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Influence of the Processes Parameters on the Properties of The ...

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Chapter 3.<br />

Analytical Methods and Designs <str<strong>on</strong>g>of</str<strong>on</strong>g> Experiments<br />

also caters <str<strong>on</strong>g>the</str<strong>on</strong>g> light refracti<strong>on</strong> with <str<strong>on</strong>g>the</str<strong>on</strong>g> particle (sec<strong>on</strong>dary scattering) which is very important when particle<br />

diameter is below 50 μm. This is also menti<strong>on</strong>ed in <str<strong>on</strong>g>the</str<strong>on</strong>g> standard for laser diffracti<strong>on</strong> measurements (ISO<br />

133201) [Kippax, 2005]. According to Lorenz-Mie’ <str<strong>on</strong>g>the</str<strong>on</strong>g>ory <str<strong>on</strong>g>the</str<strong>on</strong>g> scattering patterns <str<strong>on</strong>g>of</str<strong>on</strong>g> spheres are symmetric<br />

with axis <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> incident light. Scattering minima and maxima are in different angles, if <str<strong>on</strong>g>the</str<strong>on</strong>g> properties <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g><br />

particles vary. Figure 3.9, shows <str<strong>on</strong>g>the</str<strong>on</strong>g> diffracti<strong>on</strong> patterns <str<strong>on</strong>g>of</str<strong>on</strong>g> two particles with different sizes [Xu, 2000].<br />

With large particle (solid line) <str<strong>on</strong>g>the</str<strong>on</strong>g> peak <str<strong>on</strong>g>of</str<strong>on</strong>g> intensity is str<strong>on</strong>ger than with small particle (dashed line) and <str<strong>on</strong>g>the</str<strong>on</strong>g><br />

minimum intensity is much closer to axis <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> incident light. <strong>The</strong> intensity peaks are in <str<strong>on</strong>g>the</str<strong>on</strong>g> same locati<strong>on</strong>s<br />

in <str<strong>on</strong>g>the</str<strong>on</strong>g> both positive and negative angles because <str<strong>on</strong>g>the</str<strong>on</strong>g> symmetrical nature <str<strong>on</strong>g>of</str<strong>on</strong>g> scattering. Very illustrative way<br />

<str<strong>on</strong>g>of</str<strong>on</strong>g> displaying <str<strong>on</strong>g>the</str<strong>on</strong>g> intensity distributi<strong>on</strong> is also a radial graph as in Figure 3.9. <strong>The</strong> bold trace describes <str<strong>on</strong>g>the</str<strong>on</strong>g><br />

intensity <str<strong>on</strong>g>of</str<strong>on</strong>g> scattered light in different angles [Xu, 2000].<br />

Figure 3.9: Scattering patterns <str<strong>on</strong>g>of</str<strong>on</strong>g> two particles <str<strong>on</strong>g>of</str<strong>on</strong>g> a different size.<br />

[Xu, 2000]<br />

3.2.3 Fraunh<str<strong>on</strong>g>of</str<strong>on</strong>g>er’ <strong>The</strong>ory<br />

Fraunh<str<strong>on</strong>g>of</str<strong>on</strong>g>er’ <str<strong>on</strong>g>the</str<strong>on</strong>g>ory covers <str<strong>on</strong>g>the</str<strong>on</strong>g> light diffracti<strong>on</strong> in <str<strong>on</strong>g>the</str<strong>on</strong>g> aperture which is described in Fresnel-<br />

Kirch<str<strong>on</strong>g>of</str<strong>on</strong>g>f’ diffracti<strong>on</strong> integral [Brittain, 2003]. In Fresnel diffracti<strong>on</strong> (Figure 3.10-A), distances from <str<strong>on</strong>g>the</str<strong>on</strong>g><br />

point source and <str<strong>on</strong>g>the</str<strong>on</strong>g> screen to <str<strong>on</strong>g>the</str<strong>on</strong>g> obstacle forming <str<strong>on</strong>g>the</str<strong>on</strong>g> diffracti<strong>on</strong> pattern are relatively short. In Fraunh<str<strong>on</strong>g>of</str<strong>on</strong>g>er’<br />

diffracti<strong>on</strong> (Figure 3.10-B), <str<strong>on</strong>g>the</str<strong>on</strong>g> distances are much l<strong>on</strong>ger and all lines from <str<strong>on</strong>g>the</str<strong>on</strong>g> source to <str<strong>on</strong>g>the</str<strong>on</strong>g> obstacle and<br />

forward to <str<strong>on</strong>g>the</str<strong>on</strong>g> screen can be c<strong>on</strong>sidered parallel. In Figure 3.10-C, <str<strong>on</strong>g>the</str<strong>on</strong>g> lens forms smaller image <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> same<br />

diffracti<strong>on</strong> pattern which would be formed <strong>on</strong> <str<strong>on</strong>g>the</str<strong>on</strong>g> screen extremely far without <str<strong>on</strong>g>the</str<strong>on</strong>g> lens [Young and<br />

Freedman, 2000].<br />

(A) (B) (C)<br />

Figure 3.10: Principles <str<strong>on</strong>g>of</str<strong>on</strong>g> Fresnel’ diffracti<strong>on</strong> (A) and Fraunh<str<strong>on</strong>g>of</str<strong>on</strong>g>er’ diffracti<strong>on</strong> (B and C).<br />

[Young and Freedman, 2000]<br />

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