1. Introduction - Laboratory for Reliable Computing
1. Introduction - Laboratory for Reliable Computing 1. Introduction - Laboratory for Reliable Computing
Testing and Fault Coverage• Testing is the process of determining whether adevice functions correctly or not− How much testing of an IC is enough?• Yield (Y) is the ratio of the number of good diesper wafer to the number of dies per wafer• Fault coverage (FC) is the measure of the abilityof a test set T to detect a given set of faults thatmay occur on the DUT− FC = (#detected faults)/(#possible faults)m01intro7.02 Cheng-Wen Wu, NTHU 14
Defect Level and Fault Coverage• Defect level (DL) is the fraction of bad partsamong the parts that pass all tests and areshipped− DL = 1 – Y**(1-FC)• FC refers to the real defect coverage (probabilitythat T detects any possible fault---in F or not)• DL is measured in terms of DPM (defects permillion), and typical values claimed are less than200 DPM, or 0.02%m01intro7.02 Cheng-Wen Wu, NTHU 15
- Page 2 and 3: • IntroductionOutline• RAM func
- Page 4 and 5: • Scope of testingOutline• Defe
- Page 6 and 7: • Economics!− Product quality
- Page 8 and 9: Test Cost9080706050403020100Test co
- Page 10 and 11: Scope of Testing• Engineering Tes
- Page 12 and 13: Fault Model and Error• Fault mode
- Page 16 and 17: Defect Level and Fault CoverageRequ
- Page 18 and 19: Logic Fault Modeling: Stuck-at Faul
- Page 20 and 21: Fault Diagnosis• Fault detection:
- Page 22 and 23: Design for Testability (DFT)• A f
- Page 24 and 25: MUX ScanxCombinationalLogicCTSIM D
- Page 26 and 27: Scan-Based PS-BIST with Test Points
- Page 28 and 29: Embedded Memory Testing• Embedded
- Page 30: Off-Line Testing of RAM• Parametr
Testing and Fault Coverage• Testing is the process of determining whether adevice functions correctly or not− How much testing of an IC is enough?• Yield (Y) is the ratio of the number of good diesper wafer to the number of dies per wafer• Fault coverage (FC) is the measure of the abilityof a test set T to detect a given set of faults thatmay occur on the DUT− FC = (#detected faults)/(#possible faults)m01intro7.02 Cheng-Wen Wu, NTHU 14
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