1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing
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The Testing Problem• Given a set of faults in the circuit under test(CUT), how do we obtain a certain (small)number of test patterns which guarantees acertain (high) fault coverage?− What faults to test? (fault modeling)− How are test patterns obtained? (test patterngeneration)− How is test quality (fault coverage) measured?(fault simulation)− How are test vectors applied and results evaluated?(ATE/BIST)m01intro7.02 Cheng-Wen Wu, NTHU 17
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