1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing 1. Introduction - Laboratory for Reliable Computing
Scan-Based PS-BIST with Test PointsLFSR PIPSMUXto cps CombinationalLogic SCfrom ops POMISRSource: K.-T. Tim Cheng, UCSBm01intro7.02 Cheng-Wen Wu, NTHU 26
Why Investigating Memory Testing?• Memory testing is a more and more important issue− RAMs are key components for electronic systems∗ In Alpha 21264, cache RAMs represent 2/3 transistors and 1/3 area;in StrongArm SA110, the embedded RAMs occupy 90% area [Bhavsar,ITC-99]∗ Memory cores will represent more than 90% of SOC area by 2010[ITRS 2001]− Memories represent about 30% of the semiconductor market− Embedded memories are dominating the chip yield• Memory testing is more and more difficult− Growing density, capacity, and speed− Emerging new architectures and technologies− Embedded memories: access, diagnostics & repair, heterogeneity,custom design, power & noise, scheduling, compression, etc.• Cost drives the need for more efficient test methodologies− IFA, fault modeling and simulation, test algorithm development andevaluation, diagnostics, DFT, BIST, BIRA, BISR, etc.m01intro7.02 Cheng-Wen Wu, NTHU 27
- Page 2 and 3: • IntroductionOutline• RAM func
- Page 4 and 5: • Scope of testingOutline• Defe
- Page 6 and 7: • Economics!− Product quality
- Page 8 and 9: Test Cost9080706050403020100Test co
- Page 10 and 11: Scope of Testing• Engineering Tes
- Page 12 and 13: Fault Model and Error• Fault mode
- Page 14 and 15: Testing and Fault Coverage• Testi
- Page 16 and 17: Defect Level and Fault CoverageRequ
- Page 18 and 19: Logic Fault Modeling: Stuck-at Faul
- Page 20 and 21: Fault Diagnosis• Fault detection:
- Page 22 and 23: Design for Testability (DFT)• A f
- Page 24 and 25: MUX ScanxCombinationalLogicCTSIM D
- Page 28 and 29: Embedded Memory Testing• Embedded
- Page 30: Off-Line Testing of RAM• Parametr
Scan-Based PS-BIST with Test PointsLFSR PIPSMUXto cps CombinationalLogic SCfrom ops POMISRSource: K.-T. Tim Cheng, UCSBm01intro7.02 Cheng-Wen Wu, NTHU 26