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Silicon-based solar cells Characteristics and production processes ...

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<strong>Silicon</strong>-<strong>based</strong> <strong>solar</strong> <strong>cells</strong> – characteristics <strong>and</strong> <strong>production</strong> <strong>processes</strong><br />

A detailed description of the origin of the current in the cell, schematically<br />

presented in Figure7, is contained in Table 5.<br />

Tab. 5. Types of electron currents in a silicon <strong>solar</strong> cell.<br />

No. Current type Symbol Origin<br />

1 Cell photocurrent I ph Sum ( I E + I SCR + I B )<br />

2 Emitter<br />

photocurrent<br />

I E Electrons transferred from valence b<strong>and</strong> to<br />

conduction b<strong>and</strong> in n-type area<br />

3 Space charge<br />

photocurrent<br />

I SCR Electrons transferred from valence b<strong>and</strong> to<br />

conduction b<strong>and</strong> in space charge area<br />

4 Base photocurrent I B Electrons transferred from valence b<strong>and</strong> to<br />

conduction b<strong>and</strong> in p-type area<br />

5 Dark diffusion I 1 Electrons penetrating beyond the potential’s<br />

current<br />

barrier from emitter to base<br />

6 Dark diffusionrecombination<br />

current<br />

I 2 Recombination of electron-hole pairs in space<br />

charge area<br />

Electrons tunneled from emitter’s conduction<br />

b<strong>and</strong> to base’s valence b<strong>and</strong><br />

7 Diffusionrecombination<br />

current of surface<br />

recombination<br />

I r<br />

Electrons from conduction b<strong>and</strong> in emitter’s<br />

area recombining on cell’s front surface<br />

The total density of current J flowing through the p-n junction of surface area A 0<br />

will thus be the sum of the density of the electron current J e <strong>and</strong> the analogous<br />

density of the hole current J h . If the density of all the dark currents, both the electron<br />

<strong>and</strong> the hole ones, is designated as J 0 , then, according to the Shockley equation [17]:<br />

where :<br />

⎡ ⎛ qV ⎞ ⎤<br />

= J<br />

e<br />

+ J<br />

h<br />

= J ⎢exp⎜<br />

⎟ −1⎥<br />

(2)<br />

⎣ ⎝ kT ⎠ ⎦<br />

J<br />

0<br />

qD p qD n<br />

J +<br />

h n e p<br />

0<br />

= (3)<br />

Lh<br />

Le<br />

In this dependence, the lower index (e) refers to the electrons <strong>and</strong> (h) refers to the<br />

holes. Symbols p n <strong>and</strong> n p designate the balance electron concentration in the n+tzpe<br />

material <strong>and</strong> the balance electron concentration in the p-type material, respectively.<br />

L is the diffusion length of the charge carriers, the electrons <strong>and</strong> the holes, connected<br />

with their lifetime τ by the following relation:<br />

L = Dτ<br />

(4)<br />

where: D = μkT/q is the carrier diffusion coefficient of mobility μ.<br />

17

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