x-ray reflectivity: structural characterisation of thin films for organic ...

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Institute of Solid State Physicsgrazing incidence x-ray diffraction 2-dimensional crystallographyangle of incidence: α i ~ Θ C (critical angle)Yoneda peak at k(α f = Θ C ) !!I. K. Robinson, et al., Rep. Prog. Phys. 55 (1992) 599Professor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200912
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x-ray reflectivity: structural characterisation of thin films for organic ...

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