Simulation of Circuit Reliability with RelXpert
Simulation of Circuit Reliability with RelXpert
Simulation of Circuit Reliability with RelXpert
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Outline• MOSFET <strong>Reliability</strong> Kinetics:– Hot-Carrier Injection (HCI)– Negative Bias Temperature Instability (NBTI)– Gate Oxide Integrity (GOI)• Not included in <strong>RelXpert</strong>• <strong>RelXpert</strong> Modeling• <strong>RelXpert</strong> <strong>Simulation</strong> Flow• <strong>Circuit</strong> Example• SummarySeptember 22, 2005Slide 13