17/18 January 2007 Wiener Neustadt - Czelo
17/18 January 2007 Wiener Neustadt - Czelo
17/18 January 2007 Wiener Neustadt - Czelo
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MARKET APPLICATIONS:<br />
The large applicability of the new monitoring methods and techniques in the exploitation of the under-pressure<br />
plants from different sectors of the industry, from the energetic field, from chemistry, social area , etc. which are<br />
potential users of the results, make these researches to represent an important aspect of the actual economy<br />
strategy.<br />
TYPE OF COLLABORATION SOUGH<br />
We are searching the project coordonator and potential partners<br />
PARTNER PROFILE:<br />
Fields of research or production:<br />
-fluid mechanics, hidraulics and pneumatics, automation, electronics, information, mecatronics, measuring and<br />
control technology, automotive technology, mechanical engineering, environmental technology and others.<br />
Support provided by our organisation: The Precision Mechanics domain which incorporates techniques and<br />
procedures of measurement, equipment and measuring devices in the non-electric field (inclusive the pressure).<br />
2. Profile: RTD: Rrisk analysis in under-pressure plants which represent danger, the increase<br />
safety through the appl<br />
1-INNOVATIVE ASPECTS: This project aims to focusing on the creation of a precise system of control and<br />
calibration for organized nanosystems, micro sensors and ultra-accurate transducers.<br />
Apart from the theoretical investigation the research topic also includes the systematic elaboration of measuring<br />
methods, of mathematic methods, theoretical error computation, error-correcting software, data acquisition and<br />
processing software, measuring protocols as well as applied research activities.<br />
2-MAIN ADVANTADGES/BENEFITS: The project is relevant not only by the final model it proposes but also by<br />
its theoretical insights, its vast experimental investigations, its mathematical models and their software, which<br />
embed experience and knowledge in various mutually enriching fields likely to guarantee subsequent important<br />
accomplishments.<br />
3- TECHNICAL SPECIFICATIONS: . In order to create an efficient production structure, designing them with a<br />
warrant within some specific parameters is required. At his dimensional scale tolerances cover a narrow range<br />
too. Failing to detect extension beyond the tolerance field may have undesirable effects, ending up in<br />
deteriorating the system in which it is used. The production of these systems without rigorous control is<br />
unconceivable. The transition from the laboratory stage to the industrial production stage implies devising a<br />
metrological infrastructure which would pursue the reaching of the parameters in the production flow step by step.<br />
The project aims to design experiment and demonstrate the performances of a measuring system at a nano<br />
scale, which could substantiate further development and to devise an adequate metrological infrastructure.<br />
The experimental model will include an ultra-accurate, controlled displacement system and will be supplied with<br />
optoelectronic, laser and atom level microscope measurement systems displaying the following technical<br />
features:<br />
• Accuracy of displacemen 0.2 nm<br />
• Laser measurement resolution: 1 nm<br />
• Optoelectronic measurement resolution: 10 nm<br />
The experimental model will include the mechanical, the optical and the optoelectronical subensembles, the<br />
optoelectronical measurement subensembles and the algorithms related to (real time) measurement system data<br />
acquisition, data processing and measurement protocol presentation.<br />
4- CURENT STAGE OF DEVELOPMEN The only concerns in the field of nanoscale measuring have been set<br />
forth by researchers at INCDMF and INOE 2000. Together, they have created a prototype laboratory for a system<br />
of laser-based trace processing and equipment specialised in micropositioning of silicium plates in view of<br />
achieving integrated circuits. Researchers at INCDMF Bucharest have investigated issues related to measuring<br />
and calibrating in the nano domain and the adjoining areas; their findings have been imparted via workshops and<br />
patents within INCDMF Bucharest.<br />
5- INTELECTUAL PROPERTY RIGHTS (IPR):<br />
-Technical studies, mathematical models and specialised softwares belong to the manufacturing units<br />
-The papers published or presented at the scientific sessions together with the experiment results will be<br />
employed for professional training as a database within the centre of excellence founded for subsequent<br />
investigation<br />
-The experimental equipment model will be valorised by being donated to the specialised centre of excellence<br />
within INCDMF, together with the manufacturing documentation to be made available to all potential users<br />
-The patented technical solutions will become the property of the legal body with the highest representation.