1. Introduction - Laboratory for Reliable Computing

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Fault Diagnosis• Fault detection: tells only whether a circuitis fault-free or not• Fault identification (location; isolation):provides the location and the type of thedetected fault and other related in<strong>for</strong>mation• Fault diagnosis: includes both faultdetection and fault identificationm01intro7.02 Cheng-Wen Wu, NTHU 20
Testing• Testing is a process which includes testpattern generation, test pattern application,and output evaluation− The quality of a test set depends on its faultcoverage (FC) as well as its size− FC (typically 98-99% single stuck faults <strong>for</strong>logic circuit) can be determined by faultsimulationm01intro7.02 Cheng-Wen Wu, NTHU 21
Page 2 and 3: • IntroductionOutline• RAM func
Page 4 and 5: • Scope of testingOutline• Defe
Page 6 and 7: • Economics!− Product quality
Page 8 and 9: Test Cost9080706050403020100Test co
Page 10 and 11: Scope of Testing• Engineering Tes
Page 12 and 13: Fault Model and Error• Fault mode
Page 14 and 15: Testing and Fault Coverage• Testi
Page 16 and 17: Defect Level and Fault CoverageRequ
Page 18 and 19: Logic Fault Modeling: Stuck-at Faul
Page 22 and 23: Design for Testability (DFT)• A f
Page 24 and 25: MUX ScanxCombinationalLogicCTSIM D
Page 26 and 27: Scan-Based PS-BIST with Test Points
Page 28 and 29: Embedded Memory Testing• Embedded
Page 30: Off-Line Testing of RAM• Parametr

1. Introduction - Laboratory for Reliable Computing

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