1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing 1. Introduction - Laboratory for Reliable Computing
Logic Fault Modeling: Stuck-at Faultabc c stuck-at 0; c s-a-0; c s/0, or c/0a b c c(a/0) c(a/1) c(b/0) c(b/1) c(c/0) c(c/1)0 00 11 01 1000100000101• Single (line) stuck-at fault: line has a constant value (0/1)• Multiple stuck fault: several single stuck-at faults occur atthe same time− For a circuit with k lines, there are 2k single stuck faults, and 3 k -1multiple stuck faults0000001100001111m01intro7.02 Cheng-Wen Wu, NTHU 18
Test• A test for a fault f in circuit C is an inputcombination for which the output(s) of C isdifferent when f is present than when it isnot− A.k.a. test pattern, test vector, or experiment− A test x detects fault f iff C(x)⊕C f(x)=1• A test set for a class of faults F is a set oftests T such that for any fault f∈F, thereexists t∈T such that t detects fm01intro7.02 Cheng-Wen Wu, NTHU 19
- Page 2 and 3: • IntroductionOutline• RAM func
- Page 4 and 5: • Scope of testingOutline• Defe
- Page 6 and 7: • Economics!− Product quality
- Page 8 and 9: Test Cost9080706050403020100Test co
- Page 10 and 11: Scope of Testing• Engineering Tes
- Page 12 and 13: Fault Model and Error• Fault mode
- Page 14 and 15: Testing and Fault Coverage• Testi
- Page 16 and 17: Defect Level and Fault CoverageRequ
- Page 20 and 21: Fault Diagnosis• Fault detection:
- Page 22 and 23: Design for Testability (DFT)• A f
- Page 24 and 25: MUX ScanxCombinationalLogicCTSIM D
- Page 26 and 27: Scan-Based PS-BIST with Test Points
- Page 28 and 29: Embedded Memory Testing• Embedded
- Page 30: Off-Line Testing of RAM• Parametr
Logic Fault Modeling: Stuck-at Faultabc c stuck-at 0; c s-a-0; c s/0, or c/0a b c c(a/0) c(a/1) c(b/0) c(b/1) c(c/0) c(c/1)0 00 11 01 1000100000101• Single (line) stuck-at fault: line has a constant value (0/1)• Multiple stuck fault: several single stuck-at faults occur atthe same time− For a circuit with k lines, there are 2k single stuck faults, and 3 k -1multiple stuck faults0000001100001111m01intro7.02 Cheng-Wen Wu, NTHU 18
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