x-ray reflectivity: structural characterisation of thin films for organic ...

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Institute of Solid State Physicsstructural models 2-dimensional crystal herringbone packing of thiophene unitsProfessor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200914
Institute of Solid State Physicsconclusionx-ray reflectivity for organic thin film characterisationfilm thicknesssurface roughnessinterface roughnesstotal electron density control film quality also multilayer structures interface characterisation (e.g. gold penetration into organics) in combination with ellipsometry:determination of optical refractive indicesProfessor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200915
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x-ray reflectivity: structural characterisation of thin films for organic ...

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