PCM-2 Manual.pdf - Voss Associates
PCM-2 Manual.pdf - Voss Associates
PCM-2 Manual.pdf - Voss Associates
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the detector panels (i.e. sharp or protruding clothing, pens, pencils, badges,<br />
jewelry, etc.). If any detector becomes punctured, or otherwise damaged to the<br />
point of failure, it can easily be removed and replaced with a spare detector.<br />
Detector Replacement<br />
Special Considerations<br />
The <strong>PCM</strong>-2 has been designed for quick and easy removal and replacement of its<br />
detectors. Velcro® cinch straps retain the detectors in their respective panels in<br />
the instrument and quick-connect self-sealing fittings attach their gas plumbing<br />
harnesses. Therefore, no tools are required for detector removal and installation.<br />
A spare purged (air evacuated/P-lO gas filled) probe can thereby replace a<br />
damaged detector in minutes, preventing lengthy instrument downtime while a<br />
detector is repaired. An optional set of spare, continuously purging and internally<br />
mounted detectors is available to support such detector replacement requirements,<br />
(Reference Options Section).<br />
<strong>PCM</strong>-2 detectors are quite sensitive to contamination due to outgassing of various<br />
substances which can come in contact with internal surfaces of the probe chamber<br />
and/or those of its gas delivery components. When this happens the subject<br />
detector(s) can experience a notable decrease in efficiency characterized by low<br />
beta background values. This "poisoning" of the detector chamber can be caused<br />
by its exposure IO any organic solvents which are present in substances such as<br />
(but not limited to) adhesives, sealants and lubricants. This is especially true of<br />
RTV (silicone) adhesives. Avoid using these types of substances in areas or on<br />
components which are in direct contact with or carry counting gas to the internal<br />
surfaces of the detector assemblies.<br />
Detector Rebuilding<br />
<strong>PCM</strong>-2 detectors have been designed to be field-repairable. Often during the<br />
course of normal instrument usage, one or more detectors may go out of service<br />
due to mylar face punctures, anode wire breakage and/or other internal electrical<br />
failure(s). In the event of such detector(s) failure, repair becomes necessary.<br />
Eberline has developed specific processes for the repair or complete rebuild and<br />
testing of <strong>PCM</strong>-2 probes which vary depending on the configuration of detector<br />
assembly involved. Identification of the type of detector assembly to be rebuilt is<br />
of primary consideration in the rebuilding effort (Reference the detector<br />
configuration table above in this section).<br />
Document llOOO-A308, <strong>PCM</strong>-2 Revised Detector Assembly Procedure defines the<br />
detailed process steps for the complete assembly manufacture of the revised design<br />
detectors. Document 10429-A525, <strong>PCM</strong>-2 Detector High Voltage and Leak Test<br />
Procedure defines those processes required to properly test the probes when<br />
assembled. This procedure appears in Appendix B and supplements the detector<br />
assembly drawings 11534-D560, 11534-D561 and 11534-D562 for the revised<br />
probes.<br />
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