Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film
Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film Magnetron sputtering of Superconducting Multilayer Nb3Sn Thin Film
composition is not proper, other kinds of crystal structure can appear after theannealing, and then the superconductor parameters become worse.Fig. 3.13 the principle of the inductor T c measurementPrimary coilTested sampleSecondary coilFig. 3.14 inductor set up for T c measurementFig. 3.15 the waveform of the measurement signal48
In order to detect the component of the thin film, another method of the inductorT c measurement should be used as shown in Fig.3.13 [31] . We give a sine signal to theprimary coil, and measure the output signal of the secondary coil. In Fig. 3.15,channel 1 is the input signal, channel 2 is the output signal and the channel 3 is thereference signal.Fig. 3.16 the measurement interface before 20KFig. 3.17 the measurement interface after 20KBecause the thin film is conductor, there is a phase different between thesecondary coil and the primary coil. If the thin film is normal conductor, the phase49
- Page 7 and 8: IndexINDEX ........................
- Page 9 and 10: IntroductionThe superconductor acce
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composition is not proper, other kinds <strong>of</strong> crystal structure can appear after theannealing, and then the superconductor parameters become worse.Fig. 3.13 the principle <strong>of</strong> the inductor T c measurementPrimary coilTested sampleSecondary coilFig. 3.14 inductor set up for T c measurementFig. 3.15 the waveform <strong>of</strong> the measurement signal48
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