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Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film

Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film

Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film

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<strong>of</strong> 1A in the Fig. 3.37 and Fig. 3.42 may be that the thin film is without the Nb coverlayer. About the other curve, the shielding effect is clear compare with the Fig. 3.37,which is that the higher Nb <strong>sputtering</strong> current, the more shielding effect, but thehigher Nb <strong>sputtering</strong> current the lower transition temperature <strong>of</strong> Nb 3 Sn.17.817.6Tc-<strong>Nb3Sn</strong>-10minTc-<strong>Nb3Sn</strong>-5min17.4Tc-<strong>Nb3Sn</strong>[K]17.217.016.816.616.416.20.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9current[A]Fig. 3.44 comparing the Nb 3 Sn Tc with the different annealing timeThe T c <strong>of</strong> Nb 3 Sn, Nb and NbO x <strong>of</strong> the sample annealed for 10 minutes are shownin Fig. 3.43. The T c <strong>of</strong> NbO x and Nb should depend on the property <strong>of</strong> the bulk Nb,which is same with the sample annealed for 5 minutes. The Tc <strong>of</strong> Nb 3 Sn shoulddepend on the parameters <strong>of</strong> the <strong>sputtering</strong> and the annealing. However, the parameter<strong>of</strong> annealing has little effect on the T c as shown in Fig.3.44. Comparing with Fig.3.19,the T c <strong>of</strong> 1A should be lower than that <strong>of</strong> 1.2A. The reason <strong>of</strong> the abnormal result maybe the absentation over layer <strong>of</strong> 1A sample.3.3.3.2 XRD analysisThe XRD analysis method is same with that in Chapter 2. We do the annealingexperiment for 5 minutes and 10 minutes.65

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