x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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Institute <strong>of</strong> Solid State Physicsgrazing incidence x-<strong>ray</strong> diffraction 2-dimensional crystallographyangle <strong>of</strong> incidence: α i ~ Θ C (critical angle)Yoneda peak at k(α f = Θ C ) !!I. K. Robinson, et al., Rep. Prog. Phys. 55 (1992) 599Pr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200912