfaces. Numerical examples show that the proposed approach offersa c<strong>on</strong>siderable CPU time saving.Near Field - Far Field C<strong>on</strong>versi<strong>on</strong> Based <strong>on</strong> GeneticAlgorithm for Predicting Radiati<strong>on</strong> from PCBsH<strong>on</strong>gmei Fan; and Franz Schlagenhaufer, — The University of WesternAustraliaA near field-far field c<strong>on</strong>versi<strong>on</strong> based <strong>on</strong> a genetic algorithm hasbeen performed for a printed circuit board with a ground plane. Arobust procedure for a pre-selecti<strong>on</strong> of dipole moments has beenintroduced. Important aspects of setting up the c<strong>on</strong>versi<strong>on</strong> problem,such as the number of equivalent dipoles and choice of matchingpoints, have been addressed.Use of Genetic Algorithms to Solve Inverse ScatteringProblemsDirk Plettemeier, Technische Universität Dresden; Stefan Balling, TechnischeUniversität Dresden; Diemo Landmann, N/A; and Karl-Heinz G<strong>on</strong>schorek,Technische Universität DresdenThe inverse scattering problem described in this paper is part of thequasi-tomographic Comet Nucleus Sounding Experiment byRadiowave Propagati<strong>on</strong> (CONSERT) of the comet-missi<strong>on</strong> Rosetta.This part of the experiment is based <strong>on</strong> the utilizati<strong>on</strong> of radiati<strong>on</strong>coupling effects between the CONSERT antenna system <strong>on</strong> theRosetta-Lander and the subsurface structure of the comet nucleus inthe vicinity of the Lander. The scientific aim of this part of CON-SERT is the rec<strong>on</strong>structi<strong>on</strong> of the subsurface structure at the landingsite, especially in view of the still open questi<strong>on</strong>: “Is a comet nucleussurround by a dust layer or not?” To solve this inverse scattering©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


38EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMproblem, the line-of-sight link between Rosetta Orbiter and Landerwill be used to measure the back lobes of the CONSERT Landerantenna with high angular resoluti<strong>on</strong>.An Efficient Shielding Effectiveness Calculati<strong>on</strong> <strong>on</strong> aRectangular Enclosure with Numerous Square AperturesParissa Dehkhoda; Ahad Tavakoli; and Rouzbeh Moini, — AmirkabirUniversity of TechnologyUtilizing the traditi<strong>on</strong>al transmissi<strong>on</strong> line model, the shielding effectivenessof an enclosure with numerous apertures is efficiently calculated.Here, the array of apertures is represented by an appropriateadmittance in the model. Since the representing admittance takesthe mutual coupling between apertures into account, the results aremore accurate than that of the traditi<strong>on</strong>al transmissi<strong>on</strong> line model.The results of this fast and accurate model are in very good agreementwith the MoM and semianalytical methods.COMPUTATIONAL ELECTROMAGNETIC MODELING IIIAnalytical HF Model of a Low Voltage DC Motor ArmatureIncluding Parasitic PropertiesJens Benecke; and Stefan Dickmann, — Helmut-Schmidt-UniversitätHamburgA high frequency (HF) electrical model of a DC motor armature isderived from its geometric and physical properties. This modelincludes the armature windings’ properties as well as inductive andcapacitive couplings between windings, armature, axis, and commutatorsurfaces. It provides sufficient detail to simulate the armature’scomplex impedance up to a frequency of approximately 1 GHz, providesexpressi<strong>on</strong>s to calculate the model elements from c<strong>on</strong>structi<strong>on</strong>parameters, and visualizes their influence <strong>on</strong> the impedance.Simulati<strong>on</strong> Analysis <strong>on</strong> EMI of an ±800 kV UHVDCC<strong>on</strong>verter Stati<strong>on</strong>Zhanqing Yu; Jinliang He; R<strong>on</strong>g Zeng; Bo Zhang; and Shuiming Chen, —Tsinghua University; H<strong>on</strong>g Rao; Jie Zhao; Xiaolin Li; and Qi Wang, —Technology Research Centre, China Southern Power Grid Co. Ltd.Wide-band frequency EM noise is generated during the processes offiring and turn-off of thyristor valves in c<strong>on</strong>verter stati<strong>on</strong>s. The noisewill be c<strong>on</strong>ducted al<strong>on</strong>g the primary circuitry, and may interfere withsec<strong>on</strong>dary systems by the way of c<strong>on</strong>ducted and radiated coupling.The ± 800 kV UHVDC transmissi<strong>on</strong> project is a newly developedtechnique and is not widely used in the world. The EMI problem is<strong>on</strong>e of most important issue that should be studied deeply in thestage of designing. A method of c<strong>on</strong>ducted EMI analysis based <strong>on</strong>the time-domain wide-band circuit simulati<strong>on</strong>, as well as a methodof radiated EMI analysis based <strong>on</strong> the Method of Moments, are proposedand verified in the paper. The EMI levels of the ±800 kV c<strong>on</strong>verterstati<strong>on</strong>, which is planned and being designed in China rightnow, are presented.An Investigati<strong>on</strong> <strong>on</strong> ILCMs for Coupling of Fields into aGeneric Missile Body through AperturesLawrence Chirwa, University of Ulster; John F. Daws<strong>on</strong>; and Martin P.Robins<strong>on</strong>, — University of YorkThe c<strong>on</strong>venti<strong>on</strong>al way of analyzing <strong>electromagnetic</strong> coupling intocavities is by means of full-wave solvers based <strong>on</strong> techniques such asthe finite-difference time-domain method, the method of moments,and the transmissi<strong>on</strong> line matrix (TLM) method. However, thesemethods require c<strong>on</strong>siderable computing resources and time to reacha soluti<strong>on</strong>. Intermediate level circuit models (ILCMs) have beenshown to be far more efficient than these c<strong>on</strong>venti<strong>on</strong>al methods.They are simpler and quicker to formulate and require significantlyless time to reach a soluti<strong>on</strong> than c<strong>on</strong>venti<strong>on</strong>al methods. This paperis <strong>on</strong> investigati<strong>on</strong>s in the bid to realize intermediate level circuitmodels for coupling into the generic missile body through apertures.A model for coupling via small apertures that yields credible results isrealized, and is validated against TLM results for the same problem.Simulati<strong>on</strong> and Analysis of EMC Chambers by Ray TracingMethodMing-Shing Lin, Nati<strong>on</strong>al Yunlin University of Science & Technology; Jia-Ming Ji, Dayeh University; Chung-I Hsu, Dayeh University; and Han-Chang Hsieh, Deputy Director of Sixth DEPTThe ray tracing method in c<strong>on</strong>juncti<strong>on</strong> with image theory was usedin this study to establish an analysis tool for evaluating the propertiesof EMC chambers. Computer codes were written in Matlab forsimulating the normalized site attenuati<strong>on</strong> (NSA), field uniformity(FU), and normalized site transmissi<strong>on</strong> loss (NSTL). By the simulati<strong>on</strong>program, NSAs of a semi-anechoic chamber and NSTLs of a fullyanechoic chamber were simulated and compared with measuredresults. The effects of the sec<strong>on</strong>d-order reflecti<strong>on</strong> <strong>on</strong> the simulatedNSAs of semianechoic chambers were discussed.Reduced Order Modeling for Transient Analysis of Carb<strong>on</strong>Nanotube Interc<strong>on</strong>nectsGiulio Ant<strong>on</strong>ini; and Ant<strong>on</strong>io Orlandi, — University of L’AquilaA state-space formulati<strong>on</strong> for transient analysis of carb<strong>on</strong> nanotubeinterc<strong>on</strong>nects is presented. Peculiar features of carb<strong>on</strong> nanotubesrelated to electr<strong>on</strong> transport are modeled in terms of per unit lengthparameters. The multic<strong>on</strong>ductor transmissi<strong>on</strong> line is firstly approximatedby a ladder network; its admittance matrix Y is expressed interms of Chebyshev polynomials in a closed form. The knowledge ofthe roots of such rati<strong>on</strong>al representati<strong>on</strong> makes it possible to generatea compact state-space macromodel of the nanotube interc<strong>on</strong>nect byselecting <strong>on</strong>ly the dominant poles. Numerical calculati<strong>on</strong>s, performedin both frequency and time domains, c<strong>on</strong>firm that the proposedmodel can be used to model carb<strong>on</strong> nanotube interc<strong>on</strong>nects asa building block of more complex systems.TLM Simulati<strong>on</strong> of RF Emissi<strong>on</strong>s and C<strong>on</strong>firmati<strong>on</strong> ofResults Through TestingDavid Johns, Flomerics; and Boris Shusterman, EMC Corporati<strong>on</strong>The Transmissi<strong>on</strong>-Line Matrix (TLM) method has been developed forthe EMC analysis of circuits and equipment packaging. TLM is usuallyformulated in the time-domain, enabling transient phenomenasuch as lightning, EMP, and ESD to be analyzed. In additi<strong>on</strong>, equivalentcompact models allow detailed features such as apertures andwires to be modeled in a computati<strong>on</strong>ally efficient manner whendealing with real-world structures. Recently the TLM technique hasbeen enhanced to enable complex circuits to be replaced with equivalentradiating sources for the simplicity of the analysis.SHIELDING PERFORMANCE MODELINGNumerical Modeling of Periodic Composite Media for anElectromagnetic Shielding Applicati<strong>on</strong>Dagang Wu; Rui Qiang; Ji Chen; and Ce Liu, — University of Houst<strong>on</strong>;Marina Koledintseva, UMR; Jim Drewniak, UMR; and BruceArchambeault, IBM Corporati<strong>on</strong>This paper describes a methodology to extract effective electricalproperties for a periodic composite medium. The extracti<strong>on</strong> algo-©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 39rithm is based <strong>on</strong> a periodic finite-difference time-domain (FDTD)method. The results are compared with c<strong>on</strong>venti<strong>on</strong>al mixing theoriesand 3D Fourier series expansi<strong>on</strong> methods. Two results show satisfactoryagreement. Having extracted effective permittivity and c<strong>on</strong>ductivity,<strong>on</strong>e can readily use these parameters to study electricalproperties of composite materials with arbitrary micro-geometry andthe shielding effects of applying composite materials.Wire-Mesh Shielding Performance Evaluati<strong>on</strong> in aReverberati<strong>on</strong> ChamberFranco Moglie; Valter Mariani Primiani; Anna Pastore; and SaraPistolesi, — Università Politecnica delle MarcheThe problem of the field penetrati<strong>on</strong> into a metallic enclosure with alarge aperture protected by a wire-mesh screen is approached in thiswork, using our home made Finite-Difference Time-Domain (FDTD)code. This code, with a thin wire approximati<strong>on</strong>, accurately accountsfor the cross between wires of the mesh. All results are experimentallyvalidated using a Reverberati<strong>on</strong> Chamber (RC).Effects of Aperture Thickness <strong>on</strong> the ShieldingEffectiveness of Metallic EnclosuresRodolfo Araneo; Giampiero Lovat; and Sim<strong>on</strong>e Paulotto, — University ofRome “La Sapienza”The effects of apertures with finite thickness <strong>on</strong> the shielding effectivenessof rectangular metallic enclosures is investigated through anapproximate but efficient formulati<strong>on</strong> based <strong>on</strong> the method ofmoments. As expected, the analysis shows that the finite aperturethickness can help to increase the shielding effectiveness of the structure,especially in the high frequency regi<strong>on</strong>. Comparis<strong>on</strong>s with rigorousfull-wave results c<strong>on</strong>firm the validity of the proposed technique.Evaluati<strong>on</strong> of the Frequency Characteristics of AbsorbingMaterials with the Time-Domain Single Antenna Method ata Standard SiteSatoru Kurokawa; Masanobu Hirose; and Koji Komiyama, — Nati<strong>on</strong>alInstitute of Advanced Industrial Science and TechnologyFrequency characteristics of absorbing materials are evaluated in asingle-antenna calibrati<strong>on</strong> technique using a log periodic antenna <strong>on</strong>a standard ground plane. The technique is applied to the data bothin the frequency-domain and time-domain, to evaluate the frequencycharacteristics of absorbing materials <strong>on</strong> the ground plane. Timedomainsubtracti<strong>on</strong> enables us to separate the wave reflected fromabsorbing materials. As a result, we have found that the dynamicrange of our proposed method is more than 40 dB throughout a widefrequency range from 700 MHz to 2000 MHz.Shielding Effectiveness of Rectangular Enclosures withApertures Using Multi-Resoluti<strong>on</strong> Method of MomentsFatemeh Hodjat; Rouzbeh Moini; and Masood Shafiee, — AmirkabirUniversity of TechnologyApertures in a rectangular enclosure can be the coupling path of <strong>electromagnetic</strong>interference (EMI). A multi-resoluti<strong>on</strong> Method ofMoments (MoM) formulati<strong>on</strong> is used to evaluate the shielding effectivenessof metallic rectangular enclosures with apertures. To this end,the electric field integral equati<strong>on</strong> (EFIE) is formulated for the surfacecurrents. The use of fine meshing near the apertures and edges enablesaccurate results. Using multi-resoluti<strong>on</strong> analysis, c<strong>on</strong>siderable savingsin calculati<strong>on</strong> time is obtained. A study of the influence of the apertures’orientati<strong>on</strong>s is presented. Also the effect of c<strong>on</strong>sidering differentangles of incidence and polarizati<strong>on</strong> is shown to be significant.SPECIAL SESSION: ALGORITHM AND TECHNIQUES FORPARALLEL PROCESSING FOR EMI/EMCParallel Implementati<strong>on</strong>s of the PEEC MethodJ<strong>on</strong>as Ekman; and Peter Anttu, — Luleå University of TechnologyThis paper presents a parallel implementati<strong>on</strong> of a partial elementequivalent circuit (PEEC) based <strong>electromagnetic</strong> modeling code.The parallelizati<strong>on</strong> is based <strong>on</strong> the GMM++ and ScaLAPACK packages.The parallel PEEC solver was successfully implemented andtested <strong>on</strong> several high performance computer systems. Large structuresc<strong>on</strong>taining over 50,000 unknown current and voltage basisfuncti<strong>on</strong>s were successfully analyzed, and memory, performance, andspeedup results are presented. The numerical examples are both ofthe orthog<strong>on</strong>al and n<strong>on</strong>-orthog<strong>on</strong>al types with analysis in the timedomainand frequency-domain.A Parallel Electromagnetic Simulati<strong>on</strong> Approach for theSignal Integrity Analysis of IC PackagesEri<strong>on</strong> Gj<strong>on</strong>aj, Technische Universitaet Darmstadt; Thomas Weiland,Technische Universitaet Darmstadt; Peter Thoma, CST GmbH; and IrinaMunteanu, CST GmbHA full-wave <strong>electromagnetic</strong> field simulati<strong>on</strong> based <strong>on</strong> massive parallelizati<strong>on</strong>is proposed as a tool for the signal integrity analysis ofcomplex IC packages. The simulati<strong>on</strong>s are based <strong>on</strong> a specializeddomain partiti<strong>on</strong>ing method which allows for highly balanced parallelcomputati<strong>on</strong>s. As a real-world example, the analysis of a largecomputer chip spreader is performed. Numerical results includingsignal wave forms, and delay times are given.Accelerated Integral Equati<strong>on</strong> Soluti<strong>on</strong> Methods <strong>on</strong>Clusters and Multicore ProcessorsVikram Jandhyala, University of Washingt<strong>on</strong>; Xiren Wang, University ofWashingt<strong>on</strong>; and Chuanyi Yang, Cadence Design SystemsBoundary element based methods are now prevalent as analysis methodsfor large-scale microelectr<strong>on</strong>ic circuits. With the advent of fastmultilevel techniques, these are comparable to and often surpass PDEbasedsoluti<strong>on</strong>s. The next challenge is to ensure these algorithms arescaleable <strong>on</strong> multi-core machines and parallel clusters. This paper discussesthe parallelizati<strong>on</strong> of multilevel low-rank based algorithms forfast boundary element solvers applied to microelectr<strong>on</strong>ics.Waveform Relaxati<strong>on</strong> for the Parallel Soluti<strong>on</strong> of LargePEEC Model ProblemsGiulio Ant<strong>on</strong>ini, University of L’Aquila; Albert Ruelhi, IBM Corporati<strong>on</strong>;and J<strong>on</strong>as Ekman, Luleå University of TechnologyThe soluti<strong>on</strong> of large 3D <strong>electromagnetic</strong> models is important for themodeling of a multitude of EMC, PI, and SI problems. In this paper, weexplore new algorithms for the parallel soluti<strong>on</strong> of large time-domain 3D<strong>electromagnetic</strong> problems. Our approach is to use a volume PartialElement Equivalent Circuit (PEEC) <strong>electromagnetic</strong> formulati<strong>on</strong> incombinati<strong>on</strong> with a Waveform Relaxati<strong>on</strong> (WR) algorithm. In WR, wesplit the system into smaller subsystems and we break weak couplings sothat the problem can be solved iteratively. WR has been used to solve amultitude of different problems. It is especially suited for parallel processingdue to its favorable compute time to communicati<strong>on</strong> ratio. Wec<strong>on</strong>sider a specific example for the applicati<strong>on</strong> of WR to PEEC models.The Disc<strong>on</strong>tinuous Galerkin Finite Element Time DomainMethod (DGFETD): A High Order, Globally-Explicit Methodfor Parallel Computati<strong>on</strong>©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


40EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMStephen Gedney, University of Kentucky; Ch<strong>on</strong>g Luo, University ofKentucky; Bryan Guernsey, University of Kentucky; J. Alan Roden,Aerospace Corporati<strong>on</strong>; Robert Crawford, Aerospace Corporati<strong>on</strong>; JeffreyMiller, Aerospace Corporati<strong>on</strong>; and Stephen Gedney, University of KentuckyA disc<strong>on</strong>tinuous Galerkin Finite-Element Time-Domain method is presented.The method is based <strong>on</strong> a high order finite element discretizati<strong>on</strong>of Maxwell’s time-dependent curl equati<strong>on</strong>s. The global volume isdecomposed into c<strong>on</strong>tiguous sub-domains of finite-elements with independentfuncti<strong>on</strong> expansi<strong>on</strong>s. The fields are coupled across sub-domainboundaries by enforcing the tangential field c<strong>on</strong>tinuity. This leads to alocally implicit, globally explicit difference operator that provides anefficient high-order, accurate, time-dependent soluti<strong>on</strong>.An Efficient Implementati<strong>on</strong> of Parallel FDTDXiaohe Chen; Michael Cracraft; Yaojiang Zhang; Jianmin Zhang; andJames Drewniak, — University of Missouri-Rolla; Bruce Archambeault,IBM Corporati<strong>on</strong>; Samuel C<strong>on</strong>nor, IBM Corporati<strong>on</strong>A parallel FDTD algorithm has been realized based <strong>on</strong> 1-D domaindecompositi<strong>on</strong>. Data communicati<strong>on</strong> am<strong>on</strong>g different adjacent processorsis manipulated by a self-defined C++ class, MPI FDTD, in whichportable functi<strong>on</strong>s of the message passing interface (MPI) library areused. The details of the implementati<strong>on</strong> are discussed. EMC applicati<strong>on</strong>sof the code such as cross talk of traces, cavity, vias, as well as anIC package are provided to dem<strong>on</strong>strate the parallel efficiency.POSTER SESSION 01: SYSTEM EMCEMC Management in a High Power Pulse LaserJoel Raimbourg, CEAThe Ligne d’Integrati<strong>on</strong> Laser (LIL) is the biggest European laser facility.The plant is a 150 by 80 meter building which includes 8 highpower lasers and a target chamber for experiments. We need to stock20 Mjoules in capacity banks and commute 250 kA to feed the laserbeams. The 60 kJ of light power are c<strong>on</strong>centrated <strong>on</strong> <strong>on</strong>e target forphysics experiments. This generates <strong>electromagnetic</strong> pulses with levelsof up to 10 kV/m and frequencies up to 3 GHz. Many <strong>electromagnetic</strong>victims (such as laser beam diagnostic detectors) need to functi<strong>on</strong>under serious interference c<strong>on</strong>diti<strong>on</strong>s. This paper gives an overview ofthe <strong>electromagnetic</strong> <strong>compatibility</strong> management of this project. One ofthe principal difficulties is the single shot aspect of the process. All<strong>electromagnetic</strong> victims must work under normal c<strong>on</strong>diti<strong>on</strong>s duringthe experiment. A temporary dysfuncti<strong>on</strong> is not permitted in our case.EMI Sub-System Level Emissi<strong>on</strong> Limits Based <strong>on</strong> StatisticAnalysisQin Yu; and Zijue Zhang, — Alcatel-LucentProduct EMI pre-compliance evaluati<strong>on</strong> becomes more importantnowadays than before due to the growing industrial trend in outsourcingOEM. Precompliance testing involves measuring the radiatedand power port c<strong>on</strong>ducted emissi<strong>on</strong>s of a complex system at theunit, shelf and/or sub-system levels. Defining the appropriate EMIlimits at the sub-system level is crucial for the compliance of theoverall system. The suppliers rely <strong>on</strong> the product specificati<strong>on</strong>s todesign their products. If the sub-system level limit specified is tooc<strong>on</strong>servative, the product would be over designed and the cost wouldgo up. However, if the sub-system level limit specified is too loose,the system EMI compliance will be in jeopardy. This paper utilizedthe statistical modeling recommended by ITU to estimate the maximumincrease in the radiated and power-line c<strong>on</strong>ducted emissi<strong>on</strong>sfrom a multi-unit system. The results are useful in determiningappropriate product sub-system level EMI limits and enhancingengineering judgment for compliance evaluati<strong>on</strong>. The sub-systemlevel limits based <strong>on</strong> the statistical analysis provide plausible andrati<strong>on</strong>al criteria for sub-system level compliance evaluati<strong>on</strong> and preventthe product from being over-designed.Development of Apparatus for Measuring ElectromagneticShielding Effectiveness at the GHz Frequency BandJ<strong>on</strong>g-Hwa Kw<strong>on</strong>, ETRI; Jae Ick Choi, ETRI; and J<strong>on</strong>g Gwan Yook, Y<strong>on</strong>seiUniversityWe have designed and manufactured a flanged double ridged waveguideas a sample holder for measuring the <strong>electromagnetic</strong> shieldingeffectiveness (SE) of planar material in broadband frequency rangesup to 10 GHz. The newly proposed sample holder in this paper hasa tapered secti<strong>on</strong> for broadband impedance matching to the 50 ohmcoaxial feed secti<strong>on</strong>. And we compared the measurement results withthe simulati<strong>on</strong> results by using the commercial software tool. Theresults from the designed sample holder agree well with those fromthe fabricated <strong>on</strong>es when c<strong>on</strong>sidering the design specificati<strong>on</strong> of S11< -20 dB at the operati<strong>on</strong>al frequency range. Also, to verify themeasuring apparatus, we have tried to measure and compare the SEsof commercial shielding material made of 100% NiC by the proposedsample holder and ASTM D4935 holder.Analysis of the Shielding Effectiveness of a RectangularCavity with Apertures to an ESD Radiated Field by theTransmissi<strong>on</strong> Line MethodLiuping Wang; and Yougang Gao, — Beijing University of Posts andTelecommunicati<strong>on</strong>sIn this article, we first analyze the characteristics of an electrostaticdischarge (ESD) <strong>electromagnetic</strong> pulse (EMP) and introduce the basictheory of the transmissi<strong>on</strong> line method (TLM), which is used to analyzethe shielding effectiveness of rectangular enclosures with apertures.The calculati<strong>on</strong>s show that the TML shielding efficiency c<strong>on</strong>toursare in agreement with the FDTD calculated results. Then weexpand the fundamental formulas to deal with the cases of roundholes, multi-holes, and arbitrary angles of polarizati<strong>on</strong>.Distributi<strong>on</strong> and Characteristic of the Disturbances in theDriving System of a Fuel Cell BusBo Zhang; Jinliang He; Shaofeng Yu; Wei Li; R<strong>on</strong>g Zeng; and Y<strong>on</strong>gHuang, — Tsinghua University; Jae-bok Lee; and Sug-hun Chang, —Korea Electrotechnology Research InstituteThis paper analyzes the distributi<strong>on</strong> and the characteristic of the disturbancesin the driving system of a fuel cell bus by measuring boththe c<strong>on</strong>ductive and radiative emissi<strong>on</strong>s. A statistical method wasused to investigate the parameters of the typical voltage waveforms,which were compared with the standard <strong>on</strong>es in ISO7637-2. Theresults are useful for the further investigati<strong>on</strong> of the EMC problemsin the fuel cell bus.Electromagnetic Cross Coupling between Ground SupportPower Lines and Spacecraft Umbilical CablesJ. Chai, The Aerospace Corporati<strong>on</strong>; E. Dressel, N/A; and D. Taylor, N/AThe transients recorded by the hybrid On-line Lightning M<strong>on</strong>itoringSystem (OLMS) led to the investigati<strong>on</strong> of the <strong>electromagnetic</strong> crosscoupling between the ground support power lines and spacecraftumbilical cables. It was discovered that the associated Power-Onevents had sufficient temporal associati<strong>on</strong> and amplitude correlati<strong>on</strong>to cause the recorded transients, and some recommendati<strong>on</strong>s weremade to further address the issue.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 41Development of a Maritime Electr<strong>on</strong>ic Warfare and SensorSystems EMI Mathematical Assessment CapabilityGiuseppina Dall’Armi-Stoks, DSTO; Guy Morris, N/A; and Annie Yau,N/AElectr<strong>on</strong>ic Warfare and Sensor (EW&S) Systems have to meet theiroperati<strong>on</strong>al capability in a maritime envir<strong>on</strong>ment. However, withthe ever increasing number of EW&S systems being fitted <strong>on</strong>boardmaritime platforms, and the reality that maritime platforms arebeing required to operate jointly, the likelihood of adverse <strong>electromagnetic</strong>interference (EMI) between EW&S systems is prominent.Investigating EW&S systems’ <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC)can be an extremely complex problem. If EW&S system EMC is notaddressed and managed in a correct procedure, the soluti<strong>on</strong>s to minimizeEMI problems can be expensive and more importantly canaffect the operati<strong>on</strong>al capability of the systems. What has been recommended,by many in the EMC community, as a means of managingthe complexity of systems’ <strong>electromagnetic</strong> interference and/or<strong>electromagnetic</strong> <strong>compatibility</strong> (EMI/EMC) problems, is that theEMI/EMC must be assessed at the planning, designing and development,installati<strong>on</strong>, and/or operati<strong>on</strong> of electrical and electr<strong>on</strong>icequipment stages, each governed by an EMI c<strong>on</strong>trol plan.EMC Analysis for Sustainer Electric Propulsi<strong>on</strong>s and DeepSpace Communicati<strong>on</strong> SystemsNikolay Vazhenin; Andrey Plokhikh; Alexey Volkovsky; and GalinaSoganova, — RIAMEA general soluti<strong>on</strong> for the problem of EMC calculati<strong>on</strong> as applied to thesustainer electric propulsi<strong>on</strong> (EP) in rockets and deep-space radio communicati<strong>on</strong>systems is c<strong>on</strong>sidered in its classical statement. EP isdescribed as a source of unintended noise of artificial origin of the whiteGaussian noise type with the known spectral characteristics of radiati<strong>on</strong>.An <strong>on</strong>board receiver of the deepspace communicati<strong>on</strong> radio link is c<strong>on</strong>sideredas the receptor, the noise susceptibility of which is assessed bythe variati<strong>on</strong> of the radio link quality parameters – communicati<strong>on</strong>range and informati<strong>on</strong> rate. The calculati<strong>on</strong> results for the EP emissi<strong>on</strong>susceptibility of both informati<strong>on</strong> channel and phase synchr<strong>on</strong>izati<strong>on</strong>channel of the deep space communicati<strong>on</strong> radio link designed for aspacecraft in the orbit of Mars are presented. Recommendati<strong>on</strong>s aregiven for securing EP EMC with the <strong>on</strong>board systems of a spacecraft.Effective Technique for System Level Predicti<strong>on</strong> of theRadiated Emissi<strong>on</strong>s of Electr<strong>on</strong>ic Devices and Cablesinside Satellites from Unit Level MeasurementsFrancisco Saez de Adana; Manuel Felipe Cátedra; and Jose Manuel Gomez,— Universidad de Alcala; and Raj Mittra, Pennsylvania State UniversityA method to predict the <strong>electromagnetic</strong> emissi<strong>on</strong>s from unknownelectr<strong>on</strong>ic devices and cables at the system level is presented in thispaper. The method is based <strong>on</strong> measurements at the unit level,equivalent source decompositi<strong>on</strong>, and numerical <strong>electromagnetic</strong>simulati<strong>on</strong> of the integrated system. The approach is also valid forthe analysis of cables and c<strong>on</strong>ductors carrying electrical currents fromthe interior to the exterior of the measurement surface (Huygen’s surface)and is useful for the predicti<strong>on</strong> of the <strong>electromagnetic</strong> <strong>compatibility</strong>characteristics of electr<strong>on</strong>ic devices inside satellites.POSTER SESSION 02: PCB AND IC EMCEffectiveness of PCB Simulati<strong>on</strong> in Teaching High-SpeedDigital DesignJianjian S<strong>on</strong>g; Edward Wheeler; and Keith Hoover, — Rose-HulmanInstitute of TechnologySignal integrity for high-speed digital design at the printed-circuit board(PCB) level is an issue of increasing importance in electr<strong>on</strong>ic design thatrequires coverage in more undergraduate classes. This paper describeshow simulati<strong>on</strong> tools offer an ec<strong>on</strong>omical alternative to hardware-basedexperiments in undergraduate courses in high speed design. A simulati<strong>on</strong>tool, Hyperlynx, has been used in our high-speed digital design classto help students understand fundamental c<strong>on</strong>cepts and ideas in signalintegrity as well as to experiment with different techniques for maintainingsignal integrity in a PCB design. We present examples in whichtraditi<strong>on</strong>al approaches employing <strong>on</strong>ly closed-form expressi<strong>on</strong>s can beeffectively supplemented with simulati<strong>on</strong> to help students gain a deeperunderstanding of basic c<strong>on</strong>cepts such as time-of-flight, parasitic parameters,n<strong>on</strong>linear driver and receiver models, characteristic impedance, perunitlengthparameters, terminati<strong>on</strong> techniques, and crosstalk.Transmissi<strong>on</strong> Line Attenuati<strong>on</strong>-Impedance Realistic CornerModeling by Scaled-Down Tolerence Boundary ScanZhaoqing Chen, IBM Corprati<strong>on</strong>This paper discusses a method to generate transmissi<strong>on</strong> line attenuati<strong>on</strong>impedancerealistic corner models by a scaled-down tolerance boundaryscan. Based <strong>on</strong> nominal and tolerance specificati<strong>on</strong>s of the transmissi<strong>on</strong>line physical and geometric parameters, the scaled-down toleranceboundary scan is used to find the realistic corners in the attenuati<strong>on</strong>impedancespace. The tolerance scaling factor is determined or verifiedby comparing the derived corners with the attenuati<strong>on</strong>-impedance distributi<strong>on</strong>by M<strong>on</strong>te Carlo statistical <strong>electromagnetic</strong> simulati<strong>on</strong>s. Thisscaling factor can be used for similar structures in future applicati<strong>on</strong>s.The system eye diagrams based <strong>on</strong> different bounding models are shown.Impact of Linear Regulator Topology <strong>on</strong> Integrated CircuitEmissi<strong>on</strong>sKevin Lavery, Texas InstrumentsThe type of linear, <strong>on</strong>-chip voltage regulator is important to themeasured emissi<strong>on</strong>s from a device. A p-channel VREG is foundsuperior to an n-channel VREG in terms of suppressing emissi<strong>on</strong>s.Degree of Unbalance about Earth and Radiated Emissi<strong>on</strong> ofDifferential Type Microstrip Line in GHz BandMasahiro Shiota; Kiyotaka Matsubara; and Masamitsu Tokuda, —Musashi Institute of Technology; and Chiharu Miyazaki, MitsubishiElectric Corporati<strong>on</strong>Balance-unbalance c<strong>on</strong>versi<strong>on</strong> factors and radiated emissi<strong>on</strong>s from differentialtype microstrip lines (DML) have not been examined in thefrequency range above 1 GHz, because it is difficult to obtain the balunthat can be used in GHz band. In this paper, we tried to measure themin the frequency range above 1 GHz by using a mode analysis functi<strong>on</strong>of a network analyzer instead of the balun, and compared the measurementswith the calculated values by using the 4-terminal pair networkschain matrix theory. The comparis<strong>on</strong> results c<strong>on</strong>firmed that this calculati<strong>on</strong>method is effective in the frequency range above 1 GHz.A Scalable Model of Board to FPC Interc<strong>on</strong>nect UsingNeural NetworksHo<strong>on</strong> Hwangbo, Sungkyunkwan UniversityIn this paper, I propose the equivalent circuit model which includes theboard to flexible printed circuit (FPC) c<strong>on</strong>nector transiti<strong>on</strong> regi<strong>on</strong> andthe FPC c<strong>on</strong>nector to FPC cable transiti<strong>on</strong> regi<strong>on</strong>. Full wave simulati<strong>on</strong>sof the FPC interfaces are performed and the s-parameters of the simulatorsare compared to those of the vector network analyzer (VNA) measurements.The simulati<strong>on</strong> shows very similar s-parameters compared tothe VNA measurements verifying it as the reference tool for the equiva-©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


42EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMlent circuit model. Lumped capacitors and inductors are used as theparameters of the equivalent circuit model. I extracted the parameters byfitting the s-parameters of the equivalent circuit model to those of the3D full wave simulator. The frequency range of the proposed model is500 MHz to 3 GHz which is suitable for use with modern high speedapplicati<strong>on</strong>s. The neural network approach is then introduced as thenovel behavioral modeling method of the board to FPC interfaces. Eachlength of the board to FPC interfaces are scalable parameters and used asthe training data of the neural network structures. The predicti<strong>on</strong>s of thes-parameters using the neural networks when arbitrary transiti<strong>on</strong> lengthis given are very good compared to the 3D full wave simulati<strong>on</strong>s, andthese results validate the neural network as the promising candidate forthe modern high-speed interc<strong>on</strong>nects modeling techniques.The Soluti<strong>on</strong>s of LCD Panel (T-C<strong>on</strong>) EMI Noise for WirelessIntegrati<strong>on</strong>Sungkyu Lee, KEES; Jung-Man Lim, N/A; Ki-Seob Lee, N/A; Onsik Choi,N/A; Bae-W<strong>on</strong> Lee, N/A; Do-Wan Kim, N/A; Masashi Hayakawa, TheUniversity of Electro-Communicati<strong>on</strong>s; and Yoshio Kami, The University ofElectro-Communicati<strong>on</strong>sElectromagnetic interference (EMI) noise from a liquid crystal display(LCD) panel reduces the performance of wireless network systemsin a notebook, including two Wireless network cards: WirelessLocal Area Network (WLAN) card and Wireless Wide Area Network(WWAN) card. One of the main EMI noise sources for the wirelessnetwork system in an LCD panel is the timing c<strong>on</strong>troller (T-C<strong>on</strong>) IC.This paper introduces an approach to solve the problems of the EMInoise in the T-C<strong>on</strong> of an LCD panel, and a method of measuring theEMI noise of the T-C<strong>on</strong> itself by the use of the TEM-cell. Sec<strong>on</strong>dly,the soluti<strong>on</strong>s from the TEM cell tests, signal analyses and other measurements,suggest that there is a reducti<strong>on</strong> in the EMI noise level ofthe T-C<strong>on</strong>. Finally, the measurement results of the EMI noise levelof the LCD panel, with the improved T-C<strong>on</strong>, are presented. Becausethe EMI noise problem becomes more and more important issues forwireless network systems, the soluti<strong>on</strong>s to the problem and the rightproposals have to be studied. We suggested them in this paper.Comparative Analysis of Intel Pentium 4 and IEEE/EMC TC-9/ACEM CUP Heat SinksJunwei Lu; and Xiao Duan, — Griffith UniversityThis paper presents finite element frequency domain results for <strong>electromagnetic</strong>radiati<strong>on</strong> emitted from high power microelectr<strong>on</strong>ic circuitsc<strong>on</strong>nected to a heat sink. The heat sink model associated with <strong>on</strong>e of theIEEE EMC TC-9 challenge problems, 2000-4 CUP heat sink, has beenused to investigate different grounding c<strong>on</strong>figurati<strong>on</strong>s. A new simulati<strong>on</strong>model for the Intel P4 CPU heat sink is proposed. In c<strong>on</strong>trast to the2000-4 EMC challenge model, the Intel P4 CPU heat sink model exhibiteddifferent results. A res<strong>on</strong>ant frequency of 2.6 GHz with a reflecti<strong>on</strong>coefficient of 8.3 dB was found for the Intel P4 CPU heat sink, which isclose to the operating frequency of 2.4 GHz for IEEE and Bluetooth wirelesscommunicati<strong>on</strong> systems. The comparis<strong>on</strong> of frequency sweepingresults shows that the reflecti<strong>on</strong> coefficient was found to be -6 dB at 3.6GHz and -20 dB at 3.4 GHz from the c<strong>on</strong>venti<strong>on</strong>al CUP heat sink. TheCPU heat sink can perform as an efficient radiator at these frequencies.Chip Level EMI Approach for LCD TV PanelsDowan Kim, Samsung Electr<strong>on</strong>icsIn this paper, chip level approach is accomplished for solving EMIproblems of LCD TV panels. All the EMI noises from 30 MHz to 1GHz are classified into three noise groups by their sources, that is,the IC blocks generating the signals. Then, IC level soluti<strong>on</strong> isapplied in order to reduce the noises and it is proved that thisapproach is more powerful and essential than the traditi<strong>on</strong>al countermeasuressuch as gasket tape or shielding method. Finally, thismethod is applied to a real LCD module and it is verified that theproposed method will have excellent effects <strong>on</strong> eliminating EMItroubles from LCD TV panels.A Study <strong>on</strong> the Reducti<strong>on</strong> Method of the Magnetic FieldRadiated from a PCB Including Multi-Loops (n=2)Atsuo Mutoh, Tokyo Fuji University; Shuichi Nitta, Salesian Polytechnic;and Yuxin Yan, Tokyo University of Agriculture & TechnologyThe near magnetic field radiated from a printed circuit board (PCB)including two multi-loops is studied in this paper. It is found that themagnetic field radiated from the PCB can be reduced by means of theparts layout making the current directi<strong>on</strong> flowing through Vcc-GNDpins of the adjacent IC to be opposite, based <strong>on</strong> the following phenomena:1) the total amounts of near magnetic field cannot always beobtained from the additi<strong>on</strong> of each near magnetic field from a singlesub-circuit; and 2) Digital ICs can be characterized by the currentmodel flowing from the Vcc pin to GND pin of the digital IC.POSTER SESSION 03: EM MEASUREMENTSLow Cost Noise SourcesLukas Vojtech, Czech Technical University in PragueEMC Measurements are a classic and necessary c<strong>on</strong>diti<strong>on</strong> of device testingprocedures. In the case of testing power EMI filters or device immunity,we need simulators of the interfering signal. We are teaching the mainprinciples of EMC in our department. Practical measurements for studentsare realized in the EMC laboratory. For c<strong>on</strong>tinual interference testing, studentshave an older, but still working, interference simulator; but they needan another <strong>on</strong>e. This paper presents a few types of low cost broadband noisesources. Designed and practical working models could be helpful foreverybody who needs to assemble cheap, but good working devices.A Low Cost Line Impedance Stabilizati<strong>on</strong> Network for EMCLaboratory Instituti<strong>on</strong>Vuttip<strong>on</strong> Tarateeraseth, Srinakharinwirot University; Werachet Khanngern;and Damr<strong>on</strong>g Sakulhirirak, — King M<strong>on</strong>gkut’s Institute ofTechnology Ladkrabang, ThailandThis paper proposes how to analyze and design the Line ImpedanceStabilizati<strong>on</strong> Network (LISN). Details of the comp<strong>on</strong>ent characteristicsare described, al<strong>on</strong>g with the design of the air coil inductors in singleand multi layers based <strong>on</strong> a high, self res<strong>on</strong>ant, frequency resp<strong>on</strong>sec<strong>on</strong>cept. According to the CISPR 16-1 standard, the stabilized impedanceof 50 for the LISN at the frequency range 150 kHz to 30 MHz isproved by simulati<strong>on</strong> and experimental results. The proposed LISN isa successful low cost design in comparis<strong>on</strong> with a commercial LISN.Finally, the performance of the proposed LISN is achieved compared tothe CISPR standard and also with a commercial LISN.3-D Radiated Spurious Emissi<strong>on</strong> Test SystemLin Guo, Ministry of Informati<strong>on</strong> IndustryWith the rapid advent of the wireless technologies, wideband high frequencywireless systems are becoming more popular. These productsbring a new challenge to the EMC compliance testing, especially forthe radiated spurious emissi<strong>on</strong> test. The traditi<strong>on</strong>al 2D test method ofthe spurious emissi<strong>on</strong> is no l<strong>on</strong>ger suitable for the high frequency technologiescertificati<strong>on</strong> test. A new radiated spurious emissi<strong>on</strong> test systemis being studied in this paper, which is more suitable for the higherdirective radiated emissi<strong>on</strong> measurements. The use of this test©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 43method can substantially reduce the measurement uncertainty.Understanding and Selecting Measurement Antennas forUse in C<strong>on</strong>gested Electromagnetic Envir<strong>on</strong>mentsPhilip Keebler, EPRIIt is not uncomm<strong>on</strong> for <strong>electromagnetic</strong> <strong>compatibility</strong> (EMC) engineerswho c<strong>on</strong>duct surveys of electric and magnetic fields in some commercial,industrial, power plant, and healthcare facilities to encounterc<strong>on</strong>gested areas where challenges are presented in selecting the appropriatesurvey antenna. Site surveys and laboratory experiments c<strong>on</strong>ductedby our EMC survey group have been c<strong>on</strong>ducted with a varietyof antennas in an effort to compare techniques and measurementresults. This paper presents two examples of <strong>electromagnetic</strong> fieldmeasurements, <strong>on</strong>e c<strong>on</strong>ducted in an open area test site (OATS) and thesec<strong>on</strong>d c<strong>on</strong>ducted in a doubly-isolated shielded enclosure (DISE). Incomparing <strong>electromagnetic</strong> field measurements, we use a bic<strong>on</strong>ical logperiodic dipole (BLPD) as the radiating antenna, and two antennas, thebic<strong>on</strong>ic and disc<strong>on</strong>e, as the receiving (or antennas under test) antennas.Comparis<strong>on</strong> of the laboratory data to the OATS data clearly shows thatthe reflecti<strong>on</strong>s that do occur may attenuate or amplify the signal froman interferer at the point of installati<strong>on</strong>. C<strong>on</strong>sidering this phenomena,it is important not <strong>on</strong>ly to c<strong>on</strong>sider a survey when a new piece of equipmentis installed, but it may be necessary to perform a survey to determinethe change in the <strong>electromagnetic</strong> envir<strong>on</strong>ment when structuralmetallic objects are present at the site.Investigati<strong>on</strong> of Wave Propagati<strong>on</strong> Using a Smart Antennafor Indoor Wireless Communicati<strong>on</strong>Junwei Lu; and Zhaohui Sun, — Centre for Wireless M<strong>on</strong>itoring andApplicati<strong>on</strong>s, Griffith UniversityThis paper presents the investigati<strong>on</strong> of wave propagati<strong>on</strong> characteristicsfor indoor wireless communicati<strong>on</strong>s using a smart mobile terminalantenna. The Finite Element Method (FEM) frequency-domainbased computati<strong>on</strong> model is used to characterize electric field intensityfor a typical office envir<strong>on</strong>ment. The signal to noise ratio andsignal strength are measured according to different placements oftransmitting antennas, including a c<strong>on</strong>venti<strong>on</strong>al antenna and a smartmobile terminal antenna array. To validate the numerical computati<strong>on</strong>alresult, a measured result using a wireless network card, withan <strong>on</strong> board antenna and built-in signal strength measurement software,are employed to replace expensive and heavy apparatus.Circuit Specificati<strong>on</strong>s for Radio Noise Reducti<strong>on</strong> in Vehicle-Mounted Communicati<strong>on</strong> NetworkYouichirou Suzuki, Nipp<strong>on</strong> Soken, Inc.; Noboru Maeda, Nipp<strong>on</strong> Soken, Inc.;and Nobuyuki Iwasaki, Denso Corporati<strong>on</strong>EM noise emissi<strong>on</strong> in the radio bands from the communicati<strong>on</strong> harnessof vehicle-mounted LAN is evaluated by performing an actualmeasurement test complying with CISPR 25. This report provides amethod used to define the specificati<strong>on</strong>s for the transmitter circuitand receiver circuit required to satisfy the AM noise limit in the test.The noise propagati<strong>on</strong> is analyzed in comm<strong>on</strong> and differential modes,and an inverse calculati<strong>on</strong> is applied to obtain the specificati<strong>on</strong>s.Radio noise from the communicati<strong>on</strong> harness will be able to pass thetest by designing the transmitter and receiver to meet the specificati<strong>on</strong>sdeveloped using this method.Investigati<strong>on</strong> of the Coupling Paths of a Galvanic IsolatedAC-AC C<strong>on</strong>verterAnne Roc’h, University of Twente; D<strong>on</strong>gsheng Zhao, N/A; Frank Leferink,N/A; and J. A. Ferreira, N/AA galvanic, isolated, three-phase, AC/AC c<strong>on</strong>verter with a high-frequencyAC-link has been analyzed from an EMC point of view. Thisc<strong>on</strong>figurati<strong>on</strong> is novel because of a large number of switches, a highfrequency transformer, and a fourwire output. The essential couplingpaths are identified. Corresp<strong>on</strong>ding suppressi<strong>on</strong> remedies are given.The results, before and after measurements, have been taken todem<strong>on</strong>strate the improvement in EMC.Using Nested Reverberati<strong>on</strong> Chambers to Determine theShielding Effectiveness of a Material: Getting Back to theBasics With an Intuitive ApproachJas<strong>on</strong> Coder, University of Colorado; John Ladbury, Nati<strong>on</strong>al Institute ofStandards and Technology; and Christopher Holloway, Nati<strong>on</strong>al Institute ofStandards and TechnologyWe examine the current method for determining the shielding effectivenessof a material using nested reverberati<strong>on</strong> chambers and showa simplified approach. Included in our examinati<strong>on</strong> is a discussi<strong>on</strong> ofthe purpose for using a four antenna measurement system and a simplificati<strong>on</strong>of the equati<strong>on</strong>s used in the data processing porti<strong>on</strong> of themeasurement. The result of this simplified approach will be a measurementprocess that is more intuitive and makes use of S parametersal<strong>on</strong>g with power ratios in all porti<strong>on</strong>s of the measurement effort. Tovalidate our simplificati<strong>on</strong>s and data processing methods, we willprovide an experimental dem<strong>on</strong>strati<strong>on</strong> and verificati<strong>on</strong>.Measurement of Shielding Effectiveness in the MicrowaveFrequency Range Using a Dual Focus Flat CavityToshihide Tosaka, Nati<strong>on</strong>al Institute of Infromati<strong>on</strong> and Communicati<strong>on</strong>sTechnology; Atsuhiro Nishikata, N/A; Kaori Fukunaga, N/A; and YukioYamanaka, N/AWe suggested a new measurement method of Shielding Effectiveness(SE) in the microwave frequency range using a Dual Focus FlatCavity (DFFC). TE waves are transmitted from the transmittingpoint to the receiving point through the testing material. The shapeof the DFFC is oval and the transmitted waves are focused at thereceiving point with the same phase. This method has a largedynamic range of about 100 dB. We evaluated this method at anumber of frequencies by comparing the calculated value with themeasured value using isotropic materials. The differences were lessthan 3 % at each frequency. The measurement repeatability errorwas less than 2 %.POSTER SESSION 04: POWER LINE COMMUNICATIONS,SAFETY AND BIOLOGICAL EFFECTSTerminal C<strong>on</strong>diti<strong>on</strong> Dependency of Transmissi<strong>on</strong>Characteristics for High-Speed Power Line Communicati<strong>on</strong>Shunichi Sakuta, Musashi Institute of Technology; Yosuke Watanabe,Musashi Institute of Technology; Toshiyasu Higuma, Mitsubishi ElectricCorporati<strong>on</strong>; and Masamitsu Tokuda, Musashi Institute of TechnologyIn this paper, we studied the dependency of transmissi<strong>on</strong> characteristicsto the differential mode impedance of the power line for power linecommunicati<strong>on</strong> with the high frequency band from 2 MHz to 30 MHz.Real indoor wirings of the power line have various branch forms. Wefocused <strong>on</strong> a typical blanch model such as an outlet blanch model thatdiverges in parallel, and composed this model. We calculated and comparedtransmissi<strong>on</strong> characteristic by the Method of Moment which isused for the <strong>electromagnetic</strong> field analysis. As a result, it is understoodthat the transmissi<strong>on</strong> loss and radiated emissi<strong>on</strong> characteristics of thepower line depend <strong>on</strong> the differential mode impedance value.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


44EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMLCL Characteristics of Power Line for Power LineCommunicati<strong>on</strong> Using the Four Port Network TheoryJun Karino; Yosuke Watanabe; Akira Mori; and Masamitsu Tokuda, —Musashi Institute of TechnologyWe calculated the transmissi<strong>on</strong> characteristics and the degree ofunbalance to the ground of the power line in the high frequencyband, in order to obtain the characteristics of the power line. The calculati<strong>on</strong>model of the power line is made by a four port network theory,which has a circuit c<strong>on</strong>stant as a chain matrix of the distributedc<strong>on</strong>stant <strong>on</strong> the transmissi<strong>on</strong> line. And we compared the calculatedvalue with the measured value. As a result, in the transmissi<strong>on</strong> losscharacteristic, it is c<strong>on</strong>firmed that the calculated value agrees wellwith the measured value, by c<strong>on</strong>sidering the c<strong>on</strong>ductance of the insulatingdielectrics of a power line. From the comparis<strong>on</strong> of the measuredand calculated values with the four port network, it is revealedthat the frequency and the level occurring hump in the L<strong>on</strong>gitudinalC<strong>on</strong>versi<strong>on</strong> Loss (LCL) characteristics agree well with each other.Comparing the calculated results from the Method of Moment(MoM) and the four port network theory, it was shown that the fourport network theory is better than MoM in calculati<strong>on</strong> accuracy.Transmissi<strong>on</strong> Characteristics of an OFDM Signal for aPower Line Communicati<strong>on</strong> System with High Bit RateAkira Mori; Yosuke Watanabe; and Masamitsu Tokuda, — MusashiInstitute of Technology; and Koji Kawamoto, Sumitomo Electric Industries, Ltd.In this paper, we measured what influence the transmissi<strong>on</strong> loss characteristicsof the electric power line with various forms gave to thetransmissi<strong>on</strong> rate of the Orthog<strong>on</strong>al Frequency Divisi<strong>on</strong>Multiplexing (OFDM) signal through the power line communicati<strong>on</strong>system (PLC) modem. We classified the electric power transmissi<strong>on</strong>line with various forms in a real envir<strong>on</strong>ment into two basic elements,which are an outlet type branch and a switch type branch.Next, the transmissi<strong>on</strong> rate is measured for a c<strong>on</strong>cise power linemodel composed of the outlet type and the switch type branches,which is c<strong>on</strong>nected with the PLC modem. As a result, it is revealedthat the transmissi<strong>on</strong> rate is marginally affected by the two branchesmenti<strong>on</strong>ed above. At this time, the transmissi<strong>on</strong> characteristics ofthe electric power line are simulated from measured data. TheOFDM sending and receiving systems are composed <strong>on</strong> the computerand the transmissi<strong>on</strong> rate is simulated. It is clear that the transmissi<strong>on</strong>rates simulated agree with that measured.EMC Analysis of a Wind Turbine Blade’s LightningProtecti<strong>on</strong> SystemBastian Lewke; Josef Kindersberger; Sebastian Krämer; and Fernando PuenteLeón, — Technische Universität München; Yarú Méndez Hernández, GE GlobalResearch; and Jörg Kirchhof, Institut fuer Solare EnergieversorgungstechnikAn <strong>electromagnetic</strong> analysis of a wind turbine blade’s lightning protecti<strong>on</strong>system will be given. Impedance measurements <strong>on</strong> a 16 mblade tip are performed for a frequency sweep up to 30 MHz. Theinfluence of the blade’s positi<strong>on</strong> is analyzed. Measurement data isused to derive a method-of-moments model with a commercial tool.The method-of-moments model will be compared to a finite elementmodel. Both models will be used to derive the <strong>electromagnetic</strong> interferencecaused by the <strong>electromagnetic</strong> fields radiated by the lightningprotecti<strong>on</strong> system after a lightning strike.Effect of Subject’s Size <strong>on</strong> Electromagnetic Radiati<strong>on</strong> froma Source in the Human Body Following a 2450 MHz RadioFrequency (RF) ExposureLisheng Xu; Qinghu Meng; and H<strong>on</strong>gliang Ren, — The Chinese Universityof H<strong>on</strong>g K<strong>on</strong>gFor assessment of compliance with the safety guidelines, the radiati<strong>on</strong>effects and efficiencies of ingested wireless devices in human body trunkmodels of five-year-old children, ten-year-old children, and adults arestudied using several homogenous models and a half-wavelength dipoleat the frequency of 2450 MHz in this paper. The finite-difference timedomain(FDTD) method was used for analyzing the radiati<strong>on</strong> effects andefficiencies. Results show that radiati<strong>on</strong> efficiencies decrease with theincrement of body size greatly, ranging from -53 db to -116 db.C<strong>on</strong>sidering the signal efficiency of wireless devices and safety guidelinesof radiati<strong>on</strong> exposure, we recommend to set the ingested wirelessdevice to different power levels for users with different body size such asfive-year-old children, ten-year-old children, and adults.Evaluati<strong>on</strong> of the Genotoxic Potential of MicrowaveElectromagnetic Fields in Oni<strong>on</strong> (Allium Cepa)Mirta Tkalec; Zeljka Vidakovic-Cifrek; and Branka Pevalek-Kozlina, —Department of Botany, University of Zagreb; Kresimir Malaric; RomanMalaric; — Department of Wireless Communicati<strong>on</strong>, University of ZagrebAllium cepa seeds were exposed to 900 MHz EMF in a GTEM cellat four different field strengths (10, 23, 41 and 120 V m-1) for 2hours. The effects of a l<strong>on</strong>ger exposure time (4 hours) and modulati<strong>on</strong>was also investigated. The germinati<strong>on</strong> rate and root lengthdid not change significantly after EMF exposure. However, the EMFat higher strengths (41 and 120 V m-1) and with modulati<strong>on</strong>, aswell as l<strong>on</strong>ger exposure, significantly increased mitotic index comparedto corresp<strong>on</strong>ding c<strong>on</strong>trols. The percentage of mitotic abnormalities,mainly c<strong>on</strong>sisting of laggards, anaphase bridges, C-mitosis,vagrants and unequal distributi<strong>on</strong>, increased with all the given fieldc<strong>on</strong>diti<strong>on</strong>s.The Study of Electric Field Effect to Bending <strong>on</strong> the Growthof the Primary Root of RiceThyanuch Rotcharoen, Phetchabun Rajabhat UniversityThe growing of rice seeds (Oryza sativa L.) <strong>on</strong> a primary root stage aretested under the c<strong>on</strong>diti<strong>on</strong>s of an electric field at 28.5 kV/m, a varyingelectrode in the horiz<strong>on</strong>tal directi<strong>on</strong>, and without an electric field.This work focused <strong>on</strong> examining the bending of the root directi<strong>on</strong> andmeasuring the space angle after 8, 16 and 24 hours. The values withE-field and without E-field are compared. The results indicate that thepreferred directi<strong>on</strong> of root bending is toward the negative electrode.Analysis <strong>on</strong> the Propagati<strong>on</strong> of Wideband EM WavesEmitted from a Partial Discharge Using the C<strong>on</strong>strainedInterpolati<strong>on</strong> Profile (CIP) MethodMasatake Kawada, The University of Tokushima; and Katsuo Isaka, N/AMeasurements of partial discharge (PD) have been used to assess thec<strong>on</strong>diti<strong>on</strong> of insulati<strong>on</strong> material used in electric power equipment.Analysis of the <strong>electromagnetic</strong> (EM) waves emitted by the PD is usefulfrom the viewpoint of n<strong>on</strong>-c<strong>on</strong>tact diagnosis because a PD emitswideband EM waves. The c<strong>on</strong>strained interpolati<strong>on</strong> profile (CIP)method is used to visualize the EM waves emitted from a PD forunderstanding the physical mechanisms. The PD is numericallyobtained by the total amount of charge and the rise time. Numericalresults show that the CIP is useful for analyzing the relati<strong>on</strong>shipbetween the PD current and the EM waves.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


WORKSHOPS - 8 and 9 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>; visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updatesNanotechnologies and Advanced MaterialsFormat: Half-day WorkshopEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 45Advanced EMC Technologies in the Pan-Pacific Regi<strong>on</strong>Format: Half-day WorkshopChairs: Dr. Christopher L. Holloway, NIST, Boulder, ColoradoProf. Maria Sabrina Sarto, University of Rome “La Sapienza”, Rome,ItalyAbstractNanotechnology is functi<strong>on</strong>al engineering <strong>on</strong> an extremely smallscale that can be used to develop innovative advanced materials (e.g.metamaterials, frequency selective surfaces, phot<strong>on</strong>ic band gap, etc.),comp<strong>on</strong>ents and devices, and implants for numerous industrial applicati<strong>on</strong>s.It involves the c<strong>on</strong>trol of materials with a nanoscale finestructure, and with the manipulati<strong>on</strong> of tiny objects at the dimensi<strong>on</strong>of molecules and atoms. Nanotechnology is currently exploited inmicroelectr<strong>on</strong>ics, optoelectr<strong>on</strong>ics, and material science, but its applicati<strong>on</strong>in EMC is still not very wide.Planned Topics• The applicati<strong>on</strong> of carb<strong>on</strong> nanotube based nanodevices and nanostructuredmaterials for nanointerc<strong>on</strong>nects and shielding materials.Issues related to the fabricati<strong>on</strong>, the measurement of the electricaland <strong>electromagnetic</strong> properties, and the <strong>electromagnetic</strong> modelingat radio frequency will be treated.• The applicati<strong>on</strong> of metamaterial for antennas and <strong>electromagnetic</strong> filters.EMC and Wireless DevicesFormat: Full-day WorkshopChair: Dan Hoolihan, Hoolihan EMC C<strong>on</strong>sulting, MinnesotaAbstractThe overall workshop will provide key informati<strong>on</strong> <strong>on</strong> EMC c<strong>on</strong>cernsas they pertain to present and future wireless/cellular ph<strong>on</strong>e technologiesand associated packaging issues. More specifically, thisworkshop will address the <strong>electromagnetic</strong> interference (EMI) aspectsof the proliferati<strong>on</strong> of modern wireless devices such as current radioand cell ph<strong>on</strong>e technologies. It will address both EMI from productto product such as cellular ph<strong>on</strong>es, wireless radio devices, and packaging,as well as relevant spectrum allocati<strong>on</strong> issues.Planned Topics• EMI from Licensed Cell and Wireless Transmitters• EMI for Unlicensed Cell and Wireless Transmitters• Telecom Certificati<strong>on</strong> Body (TCB) Issues with Wireless/Telecommunicati<strong>on</strong>s Devices• EMI and Future Wireless and Cellular Technologies• Internati<strong>on</strong>al and Regulatory Aspects of EMI AndWireless/Cellular Devices• The New ANSI C63.10 Standard For Testing Unlicensed WirelessDevicesPlanned Speakers1. Dave Case, Cisco Systems, Richm<strong>on</strong>d, Ohio2. Mike Violette, Washingt<strong>on</strong> Laboratories, Maryland3. Michael Foegelle, ETS-Lindgren, Cedar Park, Texas4. Kevin Slattery, Intel Corporati<strong>on</strong>, Oreg<strong>on</strong>5. Harry Skinner, Intel Corporati<strong>on</strong>, Oreg<strong>on</strong>6. Steve Berger, TEM C<strong>on</strong>sulting, Georgetown, Texas7. Andrew Drozd, ANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>s, Rome, New York8. Art Wall, Radio Regulatory C<strong>on</strong>sultants, Inc., MarylandChair: Professor Ryuji Koga, Okayama University, JapanAbstractTaking the opportunity of <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium <strong>on</strong>EMC being held in Hawaii, to focus <strong>on</strong> and introduce the latest EMCtechnologies in the Pan-Pacific regi<strong>on</strong>, EMCJ Technical Group in theInstitute of Electr<strong>on</strong>ics, Informati<strong>on</strong> and Communicati<strong>on</strong> Engineersproposed the workshop entitled “Advanced EMC Technologies in thePan-Pacific Regi<strong>on</strong>”.Planned Topics• Crosstalk in Complex Printed Circuits• Envir<strong>on</strong>mental EMC• PCB analysis• EMC in Power Electr<strong>on</strong>ics• Biological EMCPlanned Speakers1. D<strong>on</strong>g Chul Park, Chungnam Nati<strong>on</strong>al University, Daeje<strong>on</strong>, Korea2. Gao Yougang, Beijing University of Posts & Telecommunicati<strong>on</strong>s,Beijing, China3. Werachet Khan-ngern, King M<strong>on</strong>gkut’s Institute of TechnologyLadkrabang, Thailand4. Osamu Fujiwara, Nagoya Institute of Technology, Japan5. Le-Wei Li, Nati<strong>on</strong>al University of Singapore, Singapore6. Shuichi Nitta, Salesian Polytechnic, JapanManaging Regulatory Access to Asia Pacific MarketsFormat: Full-day WorkshopChairs:Mr. Kwok Soohoo, Site EMC Coordinator, IBM, Poughkeepsie, New YorkMs. Mary Jo DiBernardo, Program Manager, Nati<strong>on</strong>al Institute ofStandards and Technology (NIST), MarylandMr. William Hurst, Chief of Technical Research Branch, FederalCommunicati<strong>on</strong>s Commissi<strong>on</strong> (FCC), Washingt<strong>on</strong> D.C.AbstractMarkets in the Asia Pacific regi<strong>on</strong> are heavily sought after, butkeeping up with technical regulati<strong>on</strong>s around the world can be achallenge. EMC regulatory requirements vary widely, and rulesregarding testing, product certificati<strong>on</strong>, declarati<strong>on</strong> of c<strong>on</strong>formity,registrati<strong>on</strong>, and MRAs (Mutual Recogniti<strong>on</strong> Agreements) can bec<strong>on</strong>fusing and costly for manufacturers – and the test labs and certificati<strong>on</strong>bodies who serve them – to effectively market their productsin these countries. In this workshop, participants will learnabout the EMC regulatory requirements of various Asia Pacificcountries, as well as the U.S. and Canada, and the steps that are necessaryin order to successfully market a product to some of the countriesin this regi<strong>on</strong>.Planned Speakers1. Mr. Kwok Soohoo, IBM, Poughkeepsie, New York2. Ms. Mary Jo DiBernardo, Nati<strong>on</strong>al Institute of Standards andTechnology, Maryland3. Mr. William Hurst, Federal Communicati<strong>on</strong>s Commissi<strong>on</strong>,Washingt<strong>on</strong> D. C.4. Mr. Wei Chen, China Quality Certificati<strong>on</strong> Center, China©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


46EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM5. Professor Guili He, China Telecommunicati<strong>on</strong> TechnologyLaboratories, China6. Mr. K. Santhosh Kumar, Dell India R&D Center, India7. Mr. Satoshi Shibata, Voluntary C<strong>on</strong>trol Council for Interference(VCCI) Internati<strong>on</strong>al Relati<strong>on</strong>s SC Chair, Panas<strong>on</strong>ic, Japan8. Ms. Melinda Tan, Info-Communicati<strong>on</strong> Development Authority,Singapore9. Mr. Su-Jin S<strong>on</strong>g, Radio Research Laboratory, Ministry ofInformati<strong>on</strong> and Communicati<strong>on</strong>, Korea10. Mr. Andy Kwan, Industry Canada, Ottawa, Canada11. Mr. Yung-Chi Tang, Bureau of Standards, Metrology andInspecti<strong>on</strong>, Taiwan12. Mr. Mick Owens, Australian Communicati<strong>on</strong>s and MediaAuthority, Australia13. Mr. W. K. Luk, Office of the Telecommunicati<strong>on</strong>s Authority,H<strong>on</strong>g K<strong>on</strong>gTUTORIALS — 8 and 9 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>The informati<strong>on</strong> is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>; visit www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updatesLimitati<strong>on</strong>s of Simulati<strong>on</strong> Techniques and Proper ModelValidati<strong>on</strong> for Both Signal Integrity and EMCFormat: Half-day TutorialChair: Bruce Archambeault, IBM, North CarolinaAbstractThis tutorial discusses the limitati<strong>on</strong>s and applicati<strong>on</strong>s of different simulati<strong>on</strong>techniques, as well as how to properly validate simulati<strong>on</strong> results.It is intended to help SI and EMC engineers who know the basics of themodeling techniques learn the details of the method limitati<strong>on</strong>s, and tohelp them run simulati<strong>on</strong>s properly and efficiently. Experienced modelerscan also benefit from the discussi<strong>on</strong>s of model validati<strong>on</strong>.Planned Speakers1. Bruce Archambeault, IBM, North Carolina2. Jim Drewniak, University of Missouri-Rolla, Missouri3. Colin Brench, Hewlett-Packard, Richards<strong>on</strong>, Texas4. Charles Bunting, Oklahoma State University, Oklahoma5. Jim Nadolny, Samtec, Pennsylvania6. Jun Fan, NCR, San Diego, CaliforniaIntroducti<strong>on</strong> to EMI Modeling TechniquesFormat: Half-day TutorialChair: Charles Bunting, Oklahoma State University, OklahomaAbstractThis tutorial will provide an introducti<strong>on</strong> to all of the comm<strong>on</strong>ly used numericalEMC modeling techniques, beginning with circuit based approaches andending with Maxwell’s equati<strong>on</strong> – full field soluti<strong>on</strong> methods. Each techniquewill be presented al<strong>on</strong>g with their strengths and weakness.Planned Speakers and Topics1. The Transmissi<strong>on</strong> Line MethodDr. David Johns, Flomerics, Massachusetts2. Introducti<strong>on</strong> to the Partial Element Equivalent Circuit TechniqueGiulio Ant<strong>on</strong>ini, University of L’Aquila, Italy3. The Finite-Difference Time-Domain TechniqueDr. Bruce Archambeault, IBM, North Carolina4. Understanding the Finite Element MethodDr. Charles F. Bunting, Oklahoma State University, Oklahoma5. Introducti<strong>on</strong> to the Method of MomentsDr. Ji Chen, University of Houst<strong>on</strong>, TexasEMC and Modern Power Electr<strong>on</strong>ic SystemsFormat: Half-day TutorialChair: Dr. Firuz Zare, Queensland University of Technology, AustraliaAbstractThe purpose of this tutorial is to address basic and advanced c<strong>on</strong>ceptsof EMC in modern power electr<strong>on</strong>ic systems that help EMC experts toanalyze EMC problems of power electr<strong>on</strong>ics used in different applicati<strong>on</strong>s.Introducing power electr<strong>on</strong>ics in details such as transformer andmotor design, modulati<strong>on</strong> strategy, and switching losses to EMCexperts may open a new research area and help development engineersto find better soluti<strong>on</strong>s to minimize sources of EMI noise at the developmentphase and improve cost, size and performance of the system.Planned Topics• Power Electr<strong>on</strong>ics: topologies, applicati<strong>on</strong>s, pulse width modulati<strong>on</strong>• Major EMI problems in power electr<strong>on</strong>ic systems• Active EMI filters used in motor drives• Methods to predict and minimize c<strong>on</strong>ducted emissi<strong>on</strong> noise inmotor drive systems• Important feedbacks from EMC experts to development engineersBasic EMC MeasurementsFormat: Half-day TutorialChair: D<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultants, New JerseyAbstractThe tutorial will present an introducti<strong>on</strong> to basic EMC measurementswith primary focus <strong>on</strong> emissi<strong>on</strong> testing. While intended for those newto this discipline, the tutorial will provide to the attendees the latestactivity in nati<strong>on</strong>al and <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> standards related to EMC measurementsand standards. A special focus c<strong>on</strong>tinues to be <strong>on</strong> measurementsand associated test facility and calibrati<strong>on</strong> issues above 1 GHzas well as associated measurement uncertainties.Planned Speakers and Topics1. Table Top EUT Emissi<strong>on</strong> MeasurementsSteve Koster, Washingt<strong>on</strong> Laboratories, Maryland2. Floor Standing EUT Emissi<strong>on</strong> MeasurementsBob Hofmann, Hofmann EMC Engineering, Illinois3. Transient Immunity TestingTom Braxt<strong>on</strong>, Braxt<strong>on</strong> EMC C<strong>on</strong>sulting, Illinois4. C<strong>on</strong>tinuous RF Immunity TestingJohn Maas, IBM, Minnesota5. Measurement Sites and Associated ErrorsD<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultants, New Jersey6. Selecting a Quality Test LabDan Hoolihan, Hoolihan EMC C<strong>on</strong>sulting, Minnesota7. Measurement Uncertainty as it Applies to Pass/Fail ResultsD<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultants, New JerseyEMC Aspects of LightningPart 1: Lightning Characteristics and ModelingFormat: Half-day TutorialChairs:Dr. Farhad Rachidi, Swiss Federal Institute of Technology,©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 47SwitzerlandVladimir Rakov, University of Florida, FloridaRajeev Thottappillil, Uppsala University, SwedenAbstractLightning represents <strong>on</strong>e of the most important sources of <strong>electromagnetic</strong>disturbances. The objective of this tutorial is to give anoverview of measured and modeled lightning parameters and todescribe lightning’s major EMC interacti<strong>on</strong>s with systems for engineeringapplicati<strong>on</strong>s with an insight into protecti<strong>on</strong> methods.Planned Speakers and Topics1. Lightning Currents for Engineering Applicati<strong>on</strong>sAlberto Borghetti, University of Bologna, ItalyGerhard Diendorfer, Austrian Electrotechnical Associati<strong>on</strong>, AustriaVladimir Rakov, University of Florida, Florida2. Lightning Electric and Magnetic FieldsVladimir Rakov, University of Florida, Florida3. Lightning Return Stroke Models and Electromagnetic FieldComputati<strong>on</strong>Rajeev Thottappillil, Uppsala University, SwedenVern<strong>on</strong> Cooray, Uppsala University, SwedenNels<strong>on</strong> Theethayi, Uppsala University, Sweden4. Lightning to Tall StructuresYoshihiro Baba, Doshisha University, JapanFridolin Heidler, University of the Federal Armed Forces, Munich,GermanyFarhad Rachidi, Swiss Federal Institute of Technology, SwitzerlandRajeev Thottappillil, Uppsala University, Sweden5. Lightning Locati<strong>on</strong> SystemsGerhard Diendorfer, Austrian Electrotechnical Associati<strong>on</strong>, AustriaMarcos Rubinstein, University of Applied Sciences, SwitzerlandEMC Aspects of LightningPart 2: Lightning Interacti<strong>on</strong> with Systems and Protecti<strong>on</strong>Format: Half-day TutorialChairs:Dr. Farhad Rachidi, Swiss Federal Institute of Technology,SwitzerlandVladimir Rakov, University of Florida, FloridaRajeev Thottappillil, Uppsala University, SwedenAbstractLightning represents <strong>on</strong>e of the most important sources of <strong>electromagnetic</strong>disturbances. The objective of this tutorial is togive an overview of measured and modeled lightning parametersand to describe lightning’s major EMC interacti<strong>on</strong>s with systemsfor engineering applicati<strong>on</strong>s with an insight into protecti<strong>on</strong>methods.Planned Speakers and Topics1. Grounding Systems for High Frequencies and TransientsLe<strong>on</strong>id Grcev, Sts. Cyril and Methodius University, Skopje,Maced<strong>on</strong>ia2. Lightning Protecti<strong>on</strong> of Buildings and Laboratory TestingStanislaw Grzybowski, Mississippi State University, Mississippi3. Lightning-Induced Voltages <strong>on</strong> Overhead LinesCarlo Alberto Nucci, University of Bologna, ItalyFarhad Rachidi, Swiss Federal Institute of Technology, Switzerland4. Lightning Protecti<strong>on</strong> of Power SystemsCarlo Alberto Nucci, University of Bologna, ItalyMario Paol<strong>on</strong>e, University of Bologna, Italy5. Lightning Interacti<strong>on</strong> with Electrified RailwaysNels<strong>on</strong> Theethayi, Uppsala University, SwedenRajeev Thottappillil, Uppsala University, Sweden6. Lightning Interacti<strong>on</strong> with AircraftAnders Larss<strong>on</strong>, Swedish Defence Research Agency, SwedenFundamentals of EMC and NARTE Exam Preparati<strong>on</strong>Format: Full-day TutorialChair: Randy Jost, Utah State University, UtahAbstractOrganized by the EMC Society Educati<strong>on</strong> and Student ActivitiesCommittee, this tutorial is designed to present the basics ofEMC to those who are new to the field of EMC, for those whoare seeking informati<strong>on</strong> <strong>on</strong> an aspect of EMC that they have notpreviously encountered, or for those who desire a refresher <strong>on</strong>the proposed EMC topics. The last 90 minutes of this tutorial isdevoted to providing assistance to those who are preparing totake the examinati<strong>on</strong> to become NARTE certified EMC engineersor technicians.Speakers and Topics1. EM Radiati<strong>on</strong>John Norgard, University of Colorado, Colorado Springs, Colorado2. Electrostatic DischargeDavid Pommerenke, University of Missouri-Rolla, Missouri3. EMI TroubleshootingDavid Hockans<strong>on</strong>, Sun Microsystems, Menlo Park, California4. EMC Case HistoriesLee Hill, SILENT Soluti<strong>on</strong>s, Amherst, New Hampshire5. NARTE Overview and Exam Preparati<strong>on</strong>Brian Lawrence, NARTE Executive DirectorFundamentals and Applicati<strong>on</strong>s of Antennas and FieldProbes in Radiated MeasurementsFormat: Half-day TutorialChair: Zh<strong>on</strong>g Chen, ETS-Lindgren, Cedar Park, TexasAbstractThis tutorial provides an introducti<strong>on</strong> to antenna and probe theoryand applicati<strong>on</strong> relevant to EMC. This tutorial covers fundamentalprinciples of operati<strong>on</strong> for various comm<strong>on</strong> antenna and field probec<strong>on</strong>figurati<strong>on</strong>s covering the frequency spectrum associated withEMC testing. The essential descriptive characteristics of antennasand probes are defined. The implicati<strong>on</strong>s of the antenna characteristics<strong>on</strong> EMC testing are discussed including the nature and use ofantenna factors, gain, radiati<strong>on</strong> resistance, VSWR, etc.Applicati<strong>on</strong>s of the antennas in radiated emissi<strong>on</strong>s and immunitiestests, and radiated site validati<strong>on</strong>s measurements are covered.Processing and interpretati<strong>on</strong> of antenna signals by receivers andanalyzers are discussed including discussi<strong>on</strong>s of signal type, signalbandwidth, and filtering of signals. This tutorial will also providethe latest updates <strong>on</strong> ANSI and <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> standards <strong>on</strong> calibrati<strong>on</strong>of the antennas and applicati<strong>on</strong>s of antennas in radiated emissi<strong>on</strong>sand immunities measurements.Planned Speakers1. Dr. Vince Rodriguez, ETS-Lindgren, Cedar Park, Texas2. Mike Windler, Chairman of ANSI ASC C63 Subcommittee 1(C63.4/C63.5), Underwriters Laboratories, Illinois3. Zh<strong>on</strong>g Chen, ETS-Lindgren, Cedar Park, Texas4. Tom Holmes, Agilent Technologies, Ohio5. Dr. Qin Yu, Lucent Technologies, Ohio©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


48EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMElectromagnetic Bandgap Structures for EMI/EMC Applicati<strong>on</strong>sFormat: Half-day TutorialChair: Omar Ramahi, University of Waterloo, CanadaAbstractWe will discuss the theoretical background behind ElectromagneticBandgap structures with the intenti<strong>on</strong> to dispel any myths that preventthe comm<strong>on</strong> EMI/EMC practiti<strong>on</strong>er from using this simple yethighly effective technology. We will discuss design rules and presentsimulati<strong>on</strong> technique that assist the designer in extracting the fullpotential of EBG structures.Planned Topics• Electromagnetic Bandgap: C<strong>on</strong>cept and Background• Planar and n<strong>on</strong>-planar EBG structures• EBG for noise mitigati<strong>on</strong> in boards• EBG for noise mitigati<strong>on</strong> in packages• EBG for noise reducti<strong>on</strong> of coupling between system comp<strong>on</strong>ents• EBG: Design and Simulati<strong>on</strong>Planned Speakers1. Omar M. Ramahi, University of Waterloo, Canada2. Madhavan Swaminathan, Georgia Institute of Technology, GeorgiaEMC in Modern Defense SystemsFormat: Half-day TutorialChair: Eli Recht, EL-OP Industry, IsraelAbstractThe EMC in defense systems has made major developments in recentyears because of more sophisticated systems, high speed digital technology,developing advanced RF and electro optic sensors, and veryhigh sensitivity systems together with harsh <strong>electromagnetic</strong> envir<strong>on</strong>ment.This tutorial will describe the EMC design in moderndefense platforms – airborne, ground, naval, and space. The tutorialwill c<strong>on</strong>centrate <strong>on</strong> various EMC design methodology and techniquesfrom comp<strong>on</strong>ent level to system and platform level.Planned Speakers1. Eli Recht, EL-OP Industry, Israel2. Vidi Bar-Natan, EL-OP Industry, IsraelInternati<strong>on</strong>al Advances in Site Validati<strong>on</strong> Techniques andRelated Activity Above 1 GHzFormat: Half-day TutorialChairs:Janet O’Neil, ETS-Lindgren, Seattle, Washingt<strong>on</strong>Dr. Vince Rodriguez, ETS-Lindgren, Cedar Park, TexasAbstractFor some time now, the American Nati<strong>on</strong>al Standards Institute(ANSI) Accredited Subcommittee (ASC) C63 (ElectromagneticCompatibility) has had a working group in place tasked with developingnew procedures for validating EMC test sites above 1 GHz.IEC/CISPR is addressing this topic as well as other associated topicssuch as measurement methods and test instrumentati<strong>on</strong> in this frequencyrange. This tutorial is intended to bring a number of c<strong>on</strong>tributorstogether to detail the progress to date and look at opti<strong>on</strong>savailable for EMC testing at higher frequencies in the future. Thistutorial will provide an introducti<strong>on</strong> to the validati<strong>on</strong> techniquesthat are likely to be required in the near future, as well as discussi<strong>on</strong>of the difficulties likely to be faced, and will include the status ofassociated test instrumentati<strong>on</strong> and measurement methods above 1GHz. It is an ideal opportunity for attendees to obtain valuable informati<strong>on</strong>about upcoming requirements in an informal atmosphere.Planned Topics and Speakers1. EMC Internati<strong>on</strong>al Standards Update On Measurement, TestInstrumentati<strong>on</strong> and Site Validati<strong>on</strong> Associated WithRadiated Emissi<strong>on</strong> Applicati<strong>on</strong> Above 1 GHz, IncludingRelated Activity in ANSI ASC C63, and IEC/CISPRD<strong>on</strong> Heirman, D<strong>on</strong> HEIRMAN C<strong>on</strong>sultants, New Jersey2. Site Qualificati<strong>on</strong> above 1 GHz: A comparis<strong>on</strong> of the CISPRSite Method and the ANSI Time-Domain MethodMike Windler, Underwriters Laboratories Inc., Illinois3. Absorber Placement Requirements, Including a Summary ofSpecific CISPR/A Activity in this AreaWerner Schaefer, Cisco, San Jose, California4. Antenna Characteristics Above 1 GHz, Including a Review ofAntenna Theory and the Importance of Pattern Informati<strong>on</strong>Vince Rodriguez, ETS-Lindgren, Cedar Park, Texas5. Site Validati<strong>on</strong> Above 1 GHz in Europe: Antenna Applicati<strong>on</strong>sand Chamber ImpactAlexander Kriz, Austrian Research Centers (ARC) GmbH, AustriaDesign and Modeling Methods for Power IntegrityFormat: Half-day TutorialChair: Madhavan Swaminathan, Georgia Institute of Technology,GeorgiaAbstractThe focus of this tutorial is <strong>on</strong> the design of advanced packages andsystems with respect to signal integrity and power integrity. Theemphasis will be <strong>on</strong> modeling and simulati<strong>on</strong> methods for powerdelivery networks in semic<strong>on</strong>ductor systems.Planned Topics• Trends in multi-core processors• Target impedance• Frequency range addressed by chip, package and board• Chip – package res<strong>on</strong>ance• Embedded decoupling in package• EMI issues with embedded communicati<strong>on</strong> devices• Electr<strong>on</strong>ic bandgap (EBG) structures• High-frequency materials characterizati<strong>on</strong>• Frequency and time domain methods for modeling chip, packageand board• Modeling of n<strong>on</strong>-ideal planes• Modal decompositi<strong>on</strong>• Stability, passivity and causality• Accurate modeling and simulati<strong>on</strong> methods• Linear and n<strong>on</strong>-linear macro-modeling methods• Applicati<strong>on</strong>s such as multi-core processors, cellular, WLAN and ADC• Near field and far field radiati<strong>on</strong>Planned Speakers1. Dr. Ege Engin, Georgia Institute of Technology, Georgia2. Madhavan Swaminathan, Georgia Institute of Technology, GeorgiaExperiences in Crafting EMC StandardsFormat: Half-day TutorialChair: Qiubo Ye, IEEE EMC Society SETCom, Communicati<strong>on</strong>sResearch Centre, Canada©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 49AbstractThis half-day tutorial aims to providing opportunities for those whowould like to learn EMC standards. General knowledge will be given<strong>on</strong> the following standards for: methods of measurement of radio frequencypower-line interference filter in the range of 100 Hz to 10GHz, the broadband over power line, the assessment of human exposureto radio frequency <strong>electromagnetic</strong> fields from portable wirelessdevices, and next generati<strong>on</strong> wireless and spectrum management.Planned Topics and Speakers1. A Tutorial <strong>on</strong> IEEE Standard 1560Kermit Phipps, EPRI PEAC Corporati<strong>on</strong>, Knoxville, Tennessee2. Introducti<strong>on</strong> to the BPL StandardsEd Hare, W1RFI, ARRL Laboratory, Newingt<strong>on</strong>, C<strong>on</strong>necticut3. IEEE Standards for the Assessment of Human Exposure to RadioFrequency Electromagnetic Fields from Portable Wireless DevicesMark Douglas, Motorola Labs, Ft. Lauderdale, FloridaWolfgang Kainz, Food and Drug Administrati<strong>on</strong>, Rockville,Maryland4. A Tutorial <strong>on</strong> IEEE Standard 1900Stephen Berger, TEM C<strong>on</strong>sulting, Georgetown, Texas5. Standard Technique for the Shielding EffectivenessMeasurement of “Small” Enclosure: the Ongoing ProjectP299.1Maria S. Sarto, University of Rome, "La Sapienza", Italy6. Automotive EMC Standards in Europe and the U. S. A.Huad<strong>on</strong>g Li, EMC Laboratory, Pi<strong>on</strong>eer Automotive Technologies,Inc., Springboro, Ohio7. EMC Standards in ChinaJinliang He, Tsinghua University, Beijing, ChinaSPECIAL TUTORIAL: IEC ACEC EMC Standards TutorialA C<strong>on</strong>versati<strong>on</strong> with the IEC Advisory Committee <strong>on</strong> EMCFormat: 90-Minute TutorialChair: Bill Radasky, Metatech Corporati<strong>on</strong>, Goleta, California;Chairman of IEC ACECAbstractCome and hear about the IEC EMC Standards. Worldwide leaders of theIEC (Internati<strong>on</strong>al Electrotechnical Commissi<strong>on</strong>) Advisory Committee<strong>on</strong> EMC (ACEC) will be holding a 90 minute tutorial <strong>on</strong> the work andgoals of major IEC EMC standards committees. Not <strong>on</strong>ly will you hearwhat is happening but also you will have a chance to meet them andshare your views and get their reacti<strong>on</strong>s. This will be a first such eventat our EMC Symposium. We hope you all can come as this will start atthe end of the afterno<strong>on</strong> workshops/tutorials <strong>on</strong> the sec<strong>on</strong>d day of the<str<strong>on</strong>g>symposium</str<strong>on</strong>g>, and will not be in c<strong>on</strong>flict with any parallel activity.NARTE WORKSHOP, EXAMINATION AND EVENTSSCHEDULE AT EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>NARTE is pleased and privileged to supportthis 50th Anniversary of the IEEEEMC Society at EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Please notethat <str<strong>on</strong>g>2007</str<strong>on</strong>g> is also the 25th Anniversary ofNARTE and we will be having a specialpresentati<strong>on</strong> cerem<strong>on</strong>y for our 25 l<strong>on</strong>geststanding EMC members at the AwardsLunche<strong>on</strong> <strong>on</strong> Thursday, July 12th. Wehope that these l<strong>on</strong>g serving memberswill be present in pers<strong>on</strong> at this event.Please make a note of the followingimportant dates:Sunday, July 8The NARTE Examinati<strong>on</strong>s Preparati<strong>on</strong> Tutorial will be included as apart of “The Fundamentals of EMC” Tutorial. This is a recommendedTutorial for all who plan to take the NARTE Certificati<strong>on</strong>Examinati<strong>on</strong>s at the end of EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>, and all those who plan toattend The Global EMC University. At the Tutorial we will adviseattendees as to the format of the two part examinati<strong>on</strong>s, we will discussthe best approach to ensure success and provide some workingexamples of typical exam questi<strong>on</strong>s.Tuesday, July 10 to Thursday, July 12NARTE will be at our usual Exhibiti<strong>on</strong> Booth each day. We invite allour members and any<strong>on</strong>e interested in learning more about NARTEand our Certificati<strong>on</strong> programs to come and visit us there. We can registeryou for the Saturday examinati<strong>on</strong> at our Booth if you have notpreviously registered. We will also have <strong>on</strong> display, and for purchase,www.narte.orgbooks and CD’s that may be used as StudyGuides for the Examinati<strong>on</strong>s.Thursday, July 12NARTE will have a special presentati<strong>on</strong> atthe Awards Lunche<strong>on</strong> to recognize the 25l<strong>on</strong>gest serving members of our EMCCertificati<strong>on</strong> Programs.Saturday, July 14The NARTE Certificati<strong>on</strong> Examinati<strong>on</strong>swill be held at the Hilt<strong>on</strong> HawaiianVillage Hotel from 8:00 am to 5:00pm.We hope that many who attend theGlobal EMC University lectures duringthe week will validate their knowledge and experience by becominga NARTE Certified Engineer or Technician. This is an ideal timeand place to take the open book Examinati<strong>on</strong> element of ourCertificati<strong>on</strong> Process. The Exams for EMC Engineer and EMCTechnician will run c<strong>on</strong>currently. Each is a two-part paper, and eachpart is scheduled to run for four hours with an opti<strong>on</strong>al <strong>on</strong>e hourbreak at lunchtime (lunch is <strong>on</strong> your own). Candidates may bringany reference materials and a PC to the examinati<strong>on</strong> room. We d<strong>on</strong>ot guarantee to provide wireless Internet access, but it may beused if available.If you are looking for a reas<strong>on</strong> to come to Hawai‘i this year, thensign up for NARTE certificati<strong>on</strong> and take the examinati<strong>on</strong> atEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Pass or fail, you will be assured of having a greatexperience.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


New for the EMC Symposium isthe “Global EMC University”Recognizing the need for low cost, high quality educati<strong>on</strong> <strong>on</strong>EMC, the Global University was developed to provide tutorialswith C<strong>on</strong>tinuing Educati<strong>on</strong>al Unit credits. (CEU’s) Nowhere elsewill <strong>on</strong>e find these noted experts from all over the world in<strong>on</strong>e place at <strong>on</strong>e time for EMC Educati<strong>on</strong> at this level.Registrati<strong>on</strong> Fee: $250.00before May 14 and receive aFREE Global University Cap,Registrati<strong>on</strong> after May 14: $350.00Attendance is limited, sign up earlyRegistrati<strong>on</strong> to EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> is requiredIn additi<strong>on</strong> to the GU Class Fee.Through Educati<strong>on</strong>, Networking & Celebrati<strong>on</strong>East meets West


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 51The Global EMC UniversityClayt<strong>on</strong> Paul, Mercer UniversityFlavio Canavero, Politecnico di TorinoGlobal EMC University Co-chairsM<strong>on</strong>day, 9 July <str<strong>on</strong>g>2007</str<strong>on</strong>g> through Thursday, 12 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>This dedicated track is devoted to those relatively new to EMC andincludes a well-planned curriculum taught by world-renowned EMCexperts. Nowhere else can <strong>on</strong>e receive this level of EMC educati<strong>on</strong>from instructors all over the world in <strong>on</strong>e place at <strong>on</strong>e time. If you arenew to EMC, this track is for you!A certificate of completi<strong>on</strong> will be provided to students who havesigned in and signed out M<strong>on</strong>day through Thursday, thereby c<strong>on</strong>firming100% attendance at all lectures. CEUs will be assigned to thiscourse.Students of the Global EMC University are encouraged to attendThe Fundamentals of EMC Tutorial <strong>on</strong> Sunday, 8 July as the materialpresented during this full day tutorial was designed to complementthe Global EMC University curriculum.Learning Objectives/Outcomes:At the end of this sequence of lectures, the participant will:(1) Understand and be able to use the PSPICE circuit analysis programin solving EMC problems;(2) Be able to view the typical digital signals both in the time and thefrequency domains, and will understand the relati<strong>on</strong>ship betweenthe time-domain parameters and the spectral c<strong>on</strong>tent of the signal;(3) Understand the n<strong>on</strong>ideal (parasitic effects) of comp<strong>on</strong>ents (wiresand PCB lands, resistors, capacitors, inductors, ferrites, etc.);(4) Understand how to redesign a power supply filter to reduce thec<strong>on</strong>ducted emissi<strong>on</strong>s of a product;(5) Understand the basic properties of all antennas whether they beused for measurement of compliance or in immunity testing;(6) Understand how radiated <strong>electromagnetic</strong> fields are produced in anelectr<strong>on</strong>ic product and design methods that reduce those emissi<strong>on</strong>s;(7) Understand how <strong>electromagnetic</strong> shielding is accomplished andthe factors that affect those properties;(8) Understand how to design high-speed digital circuit to preservesignal integrity;(9) Understand crosstalk and the opti<strong>on</strong>s that the designer has to c<strong>on</strong>trolcrosstalk;(10)Understand the basic principles of proper PCB layout that c<strong>on</strong>trolsradiated and c<strong>on</strong>ducted emissi<strong>on</strong>s.GLOBAL EMC UNIVERSITY SCHEDULESunday, 8 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:30am to 5:30pmThe Fundamentals of EMC TutorialMultiple SpeakersStudents of the Global EMC University are encouragedto attend The Fundamentals of EMC Tutorialheld as part of the regular Symposium schedule. Thematerial presented during this full day tutorial wasdesigned to complement the Global EMC Universitycurriculum below.M<strong>on</strong>day, 9 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 9:50amUse of PSPICE in Solving EMC ProblemsInstructor: Professor Clayt<strong>on</strong> PaulOutline: Download PSPICE, basic program preparati<strong>on</strong>and coding rules, solving DC circuits, solving ACcircuits using the phasor circuit analysis method (frequencyresp<strong>on</strong>se and filters), solving for the timedomainsoluti<strong>on</strong> of circuits.10:10am to 12:00pmSignal SpectraInstructor: Professor Flavio CanaveroOutline: Fourier series, computati<strong>on</strong>al techniques,digital signal spectra and the relati<strong>on</strong> to timedomainparameters, using PSPICE to compute theFourier series, processing of the series by linearsystems.1:00pm to 2:50pmN<strong>on</strong>ideal Behavior of Comp<strong>on</strong>entsInstructor: Professor Todd HubingOutline: High-frequency behavior of resistors, capacitors,inductors, ferrites.3:10pm to 5:00pmC<strong>on</strong>ducted Emissi<strong>on</strong>s and Power SupplyFiltersInstructor: Professor Mark A. SteffkaOutline: Brief review of the c<strong>on</strong>ducted emissi<strong>on</strong>regulatory requirements, the LISN, comm<strong>on</strong>-modeand differential-mode currents, analysis of typicalpower supply filters.Tuesday, 10 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 9:50amAntennasInstructor: Professor Andy MarvinOutline: Review of <strong>electromagnetic</strong> waves (fieldstructure, propagati<strong>on</strong> velocity, power flow, relati<strong>on</strong>shipto c<strong>on</strong>stitutive parameters), general properties ofantennas (gain, directivity, effective aperture, antennafactor, input impedance), Friis transmissi<strong>on</strong> formulas,multipath, Hertzian and loop dipoles, nearfield/far-fieldcriteria, practical dipole antennas,baluns, examples of comm<strong>on</strong> EMC antennas.10:10am to 12:00pmRadiated Emissi<strong>on</strong>sInstructor: Professor Tom JerseOutline: Simple models for comm<strong>on</strong>-mode and differential-moderadiati<strong>on</strong>.Wednesday, 11 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 9:50amShieldingInstructor: Professor Christos ChristopoulosOutline: Meaning and uses of shielding, quantitativeevaluati<strong>on</strong> of shielding, gasketing, effects andmitigati<strong>on</strong> of apertures.10:10am to 12:00pmTransmissi<strong>on</strong> Lines and Signal IntegrityInstructor: Professor James DrewniakOutline: Time- and frequency-domain soluti<strong>on</strong> ofthe transmissi<strong>on</strong>-line equati<strong>on</strong>s, use of PSPICE toprovide soluti<strong>on</strong>s, effects of mismatch and whenthe line doesn’t matter, series and parallel matching,series and parallel distributi<strong>on</strong>, power distributi<strong>on</strong>and decoupling, effects of losses.Thursday, 12 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>8:00am to 9:50amCrosstalkInstructor: Professor Ant<strong>on</strong>io OrlandiOutline: Models for electrically short lines (inductiveand capacitive coupling), shielded wires andtwisted pairs.10:10am to 12:00pmPCB Layout and System C<strong>on</strong>figurati<strong>on</strong> forEMCInstructor: Professor Kye Yak SeeOutline: PCB layout c<strong>on</strong>siderati<strong>on</strong>s vs. radiatedemissi<strong>on</strong>s; correlati<strong>on</strong> of ground bounce and radiatedemissi<strong>on</strong>s; comm<strong>on</strong> mode <strong>on</strong> cables and its radiati<strong>on</strong>.NOTE: In order to take complete advantage ofthe presentati<strong>on</strong>s, attendees are str<strong>on</strong>glyencouraged to BRING LAPTOP OR NOTE-BOOK COMPUTERS TO THE SEMINAR.Please note that full registrati<strong>on</strong> at the IEEEEMC Symposium is required in additi<strong>on</strong> to theGlobal EMC University registrati<strong>on</strong> fee.The additi<strong>on</strong>al fee for the Global EMCUniversity is $250 USD if received by May 14or $350 USD if received after this date.Attendance at the Global EMC University islimited to ensure interacti<strong>on</strong> with the instructors.Please register early to reserve your space.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


52EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMThank you to the following exhibitors for your participati<strong>on</strong>in the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium <strong>on</strong>Electromagnetic Compatibility!Company Booth #19th Int'l Zurich Symposium <strong>on</strong> EMC 2082008 IEEE EMC Symposium 908; 9103M Electr<strong>on</strong>ic Adhesives & Specialties 703; 705; 707A.H. Systems 302; 304; 306Advanced Test Equipment Rentals 802Agilent Technologies 303; 305Ali<strong>on</strong> Science & Technology/R&B Laboratory 741American Assoc. for Lab Accreditati<strong>on</strong>/A2LA 435American TCB 535Amplifier Research 402 - 413ANDRO Computati<strong>on</strong>al Soluti<strong>on</strong>s 822; 824ANSI-Accredited Standards Committee C63 912Antenna Research Assoc. (ARA) 623Arc Technologies, Inc. 704Aval<strong>on</strong> Equipment 706California Instruments 714Capc<strong>on</strong> Internati<strong>on</strong>al, Inc. 103CKC Laboratories, Inc. 729Communicati<strong>on</strong>s & Power Industries 628C<strong>on</strong>formity Magazine 309; 311CST of America 528Cuming Lehman Chambers, Inc. 740Dynamic Sciences Internati<strong>on</strong>al 529; 531Educated Design & Development (ED&D) 328Electro Magnetic Applicati<strong>on</strong>s 532Elite Electr<strong>on</strong>ic Engineering, Inc. 815Elliott Laboratories 102EM Software & Systems 841EMC Soluti<strong>on</strong>s Ltd. 432EMI Solfware LLC T-3emi-tec GMBH 641EMS-Plus LLC T-1ETS-Lindgren503 islandFerroxcube USA 711Fischer Custom Communicati<strong>on</strong>s Inc 323, 325, 422, 424Flomerics 811Haefely EMC 634HV Technologies 725IBM Corporati<strong>on</strong> 643IECS Corp. 724IEEE EMC Society 914; 916IEEE PSES Society 906Instruments for Industry 715; 717Intermark (USA) Inc. 833; 835Isodyne Inc. 214ITEM Publicati<strong>on</strong>s 609; 611JDSU 533Kikusui America, Inc. 329; 331Lambda Americas 840Liberty Labs, Inc. 631; 633; 635Mentor Graphics 702Michigan Scientific Corp. 217Milmega Ltd 630; 632MuRata Electr<strong>on</strong>ics, Inc. 211NARTE Inc. 710NAVAIR 430NEC Informatec Systems 431; 433NEC Tokin America 429Nemko 216NIST 342Noise Laboratory Co. Ltd. 316Northwest EMC 307NVLAP 340Oak-Mitsui Technologies 222Panashield, Inc. 314Pears<strong>on</strong> Electr<strong>on</strong>ics Inc. 629PPM (Pulse Power & Measurement) Ltd. 625Quantum Change / EMC Systems 603; 605RF Exposure Lab LLC 209Rohde & Schwarz608 islandSAFETY & EMC Magazine 807Schlegel Systems, Inc. 203Seiren Co., Ltd. 223Seven Mountains Scientific Inc. 823Siemic, Inc. 210Sigrity Inc. 434Simlab Software GMBH 723Solar Electr<strong>on</strong>ics Co. 228Southwest Research Institute 534Spectrum C<strong>on</strong>trol, Inc. 322Spira Manufacturing 722SVAD- White Sands Missile Range 708Sypris Test & Measurement 709Taiyo Wire Cloth Co., Ltd 111Taiyo Yuden USA, Inc. 324TDK RF Soluti<strong>on</strong>s 523, 525, 622, 624Tecknit - Parker Hannifin Corp. 313TennMax America 803TESEQ (Schaffner EMC, Inc.) 423, 425, 522, 524Test & Measurement WorldMedia CenterThermo Electr<strong>on</strong> Corp. 615; 617TUV America, Inc. 202TUV Rheinland of N.A. 716U.S. Navy 428Underwriters Laboratories 308; 310Vanguard Products Corp. 335VCCI 817Vishay Intertechnology, Inc. 607W.L. Gore & Associates 215WaveZero 530Webcom Communicati<strong>on</strong>s T-2Wyle Laboratories 334Exhibtor listing is current as of 30 April <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Please see www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for updates to the exhibitor list.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


10'IEEE EMC SYMPOSIUMJULY 10-12, <str<strong>on</strong>g>2007</str<strong>on</strong>g>EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 53ALA WAI PROMENADELOADING DOCKL-UPTIONSx20'2"WROLL-UP2 SECTIONS14'2"Hx20'2"WCONCESSIONFAFH160 162360 361 460 461 463 46510'EXITWOMEN MEN WOMEN MENFH760 761 860 861 863DFCONCESSIONFAROLL-UP2 SECTIONS14'2"Hx20'2"W50'156 157 256 257 356357456 457 556 557 656 657756757 85685720'154 155 254 255 354152 153 252 253 352 353 452150 151 250 251 35040'PRODUCT50' APPLICATIONTHEATER248 249 34824610'247 346244 245 34410'35540'454 455 554 555 654 655453 55280'50TH ANNIVERSARYMUSEUM553 652 653 75210'754651 750649 748647 746645 74410'755 854753 852 853751 850749 848747 846 847745 84485585184984515'60'CAFE20'242 243 34210'80'643 742743 842240 241 340 641 740 741 840 84120'BREAK AREA84340'20'20'T7T6T5T4135 234 235 334 335 434 435 534 535 634 635 734 735 834 835133 232 233 332 333 432 433 532 533 632 633 732 733 832 83310'10' 10' 10' 10' 10' 10' 10'131 230 231 330 331 430 431 530 531 630 631 730 731 830 831129 228 229 328 329 428 429 528 529 628 629 72810'729 82882915'100'EXPERIMENTSAND DEMOSROLL-UP17'8"Hx20'0"WT310'T2125 224 225 324 325 424425 524525 624 625 724725 824 825EXITT1123 222 223 322 323 422 423 522 523 622 623 722723 82282310'FH20'FH FH80'30'116 117 216 217 316114 115 214 215 31410'110 111 210 211 310108 109 208 209 308106 107 206 207 306104 105 204102 103 20220'205 304203 30220'31331130960'BREAK AREA30'A/R10'10'30'30'R&S30720'30520' 20'303 402-413 503608ETS617 716615 714611 710609 708607 706605 704603 70220'717 816 817715 814 81510'711 810 811709 808 809707 806 807705 804703 80280580315'15'40'40'20'40'INTERNETCAFEGES SERVICENTER20'40'15'30' STORAGE900 902 904 906 908 910 912 914 91660'MEDIA CENTERFH FAFH FA FAWATERFALLENTRANCEREGISTRATIONLOBBYFAWOMENMENATKINSON DRIVEHAWAI'I CONVENTION CENTERHONOLULU, HAWAIIEXHIBIT HALL LEVELALL BOOTHS 10'x10' UNLESS OTHERWISE NOTED.PLAN PREPARED BY:5560 Katella AvenueCypress, CA 90630PH: 562-370-1500 FX: 562-370-1699SUBJECT TO FIRE MARSHALL APPROVALCopyright C by GES Expositi<strong>on</strong> Services, All Rights Reserved.No part of thispublicati<strong>on</strong> may be reproduced, stored in any retrieval system, or transmitted inany form by any means - electr<strong>on</strong>ic, mechanical photocopying, recording, orotherwise - without the express written c<strong>on</strong>sent of GES Expositi<strong>on</strong> Services.M-9777 22-04054 04-18-06J.HAAS 07-19-06P.PIETROK 12-18-0612-20-0612 27 06SCALE0' 5' 10' 15' 20' 30' 40' 50FE -FIRE EXTINGUISHERFA- FIRE ALARMFH -FIRE HOSE©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


54EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMEXHIBITORSYou are invited to take part in the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>alSymposium <strong>on</strong> Electromagnetic Compatibility from 8-13 Julyat the Hawai‘i C<strong>on</strong>venti<strong>on</strong> Center. This <str<strong>on</strong>g>symposium</str<strong>on</strong>g> is yourgateway to the emerging and dynamic markets in the Pacific Rim.We are expecting record attendance at this <str<strong>on</strong>g>symposium</str<strong>on</strong>g> for several reas<strong>on</strong>s:• The technical program is targeting engineers new to EMC in thePacific Rim where much EMC design work has in recent years beenoff-shored. They need the level of educati<strong>on</strong> that our <str<strong>on</strong>g>symposium</str<strong>on</strong>g>provides, the access to our industry experts, and the products andservices our exhibitors’ offer.• The technical program features a record number of papers, specialsessi<strong>on</strong>s, workshops, and tutorials. This resp<strong>on</strong>se by authors hasexceeded our expectati<strong>on</strong>s!• It’s the 50th anniversary of the founding of the EMC Society; manywill want to attend to join in the unique celebrati<strong>on</strong>s planned.• The vacati<strong>on</strong> destinati<strong>on</strong> appeals to engineers and their families whowill want to combine business and pleasure.• Hawai’i is currently not that expensive, relatively speaking, for n<strong>on</strong>-UScitizens whose currency goes further than US dollars these days. With ourassistance in travel planning and obtaining visas, travel to Hawai’i hasnever been easier or more affordable for European and Asian engineers.• We’ve learned the tools to effectively cross-market EMC Societytechnical activity within its related IEEE Societies, such asMicrowave Theory and Techniques, Vehicular Technology,Instrumentati<strong>on</strong> and Measurements, Antennas and Propagati<strong>on</strong>, andthe like. We will reach new engineers who have a comm<strong>on</strong> interestin EMC and promote their attendance at our <str<strong>on</strong>g>symposium</str<strong>on</strong>g>Join us in Hawai’i where “East Meets West” for Educati<strong>on</strong>,Networking and Celebrati<strong>on</strong>. Remember, this anniversary <str<strong>on</strong>g>symposium</str<strong>on</strong>g>was 50 years in the making! For more informati<strong>on</strong>, visitthe EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Symposium web site at www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org.CONNECTION PROGRAM (“PATRON PROGRAM”)Go bey<strong>on</strong>d just being an exhibitor at the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>alSymposium <strong>on</strong> EMC. Take advantage of our Participant C<strong>on</strong>necti<strong>on</strong>Program to let our participants know that you’re there and you care.The program provides numerous opportunities for high-visibilitymarketing to the participants at the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. In additi<strong>on</strong>, we willrecognize those that take significant advantage of this opportunity toc<strong>on</strong>nect by having four levels of awards with corresp<strong>on</strong>ding announcementsof appreciati<strong>on</strong> for our outstanding benefactors.Promoti<strong>on</strong>al opportunities are available for all marketing budgets,including:Refrehment Break Sp<strong>on</strong>orsTuesday Welcome Recepti<strong>on</strong> Sp<strong>on</strong>sorsPocket Guide Sp<strong>on</strong>sorShaved Hawaiian Ice CartsExhibit Hall BingoOverhead Aisle Banner SignageC<strong>on</strong>venti<strong>on</strong> Bus SignageProduct Applicati<strong>on</strong> Pavili<strong>on</strong> Patr<strong>on</strong>Internet AccessPaper Print Stati<strong>on</strong>sSpeaker GiftsFinal Program AdsFor More Informati<strong>on</strong>:Sue Kingst<strong>on</strong>Ph<strong>on</strong>e: (310) 937-1006Cell: (310) 699-2609Email: s.kingst<strong>on</strong>@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgATTENTION SYMPOSIUM ATTENDEES!VISIT THE EXHIBIT HALL AT EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> WHERE YOU’LL FIND:World Class EMC Exhibits – Learning and Career OpportunitiesYou’ll see large and small exhibits showcasing the latest developmentsin EMC products and services, staffed by friendly and knowledge people.You can also learn about related EMC organizati<strong>on</strong>s that can helpyou further your career including the IEEE EMC Society, NARTE,VCCI, American Associati<strong>on</strong> for Lab Accreditati<strong>on</strong>/A2LA, AmericanTCB and NVLAP booths, to name a few. Get involved in EMC standardsand visit the IEEE EMC Society and American Nati<strong>on</strong>al StandardsInstitute (ANSI) C63 TM booths. Expand your horiz<strong>on</strong>s by dropping bythe booths of EMC trade publicati<strong>on</strong>s, including C<strong>on</strong>formity Magazine,Microwave Journal, ITEM Publicati<strong>on</strong>s, Test and Measurement World,and Webcom Communicati<strong>on</strong>s, to name a few. Wear comfortable walkingshoes to navigate over 100,000 sq. ft. of the exhibit hall.Product Applicati<strong>on</strong> Pavili<strong>on</strong>sDrop in <strong>on</strong> these informal presentati<strong>on</strong>s led by EMC exhibitors whereyou’ll learn how to use a product, the nuances of instrumentati<strong>on</strong>, andmore. These sessi<strong>on</strong>s are designed to show you how to maximize theuse of available equipment and techniques so you can do your jobmore c<strong>on</strong>fidently and efficiently.EMC MuseumAs part of the 50th Anniversary of the EMC Society, this display featuringitems from the EMC Society archives and exhibitors will showyou where we’ve been and just how far we’ve come in the science ofEMC. From historic Stoddart receivers, to a collecti<strong>on</strong> of IEEE EMCSymposium proceedings covers, you’ll be fascinated by today’s c<strong>on</strong>necti<strong>on</strong>to the last 50 years of the EMC Society. Ken Javor, a notedEMC technical expert, will also be giving live dem<strong>on</strong>strati<strong>on</strong>s of olderEMI receivers and c<strong>on</strong>necting their development with the developmentof EMI standards, both military and commercial. Also, in thisarea, Jerry Ramie will pers<strong>on</strong>ally review the “History of the EMCSociety”, the power point presentati<strong>on</strong> you’ve been hearing about.Jerry has been working <strong>on</strong> this for several years; come see the fabulousresults of his efforts!Dem<strong>on</strong>strati<strong>on</strong>s and ExperimentsSeveral software and hardware dem<strong>on</strong>strati<strong>on</strong>s will be scheduled in theexhibit hall showing important EMC c<strong>on</strong>cepts and covering a widerange of elctromagnetic effects. These informal, practical sessi<strong>on</strong>s arealways very well attended! See www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for the schedule ofdem<strong>on</strong>strati<strong>on</strong>s and experiments al<strong>on</strong>g with their topic titles.And, last but not least, come for the FOOD CONCESSIONS,BREAK AREAS, REFRESHMENTS, WIRED AND WIREDINTERNET ACCESS, RESTROOMS, and more…©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 5550 TH ANNIVERSARYOF THE IEEE EMC SOCIETYDan Hoolihan, Hoolihan EMC C<strong>on</strong>sulting50th Anniversary Committee ChairThe 50th Anniversary Celebrati<strong>on</strong> of the ElectromagneticCompatibility Society of the IEEE will take place throughout the<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE EMC Symposium week in Hawai‘i (8-13 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>).A special exhibit will run in the Exhibit Hall of the Symposiumat the Hawai‘i C<strong>on</strong>venti<strong>on</strong> Center. This exhibit will have both liveand passive displays of historic test equipment representing the last50 years of Radio Frequency Interference and EMC Engineering technicaldevelopment. The passive equipment display will featureStoddart Receivers that will be explained and illustrated with verbalplacards; there will also be an opportunity to “peek” inside thereceivers and see the vacuum-tube c<strong>on</strong>structi<strong>on</strong>. The live display willinclude actual dem<strong>on</strong>strati<strong>on</strong>s of NF-105 receivers and similar testequipment devices by a volunteer from the EMC Society of the IEEE.These historical exhibits will run from Tuesday through Thursday ofthe Symposium week.We will also have special events during the week for the originalFounders of the EMC Society. This will include a public sessi<strong>on</strong> <strong>on</strong>Thursday morning in the Exhibit Hall, where the Founders will sharestories of their experiences in the 1940s, 1950s and 1960s.Poster displays of Past-Presidents and other past officers of theEMC Society will be <strong>on</strong> public display in the Exhibit Hall of the c<strong>on</strong>venti<strong>on</strong>center. There will also be a power point presentati<strong>on</strong> <strong>on</strong> thehistory of the EMC Society that will be narrated live by Jerry Ramie,the originator of the PP presentati<strong>on</strong>.An EMC booklet <strong>on</strong> the history of the EMC Society will be distributedto each attendee of the Symposium.Additi<strong>on</strong>al mini-celebrati<strong>on</strong>s are planned throughout the week tohighlight the 50th Anniversary of the EMC Society.A unique 50th Anniversary Celebrati<strong>on</strong> will be held <strong>on</strong> Friday, 13July, the final day of the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Symposium. It’s a Hawaiianroad trip, with the sights and sounds of beautiful Oahu as your compani<strong>on</strong>!Join us for a scenic drive revealing some of the best sightseeingthe island has to offer. The narrated coach tour includes thegorgeous Pali Cliffs in Nuuanu Valley, where King Kamehamehac<strong>on</strong>quered the island of Oahu. Then it’s <strong>on</strong> through the varied communitiesof Windward Oahu as you make your way to the northernmostpart of the island.A Cocktail Recepti<strong>on</strong> and Lunche<strong>on</strong> h<strong>on</strong>oring the OriginalFounders and Past Presidents of the EMC Society will be served atthe Turtle Bay Resort <strong>on</strong> the Northern Shores of Oahu. Also h<strong>on</strong>oredwill be the Most Influential Papers presented since the founding ofthe EMC Society plus some h<strong>on</strong>orary awards for unique c<strong>on</strong>tributi<strong>on</strong>sto the Society.On your return trip to Waikiki, view the world-famous North Shoresurfing beaches at Sunset, Pipeline and Waimea Bay. In colorful c<strong>on</strong>trastto the brilliant blue of the crystalline waters, you’ll also find emeraldoceans of shimmering pineapple and sugar cane fields waving gently inthe breeze. Take a glimpse into the Hawai’i of l<strong>on</strong>g ago as you pass remnantsof old homesteads. Be sure to bring your camera to record the marvelsthat gave Hawai’i its name and reputati<strong>on</strong> as Paradise.This EMC Society 50th Anniversary Celebrati<strong>on</strong> is open to allmembers and acquaintances that register for it.One ticket for the EMC Society 50th Anniversary Celebrati<strong>on</strong>Lunche<strong>on</strong> & Island Tour <strong>on</strong> Friday, 13 July, is included with FullC<strong>on</strong>ference Registrati<strong>on</strong>s. A separate ticket purchase is requiredwith One Day Registrati<strong>on</strong>s and Guest Registrati<strong>on</strong>s. Ticket purchase<strong>on</strong> site during the Symposium is subject to space availability.Attendance is not recommended for children under the age of 8.PHOTOS COURTESY OF TURTLE BAY RESORTPristine Kawela Bay near the Turtle Bay Resort. You’llwant to walk <strong>on</strong> this beach before the Anniversary celebrati<strong>on</strong>begins!The lush lawn of the Turtle Bay Resort where the EMCSociety will hold its 50th Anniversary celebrati<strong>on</strong> <strong>on</strong> July 13.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


56EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMInvitati<strong>on</strong> to theIEEE EMC Chapter’s RetreatJuly 9th, <str<strong>on</strong>g>2007</str<strong>on</strong>g>, 9:00 AM – 4:00 PMHawai'i C<strong>on</strong>venti<strong>on</strong> Center – H<strong>on</strong>olulu, Hawaii USA<str<strong>on</strong>g>2007</str<strong>on</strong>g> Chapter’s RetreatDear Chapter Chairpers<strong>on</strong>,The IEEE EMC Society is pleased to wholeheartedly extend an invitati<strong>on</strong>to all IEEE EMC Chapters to attend the Chapter Chair Retreat (meeting)taking place in H<strong>on</strong>olulu, Hawaii.The <strong>on</strong>e day Retreat will be held in c<strong>on</strong>juncti<strong>on</strong> with the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE EMCSymposium in H<strong>on</strong>olulu, Hawaii, http://www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org/, held fromSunday, July 8, to Friday, July 13, <str<strong>on</strong>g>2007</str<strong>on</strong>g> at the Hawai'i C<strong>on</strong>venti<strong>on</strong>Center, H<strong>on</strong>olulu, Hawaii.GoalsThe main objective of the Chapter Chair Retreat is the exchange ofinformati<strong>on</strong> between the chapter chairpers<strong>on</strong>s and the EMCS Global andRegi<strong>on</strong>al officers (e.g. VP for Member Services, Regi<strong>on</strong>al Membershipand Chapter Coordinator, Regi<strong>on</strong>al C<strong>on</strong>ference Coordinator). More activechapters could assist less active chapters by exchanging theirexperiences, knowledge as well as methods about developing a chapterand organizing events. From the regi<strong>on</strong>al point of view the chapter chairmeeting is a forum to discuss recent problems and plans betweenchairpers<strong>on</strong>s and regi<strong>on</strong>al officers.We plan to start with presentati<strong>on</strong>s made by the EMCS Board of Director Officers andMembership/Chapter Coordinators followed by short presentati<strong>on</strong>s by the Chapter Officers <strong>on</strong> theactivities and best practices in their chapters.Planned Topics include: Exchange of informati<strong>on</strong> Administrative informati<strong>on</strong> for Chapter Chairs Membership development at the Chapter Level Global development of EMCS and particularly in Regi<strong>on</strong>s 1-7 Regi<strong>on</strong>al Events (discussi<strong>on</strong> of proposal, planning of Regi<strong>on</strong>al Workshops and C<strong>on</strong>ferences<strong>on</strong> EMC, and coordinati<strong>on</strong> of global, regi<strong>on</strong>al and local events) Cooperati<strong>on</strong> between chapters Chapter Best Practices Presentati<strong>on</strong> (by Chapter Representatives)Please, prepare a short presentati<strong>on</strong> (2-3 Power Point slides) of your chapter status, activitiesand top 5 best practices. You will be given time to present your chapter to the attendees at theretreat.SummaryFollowing the success of the previous retreat held in Regi<strong>on</strong> 8 and 9, we are certain that this Retreatwill be of great value to you and your Chapter. Therefore, we recommend that you and/or arepresentative of your chapter attend the meeting.Kindly c<strong>on</strong>firm your participati<strong>on</strong> to the IEEE EMC Chapter Coordinator Francesca Maradei at:fr.maradei@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org and a copy to Dave Staggs, VP for Member Services at d.staggs@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org, nolater than June 20, <str<strong>on</strong>g>2007</str<strong>on</strong>g>.We look forward to welcoming you in H<strong>on</strong>olulu.Best wishes,Francesca Maradei and Janet O’NeilEMCS VP for Member ServicesDave Staggsd.staggs@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgSymposium ChairmanJanet O’Neilj.n.<strong>on</strong>eil@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgEMCS Chapter CoordinatorFrancesca Maradeifr.maradei@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgRegi<strong>on</strong>s 1-7 C<strong>on</strong>ference CoordinatorJanet O’Neilj.n.<strong>on</strong>eil@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgMark your Calendar: Date and Venue of the RetreatVenue:Date:Hawai'i C<strong>on</strong>venti<strong>on</strong> Center – H<strong>on</strong>olulu, Hawaii USAJuly 9th, <str<strong>on</strong>g>2007</str<strong>on</strong>g>, 9:00 AM – 4:00 PM©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


