x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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intensityInstitute <strong>of</strong> Solid State Physicsx-<strong>ray</strong> <strong>reflectivity</strong>optical reflection <strong>of</strong> x-<strong>ray</strong>s on surfaces and interfacesinterference between the surface reflected and the interface reflected beams most accurate method <strong>of</strong> layer thickness determination (1nm … 700 nm) only possible <strong>for</strong> homogenous thick layerslayer thicknesslargelayer thicknesssmalln = 1n ~ 1α iα fα fmedium1n ~ 1medium2fitting parameters:film thicknesssurface roughnessinterface roughnesselectron densityα iH. Kissig, Ann. Physik (1931)α iF. Schreiber, X-<strong>ray</strong> Scattering on Thin Films and SurfacesPr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20094