x-ray reflectivity: structural characterisation of thin films for organic ...

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Institute of Solid State PhysicsDHS900contentx-ray reflectivity - introductionpolymer thin films - PS, P3HT, F8T2molecular monolayers - pentaceneself assembled monolayers - SAMsconclusionBRUKER D8 DiscoverProfessor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20092
Institute of Solid State Physicsx-ray reflectivity refraction of x-rays at interfacesα in < 1r eclassical electron radiusρ e electron density in the solidμ xlinear absorption coefficientn 1 itypical values: δ ~ 10 -5 ...10 -6β ~ 10 -7 ...10 -822r e e4xcritical angle of total external reflection: Θ C ..= √(2δ) = 0.1° (organics) … 0.4° (gold)J. Als-Nielsen, et al., Elements of Modern X-ray Physics, Wiley & Sons 2001Professor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 20093
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