Simulation of Circuit Reliability with RelXpert
Simulation of Circuit Reliability with RelXpert
Simulation of Circuit Reliability with RelXpert
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Example <strong>RelXpert</strong> Application:Overdriven IO Design• Improving the Designfor <strong>Reliability</strong>– Evaluate transistor leveldegradations– Identify transistors incritical path <strong>of</strong> the design– Implement fixes for criticaltransistors.• Fixes Implemented– Internal NMOS cascoded– NMOS length increased• ~2 * LminJitter(ps)DutyCycle(%)Spec18052.5 -47.5Pre-OptimizedBOL5749.3EOL21844.9Post -OptimizedBOL7149.2EOL16047.7Table1 : Results for SSTL buffer aftercorrection for HCI – NBTI degradationSeptember 22, 2005Slide 17
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