x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
x-ray reflectivity: structural characterisation of thin films for organic ...
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Institute <strong>of</strong> Solid State Physicsfilm preparation:substrate: plasma etching, surface activation by HCl, rinse by waterSAM preparation : 0.5 … 2 days in toluene solution, rinse with dry toluene0.5 days in solution 1 day 2 daysPr<strong>of</strong>essor Roland Resel Horst Cerjak, 19.12.2005Bologna, 17 February 200910