x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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Institute <strong>of</strong> Solid State Physicspentacene sub-monolayer physical vapour deposition on SiOxnom. t ... nominal thicknesscov afm… coverage2µmPr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20097