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Mission Design for the CubeSat OUFTI-1

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CHAPTER 55.7 The radiation environmentThe trajectory of charged particles of solar wind, electrons and protons, is modifiedby <strong>the</strong> interaction with <strong>the</strong> earth magnetic field: <strong>the</strong>y remain trapped into<strong>the</strong> so-called radiations belts, or Van-Allen belts. They are two belts where <strong>the</strong>radiation environment is <strong>the</strong>re<strong>for</strong>e extremely hard and <strong>the</strong> spacecrafts passingthrough <strong>the</strong>m needs to be protected. We can in fact identify two different belts:• <strong>the</strong> inner belt extending approximately between 1,000 and 15,000 Km. Itcontains high concentrations of energetic protons with energies exceeding100 MeV and electrons in <strong>the</strong> range of hundreds of kiloelectronvolts• <strong>the</strong> outer belt extending till 50,000 Km.electrons.It contains mainly energeticThe belts altitude strongly depends also from <strong>the</strong> solar activity.Anyway <strong>OUFTI</strong>-1 will have <strong>the</strong> apogee inside <strong>the</strong> inner belt and <strong>the</strong>re<strong>for</strong>e somecares have to be taken. Trapped particles in <strong>the</strong> radiation bells, as well as solarflare protons and galactic cosmic rays, can cause in fact <strong>the</strong> so-called SingleEvent Phenomena (SEP) within microelectronic devices. There are three differenttypes of SEP: <strong>the</strong> Single-Event Upset, SEU, <strong>the</strong> Single-Event Latchup,LEL, and <strong>the</strong> Single-Event Burnout, SEB. If <strong>the</strong> first case nei<strong>the</strong>r damages <strong>the</strong>part nor interferes with its subsequent operation, <strong>the</strong> second one causes <strong>the</strong> partto hang up and to no longer operate until <strong>the</strong> power to <strong>the</strong> device is turned offand than back on. The most critical situation is <strong>the</strong> Single-Event Burnout: inthis case in fact <strong>the</strong> devices fails permanently.In order to prevent <strong>the</strong>se events, we need to blind somehow <strong>the</strong> sensible partsbut to do that we need to know <strong>the</strong> total radiation dose, which represent <strong>the</strong>sum of <strong>the</strong> protons, electrons and bremsstrahlung dose produced by <strong>the</strong> interactionof electrons with <strong>the</strong> shielding material.The estimation of <strong>the</strong> total dose has been done with <strong>the</strong> software SPENVIS,SPace ENVironment In<strong>for</strong>mation System, a software developed by <strong>the</strong> BelgianInstitute <strong>for</strong> Space Astronomy and funded by <strong>the</strong> European Space Agency.In figure 5.28 <strong>the</strong> radiation dose as a function of equivalent aluminium shieldingthickness is represented. The unit <strong>for</strong> <strong>the</strong> radiation dose is <strong>the</strong> rad which is<strong>the</strong> amount that deposits 100 ergs (6.25 · 10 7 MeV ) per gram of target material.These values have been calculated <strong>for</strong> <strong>the</strong> total mission duration with <strong>the</strong> hypo<strong>the</strong>sisof solar maximum: <strong>the</strong>y are <strong>the</strong>re<strong>for</strong>e higher that <strong>the</strong> real values. Theanalysis has been done <strong>for</strong> a finite slab with silicon as target material.As expected, <strong>the</strong> radiation dose of protons and electrons is especially intensebut, already with 2 mm of shielding aluminium, it can be greatly reduced.Once <strong>the</strong> value of total radiation dose that can be tolerated by <strong>the</strong> electronicsdevices on board and <strong>the</strong> frequency of Single Event Phenomena (SEP) will beGalli Stefania 54 University of Liège

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