Simulation of Circuit Reliability with RelXpert
Simulation of Circuit Reliability with RelXpert Simulation of Circuit Reliability with RelXpert
Circuit Reliability SimulationINPUT SIMULATION OUTPUTSPICE NetlistTISPICE• TransistorDegradation• Lifetime Analyses• Circuit Waveforms:RelXpert SPICE Model= standard SPICE Model+ additional HCI and NBTI modelparametersRelXpertFresh vs. AgedSeptember 22, 2005Slide 14
Outline• MOSFET Reliability Kinetics:– Hot-Carrier Injection (HCI)– Negative Bias Temperature Instability (NBTI)– Gate Oxide Integrity (GOI)• Not included in RelXpert• RelXpert Modeling• RelXpert Simulation Flow• Circuit Example• SummarySeptember 22, 2005Slide 15
- Page 1: Simulation of Circuit Reliabilitywi
- Page 5: • For NMOS and PMOS, charges in t
- Page 9 and 10: RelXpert Model Extraction Steps:1.
- Page 11 and 12: HCI Lifetime Model Parameter Extrac
- Page 13: Outline• MOSFET Reliability Kinet
- Page 17 and 18: Example RelXpert Application:Overdr
- Page 19: Summary• Some circuit designs are
Outline• MOSFET <strong>Reliability</strong> Kinetics:– Hot-Carrier Injection (HCI)– Negative Bias Temperature Instability (NBTI)– Gate Oxide Integrity (GOI)• Not included in <strong>RelXpert</strong>• <strong>RelXpert</strong> Modeling• <strong>RelXpert</strong> <strong>Simulation</strong> Flow• <strong>Circuit</strong> Example• SummarySeptember 22, 2005Slide 15
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