1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing 1. Introduction - Laboratory for Reliable Computing
from larc.ee.nthu.edu.tw
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11.07.2015
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Test Cost9080706050403020100Test costPackage costSilicon cost0.5um0.35um0.25um0.18umm01intro7.02 Cheng-Wen Wu, NTHU 8
DFT Usage Trend% T e s t C o v e r e d b y B I S T100806040200DFT for SOC/MPU2003 2004 2005 2006 2007 2008 2009 2012 2015 2018m01intro7.02 Cheng-Wen Wu, NTHU 9
- Page 2 and 3: • IntroductionOutline• RAM func
- Page 4 and 5: • Scope of testingOutline• Defe
- Page 6 and 7: • Economics!− Product quality
- Page 10 and 11: Scope of Testing• Engineering Tes
- Page 12 and 13: Fault Model and Error• Fault mode
- Page 14 and 15: Testing and Fault Coverage• Testi
- Page 16 and 17: Defect Level and Fault CoverageRequ
- Page 18 and 19: Logic Fault Modeling: Stuck-at Faul
- Page 20 and 21: Fault Diagnosis• Fault detection:
- Page 22 and 23: Design for Testability (DFT)• A f
- Page 24 and 25: MUX ScanxCombinationalLogicCTSIM D
- Page 26 and 27: Scan-Based PS-BIST with Test Points
- Page 28 and 29: Embedded Memory Testing• Embedded
- Page 30: Off-Line Testing of RAM• Parametr
DFT Usage Trend% T e s t C o v e r e d b y B I S T100806040200DFT <strong>for</strong> SOC/MPU2003 2004 2005 2006 2007 2008 2009 2012 2015 2018m01intro7.02 Cheng-Wen Wu, NTHU 9
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