Test systems for all interfaces - Comprion

uT ³ Platform
universal Conformance Platform for Terminal Testing

uT³ – “All-inclusive” conformance tester
uT³ Platform – Main use cases
■ Terminal conformance testing of the
SWP/HCI interface (GCF, PTCRB)
■ Conformance testing of the NFC
interface (EMVCo, NFC Forum)
■ Development/Testing of UICC
interfaces of NFC enabled phones
■ Development/Testing of CLFs
■ ISO 7816 and IC-USB interface
testing
Prior to launch, handsets must prove that their
interfaces meet the requirements defined in
several core specifications. If they are enabled
for Near Field Communication (NFC) this must
be done towards the contactless environment
as well as for the contact-based communica-
tion towards the secure element. In particular,
the interface of the element containing e.g. the
payment data should be tested extensively.
There are several conformance tests demanded
by GCF which require contactless and contact-
based test devices running simultaneously.
Test setup
COMPRION’s hardware and software engi-
neers, experts in designing test solutions with
very high integration and automation levels,
developed a one-of-a-kind conformance test
platform for performing the following tasks
using a single box:
■ handling contact-based and contactless
technologies simultaneously
■ testing of all interfaces up to conformance
level
■ verifying analogue characteristics with in-
tegrated digital oscilloscope and amplifier
For ISO 7816, SWP/HCI and IC-USB interface testing, the device under
test (DUT) is connected via the UT³ Analog Probe to the UT³ Platform.
For NFC testing (e.g. simulating a contactless reader) the antenna is
used to generate the respective NFC field. As you can see, neither a
separate digital oscilloscope nor an RF amplifier is needed as both
components are already contained within the platform.
Thus with UT³ Platform you need just one test system to verify the
conformance on all interfaces of an NFC enabled handset, no matter if
the ETSI SWP/HCI or the NFC Forum tests have to be executed.

The Benefi ts
Test Plan Manger
This user interface facilitates the test
management significantly:
■ Management of multiple devices
under test with different configurations
■ Automated test plan generation
according to DUT features to guarantee
a complete arrangement of
all mandatory test cases
■ Summary reports and result
statistics
■ Comprehensive test results with
recorded communication details
Get the GCF and PTCrB approval with a validated conformance test platform
UT³ Platform is listed as a conformance platform
at GCF (TP 118) and PTCRB. It works as
a simulator for all relevant interfaces and offers
predefined test benches containing the
required conformance test cases:
Simulation NFC,
SWP/HCI, IC-uSB,
ISO/IEC 7816
Test Benches
(NFC, SWP,
HCI)
Analog
Scope
uT ³
COMPrION
MoVie
NFC
Monitoring
universal
Telecom
Translator
■ ETSI TS 102 694
■ ETSI TS 102 695
■ NFC Forum Test Cases for Digital Protocol
■ NFC Forum Test Cases for Tag Operation
■ NFC Forum Test Cases for LLCP*
■ NFC Forum Test Cases for SNEP*
■ NFC Forum Test Cases for NFC RF
Analogue*
* 2nd wave of certification, not yet released by NFC Forum
Extensible software
You can customize the setup
of your UT³ Platform according
to the changing nature of your
testing needs. UT³ Platform’s
software is extensible with the
modules shown in the adjoining
illustration.

Log fi les for communication during test execution
All communication on each of the monitored interfaces
is recorded during the execution of test cases.
Contactless and contact-based communication
is displayed synchronised in a single GUI.
Test scripts allowing creation of own test scenarios
Besides using the predefined NFC, SWP/HCI,
IC-USB and COMPRION test cases, the user can
also set up self-defined scripts, e.g. to induce
protocol errors, making UT³ Platform also a companion
for development testing.
result overview
To ease debugging, the test report is segmented
into three different detail steps:
■ General test result overview
■ Test results of the separate conformance
requirements
■ Display of separate commands in accordance
with conformance requirements
Quick measurement with Analog Scope
The Analog Scope is an integrated digital storage
oscilloscope designed to visualise analogue
and digital measurement data on the
physical layer. Since the oscilloscope functionality
is integrated into UT³ Platform, no additional
cabling is needed.
Thus the measured signal stays unbiased from
any electromagnetic interference.
A multilevel, complex trigger logic enables you
to analyse and resolve errors. Quick measurement
functions using a single mouse click
provide you with information of the waveform
characteristics such as the modulation index
and the frequency spectrum.

