Practice of Kinetics (Comprehensive Chemical Kinetics, Volume 1)

438 INDEXmethyl radicals, chain termination by inCH3CHO decomposition, 3—, determination by mass spectroscopy, 294,299, 300, 302—, determination by reaction with Cl 2 and I 2 ,316—, dimerisation of, determination of rate coefficient,48-51, 63, 100—, from Me 3 CO decomposition, 4, 88—, hot, reaction of, 283—, reaction + CH 3 CHO, 3, 76—, reaction + (CH 3 ) 2 CO, 51—, reaction + (CH 3 ) 2 0, 76—, reaction + (CH 3 ) 2 N 2 , 63—, reaction + halogens and H halides, 74, 88—, reaction + NO, 72—, reaction + SF fl , 16—, removal of metallic mirrors by, 314, 315—, scattering from K and CH 3 I crossed molecularbeams, 175methyl salicylate, isomerisation and fluorescencequenching, 155methylene, detection by mass spectroscopy,295—, from flash photolysis CH 2 N 2 , 294—, from photolysis of C^H^ 63—, insertion reactions of, 77—, metal mirror removal by, 315—, reaction + butene-2, 323, 324—, reaction + CH a CO, 305—, reaction + N 2 in matrix, 335methylene imine, from matrix photolysis ofCH 2 N a , 335mica, Ag single crystal film on, 184—, clean surface by cleavage, 184mica float, for Langmuir trough, 266mica slide, for surface pressure-area measurements,264microbalances, for determination of adsorbedweight, 198, 199, 246—, for determination of weight loss, 247microreactor, for catalysis, 234microscopic reversibility, 15microscopy, for study of solid state reactions,255, 256microwave absorption, for measuring conductivity,213—, to determine electrons in flames, 329, 330microwave discharge, and ESR studies, 91microwave discharge lamps, 52, 53:microwave T-jump, 135mirrors, metallic, see metal mirrors—, use to find tangents to curves, 356mixing, in catalytic reactions in liquids, 251—» of gases, and mass transport to catalyst, 224—, —, in flow system, 26—, —, in static system, 20, 22—, of reactants, and fast reactions, 113, 116,162-164mobility of radicals in glasses, ESR study, 311molar volumes, and dilatometry, 23molecular beams, 117, 172-176, 288molecular beam sampling, for mass spectroscopy,299, 302-304molecular sieve catalysts, preparation of, 221molecular sieve columns, in gas chromatography,79, 80, 237molybdenum, chemisorption on, 190—-, cleaning surface of, 182—, oxidation of, 246—:, preparation of films of, 183—, removal of C from, 181molybdenum oxide, determination of H atomsby, 315monochromatic radiation, and fluorescencequenching, 152—, production of, 55-59—, use in flash photolysis, 120—, use in photoemission, 202—, use in shock tube studies, 128monoenergetic high energy radiation, productionof, 65Nnaphthalene, exchange with Ci 0 H 8 -, 150, 151NBr, NCI and NCN radicals, trapped, 335neon, as carrier gas in gas chromatography,237—, collision cross-section for electrons, 330—, efficiency in energy transfer, 17—, in Hg lamps, 39—, in resonance lamps, 52—, reaction +Hg*, 39Nernst equation, 159neutralisation, rate coefficient of, 112Newton diagram, for data from molecularbeam studies, 174NF radical, trapped, 335NF a radical, study by ESR, 313NH and NH 2 radicals, determination in flames,287, 290—, trapped, 334nickel, adsorption of H 2 on, conductivity andcontamination, 211—, —, molecular beam study, 175•- —, adsorption of O a and CO on, IR and electrondiffraction studies, 216—, chemisorption on, 190—, cleaning surface of, 181, 182, 185