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PCM-2 Manual.pdf - Voss Associates

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the detector panels (i.e. sharp or protruding clothing, pens, pencils, badges,<br />

jewelry, etc.). If any detector becomes punctured, or otherwise damaged to the<br />

point of failure, it can easily be removed and replaced with a spare detector.<br />

Detector Replacement<br />

Special Considerations<br />

The <strong>PCM</strong>-2 has been designed for quick and easy removal and replacement of its<br />

detectors. Velcro® cinch straps retain the detectors in their respective panels in<br />

the instrument and quick-connect self-sealing fittings attach their gas plumbing<br />

harnesses. Therefore, no tools are required for detector removal and installation.<br />

A spare purged (air evacuated/P-lO gas filled) probe can thereby replace a<br />

damaged detector in minutes, preventing lengthy instrument downtime while a<br />

detector is repaired. An optional set of spare, continuously purging and internally<br />

mounted detectors is available to support such detector replacement requirements,<br />

(Reference Options Section).<br />

<strong>PCM</strong>-2 detectors are quite sensitive to contamination due to outgassing of various<br />

substances which can come in contact with internal surfaces of the probe chamber<br />

and/or those of its gas delivery components. When this happens the subject<br />

detector(s) can experience a notable decrease in efficiency characterized by low<br />

beta background values. This "poisoning" of the detector chamber can be caused<br />

by its exposure IO any organic solvents which are present in substances such as<br />

(but not limited to) adhesives, sealants and lubricants. This is especially true of<br />

RTV (silicone) adhesives. Avoid using these types of substances in areas or on<br />

components which are in direct contact with or carry counting gas to the internal<br />

surfaces of the detector assemblies.<br />

Detector Rebuilding<br />

<strong>PCM</strong>-2 detectors have been designed to be field-repairable. Often during the<br />

course of normal instrument usage, one or more detectors may go out of service<br />

due to mylar face punctures, anode wire breakage and/or other internal electrical<br />

failure(s). In the event of such detector(s) failure, repair becomes necessary.<br />

Eberline has developed specific processes for the repair or complete rebuild and<br />

testing of <strong>PCM</strong>-2 probes which vary depending on the configuration of detector<br />

assembly involved. Identification of the type of detector assembly to be rebuilt is<br />

of primary consideration in the rebuilding effort (Reference the detector<br />

configuration table above in this section).<br />

Document llOOO-A308, <strong>PCM</strong>-2 Revised Detector Assembly Procedure defines the<br />

detailed process steps for the complete assembly manufacture of the revised design<br />

detectors. Document 10429-A525, <strong>PCM</strong>-2 Detector High Voltage and Leak Test<br />

Procedure defines those processes required to properly test the probes when<br />

assembled. This procedure appears in Appendix B and supplements the detector<br />

assembly drawings 11534-D560, 11534-D561 and 11534-D562 for the revised<br />

probes.<br />

16-4

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