ATmega32A Datasheet - Sunrom Technologies

ATmega32ATable 24-4.SignalNameBoundary-scan Signals for the Analog ComparatorDirection as Seen fromthe Comparator24.5.6 Scanning the ADCFigure 24-10 shows a block diagram of the ADC with all relevant control and observe signals. The Boundary-scan cell fromFigure 24-9 is attached to each of these signals. The ADC need not be used for pure connectivity testing, since all analoginputs are shared with a digital port pin as well.Figure 24-10. Analog to Digital ConverterDescriptionAC_IDLE Input Turns off Analogcomparator when trueACO Output Analog ComparatorOutputACME Input Uses output signal fromADC mux when trueACBG Input Bandgap ReferenceenableRecommended Inputwhen Not in UseWill become input to µCcode being executedOutput Values whenRecommended Inputs are Used1 Depends upon µC code beingexecuted00 Depends upon µC code beingexecuted0 Depends upon µC code beingexecutedVCCRENAREFIREFENTo Comparator2.56VrefMUXEN_7ADC_7MUXEN_6ADC_6MUXEN_5ADC_5MUXEN_4ADC_4SCTESTADCBGENPASSENEXTCHMUXEN_3ADC_3MUXEN_2ADC_2MUXEN_1ADC_1MUXEN_0ADC_0G10+G20+1.22VrefACTENPRECHDAC_9..0ADCENPRECHAREFAREF10-bit DAC +-DACOUTCOMPCOMPNEGSEL_2ADC_210x-20x-HOLDNEGSEL_1NEGSEL_0ADC_1ADC_0STACLKAMPENGNDENThe signals are described briefly in Table 24-5.8155C–AVR–02/11243