x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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Institute <strong>of</strong> Solid State PhysicsAcknowledgementsB. Stadlober, A. Haase,NMP WeizE.C.P. Smith, H. Wondergem, D. de Leeuw,Philips EindhovenF. Zontone, O. Konovalov,ID10B, ESRF, GrenobleD. SmilgiesG2-line, CHESS, Cornell University, Ithaca, NYPr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200916