x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
intensityInstitute <strong>of</strong> Solid State Physicsx-<strong>ray</strong> <strong>reflectivity</strong>optical reflection <strong>of</strong> x-<strong>ray</strong>s on surfaces and interfacesinterference between the surface reflected and the interface reflected beams most accurate method <strong>of</strong> layer thickness determination (1nm … 700 nm) only possible <strong>for</strong> homogenous thick layerslayer thicknesslargelayer thicknesssmalln = 1n ~ 1α iα fα fmedium1n ~ 1medium2fitting parameters:film thicknesssurface roughnessinterface roughnesselectron densityα iH. Kissig, Ann. Physik (1931)α iF. Schreiber, X-<strong>ray</strong> Scattering on Thin Films and SurfacesPr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20094
Change language