SOCIAL ACTIVITIESEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 57WELCOME RECEPTIONHilt<strong>on</strong> Hawaiian Village Beach Resort & SpaRooftop GardenTuesday, July 10, <str<strong>on</strong>g>2007</str<strong>on</strong>g>6:30pm to 8:30pmAloha and welcome to EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>! The Symposium SteeringCommittee invites attendees to join old friends and make newacquaintances during an evening of refreshments amidst spectacularviews of the ocean and H<strong>on</strong>olulu skyline at sunset. This event hasproven to be very popular and is an excellent way to meet and networkwith others from the EMC community. The tropical sun sets late inJuly, so be sure to wear your best sun hat. We will be awarding funprizes for the best hats.One ticket for this event is included with Full C<strong>on</strong>ferenceRegistrati<strong>on</strong>s and Guest Registrati<strong>on</strong>s. Separate registrati<strong>on</strong> isrequired with One Day Registrati<strong>on</strong>s.GALA EVENTTRADITIONAL HAWAIIAN LUAURoyal Hawaiian HotelWednesday, July 11, <str<strong>on</strong>g>2007</str<strong>on</strong>g>6:30pm to 10:30pmJoin your fellow attendees and their compani<strong>on</strong>s for an unforgettableevening! With a backdrop of Diam<strong>on</strong>d Head and Waikiki Beach, yourevening begins with Hawaiian melodies and refreshing Mai Tais orLuau Punch in the Coc<strong>on</strong>ut Grove, where each guest is greeted with alei. The evening c<strong>on</strong>tinues with a feast of foods from the Islands. Thecrowning glory is the spectacular Royal Polynesian Extravaganza.Every<strong>on</strong>e is sure to enjoy the s<strong>on</strong>g and dance of the islands as well asthose from other Pacific Rim locati<strong>on</strong>s that have influenced theunique culture found <strong>on</strong>ly in Hawai’i. (See photos <strong>on</strong> this page.)One ticket for this gala event is included with Full C<strong>on</strong>ferenceRegistrati<strong>on</strong>s. A ticket purchase is required with One DayRegistrati<strong>on</strong>s and Guest Registrati<strong>on</strong>s. Ticket purchase <strong>on</strong> site duringthe Symposium is subject to space availability. Attendance is notrecommended for children under the age of 8.AWARDS LUNCHEONHawai’i C<strong>on</strong>venti<strong>on</strong> CenterThursday, July 12, <str<strong>on</strong>g>2007</str<strong>on</strong>g>1:00pm to 2:30pmPlease join us as c<strong>on</strong>tributors to the IEEE EMC Society are h<strong>on</strong>oredand the <str<strong>on</strong>g>2007</str<strong>on</strong>g> Best Paper Award winner is announced.EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> GUEST HOSPITALITY SUITEAloha! We are glad that you plan to join us in lovely H<strong>on</strong>olulu,Hawai’i.As a fully registered EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest, you are welcome to visit theEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest Hospitality Suite located at the Hilt<strong>on</strong> HawaiianVillage Hotel.As a fully paid registered EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest, your registrati<strong>on</strong>packet should include a color-coded name badge that will allow youaccess to the suite and entitles you to receipt of a compani<strong>on</strong> gift bag.The bags this year will help to make your beach experience moreenjoyable. We have great canvas navy floral print bags with a zipperclosure and a side zip pocket. The smaller matching two-zipper pouchis perfect for credit cards, keys, driver’s license, and small items if youwant to travel light. The bag c<strong>on</strong>tains a beach towel in multiple tropicalcolors for drying off as well as sunscreen and lip balm, which areessential in the tropics. To sustain you <strong>on</strong> your jog to the beach, alsoincluded are coffee and chocolate!EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Registered Guests are welcome to enjoy an extendedcomplimentary c<strong>on</strong>tinental breakfast to start each day. There will be a“Destinati<strong>on</strong> Management C<strong>on</strong>sultant” available in the suite to signyou up for the complimentary tours offered each day to Hilo Hattie’sor Maui Divers.As a fully paid EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Registered Guest, come and enjoy theEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest Hospitality Suite, Sunday through Thursday,7:00am to 12:00 no<strong>on</strong>.CHILDREN’S WORKSHOPBoys and girls, join us in building “Crazy Dune Buggies” at theEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Children’s Workshop <strong>on</strong> Tuesday, July 10, andWednesday, July 11. All kits will be prepared individually witheverything you will need to build your project. We will learn theimportance of building them precisely as well as how important it isto troubleshoot beforehand in order for them to hold up for the durati<strong>on</strong>of their race in the sand <strong>on</strong> Thursday, July 12. We will be decoratingour individual dune buggies so we will be able to recognizethem in the race.On Thursday, July 12, we will again be visiting selected booths <strong>on</strong>the exhibit floor where exhibitorswill explain in layman’s terms whatthe <str<strong>on</strong>g>symposium</str<strong>on</strong>g> is really all about.We’re looking forward to seeingall of our returning littleengineers who outdid themselveslast year in making the boat andthe race so successful <strong>on</strong> LakeEMC in Portland.Registrati<strong>on</strong> for this event isincluded with Junior GuestRegistrati<strong>on</strong>s. Registrati<strong>on</strong> <strong>on</strong> siteduring the Symposium is subject tospace availability.PHOTOS COURTESY OF ROYAL HAWAIIAN HOTEL©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


58EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMTOURSThe IEEE EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Symposium is pleased to offer the followingtours during this year’s <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. Please sign-up for these tours(except for complimentary tours listed <strong>on</strong> pae 60) when registeringfor this year’s <str<strong>on</strong>g>symposium</str<strong>on</strong>g>. (Pre-registrati<strong>on</strong> and pre-payment arerequired for opti<strong>on</strong>al tours. Registrati<strong>on</strong> <strong>on</strong> site during theSymposium is subject to space availability.)Sunday, July 8, <str<strong>on</strong>g>2007</str<strong>on</strong>g>Grand Circle Island with Dole Plantati<strong>on</strong>Price:$67.00 US per adultDeparts8:15a.m.Returns5:30p.m.Minimum requirement: 40 passengersGet to know Hawai‘i from the inside out with an all-day tour thatcircles the entire island, covering 120 miles of O‘ahu’s best sightseeingspots. For a close-up view of a seawater erupti<strong>on</strong>, you’ll visitHawai‘i’s own Old Faithful known as the “Blow Hole”, where you’llwitness oceanside water play at full-force. Besides Sandy Beach —a favorite for body surfers — you’ll venture to the most celebratedsurfing z<strong>on</strong>es in the world al<strong>on</strong>g the North Shore: Waimea Bay,Sunset Beach and the spectacular Banzai Pipeline. At DolePlantati<strong>on</strong> you will ride the pineapple express train and learn aboutthe history of Hawai‘i’s pineapple industry. You may choosebetween a stroll through plantati<strong>on</strong> gardens or test your skill at thepineapple garden maze. In colorful c<strong>on</strong>trast to the brilliant blue ofthe crystalline waters, you’ll also find emerald oceans of shimmeringpineapple and sugar cane fields waving gently in the breeze.Take a glimpse into the Hawai‘i of l<strong>on</strong>g ago as you pass remnantsof old homesteads <strong>on</strong> your return to Waikiki. Be sure to bring yourcamera to record the marvels that gave Hawai‘i its name and reputati<strong>on</strong>as Paradise.A n<strong>on</strong>-hosted lunch stop will be made at historic CrouchingLi<strong>on</strong> Restaurant. Located <strong>on</strong> the slopes of Ka‘a‘awa, you willexperience the warm feeling of Hawai‘i hospitality, while enjoyingan extensive lunch menu that includes seafood, beef dishes,sandwiches, and salads. Surrounded by expansive ocean views thistraditi<strong>on</strong>al Hawaiian restaurant lives up to its “landmark” status.(Pre-registrati<strong>on</strong> and pre-payment are required for opti<strong>on</strong>altours. Registrati<strong>on</strong> <strong>on</strong> site at the Symposium is subject to spaceavailability.)NOTES:A stop will be made at the Crouching Li<strong>on</strong> Restaurant for lunch, butthe cost of lunch is not included.There is no charge for children under age 4, provided they do notoccupy a seat in the vehicle.M<strong>on</strong>day, July 9, <str<strong>on</strong>g>2007</str<strong>on</strong>g>Stars and StripesPrice:DepartsReturnsMinimum requirement:$60.75 US per adult7:30a.m.4:00p.m.40 passengersCelebrate the h<strong>on</strong>or, valor and courage of the U.S. Servicemen whoserved during World War II <strong>on</strong> this special Stars and Stripes tour. It’sa nostalgic journey to the two historic places that marked the beginningand end of the war for the United States – Pearl Harbor and theUSS Missouri.At the site of Pearl Harbor, you’ll view the Ariz<strong>on</strong>a Memorialwhere the remains of the USS Ariz<strong>on</strong>a lay silent beneath the waves.The events of the 1941 attack <strong>on</strong> Pearl Harbor unfold throughdetailed narrati<strong>on</strong>s and photos. While at Pearl Harbor, you’ll travelacross the Ford Island Bridge to the historic USS Missouri battleship,otherwise known as the “Mighty Mo”. It was <strong>on</strong> the decks of this celebratedwarship that the Japanese surrender cerem<strong>on</strong>y took place,signaling the end of their involvement in World War II. Explore thepassages, rooms and corridors <strong>on</strong> a special guided tour.From Pearl Harbor, you’ll take a drive through metropolitanH<strong>on</strong>olulu and up to the Punchbowl Crater for a pers<strong>on</strong>al guided tourby the American Legi<strong>on</strong> of the Nati<strong>on</strong>al Cemetery of the Pacific.After enjoying the serenity and spectacular view atop Punchbowl,you’ll wind through Downtown H<strong>on</strong>olulu for a view of its manyhighlights. (Pre-registrati<strong>on</strong> and pre-payment are required foropti<strong>on</strong>al tours. Registrati<strong>on</strong> <strong>on</strong> site during the Symposium is subjectto space availability.)NOTES:Lunch <strong>on</strong> own at the snack bar <strong>on</strong> the ship.No backpacks, fanny packs, or bags permitted.We recommend wearing good walking shoes and d<strong>on</strong>’t forget yourcamera.Tuesday, July 10, <str<strong>on</strong>g>2007</str<strong>on</strong>g>H<strong>on</strong>olulu Hidden TreasuresPrice:$63.00 US per adultDeparts8:30a.m.Returns12:30p.m.Minimum requirement: 21 passengersLearn about H<strong>on</strong>olulu’s most interesting historic sites, see an amazingcollecti<strong>on</strong> of rainforest and tropical plants, and relax by hidden waterfalls<strong>on</strong> this professi<strong>on</strong>ally guided and narrated tour. Start the day withexquisite panoramic views of Diam<strong>on</strong>d Head, Waikiki, H<strong>on</strong>olulu, andthe southwest coast of Oahu as we travel up into the Ko’olauMountains to famous Mount Tantalus. We’ll pause at a breathtakingoverlook to take in the vista from this unique vantage point. An excellentplace to take a memorable photo! We’ll also learn about the rainforestplants in the park, and look for the vibrant yellow OahuAmakihi, a rare and endangered Hawaiian h<strong>on</strong>eycreeper bird species.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 59From there we will take a step back in time as we visit the RoyalMausoleum and learn about the Hawaiian m<strong>on</strong>archy. A short walktakes us next to misty Kapena falls, where you will view ancientHawaiian petroglyphs (rock carvings) near the bank of Alapena pool,and learn the legend of Kaupe, the ancient guardian spirit that is saidto protect travelers at this unique place.We venture next to Queen Liliuokalani Botanic Garden, whereyou will learn about endemic Hawaii an plant species <strong>on</strong> the groundsof this former Hawaiian M<strong>on</strong>arch’s home near a scenic waterfall. Ournext stop is Foster Botanical Garden, where your professi<strong>on</strong>al naturalistguide will describe the unique tropical plants such as cacao,pepper, cinnam<strong>on</strong> and allspice trees. See the famous Foster orchid collecti<strong>on</strong>,as well as the “Bo Tree”, grown from a cutting of the originaltree planted in India 800 years ago by the first Dalai Lama. Ourguides have trained with the docents of this famous garden, and willprovide an unsurpassed narrative.Finally, you’ll relax and enjoy a visit to Iolani Palace grounds,where you will marvel at <strong>on</strong>e of the world’s largest Banyan trees whilelearning more about the Hawaiian m<strong>on</strong>archy and the history of the<strong>on</strong>ly royal palace in the United States. See the King KamehamehaStatue, the Hawai’i State Capital, and historic H<strong>on</strong>olulu sights al<strong>on</strong>gthe way.This tour requires no hiking, is accessible for all skill levels, andis a great way to experience Oahu’s world famous botanical gardens,H<strong>on</strong>olulu’s most significant historic sites, and scenic waterfalls all in<strong>on</strong>e day. (Pre-registrati<strong>on</strong> and pre-payment are required for opti<strong>on</strong>altours. Registrati<strong>on</strong> <strong>on</strong> site during the Symposium is subject to spaceavailability.)NOTES:Fitness/Hiking Level (easy).Distance is approximately 1.5 miles (total walking distance).Shoes may get wet, depending <strong>on</strong> the weather.Participants should be in overall good health.Guests should wear comfortable, but sturdy footwear (Flip Flops arenot recommended).No valuables other than those that fit in your daypack.O‘ahu. Shangri-La, Miss Duke’s H<strong>on</strong>olulu estate, is now open to ourgroup exclusively for a glimpse into the life of this extremely remarkable,private and fascinating individual.During her round-the-world h<strong>on</strong>eymo<strong>on</strong> after marrying would beSenator James “Jimmy” Cromwell, Miss Duke fell in love with thegentle people and tropical haven of Hawai’i. Vowing to return andmake a home in the islands, Miss Duke acquired nearly five acres <strong>on</strong>Diam<strong>on</strong>d Head’s south shore where her dream home would be built.Although her marriage to Mr. Cromwell did not last, Miss Duke createdShangri-La <strong>on</strong> this site and embarked <strong>on</strong> a 60-year journey ofcollecting what would become the largest private collecti<strong>on</strong> ofIslamic art in the world.Up<strong>on</strong> her death in 1993, Miss Duke’s last will and testamentcalled for the creati<strong>on</strong> of the Doris Duke Foundati<strong>on</strong> for Islamic Art.As her collecti<strong>on</strong> grew during her lifetime, Miss Duke realized thatthese treasures must forever remain intact as a collecti<strong>on</strong> and serve toeducate the public in the manner in which she so diligently displayedthem <strong>on</strong> the grounds of her lush estate.Our guests will begin their journey at the H<strong>on</strong>olulu Academy ofthe Arts where they will be shown an orientati<strong>on</strong> video of theShangri-La residence and get a first peak at the treasures housed <strong>on</strong>property. From there, guests will be escorted via minicoach toDiam<strong>on</strong>d Head’s exclusive Black Point district, locati<strong>on</strong> of the estate.Up<strong>on</strong> completi<strong>on</strong> of the tour, guests will then be returned to theH<strong>on</strong>olulu Academy of the Arts where they may experience the museum’srevolving collecti<strong>on</strong> at their leisure. (Pre-registrati<strong>on</strong> and prepaymentare required for opti<strong>on</strong>al tours. Registrati<strong>on</strong> <strong>on</strong> site duringthe Symposium is subject to space availability.)Wednesday, July 11, <str<strong>on</strong>g>2007</str<strong>on</strong>g>Shangri-la TourPrice:Tour 1DepartsReturnsTour 2DepartsReturnsMinimum requirement:$62.00 US per adult7:30a.m.11:30a.m.10:00a.m.2:00p.m.24 passengersNOTES:Children under 12 not permitted.Picture taking is not allowed inside the estate.Secured bins are available at the estate for handbags. We do not recommendbringing large bags or valuables.Thursday, July 12, <str<strong>on</strong>g>2007</str<strong>on</strong>g>H<strong>on</strong>olulu City Iolani Palace and Queen Emma’s Summer HomePrice:$68.00 US per adultDeparts8:30a.m.Returns1:00p.m.Minimum requirement: 20 passengersThere is a limit of 25 guests per tour. A third tour may be possible ifneeded.Fiercely independent, rich bey<strong>on</strong>d avarice, an <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>celebrity and socialite, activist and philanthropist, Miss Doris Duke,<strong>on</strong>e of the wealthiest people in history was certainly a force to bereck<strong>on</strong>ed with! Unbeknownst to the world, Miss Duke inc<strong>on</strong>spicuouslycreated a veritable palace of treasures <strong>on</strong> the southern shore of©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


60EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMBesides being a tropical centerpiece of natural beauty, O‘ahu holdsthe most cosmopolitan flavor of all the Hawaiian Islands. Rangingfrom old Chinatown to the modern business district, you’ll discovera side of Hawai‘i rich with cultural and historical significance. Stopfor <strong>on</strong>e hour at the majestic Iolani Palace and a docent-guided tour ofthis incredible structure. You’ll see the distinctive State CapitalBuilding, Aloha Tower down by the pier, the serene University ofHawai‘i grounds, and Punchbowl, the Nati<strong>on</strong>al Cemetery of thePacific. A brief journey to the lush Nu‘uanu valley brings you to theformer home of Queen Emma, c<strong>on</strong>sort of King Kamehameha IV. ThisNew England-style house was c<strong>on</strong>structed <strong>on</strong> the East Coast, transportedaround Cape Horn by ship, and assembled in its present locati<strong>on</strong>in 1848. The verdant garden of tropical flowers is worth a strollto take in the marvelous views and aromatic landscape. This tour is aterrific way to get a well-rounded idea of all the marvels modernO‘ahu offers. (Pre-registrati<strong>on</strong> and pre-payment are required foropti<strong>on</strong>al tours. Registrati<strong>on</strong> <strong>on</strong> site during the Symposium is subjectto space availability.)Complimentary ActivitiesThe Store of Hawai‘i - Hilo HattieSign up for this activity in the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest Hospitality Suite(Open Sunday through Thursday from 7:00am to 12:00pm at theHilt<strong>on</strong> Hawai‘ian Village)Hilo Hattie is Hawai‘i ’s largest chain of Hawaiian stores.Shoppers discover Hawai‘i’s largest selecti<strong>on</strong> of Hawaiian fashi<strong>on</strong>s,gifts, gourmet foods, souvenirs, T-shirts, home accessories, beautyproducts and island jewelry. Hilo Hattie is also the world’s largestmanufacturer of Hawaiian resort and casual fashi<strong>on</strong>s, offering hundredsof prints and styles <strong>on</strong>ly found at Hilo Hattie. Shoppers enjoylow manufacturers direct prices <strong>on</strong> thousands of Hawaiian products.Recently, Hilo Hattie was awarded the prestigious Kahili Award bythe Hawai’i Visitors Bureau as “The Best Retailer in Hawai‘i” and“The Best Attracti<strong>on</strong> in Hawai‘i”. Volume discounts are available <strong>on</strong>uniforms, VIP gifts, gift baskets, customized T-shirts and VIPamenities. Hawaiian Shirt Shacks are also available in which HiloHattie will take garments to the hotels for group check-ins.Maui Divers Jewelry Design CenterSign up for this activity in the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Guest Hospitality Suite(Open Sunday through Thursday from 7:00am to 12:00pm at theHilt<strong>on</strong> Hawaiian Village)You d<strong>on</strong>’t need to be an experienced diver to discover Hawai‘i’srarest deep ocean treasures. Maui Divers will reveal them for you inan unforgettable half-hour tour. Fresh from an underwater grove,you’ll see how Hawai‘i’s enchanting State Gemst<strong>on</strong>e — Black Coral,is turned into a master jewelry designer’s work of art. Experienceclose-up how artisans create numerous fine pieces by hand, and howstunningly beautiful native Hawaiian jewelry settings can be.Holoholo Ka‘a (to go for a drive or a ride)In additi<strong>on</strong> to the pre- and post-c<strong>on</strong>ference activities, the island ofOahu offers a wealth of activities that will create indelible memories.Take a surfing less<strong>on</strong> <strong>on</strong> Waikiki Beach. Watch a dolphin show at SeaLife Park. See 350 species of aquatic animals and plants at the WaikikiAquarium. Learn about Hawaiian history at the Bishop Museum. Takea drive to Haleiwa and the North Shore. Hike to Makapu‘uLighthouse <strong>on</strong> the South Shore. Eat a plate lunch and malasadas inKapahulu. See Hawai‘i’s largest collecti<strong>on</strong> of fine arts at the H<strong>on</strong>oluluAcademy of Arts. Seek tranquility at the Byodo-In temple, a meticulousreplica of a 900-year old Japanese Temple. Your hotel c<strong>on</strong>ciergewill be happy to assist you with informati<strong>on</strong> and arrangements.PHOTO COURTESY OFHAWAII CONVENTION & VISITORS BUREAUPHOTO COURTESY OFHAWAII CONVENTION & VISITORS BUREAU©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 61ACCOMMODATIONSHilt<strong>on</strong> Hawaiian VillageBeach Resort & Spa2005 Kalia RoadH<strong>on</strong>olulu, HI 96815-1999Ph<strong>on</strong>e: (808) 949-4321Toll Free: 1-800-HILTONSwww.hilt<strong>on</strong>hawaiianvillage.comGuaranteed reservati<strong>on</strong>s are held until 6:00am the following morning,at which time the reservati<strong>on</strong> and deposit are forfeited.In the event a guest who has a c<strong>on</strong>firmed room check outs prior tothe reserved checkout date, the Hotel will add an early checkout feeof $50 US to that guest’s account.Reservati<strong>on</strong> cancellati<strong>on</strong>s must be received 72 hours prior to thescheduled arrival date. If notice is not received by that time, the depositwill be forfeited or the credit card will be charged a <strong>on</strong>e night’s stay.Requests for accommodati<strong>on</strong>s received after the deadline will beaccepted <strong>on</strong> a space available basis at the prevailing rate. Reservati<strong>on</strong>requests for specific room types, views and bedding are subject toavailability at the time of arrival and are not guaranteed.Attenti<strong>on</strong> Families: The Hotel has dedicated children’s programsand babysitting services. Check the hotel web site at www.hilt<strong>on</strong>hawaiianvillage.comfor more informati<strong>on</strong>.C<strong>on</strong>ference Rates:Garden View $189 USPartial Ocean View $205 USOcean View $219 USGovernment <str<strong>on</strong>g>2007</str<strong>on</strong>g> Prevailing rateHilt<strong>on</strong> Hawaian Village® Beach Resort & Spa is Waikiki’s <strong>on</strong>ly trueresort destinati<strong>on</strong>, offering the perfect mix of excepti<strong>on</strong>al resort accommodati<strong>on</strong>sand classic Hawaiian hospitality, all nestled <strong>on</strong> 22 beachfr<strong>on</strong>tacres. Imagine the widest stretch of white sand <strong>on</strong> Waikiki, aserene beachfr<strong>on</strong>t lago<strong>on</strong>, lush tropical gardens with exotic wildlife andcascading waterfalls, majestic views of Diam<strong>on</strong>d Head and stunningseaside sunsets. Discover 90 shops and boutiques and a diverse, <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g>selecti<strong>on</strong> of restaurants. The resort’s beachfr<strong>on</strong>t Super Pool isthe largest <strong>on</strong> the island, and <strong>on</strong> Friday night it becomes the stage fora celebrati<strong>on</strong> of Hawaiian culture and entertainment, ending with aspectacular fireworks show! The Hilt<strong>on</strong> Hawaiian Village is Oahu’smost prestigious and productive place to mix business and pleasure.For the c<strong>on</strong>venience of the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> c<strong>on</strong>ference attendees, a blockof sleeping rooms have been reserved for attendees at the Hilt<strong>on</strong>Hawaiian Village’s Tapa Tower in H<strong>on</strong>olulu, Hawai‘i.Accommodati<strong>on</strong>s may be booked directly through the Hilt<strong>on</strong>808-949-4321 (direct) or Toll Free 1-800-HILTONS. Hotel reservati<strong>on</strong>deadline for these rates is June 10, <str<strong>on</strong>g>2007</str<strong>on</strong>g>, OR when the IEEEc<strong>on</strong>tracted room block is sold out. Make your reservati<strong>on</strong>s early!!!The c<strong>on</strong>ference rates are subject to applicable state and local taxes(currently 11.41%) and are based <strong>on</strong> single or double occupancy.There will be a $45 US per pers<strong>on</strong> per night charge for each third andfourth adult in the room. Children 18 years of age and under, whensharing the room with a parent, will not be charged when utilizingexisting bedding.The c<strong>on</strong>ference rates are available for the dates of 4 July through 14July <str<strong>on</strong>g>2007</str<strong>on</strong>g> based <strong>on</strong> availability. When making hotel reservati<strong>on</strong>s, pleaserefer to the IEEE EMC C<strong>on</strong>ference to receive the discounted rate.Reservati<strong>on</strong>s must be made by 10 June <str<strong>on</strong>g>2007</str<strong>on</strong>g> to ensure the c<strong>on</strong>ference rate.The Hotel requires a <strong>on</strong>e-night deposit in advance to accompanythe reservati<strong>on</strong> either in the form of a credit card or check.Ala Moana Hotel410 Atkins<strong>on</strong> DriveH<strong>on</strong>olulu, Hawai‘i 96814Ph<strong>on</strong>e: 808-955-4811http://www.alamoanahotel.comEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> CONFERENCE RATE: $169 USThe all-new Ala Moana Hotel is the definitive H<strong>on</strong>olulu address forurban relaxati<strong>on</strong>. A multi-milli<strong>on</strong> dollar transformati<strong>on</strong> reveals a stunninghotel with a c<strong>on</strong>temporary character and island-style appeal.Deluxe guest rooms reflect the cool colors of paradise and warmhues of refined hospitality. Casually sophisticated and comfortablyappointed for business or leisure, you'll find mountain and oceanviews enhanced by the rhythms of the city, splendid sunsets, and thepleasure of your surroundings.Five diverse restaurants, H<strong>on</strong>olulu’s popular Rumours nightclub,a spacious new sundeck with poolside cocktail bar, and an impressivefitness center provide guests with desired amenities.Adjoining the world-class Ala Moana Shopping Center, it’s apleasant stroll to over 260 retailers showcasing the finest names infashi<strong>on</strong> and a delightful array of dining. The Hawai’i C<strong>on</strong>venti<strong>on</strong>Center is a c<strong>on</strong>veniently located just step away, and when business isd<strong>on</strong>e, the 76-acre Ala Moana Beach Park welcomes swimming, surfing,and day-dreaming in a shady setting by the sea.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


