x-ray reflectivity: structural characterisation of thin films for organic ...

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intensityInstitute of Solid State Physicsx-ray reflectivityoptical reflection of x-rays on surfaces and interfacesinterference between the surface reflected and the interface reflected beams most accurate method of layer thickness determination (1nm … 700 nm) only possible for homogenous thick layerslayer thicknesslargelayer thicknesssmalln = 1n ~ 1α iα fα fmedium1n ~ 1medium2fitting parameters:film thicknesssurface roughnessinterface roughnesselectron densityα iH. Kissig, Ann. Physik (1931)α iF. Schreiber, X-ray Scattering on Thin Films and SurfacesProfessor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20094
Institute of Solid State Physicspolymer thin films spin coated films from different concentrations effect of annealingO. Werzer, et al., Thin Solid Films, 2007Professor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20095
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x-ray reflectivity: structural characterisation of thin films for organic ...

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