1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing
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Embedded Memory Testing• Embedded memory testing is increasingly difficult− High bandwidth (speed and I/O data width)− Heterogeneity and plurality− Isolation (accessibility)− AC test, diagnostics, and repair• Test automation is required− Failure analysis, fault simulation, ATG, anddiagnostics− BIST/BIRA/BISR generationm01intro7.02 Cheng-Wen Wu, NTHU 28