62GENERAL INFORMATIONEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMHistory Lunche<strong>on</strong>The EMC Society History Committee will host a lunche<strong>on</strong> <strong>on</strong>Wednesday, July 11 at no<strong>on</strong>. This year the committee will h<strong>on</strong>or sixof the original founders of the EMC Society at the lunche<strong>on</strong>, whichwill include invited students, Board of Directors members, and otherdistinguished guests. Attendance is by invitati<strong>on</strong> <strong>on</strong>ly; please c<strong>on</strong>tactDan Hoolihan for more informati<strong>on</strong> at d.hoolihan@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org.Chapter Chair Lunche<strong>on</strong>The annual Chapter Chair Lunche<strong>on</strong> will not take place this year.Instead, the Chapter Retreat will be held <strong>on</strong> M<strong>on</strong>day, July 9. Formore informati<strong>on</strong>, please see the invitati<strong>on</strong> <strong>on</strong> the retreat included inthis program <strong>on</strong> page 56.Symposium VenueThe spirit of the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center is the spirit of Aloha –welcoming and serving all who visit the Center with unc<strong>on</strong>diti<strong>on</strong>alAloha. The Hawai’i C<strong>on</strong>venti<strong>on</strong> Center combines the modern requirementsof a state-of-the-art meeting facility with the beauty, comfortand culture that are uniquely Hawai’i. Soaring forms and breathtakingspace call to mind tropical palm trees and Polynesian sailing canoes.The design of the glass-fr<strong>on</strong>t center represents the unique culture ofHawai’i, with its bold architecture, $2 milli<strong>on</strong> Hawaiian art collecti<strong>on</strong>,and features such as a rooftop tropical garden, glass-encased meetingrooms and outdoor functi<strong>on</strong> spaces lined with giant palm trees. AllEMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> workshops, tutorials, technical sessi<strong>on</strong>s and the exhibiti<strong>on</strong>will be held at the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center, al<strong>on</strong>g with many committeemeetings. Please check the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> website and the finalprogram for an updated list of EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> events and locati<strong>on</strong>s.Shuttle busses will run between the host hotel — the Hilt<strong>on</strong>Hawaiian Village Beach Resort & Spa — and the Hawai’i C<strong>on</strong>venti<strong>on</strong>Center throughout the <str<strong>on</strong>g>symposium</str<strong>on</strong>g> week. The Ala Moana Hotel isjust a short walk away.Dem<strong>on</strong>strati<strong>on</strong>s and Experiments: Now in Its 15th C<strong>on</strong>secutive Year!The EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> Technical Program also includes hands <strong>on</strong> dem<strong>on</strong>strati<strong>on</strong>sand experiments. Several software and hardware dem<strong>on</strong>strati<strong>on</strong>swill be scheduled in the exhibit hall during exhibit hours at theHawai’i C<strong>on</strong>venti<strong>on</strong> Center over July 10-12. The hardware experimentsare devoted to dem<strong>on</strong>strating important EMC c<strong>on</strong>cepts througha series of interactive experiments. The experiments cover a wide rangeof <strong>electromagnetic</strong> effects. This year’s experiments will include measurementautomati<strong>on</strong>, the use of RF field probes, reverberati<strong>on</strong> chambertechniques, TEM cells, ESD and time domain techniques. In the softwaredem<strong>on</strong>strati<strong>on</strong>s, fundamental EMC modeling approaches andsimulati<strong>on</strong> methods are illustrated through a series of interactive computerdem<strong>on</strong>strati<strong>on</strong>s. Various computati<strong>on</strong>al <strong>electromagnetic</strong> (CEM)modeling techniques will be dem<strong>on</strong>strated illustrating their applicati<strong>on</strong>to both well defined can<strong>on</strong>ical-type problems and real world EMCproblems in order to show specifically how these techniques can beapplied. These informal, practical sessi<strong>on</strong>s are always very well attended!Please see www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org and/or the final program for a scheduleof dem<strong>on</strong>strati<strong>on</strong>s and experiments al<strong>on</strong>g with their topic titles.RAC/SACCom LunchThe annual lunche<strong>on</strong> of the Representative Advisory Committee andthe Standards Advisory and Coordinating Committee will be held <strong>on</strong>M<strong>on</strong>day, July 9 from 11:00am to 2:00pm at the Hawai’i C<strong>on</strong>venti<strong>on</strong>Center. Those interested in attending should c<strong>on</strong>tact RAC ChairFred Heather (heatherf@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org) or SACCom Chair Dave Guzman(dguzman@rftek.net) by July 1. Advance reservati<strong>on</strong>s are required!Internet AccessComplimentary wired Internet access will be available at the InternetCafé stati<strong>on</strong>s in the Exhibit Hall at the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center.In additi<strong>on</strong>, complimentary wireless Internet access will also be availablethroughout the Exhibit Hall.Message Center Informati<strong>on</strong>This will be located next to the registrati<strong>on</strong> desk at the Hawai’iC<strong>on</strong>venti<strong>on</strong> Center. Details will be provided in the final program.C<strong>on</strong>tact April Coles at a.coles@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org for more informati<strong>on</strong>.Speaker Ready RoomThe speaker ready room at the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center will beopen from 7:00am – 5:00pm Sunday through Thursday of the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>week. Speakers will have various audio visual aids availablefor assistance in preparing and fine tuning their presentati<strong>on</strong>s.Speakers BreakfastA speakers breakfast will be held for all speakers and sessi<strong>on</strong> chairs from7:00am-8:00am at the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center from Sunday throughThursday. The objective of the breakfast is to review planning for theindividual sessi<strong>on</strong>(s) as well as allow speakers and sessi<strong>on</strong> chairs to get toknow each other. All speakers and sessi<strong>on</strong> chairs are required to attendthe breakfast <strong>on</strong> the day of their presentati<strong>on</strong> to ensure a seamless transiti<strong>on</strong>of speakers, correct pr<strong>on</strong>unciati<strong>on</strong> of presenter names, correct bioinformati<strong>on</strong> is relayed, and coaching <strong>on</strong> the questi<strong>on</strong> and answer periodis provided, thus resulting in a professi<strong>on</strong>al, well-organized sessi<strong>on</strong>.Exhibitors BreakfastAll exhibitors are invited to attend this annual breakfast buffet <strong>on</strong>Thursday, July 12 from 7:00am to 8:00am at the Hawai’i C<strong>on</strong>venti<strong>on</strong>Center. Chaired by Barry Wallen, the EMC Society VP forC<strong>on</strong>ferences, this breakfast provides a forum for exhibitors and theSociety to exchange best practices and ideas for improving theexhibitor experience at the annual Symposium. Attendees will hearplans for the future IEEE EMC Symposia as well as receive the registrati<strong>on</strong>facts and summary of EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> activity.Student ActivitiesThe EMC Society Educati<strong>on</strong> and Student Activities Committee(ESAC) sp<strong>on</strong>sors many activities during the annual IEEE EMCSymposium, including the Fundamentals of EMC Tutorial,Experiments and Dem<strong>on</strong>strati<strong>on</strong>s, Student Paper C<strong>on</strong>test, StudentDesign C<strong>on</strong>test, Beranek Travel Awards, and the University GrantAward. Stop by the ESAC table at the Symposium to learn moreabout the activities and opportunities the EMC Society offers for students.There will be a limited number of EMC Society Experiment©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 63CDs available for faculty members, IEEE Secti<strong>on</strong> Chairs and EMCChapter Chairs. This CD includes three EMC experiments that werefilmed at previous Symposia and features Jasper Goedbloed, DouglasSmith and Clayt<strong>on</strong> Paul sharing some interesting insights. (availablewhile supplies last). C<strong>on</strong>tact the ESAC Chair, Professor RobertNels<strong>on</strong>, for more informati<strong>on</strong> at r.m.nels<strong>on</strong>@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org.Committee MeetingsMany committee meetings will be held during the Symposium weekat the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center. These will typically be held from7:00am-8:30am and include the annual meetings of the EMC SocietyTechnical and Standards Committees. Please visit the websitewww.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for the schedule of committee meetings scheduledduring the Symposium. Most meetings are open to guests whoare interested in the meeting topic. For a list of the EMC SocietyTechnical and Standards Committees and c<strong>on</strong>tact informati<strong>on</strong>, pleasesee page 67 in this program. If you wish to hold a committee meetingat EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g>, reservati<strong>on</strong>s for rooms must be made in advance;the latest acceptable date is June 10, <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Please c<strong>on</strong>tact AprilColes at IEEE C<strong>on</strong>ference Management Services at a.coles@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgfor more informati<strong>on</strong> <strong>on</strong> scheduling a meeting room.IEEE PressIEEE Press will staff a large booth near the registrati<strong>on</strong> desk at theHawai’i C<strong>on</strong>venti<strong>on</strong> Center. This is an opportunity to browse manyinteresting books <strong>on</strong> EMC and related topics. You might just find anauthor of <strong>on</strong>e of the books nearby which you can ask to pers<strong>on</strong>allyautograph your copy, if the timing is right! Credit cards accepted.RELATED INDUSTRY ACTIVITYEMC Aviators ClubEMC Society members Andy Marvin and Ant<strong>on</strong>io Orlandi recentlyformed the NEW EMC Aviators Club. To be part of the Club, <strong>on</strong>eshould be involved in EMC, have a pilot’s license (power or gliding)and a wish to share <strong>on</strong>e’s adventures and pictures with others. You canuse the club web site http://orlandi.ing.univaq.it/EMCfly/index.htmto post photos or links to your own sites. You can arrange to shareflights with other EMC people when traveling to meetings or c<strong>on</strong>ferences.They will arrange informal meetings at the main EMC c<strong>on</strong>ferences,probably over lunch or an evening with beer or wine. There isno membership fee. Simply send your profile details and any pictures(please use standard and efficient file formats) to Ant<strong>on</strong>io Orlandi atorlandi@ing.univaq.it. Planning is now underway for some flying inHawaii in c<strong>on</strong>juncti<strong>on</strong> with the <str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium<strong>on</strong> EMC. C<strong>on</strong>tact Professor Orlandi for more informati<strong>on</strong>.NVLAP Assessor/Laboratory Training SeminarThere will be a free NVLAP training seminar <strong>on</strong> Saturday, July 7.The seminar is open to all current and potential NVLAP assessors,NVLAP-accredited laboratories, and laboratories c<strong>on</strong>sidering accreditati<strong>on</strong>.Presentati<strong>on</strong>s will be c<strong>on</strong>ducted by the NVLAP staff <strong>on</strong> thevarious elements of laboratory accreditati<strong>on</strong>. This is a great opportunityto better understand the NVLAP business practice, accreditati<strong>on</strong>process, and what to expect during the <strong>on</strong>-site assessment activity.For more informati<strong>on</strong> or to attend, please c<strong>on</strong>tact Brad Moore:brad.moore@nist.gov or ph<strong>on</strong>e 301-975-5740.Amateur Radio Lunche<strong>on</strong>The Amateur Radio Lunch will take place <strong>on</strong> Wednesday, July 11from 12:00pm – 1:30pm at the Hawai’i C<strong>on</strong>venti<strong>on</strong> Center. All IEEEEMC Hams are welcome to attend this annual lunche<strong>on</strong>.Reservati<strong>on</strong>s are required by June 30. Please c<strong>on</strong>tact Tom (W3IA) orJosie (K3SJS) Chesworth, Seven Mountains Scientific, Inc., P.O. Box650 Boalsburg, PA or ph<strong>on</strong>e 814-466-6559; e-mail: Jo@7ms.comdB Society DinnerThe dB Society will meet <strong>on</strong> Sunday, July 8 at 6:30pm (note the newday this year for the annual “picnic”). This is a privately held functi<strong>on</strong>for dB Society members <strong>on</strong>ly. Members please c<strong>on</strong>tact JanetO’Neil for more informati<strong>on</strong> at j.n.<strong>on</strong>eil@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org.Please join us <strong>on</strong> Thursday, July 12, <str<strong>on</strong>g>2007</str<strong>on</strong>g> for theannual EMC Society Awards Lunche<strong>on</strong>1:00 – 2:30 pmHawai’i C<strong>on</strong>venti<strong>on</strong> CenterThe following awards will be presented:EMC Society President's Memorial AwardRichard R. Stoddart Awardfor Outstanding PerformanceH<strong>on</strong>orary Life Member AwardLaurence G. Cumming Awardfor Outstanding ServiceCertificate of AcknowledgementCertificate of Recogniti<strong>on</strong>Best Transacti<strong>on</strong>s <strong>on</strong> EMC Paper AwardBest Symposium Paper AwardBest Student Paper AwardAnd more….PHOTO BY KEN WYATTAt the c<strong>on</strong>clusi<strong>on</strong> of the lunche<strong>on</strong>, in commemorati<strong>on</strong> of the EMC Society’s50th Anniversary, <strong>on</strong>e lucky attendee will receive a complimentary “dB clock”designed by EMC Society legend, the late Al Parker, founder of Solar Electr<strong>on</strong>ics.Stop by the “Exhibitor Museum” in the exhibit hall to see this unique clock <strong>on</strong> display.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


64In December 2004, ANSI ASC C63 published its l<strong>on</strong>g awaitedantenna calibrati<strong>on</strong> standard that replaced the 1988 and 1998versi<strong>on</strong>s. Late last year ASC C63 added to this standard an interpretati<strong>on</strong>that clarified some text and a flow chart. The standard takesinto account the errors that are introduced when using certain broadbandantennas especially at frequencies below 200 MHz and providescorrecti<strong>on</strong> factors when these antennas are used for site validati<strong>on</strong>.The standard also introduces measurement techniques for determiningantenna factors for other types of antennas. The workshop willlead the user through the new document, highlighting which calibrati<strong>on</strong>path should be used based <strong>on</strong> the type of antenna being calibrated.This is essential to ensure that the right antenna factor is usedespecially when validating semi-anechoic chambers. As time permits,attendees will get a chance to apply what they learned via problemsolving and/or performing an antenna calibrati<strong>on</strong> in the lab at themeeting venue.Workshop OverviewIn this seminar, you will learn about:• General calibrati<strong>on</strong> test c<strong>on</strong>diti<strong>on</strong>s• Appropriate measurement geometry• Methods to determine antenna factors• Applicati<strong>on</strong> of standard site method• Reference antenna method• Equivalent capacitance substituti<strong>on</strong> method• Discrete and c<strong>on</strong>tinuous frequency calibrati<strong>on</strong> c<strong>on</strong>siderati<strong>on</strong>s• Rati<strong>on</strong>ale for geometry specific correcti<strong>on</strong> factors for bic<strong>on</strong>icals• Guidelines for measurement uncertainty• Participate in hands-<strong>on</strong> calibrati<strong>on</strong> setup and calibrati<strong>on</strong>EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMNEW REVISED ANTENNA CALIBRATION STANDARD(ANSI C63.5-2006) WORKSHOPSupport Material• ANSI C63.5-2006• A complete lecture notebook• Handouts and referencesWho Should Attend• Those resp<strong>on</strong>sible for using and calibrating antennas in makingradiated emissi<strong>on</strong> compliance measurements and site validati<strong>on</strong>• Calibrati<strong>on</strong> technicians• Calibrati<strong>on</strong> accreditati<strong>on</strong> bodies• Lab quality assessors• Regulatory Compliance Managers• Test Instrumentati<strong>on</strong> and chamber manufacturersDate and Locati<strong>on</strong>Friday, July 6, <str<strong>on</strong>g>2007</str<strong>on</strong>g>Hilt<strong>on</strong> Hawaiian Village Hotel(Headquarter Hotel for the IEEE EMC Symposium)2005 Kalia RoadH<strong>on</strong>olulu, HI 96815-1999Agenda (approx.)Registrati<strong>on</strong> and C<strong>on</strong>tinental Breakfast: 8:00 amClass: 8:30 am to 5:00 pmRegistrati<strong>on</strong> Fee IncludesComplete lecture notebook, c<strong>on</strong>tinental breakfast, lunch, and breaks,roundtrip local transportati<strong>on</strong> between hotel in Waikiki and the university,as well as a copy of ANSI C63.5-2006.Expert InstructorsD<strong>on</strong>ald N. Heirman, Workshop Director,(D<strong>on</strong> HEIRMAN C<strong>on</strong>sultants)Dennis Camell (Nati<strong>on</strong>al Institute of Standards and Technology)Michael J. Windler (Underwriters Laboratories)HotelThe Hilt<strong>on</strong> Hawaiian Village Hotel has rooms reserved for those attendingthe IEEE EMC Symposium, (headquarter hotel for <str<strong>on</strong>g>symposium</str<strong>on</strong>g>).Please visit the website www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org for complete hotel informati<strong>on</strong>and registrati<strong>on</strong> or see informati<strong>on</strong> included <strong>on</strong> the hotel in this program.Registrati<strong>on</strong> FormC<strong>on</strong>tact: Janet O’NeilTeleph<strong>on</strong>e: 425-868-2558Fax: 425-868-2558 (Call First)C63.5 workshop— 6 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>By 10 June <str<strong>on</strong>g>2007</str<strong>on</strong>g> *:Attendees $400 USDC63 & S/C Members $350 USDMs./Mr./Dr.CompanyAddressCity State ZipDaytime Ph<strong>on</strong>eFaxEmailCredit Card (check <strong>on</strong>e): MC Visa AmexCredit Card No:Expirati<strong>on</strong> Date:Signature:Add $100 if after 10 June or at the door** $100 USDAdd’l copy of notebook**$100 USDTotal $* Please do not mail after 15 June <str<strong>on</strong>g>2007</str<strong>on</strong>g>.**With prior teleph<strong>on</strong>e or fax registrati<strong>on</strong> <strong>on</strong>ly.USDCheck or Credit Card Number must accompany registrati<strong>on</strong>.Make check payable to U.S. EMC Standards Corporati<strong>on</strong> in U.S.dollars drawn <strong>on</strong> a U.S. bank. Mail to:Janet O’Neil, ETS-Lindgren22117 Northeast 10th PlaceSammamish, WA 98074Email: j.n.<strong>on</strong>eil@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgNOTE: You are not registered until you receive c<strong>on</strong>firmati<strong>on</strong>Important: The organizing committee may substitute speakers, modify the program (or lecture notes), restrict class size or cancel the workshop. No refunds will be madeto individuals who cancel after 10 June <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Substituti<strong>on</strong>s are allowed. Registrati<strong>on</strong> will be c<strong>on</strong>firmed <strong>on</strong> a first come, first served basis. Workshop requires a minimum of 15attendees; it will be cancelled if less than 15 sign up by 10 June <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Please do not wait to register and do not miss the 10 June <str<strong>on</strong>g>2007</str<strong>on</strong>g> absolute deadline. Registrati<strong>on</strong> fees will be returnedif workshop is cancelled. Book refundable travel arrangements as appropriate if workshop is cancelled.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 65<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium<strong>on</strong> Electromagnetic Compatibility8-13 July <str<strong>on</strong>g>2007</str<strong>on</strong>g> • H<strong>on</strong>olulu, HawaiiNARTE Exams 14 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.orgSymposium Registrati<strong>on</strong> FormNAME & ADDRESS: (please print)EMCS Member? ❏ Yes ❏ No IEEE Member? ❏ Yes ❏ No IEEE Member #____________________ ❏ Amateur Radio Call Sign ________________Please check appropriate box (check <strong>on</strong>e <strong>on</strong>ly): ❏ Manufacturer ❏ Government ❏ Educati<strong>on</strong> ❏ C<strong>on</strong>sultant/OtherFamily/Surname Pers<strong>on</strong>al Name MICompany/Instituti<strong>on</strong>AddressCity State/Province Postal CodeCountry Ph<strong>on</strong>e FaxEmailAre you an author? ❏ Yes ❏ No Author Paper Number(s): _____________________________________________________________________________Indicate if vegetarian meal(s) are required for: Attendee ❏ Yes ❏ No Compani<strong>on</strong> ❏ Yes ❏ NoOther special requirements (special diet, wheelchair, etc)? ❏ Yes ❏ No ___________________________________________________________________GUEST(S): (please print name(s) as you would like them to appear <strong>on</strong> the badge)NameNameREGISTRATION FEES: (please indicate quantity and amount)<strong>on</strong> or before after14 May <str<strong>on</strong>g>2007</str<strong>on</strong>g> 14 May <str<strong>on</strong>g>2007</str<strong>on</strong>g> QuantityFull Registrati<strong>on</strong> 1Member $522.00 $626.00 $________N<strong>on</strong>-Member $696.00 $812.00 $________EMCS Life Member No Fee No Fee $________IEEE Life Member $122.00 $139.00 $________Retired/Unemployed 2 $232.00 $261.00 $________Full Time Student 3 $122.00 $139.00 $________Guest Registrati<strong>on</strong> 4Guest (ages 18 and up) $75.00 $80.00 _____ $________Jr. Guest (ages 8 - 17) $30.00 $35.00 _____ $________Children under 8 freeOne Day Registrati<strong>on</strong> 5Please mark the day(s) you wish to attendMember S M T W TH $174.00 $185.00 _____ $________N<strong>on</strong>-Member S M T W TH $232.00 $261.00 _____ $________Full Time Student 3 S M T W TH $40.00 $50.00 _____ $________Exhibit Hall Only No Fee No Fee _____ $________Additi<strong>on</strong>al Opti<strong>on</strong>sSymposium Record CD &Print Copy Workshop Notes $35.00 $35.00 _____ $________Symposium Record - CD Only $20.00 $20.00 _____ $________Tuesday Welcome Recepti<strong>on</strong> $60.00 $65.00 _____ $________(Adult)Tuesday Welcome Recepti<strong>on</strong> $20.00 $25.00 _____ $________(Jr. Guest)Wednesday Gala/Luau (Adult) $100.00 $115.00 _____ $________Wednesday Gala/Luau (Jr. Guest)* $45.00 $55.00 _____ $________Thursday Awards Lunch (Adult) $40.00 $45.00 _____ $________Thursday Awards Lunch $25.00 $30.00 _____ $________(Jr. Guest)Friday Event/Lunche<strong>on</strong> (Adult) $50.00 $75.00 _____ $________Friday Event/Lunche<strong>on</strong> $25.00 $45.00 _____ $________(Jr. Guest)*Note: Print copies of the complete Symposium Record are not available.* Attendance at the Wednesday Gala and Friday Event is not recommended forchildren under the age of 8.NameNameTOURS: (please indicate quantity, amount, and total)QuantitySunday 8 JulyGrand Circle Island Tour $67.00 _____ $________M<strong>on</strong>day 9 JulyStars and Stripes Tour $60.75 _____ $________Tuesday 10 JulyH<strong>on</strong>olulu’s Hidden Treasures Tour $63.00 _____ $________Wednesday 11 JulyShangri La Tour #1 $62.00 _____ $________Departs at 7:30 AMShangri La Tour #2 $62.00 _____ $________Departs at 10:00 AMThursday 12 JulyH<strong>on</strong>olulu City & Palace Tour $68.00 _____ $________<strong>on</strong> or before after14 May <str<strong>on</strong>g>2007</str<strong>on</strong>g> 14 May <str<strong>on</strong>g>2007</str<strong>on</strong>g> QuantityGlobal EMC University* $250.00 $350.00 _____ $________*Attendance is limited – Register Early!Full registrati<strong>on</strong> at the EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> <str<strong>on</strong>g>symposium</str<strong>on</strong>g>is required in additi<strong>on</strong> to the Global EMC University fee.TOTAL REMITTANCE:$________________NARTE ExamOn Saturday, 14 July, the NARTE EMC Certificati<strong>on</strong> exam will be held at theHilt<strong>on</strong> Hawaiian Village Hotel. Please indicate below if you plan to participatein the NARTE exam.❏ Yes, I plan to attend the NARTE exam.Friday EventOn Friday, 13 July, there will be a 50th Anniversary Event at the Turtle BayResort. This Event is included with FULL registrati<strong>on</strong>s.“FULL Registrants,”please indicate whether or not you plan to attend the Friday Event.❏ Yes ❏ No©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


66EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Internati<strong>on</strong>al Symposium<strong>on</strong> Electromagnetic Compatibility8-13 July <str<strong>on</strong>g>2007</str<strong>on</strong>g> • H<strong>on</strong>olulu, HawaiiNARTE Exams 14 July <str<strong>on</strong>g>2007</str<strong>on</strong>g>www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.orgSymposium Registrati<strong>on</strong> Form1 Full, 6 day (Sunday, 8 July - Friday, 13 July) registrants are entitled to: CD ROM of Symposium Record, Print Copy of Workshop Notes,admissi<strong>on</strong> to the Symposium which includes Technical Sessi<strong>on</strong>s, Exhibit Hall, Workshops, Tuesday Welcome Recepti<strong>on</strong>, WednesdayBanquet, Thursday Awards Lunche<strong>on</strong> and Friday Event.2 A reducti<strong>on</strong> of the Registrati<strong>on</strong> Fee was approved for retired or unemployed IEEE EMC Society Members <strong>on</strong>ly. The registrant must providethe name of the company that they left and the date for retirement/unemployment.3 Student registrati<strong>on</strong>s are open to full time students, and include the CD ROM of Symposium Record, Print Copy of Workshop Notes,admissi<strong>on</strong> to the Symposium which includes Technical Sessi<strong>on</strong>s, Exhibit Hall, Workshops, Tuesday Welcome Recepti<strong>on</strong>, Wednesday Banquet,Thursday Awards Lunche<strong>on</strong> and Friday Event. Students will be required to show a Student ID at the c<strong>on</strong>ference to c<strong>on</strong>firm their status asfull-time students.4 Guests may include an adult compani<strong>on</strong> and any accompanying children. Each guest must be registered to receive admissi<strong>on</strong> to theGuest Lounge, Children’s Workshops, and Tuesday Welcome Recepti<strong>on</strong>. All guests are welcome into the Exhibit Hall.5 One-Day Registrants are entitled to admissi<strong>on</strong> for <strong>on</strong>e day and the CD ROM of Symposium Record and Print Copy of Workshop Notes.EMC MEMBERSHIP:Free First year membership to IEEE/EMC if you join at the Symposium. See IEEE EMC or IEEE Marketing Booth in the Exhibit Hall for details.METHOD OF PAYMENT:❏ Check (in USD) made out to IEEE/EMC ❏ Visa ❏ MasterCard ❏ American Express ❏ Diners ClubCredit Card NumberExpirati<strong>on</strong> DateCardholder NameAuthorized Signature❏ Wire TransferIf you are paying by wire transfer please c<strong>on</strong>tact Andrea Sadlowski (emc07reg@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org) for bank informati<strong>on</strong>.CANCELLATION POLICY:All requests for refunds prior to 30 May <str<strong>on</strong>g>2007</str<strong>on</strong>g> must be in writing. A $50 service charge will apply. No refunds will be made after 3:00 PM EDT<strong>on</strong> 30 May <str<strong>on</strong>g>2007</str<strong>on</strong>g>. Substituti<strong>on</strong>s are permitted.The <str<strong>on</strong>g>2007</str<strong>on</strong>g> Committee reserves the right to cancel any tour that does not meet the minimum requirement. If a tour is cancelled, you willreceive a full refund and will be c<strong>on</strong>tacted prior to the <str<strong>on</strong>g>symposium</str<strong>on</strong>g>.EMERGENCY CONTACT:NameRelati<strong>on</strong>shipDay-time Ph<strong>on</strong>eEvening Ph<strong>on</strong>eMail or Fax completed form and payments to:IEEE/CMS, 445 Hoes Lane, Piscataway, NJ 08855-1331, USAPh<strong>on</strong>e: +1 732 562 5337 Fax: +1 732 465 6447 Email: emc07reg@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM 67<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Electromagnetic Compatibility SocietyMembership OfferJoin IEEEToday!Access the world ofTechnologyIEEE has been there since 1884,supporting professi<strong>on</strong>als fromacademia and industry. IEEEMembership includes a pers<strong>on</strong>alsubscripti<strong>on</strong> to the award winning IEEESpectrum, world's most widely readelectrical and electr<strong>on</strong>ics magazine.Over 360,000 IEEE members receivetimely articles <strong>on</strong> the status ofc<strong>on</strong>temporary professi<strong>on</strong>al topics, aswell as careers and educati<strong>on</strong>,applicati<strong>on</strong>s of state-of-the-arttechnology and various historical andtutorial issues.Exclusive Benefits no otherorganizati<strong>on</strong> can match: Access informati<strong>on</strong> <strong>on</strong>-line –search and read 1 milli<strong>on</strong> abstracts Exclusive articles just for members Newsletter "The Institute" tokeep you current Save m<strong>on</strong>ey <strong>on</strong> standards,c<strong>on</strong>ference proceedings, books,c<strong>on</strong>ference fees and more Discounts <strong>on</strong> flights, car rental andhotels with IEEE Travel Services Healthcare, life insurance,mortgage services, auto and homeinsurance, professi<strong>on</strong>al liabilityinsurance with IEEE FinancialAdvantage ProgramObtain an @<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org e-mail aliaswith virus and spam scanningFor more informati<strong>on</strong> Visit ourweb site at:http://www.emcs.org/Focus Your CareerWithIEEE Electromagnetic Compatibility Society (EMC-S)Society membership enhances the benefits you receive as an IEEE member. Network with the topminds in your field and develop the support structure you need for success in your career. Yourmembership c<strong>on</strong>nects you with innovators and practiti<strong>on</strong>ers around the world – people you may nototherwise meet in the course of your daily job. Society membership offers many opportunities tovolunteers. Whether you volunteer to serve <strong>on</strong> technical committees, edit a journal, get involved inlocal and regi<strong>on</strong>al activities through your EMC chapter or in any other way, the experience you gainputs you <strong>on</strong> the career path for c<strong>on</strong>tinued success.Introducing… the EMC Society of the IEEEThe EMC Society encompasses the design, integrati<strong>on</strong>, testing and analysis of electrotechnologyproducts and systems to c<strong>on</strong>trol <strong>electromagnetic</strong> interference. It strives for EMC enhancementthrough the generati<strong>on</strong> of engineering standards, measurement techniques, instrumentati<strong>on</strong> andprocedures, the study of equipment and systems characteristics, improved techniques and devicesfor EMI c<strong>on</strong>trol, educati<strong>on</strong> in EMC and studies of the origins of interference.The EMC Society promotes close cooperati<strong>on</strong> and exchange of technical informati<strong>on</strong> am<strong>on</strong>g itsmembers and other professi<strong>on</strong>al societies. To facilitate the exchange, local chapter and annual<str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> symposia meetings are held for the presentati<strong>on</strong> of papers, workshops and tutorialsessi<strong>on</strong>s and for the meeting of the EMC-S's various committee meetings. More than 4,000members of the Society are active in more than 60 chapters world-wide, while several new chaptersare under c<strong>on</strong>structi<strong>on</strong>.The EMC Society of the IEEE was founded <strong>on</strong> October 10, 1957, when the IRE approved thepetiti<strong>on</strong> signed by 326 engineers wishing to form a Professi<strong>on</strong>al Group <strong>on</strong> Radio FrequencyInterference. Since then, the c<strong>on</strong>tributi<strong>on</strong>s made by the EMC Society have been numerous. In <str<strong>on</strong>g>2007</str<strong>on</strong>g>,the EMC Society will be celebrating its 50th anniversary.Member Benefits HighlightsIEEE and EMC-S MembershipEMC-S Affiliate Membership FREE <strong>on</strong>line access to EMC-S Newsletter FREE <strong>on</strong>line access to EMC-S Newsletter FREE access to EMC-S Digital Library FREE access to EMC-S Digital Library FREE Quarterly EMC-S Newsletter FREE Quarterly EMC-S NewsletterFREE Quarterly IEEE Transacti<strong>on</strong>s <strong>on</strong> EMC(<strong>on</strong> line access)FREE IEEE Web Account, e-mail @<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.orgalias, virus scanning and moreFREE subscripti<strong>on</strong> to "IEEE Spectrum" and"The Institute"Plus these benefits:FREE CD-ROM from the annual Internati<strong>on</strong>alIEEE EMC Symposium <strong>on</strong> EMCRegistrati<strong>on</strong> discounts at the EMC-S annualsymposiaIEEE exclusive insurance servicesFREE Quarterly IEEE Transacti<strong>on</strong>s <strong>on</strong> EMC(<strong>on</strong> line access)FREE IEEE Web AccountPlus these benefits:FREE CD-ROM from the annual Internati<strong>on</strong>alIEEE EMC Symposium <strong>on</strong> EMCRegistrati<strong>on</strong> discounts at the EMC-S annualsymposiaBring your completed IEEE & EMCS Member Applicati<strong>on</strong>to the IEEE EMC-S Membership Booth©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


68EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAM Yes! I want to join:<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE Electromagnetic Compatibility SocietyProfessi<strong>on</strong>al Membership/Subscripti<strong>on</strong> Applicati<strong>on</strong>Membership subscripti<strong>on</strong>s are annualized to, and expire <strong>on</strong>, 31 December <str<strong>on</strong>g>2007</str<strong>on</strong>g>.Pay full or half-year rate depending up<strong>on</strong> the date of receipt by the IEEEIEEE benefits include a m<strong>on</strong>thly subscripti<strong>on</strong> to IEEE Spectrum magazineIEEE EMC-S benefits include a quarterly subscripti<strong>on</strong> to the EMC-S Newsletter and the IEEETransacti<strong>on</strong>s <strong>on</strong> Electromagnetic CompatibilityMembership Opti<strong>on</strong>s:All prices quoted in U.S. dollars FULL YEAR HALF YEARApplicati<strong>on</strong>s received Applicati<strong>on</strong>s received16 Aug 06 – 28 Feb 07 1 Mar 07 – 15 Aug 07I do not bel<strong>on</strong>g to the IEEE. I want to join <strong>on</strong>ly the EMCS. $ 87.00 ❑ $44.00 ❑Professi<strong>on</strong>al Affiliati<strong>on</strong>(s): ____________________________I reside in the United States $189.00 ❑ $94.50 ❑I reside in Canada (Including HST) $187.72 ❑ $94.43 ❑I reside in Canada (Including GST) $175.88 ❑ $88.47 ❑I reside in Africa/Europe/Middle East $159.00 ❑ $80.00 ❑I reside in Latin America $152.00 ❑ $76.50 ❑I reside in Asia/Pacific $153.00 ❑ $77.00 ❑I reside in Asia/Pacific (Tokyo Council) $178.00 ❑ $89.50 ❑I already bel<strong>on</strong>g to the IEEE and I now want to join the EMCS. $ 25.00 ❑ $13.00 ❑I am a student (select the category that applies):I Reside in USA and wish to join the IEEE and the EMCS $ 43.00 ❑ $22.00 ❑I reside in Canada (HST ) and wish to join the IEEE and the EMCS $ 49.02 ❑ $25.08 ❑I reside in Canada (GST ) and wish to join the IEEE and the EMCS $ 45.48 ❑ $23.32 ❑I reside outside USA/Canada) and wish to join the IEEE & the EMCS $ 38.00 ❑ $19.50 ❑I am a Student IEEE member and wish to join the EMCS $ 13.00 ❑ $ 7.00 ❑(IEEE members <strong>on</strong>ly need to furnish name, address, and IEEE number with payment.) Canadian residents pay 6% GST or 14% HST Reg. No. 125634188 <strong>on</strong> Society payment(s) and Publicati<strong>on</strong>s <strong>on</strong>lyMinimum Income or Unemployed Provisi<strong>on</strong>Applicants who certify that their prior year income did not exceed US$11,900 (or equivalent) or were notemployed are granted 50%reducti<strong>on</strong> in full year dues, regi<strong>on</strong>al assessment and fees for <strong>on</strong>e IEEE Society. Ifapplicable, please check appropriate box and adjust payment accordingly. Student members are not eligible.I certify I earned less than US$11,900 in 2005 ❑I certify that I was unemployed in 2005❑Are you now or were you ever a member of the IEEE?Yes ❑ No ❑ If yes, provide IEEE number if known: _________________Pers<strong>on</strong>al Informati<strong>on</strong>:Please enter your name as you want it to appear <strong>on</strong> corresp<strong>on</strong>dence.Gender (opti<strong>on</strong>al): Male ❑ Female ❑ Date of birth (Opti<strong>on</strong>al): (DD/MM/YYYY) ___/___/_______________________________________________________________________________________________Title First name Middle Last/Surname___________________________________________________________________________________________Home address___________________________________________________________________________________________CityState/Province___________________________________________________________________________________________Postal CodeCountry___________________________________________________________________________________________Home teleph<strong>on</strong>eFacsimile___________________________________________________________________________________________Preferred e-mailBusiness/Professi<strong>on</strong>al Informati<strong>on</strong>:___________________________________________________________________________________________Title/Positi<strong>on</strong>___________________________________________________________________________________________Years in current positi<strong>on</strong>Years of practice since graduati<strong>on</strong>___________________________________________________________________________________________Employer nameDepartment/Divisi<strong>on</strong>___________________________________________________________________________________________Street address City State/Province___________________________________________________________________________________________Postal CodeCountry___________________________________________________________________________________________Office teleph<strong>on</strong>eOffice facsimileSEND MAIL TO: ❑ Home Address OR ❑ Business/School AddressPayment Informati<strong>on</strong>Payment is required with applicati<strong>on</strong>IEEE membership feeAMOUNT PAIDEnclosed:❑ Check/M<strong>on</strong>ey Order †Charge my:❑ MasterCard❑ Visa❑ American Express❑ Diner’s Club$____TAX $____TOTAL $_________________________________________________Card Number_____________________________________________Expirati<strong>on</strong> Date (m<strong>on</strong>th/year)_____________________________________________SignatureUSA-<strong>on</strong>ly include 5-digit billing zip code□□□□□† Payable to the IEEE in U.S. dollars drawn <strong>on</strong> a U.S.bank account. Please include member name andnumber (if known) <strong>on</strong> your check.In order for us to process yourapplicati<strong>on</strong>, you must complete andreturn this form to:IEEE Admissi<strong>on</strong> and Advancement445 Hoes LanePO Box 6804Piscataway, NJ 08855-6802 USAor Fax to (732) 981-0225 (credit cardpayments <strong>on</strong>ly)(Allow up to 8 weeks to completeapplicati<strong>on</strong> processing)I hereby make applicati<strong>on</strong> forElectromagnetic CompatibilitySociety and/or IEEE membershipand agree to be governed byIEEE’s C<strong>on</strong>stituti<strong>on</strong>, Bylaws,Statements of Policies andProcedures, and Code of Ethics.I authorize release of informati<strong>on</strong>related to this applicati<strong>on</strong> todetermine my qualificati<strong>on</strong>s formembership.___________________________SignatureDateAPPLICATION MUST BE SIGNED©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


70EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> ADVANCE PROGRAMEMC SOCIETY TECHNICAL COMMITTEESWhat is a technical committee? The technical committees play an important role in the overall success of the EMC Society by promoting activitiesin their fields and providing expert knowledge and assistance to generate and review technical papers, organize and operate sessi<strong>on</strong>s at symposia,generate and develop standards and evaluate the “state of the art” in EMC science.You are invited to join the EMC Society Technical Committees. See the committee meetings scheduled at EMC <str<strong>on</strong>g>2007</str<strong>on</strong>g> <strong>on</strong> www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.orgTechnical Committee 1: EMC ManagementChair: Dave Southworth (d.southworth@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Bob Scully (bob.scully@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Secretary: Doug Kramer (drkramer@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)This committee is c<strong>on</strong>cerned with the development and disseminati<strong>on</strong>of Best Practices and Methodologies for the successful leadership,supervisi<strong>on</strong> and guidance of EMC related activities. These BestPractices and Methodologies shall be structured so as to provide assistanceto all managers, and engineers. Appropriate and c<strong>on</strong>venienttools shall serve as a foundati<strong>on</strong> to these Best Practices andMethodologies.Technical Committee 2: EMC MeasurementsChair: D<strong>on</strong> Heirman (d.heirman@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Thomas J. Fagan (tjfagan@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Acting Secretary: Bob Hofmann (hrhofmann@att.net)This committee is c<strong>on</strong>cerned with the measurement and instrumentati<strong>on</strong>requirements in EMC standards and procedures and how they areinterpreted. Also c<strong>on</strong>cerned with the adequacy of measurement proceduresand measurement instrumentati<strong>on</strong> specificati<strong>on</strong>s for radiatedand c<strong>on</strong>ducted emissi<strong>on</strong> and susceptibility tests and the rati<strong>on</strong>ale forperformance limits for these tests.Technical Committee 3: Electromagnetic Envir<strong>on</strong>mentChair: Graham (Bill) Strauss (straussgw@navair.navy.mil)Vice Chair: vacantSecretary: vacantThe charter of TC3, the Technical Committee <strong>on</strong> ElectromagneticEnvir<strong>on</strong>ment is to encourage research <strong>on</strong> the:• Electromagnetic envir<strong>on</strong>ment (EME),• Development of standards for EME measurement and characterizati<strong>on</strong>,• Natural and man-made sources of <strong>electromagnetic</strong> envir<strong>on</strong>ment thatcomprise this envir<strong>on</strong>ment,• Effects of noise (unwanted porti<strong>on</strong>s of EME) <strong>on</strong> systems performance,and• Effects of <str<strong>on</strong>g>internati<strong>on</strong>al</str<strong>on</strong>g> civil and military standards intended to c<strong>on</strong>trolman-made intenti<strong>on</strong>al and unintenti<strong>on</strong>al emissi<strong>on</strong>s of <strong>electromagnetic</strong>energy.Technical Committee 4: Electromagnetic Interference C<strong>on</strong>trolChair: Bob Scully (bob.scully@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Kermit Phipps (KPhipps@epri-peac.com)Secretary: John Archer (archerj@indy.net)This committee is c<strong>on</strong>cerned with the fundamentals of transmissi<strong>on</strong>/propagati<strong>on</strong>media and interference c<strong>on</strong>trol technology, togetherwith associated design, analysis, and techniques useful for the identificati<strong>on</strong>,characterizati<strong>on</strong>, c<strong>on</strong>trol and mitigati<strong>on</strong> of <strong>electromagnetic</strong>interference at the system, subsystem and unit levels.Technical Committee 5: High Power ElectromagneticsChair: Dr. William A. Radasky (wradasky@aol.com)Vice Chair: Mr. Michael K. McInerney (mkmcinerney@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Secretary: Dr. Randy J. Jost (randy.j.jost@usu.edu)This committee is c<strong>on</strong>cerned with the effects and protecti<strong>on</strong> methodsfor electr<strong>on</strong>ic equipment and systems for all types of high power <strong>electromagnetic</strong>envir<strong>on</strong>ments. These envir<strong>on</strong>ments include <strong>electromagnetic</strong>pulse (EMP), intenti<strong>on</strong>al EMI envir<strong>on</strong>ments (e.g. high powermicrowaves and ultra wideband), lightning <strong>electromagnetic</strong> currentsand fields, and electrostatic discharge. Interacti<strong>on</strong>s with aircraft andother mobile systems are included.Technical Committee 6: Spectrum ManagementChair: Thomas J. Fagan (tjfagan@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Larry Cohen (lcohen@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Secretary: Karen Dyberg (kdyberg@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)This committee is c<strong>on</strong>cerned with frequency coordinati<strong>on</strong>, managementprocedures for efficient spectrum use, band occupancy and c<strong>on</strong>gesti<strong>on</strong>,federal regulati<strong>on</strong>s and their adequacy.Technical Committee 7: N<strong>on</strong>sinusoidal FieldsChair: Dr. William J. Croisant (w.croisant@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Michael K. McInerney (mkmcinerney@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Secretary: Dr. Frank Sabath (frank.sabath@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)This committee is c<strong>on</strong>cerned with the applicati<strong>on</strong> of <strong>electromagnetic</strong>signals with large relative bandwidth, comm<strong>on</strong>ly referred to as n<strong>on</strong>sinusoidalwaves, delineati<strong>on</strong> of the differences between time-domainand frequency-domain principles, analytical and numerical treatmentsof the Maxwell postulates directly in time-domain, c<strong>on</strong>ceptualizati<strong>on</strong>,design, fabricati<strong>on</strong> and testing of materials and devices for ultra-widebandwidth systems.Technical Committee 8: Electromagnetic Product SafetyChair: Richard Georgerian (richardg@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)Vice Chair: Dan Modi (Dan.Modi@alc<strong>on</strong>Labs.com)Secretary: Jim Bacher (j.bacher@<str<strong>on</strong>g>ieee</str<strong>on</strong>g>.org)To provide a professi<strong>on</strong>al forum for Product Safety professi<strong>on</strong>als, bothto develop their own skills, and to provide Product Safety outreach toengineers, students, and others.Technical Committee 9: Computati<strong>on</strong>al ElectromagneticsChair: Dr. Jun Fan (jf151005@ncr.com)Vice Chair: Dr. Chuck Bunting (reverb@okstate.edu)Secretary: Dr. Alan Roden (JAlan.Roden@aero.org)This committee is c<strong>on</strong>cerned with broad aspects of Applied Computati<strong>on</strong>alElectromagnetic techniques that can be used to model electro-magneticinteracti<strong>on</strong> phenomena in circuits, devices, and systems. The primaryfocus is with the identificati<strong>on</strong> of the modeling methods that can beapplied to interference (EMC) phenomena, their validati<strong>on</strong> and delineatingthe practical limits of their applicability. Included are low and highfrequency spectral-domain techniques and time-domain methods.Technical Committee 10: Signal IntegrityChair: Jim Nadolny (jim.nadolny@samtec.com)Vice Chair: Prof. Ant<strong>on</strong>io Orlandi (orlandi@ing.univaq.it)Secretary: Prof. Giulio Ant<strong>on</strong>ini (ant<strong>on</strong>ini@ing.univaq.it)This committee is c<strong>on</strong>cerned with the design, analysis, simulati<strong>on</strong>,modeling and measurement techniques useful in maintaining thequality of electrical signals. These activities encompass all aspects ofsignal integrity from the integrated circuit level to the system level.©<str<strong>on</strong>g>2007</str<strong>on</strong>g> IEEE www.emc<str<strong>on</strong>g>2007</str<strong>on</strong>g>.org


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