MPU-6000 and MPU-6050 Product Specification Revision 1.0

MPU-6000/MPU-6050 Product SpecificationDocument Number: PS-MPU-6000A-00Revision: 1.0Release Date: 11/24/201013 Reliability13.1 Qualification Test PolicyInvenSense’s products complete a Qualification Test Plan before being released to production. TheQualification Test Plan for the MPU-60X0 followed the JEDEC 47G.01 Standards, “Stress-Test-DrivenQualification of Integrated Circuits,” with the individual tests described below.13.2 Qualification Test PlanAccelerated Life TestsTEST Method/Condition LotQuantityHigh TemperatureOperating Life(HTOL/LFR)Highly Accelerated StressTest (1) (HAST)High TemperatureStorage Life (HTS)JEDEC JESD22-A108C, Dynamic,3.63V biased, Tj>125°C[read-points 168, 500, 1000 hours]JEDEC JESD22-A118Condition A, 130°C, 85%RH, 33.3 psia.,unbiased, [read-point 96 hours]JEDEC JESD22-A103C, Cond. A, 125°C,Non-Biased Bake[read-points 168, 500, 1000 hours]Device Component Level TestsTEST Method/Condition LotQuantitySample/ LotAcc /RejectCriteria3 77 (0/1)3 77 (0/1)3 77 (0/1)Sample/ LotAcc /RejectCriteriaESD-HBM JEDEC JESD22-A114F, (1.5KV) 1 3 (0/1)ESD-MM JEDEC JESD22-A115-A, (200V) 1 3 (0/1)Latch Up JEDEC JESD78B Level 2, 125C, +/- 60mA 1 6 (0/1)Mechanical ShockJEDEC JESD22-B104C,Mil-Std-883H, method 2002.5,Cond. E, 10,000g’s, 0.2ms,±X, Y, Z – 6 directions, 5 times/directionVibrationJEDEC JESD22-B103B, Variable Frequency(random), Cond. B, 5-500Hz,X, Y, Z – 4 times/directionTemperature Cycling (TC) (1) JEDEC JESD22-A104D Condition N,[-40°C to +85°C], Soak Mode 2 [5’], 100 cycles3 5 (0/1)3 5 (0/1)3 77 (0/1)Board Level TestsTEST Method/Condition LotQuantityBoard Mechanical Shock JEDEC JESD22-B104C,Mil-Std-883H, method 2002.5,Cond. E, 10000g’s, 0.2ms,+-X, Y, Z – 6 directions, 5 times/directionBoardJEDEC JESD22-A104D Condition N,Temperature Cycling (TC) (1) [ -40°C to +85°C], Soak Mode 2 [5’], 100 cyclesSample/ LotAcc /RejectCriteria1 5 (0/1)1 40 (0/1)CONFIDENTIAL & PROPRIETARY 51 of 53