An Improved VLSI Test Economics Analysis System - Laboratory for ...
An Improved VLSI Test Economics Analysis System - Laboratory for ... An Improved VLSI Test Economics Analysis System - Laboratory for ...
where R int is interest rate in the time interval. Consequently, tester cost of the project isC tester = f 2b , f 2a= [(1 + R int ) N t, (1 , R d ) N t] U tester ;(2.13)More general form of preceding equation isC = [(1 + R int ) N t, (1 , R f ) N t] U; (2.14)where R f is negative if this capital, such as tester, depreciates after t 1 , and positive if thiscapital appreciates after t 1 , such as building. To simplify above equation, the followingcondition is used. If R int 1 and R f 1,(1 + R int ) N t = 1+Rint N t ;(1 , R f ) N t = 1 , Rf N t :(2.15)Thus, Equation 2.14 can be rewritten asC = ((1 + R int ) N t, (1 , R f ) N t) U= ((1 + R int N t ) , (1 , R f N t )) U(2.16)=(R int + R f )N t U:Moreover, if jR f jR int ,C = UR f N t : (2.17)Notice that jR f jN t < 1 must be satisfy, i.e., cost can never exceed value of this capital.Some costs, such as salary, prototyping, etc., are purchased only for immediate or currentuse. They can be modeled asC = U (2.18)In conclusion, three type of cost models are proposed in our cost models:Type I: C = UThis equation is used to model the costs purchased only for immediate or currentuse such as prototyping.18
Type II: C = UR f N tThis equation is used for capital cost. It considers depreciation of capital, butsimplies calculation by some trick of mathematical analysis.Type III: C = [(1 + R int ) N t , (1 + R f) N t ] UThis more precise capital cost model is used only when the time interval is long andthe depreciation or appreciation rate is high.Costf2b(t1)f 2b (t1.1)f2b(t1.2)f2b(t1.3)f 2b (t1.4)f 2b (t1.5)f2b(t 1.6)f 2a (t1.6 )f2a(t1.5)f 2a (t1.4)f 2a (t1.3)f 2a (t 1.2)f (t 1.1)2af 2a (t 1)t1 t1.1 t1.2 t1.3 t1.4 t1.5 t1.6t2TimeFigure 2.5: Continuous cost.In follows, we consider continuous cost. If the cost is continuous form t 1 to t 2 , as shown inFigure 2.5. Then, total cost should beC =NX n=0f 2b (t 2 , (t 1 + nt)) , f 2a (t 2 , (t 1 + nt)); where N = t2 , t 1t(2.19)is number of time interval between t 1 and t 2 . Type II cost model, as Equation 2.17, is usedfor each item of the summation. Then, this summation can be given byC =NX n=1= UR fN Xn=1n = URfN 2R f N(t 2 , (t 1 + nt))U2 ; (2.20)19
- Page 1 and 2: An Improved VLSI Test Economics Ana
- Page 3 and 4: Contents1 Introduction 11.1 Economi
- Page 5 and 6: List of Figures2.1 Area relation be
- Page 7 and 8: Chapter 1IntroductionFrom business
- Page 9 and 10: costs are summed as the total cost.
- Page 11 and 12: TEEM)" for VLSI test strategy plann
- Page 13 and 14: Chapter 2Economic ModelsIn this cha
- Page 15 and 16: 2.2 Circuit DescriptionThis section
- Page 17 and 18: Gate Area Ratio (gar): Average gate
- Page 19 and 20: (a) (b) (c)Figure 2.1: Area relatio
- Page 21 and 22: The proposed economic models consis
- Page 23: However, cost is greatly impacted b
- Page 27 and 28: where K dsgn is user dened design c
- Page 29 and 30: where U space is price of the build
- Page 31 and 32: Table 2.6: N pass and N v ratio.Bef
- Page 33 and 34: is aected by gate count, complexity
- Page 35 and 36: FC100%FC100%Phase IPhase IIVV(a)(b)
- Page 37 and 38: In our study, we run ATPG for ISCAS
- Page 39 and 40: asR dft = 1 2 (TMM grow +2TMM matu
- Page 41 and 42: Chapter 3System DevelopmentIn our s
- Page 43 and 44: the browser.3.2 Analysis FlowConnec
- Page 45 and 46: (a)(b)Figure 3.4: Model Editor: (a)
- Page 47 and 48: If this equation is a function, for
- Page 49 and 50: Table 4.1: ISCAS'89 benchmark circu
- Page 51 and 52: Table 4.2: Fault coverage parameter
- Page 53 and 54: Table 4.3: Fault coverage and test
- Page 55 and 56: 4.3 Case StudyIn this section, a re
- Page 57 and 58: Table 4.8: Parameters of time model
- Page 59 and 60: Table 4.12: Cost of dierent volume.
- Page 61 and 62: in Figure 4.4 for 2K volume and Fig
- Page 63 and 64: circuits were translated to Verilog
- Page 65 and 66: Design space cost for rent building
- Page 67 and 68: Revenue with DFT design:R dft = 1 2
- Page 69 and 70: 1s298s344Fault Coverage (FC)0.90.80
- Page 71 and 72: Fault Coverage (FC)10.90.80.70.60.5
- Page 73 and 74: Fault Coverage (FC)10.90.80.70.60.5
where R int is interest rate in the time interval. Consequently, tester cost of the project isC tester = f 2b , f 2a= [(1 + R int ) N t, (1 , R d ) N t] U tester ;(2.13)More general <strong>for</strong>m of preceding equation isC = [(1 + R int ) N t, (1 , R f ) N t] U; (2.14)where R f is negative if this capital, such as tester, depreciates after t 1 , and positive if thiscapital appreciates after t 1 , such as building. To simplify above equation, the followingcondition is used. If R int 1 and R f 1,(1 + R int ) N t = 1+Rint N t ;(1 , R f ) N t = 1 , Rf N t :(2.15)Thus, Equation 2.14 can be rewritten asC = ((1 + R int ) N t, (1 , R f ) N t) U= ((1 + R int N t ) , (1 , R f N t )) U(2.16)=(R int + R f )N t U:Moreover, if jR f jR int ,C = UR f N t : (2.17)Notice that jR f jN t < 1 must be satisfy, i.e., cost can never exceed value of this capital.Some costs, such as salary, prototyping, etc., are purchased only <strong>for</strong> immediate or currentuse. They can be modeled asC = U (2.18)In conclusion, three type of cost models are proposed in our cost models:Type I: C = UThis equation is used to model the costs purchased only <strong>for</strong> immediate or currentuse such as prototyping.18
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