x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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Institute <strong>of</strong> Solid State Physicsgrazing incidence x-<strong>ray</strong> diffraction appearance <strong>of</strong> Bragg rodshalf a day in solutionE. C. P. Smith, et al., Nature (2008)Pr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200913