Technical Specifications
CAPABILITIES
NFC simulation/testing
■ Support of all NFC modes: Card Emulation,
Reader/Writer, Peer-to-Peer
■ Simulation of polling and listening mode for NFC-A,
NFC-B, NFC-F
■ Simulation of PICCs and PCDs as per ISO/IEC 14443,
types A and B
■ Support for higher bit rates (up to fc/16; 848kbit/s)
■ Hardware supporting Waiting Time Extension
(WTX) Request
■ Configurable protocol/timing parameters
■ Hardware supports RF Analogue testing
SWP and HCI simulation/testing
■ According to ETSI TS 102 613 (SWP),
and ETSI TS 102 622 (HCI)
■ Adjustable logical SWP/HCI protocol parameters
■ Error simulation
■ S1/S2-signal at C6 contact:
- Adjustable current value for S2
- Measurement of voltage (S1) and current (S2)
■ Advanced SWP test features
- Extended bit duration
- Support for selective reject s-frame (SREJ)
- HW analogue SWP testing
Monitoring and analysis
■ NFC Forum digital protocol and activity, LLCP
■ NFC Forum application protocol: NDEF, RTD
■ All NFC Forum tag types
■ ISO/IEC 14443 (A/B)
■ ISO/IEC 18092
■ Proprietary contactless protocols B', MIFARE and
FeliCa
■ Display and analysis of protocol specific information
in synchronised views:
Physical, Protocol, Application, Logical Link,
Summary and Info view
■ Search and filter within the different views
■ Generation of comprehensive reports
■ Various on-the-fly protocol checks
■ Decoding of carrier and subcarrier
■ Timing measurements of Frame Delay/Waiting Time
Monitoring of bit rates from 106 kbit/s up to
848 kbit/s
TEST SuITES
SWP/HCI test benches
■ SWP test cases according to ETSI TS 102 694-1
■ HCI test cases according to ETSI TS 102 695-1
and ETSI TS 102 695-3
NFC test cases according to NFC Forum
■ NFC Forum Digital Protocol tests
■ NFC Forum Tag Type 1-4 tests
■ NFC Forum LLCP Test Bench *
■ NFC Forum SNEP Test Bench *
■ NFC Forum RF Analogue *
FurTHEr OPTIONS
Analog Scope
■ Integrated digital storage oscilloscopes with configu-
rable sample rate of up to 100 M samples/s in contact
based operation, and up to 4fc in contactless
operation mode
■ Detailed timing and value measurements
■ Analogue voltage measurements on contacts VCC,
RST, CLK, I/O and SWP
■ Analogue current measurements on contacts VCC
and SWP
■ 2-stage cascading trigger definition
■ Retriggering: multiple recording of samples initiated
by defined trigger condition
■ Configurable sample rate: Resolution per sample:
up to 14 bit
■ Record length up to 32 M sample points in contact-
less and 256 G sample points in contact based
operation mode
Analog Scope Viewer
■ Visualisation of the analogue signals (e.g. modulated
carrier amplitude, envelope signal)
■ Display of up to 8 digital channels in contactless
and up to 16 digital/2 analogue channels in contact
based operation mode
■ Signal/frequency analysis
■ Quick measurements
- Modulation index
- Waveform characteristics
- Frequency spectrum
- Fall/rise times
- Peak-to-peak
- Top/bottom
- Duty cycles
- Overshot, Undershot
- Low Level, Mid Level, High Level
COMPrION MoVie
■ Viewing software for sharing log files traced with
COMPRION monitoring products without need of
connected hardware
NFC DC Measurement
■ Two measurement channels
- sample rate 100 MHz
- resolution 14 bit
- Input impedance: BNC 1MΩ/15pF; MCX 10 MΩ/10pF
- Input measurement range: ±2.50V up to ±25V
■ External Trigger input
■ Trigger out
■ LEDs to indicate active channel, selected input range,
hardware status
GENErAL FEATurES
■ Supported Smart Card voltage: 1.2 V/1.8 V/3 V/5 V
■ Supported ISO/IEC 7816 protocols: T=0, T=1
■ Supported IC-USB modes: ICCD, Ethernet Emulation
Module, Mass Storage
■ NFC: Feedback dialogue for optimal antenna
positioning
■ Time measurement performance:
- Resolution (contactless): up to (8f ) c -1
- Resolution (contact based): 10 ns
■ Measurement units: etu, second, CLK cycles
■ Time-synchronisation interfaces
- High speed COMPRION SyncBus
- Trigger out: connection between Analog Scope and
external oscilloscope (1 V signal level at 50 Ω)
■ COMPRION Monitoring Remote Control: start/stop
monitoring remotely
■ PCD output
- P 1W into 50 Ω impedance
max
- Frequency range 13.56 MHz ± 3.75 MHz
- Frequency resolution < 24 mHz
■ COMPRION Remote Simulation Server
DIMENSIONS
■ W x D x H: 450 x 375 x 175 mm
■ Weight: 14 kg
SCOPE OF DELIVEry
■ UT³ Platform
■ UT³ Analog probe
■ Analog Flex Probes types A-D (terminal connectors)
■ Antenna – T – Type 01
■ Keyboard/mouse
■ Mounting Material for 19” Rack
■ Powercords (EU,US)
*planned (2nd wave of NFC Forum certification)
CE/FCC approval class A: This is a class A product. In a domestic environment
this product may cause radio interference in which case the user may be required
to take adequate measures.

COMPrION – Test systems
for all interfaces
Terminal Testing ISO/IEC 7816 SWP/HCI IC-USB NFC SWP/NFC Sync.
IT³ Prove! - - - - - - - -
CONFORMANCE
IT³ Platform - - - - - - - -
CONFORMANCE
IT³ EMV - - - - - - - -
Prove 2 - -
UT³ Platform
PLATFORM
PLATFORM
CONFORMANCE
PLATFORM
CLT One B - - - - - -
Card Testing ISO/IEC 7816 SWP/HCI IC-USB NFC SWP/NFC Sync.
ICC Spectro - - - -
Spectro 2 - -
Monitoring (Spy Tools) ISO/IEC 7816 SWP/HCI IC-USB NFC SWP/NFC Sync.
MiniMove - - - -
Move 2 - -
CLT Move - - - - - -
Combined Handset Testing Hardware Technologies
COMPRION SIMfony
COMPrION GmbH
Technologiepark 25
33100 Paderborn
Germany
Phone: +49 (0) 5251 / 699 86 0
Fax: +49 (0) 5251 / 699 86 99
E-mail: info@comprion.com
www.comprion.com
© COMPRION GmbH
Printed in Germany, January 2012
IT³ Prove! or IT³ Platform
+ Network Simulator
Technical data current for 01/2012. We reserve the right to alter technical specifications without prior notice.
Available for LTE, CDMA2000
and GSM/W-CDMA