x-ray reflectivity: structural characterisation of thin films for organic ...

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Institute of Solid State Physicsfilm preparation:substrate: plasma etching, surface activation by HCl, rinse by waterSAM preparation : 0.5 … 2 days in toluene solution, rinse with dry toluene0.5 days in solution 1 day 2 daysProfessor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200910
Institute of Solid State Physicsx- ray reflectivity fitting by a double layer model before / after heat treatment @ 120°CE. C. P. Smith, et al., Nature (2008)Professor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200911
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x-ray reflectivity: structural characterisation of thin films for organic ...

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