Putting SSDs to the Test - A Case Study - Micron
Putting SSDs to the Test - A Case Study - Micron
Putting SSDs to the Test - A Case Study - Micron
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P5Q Serial PCM Innovates System Designs for Smart Grid Products<br />
Requirement Existing Solution P5Q P5Q Benefit<br />
Cost Effectiveness<br />
System Complexity<br />
Bit Alterable<br />
Write Cycling<br />
Write Speed<br />
(for 256 bytes)<br />
Three components:<br />
• Serial NOR<br />
• EEPROM<br />
• NVRAM<br />
Backup Power:<br />
• Large capaci<strong>to</strong>r<br />
3 SPI required;<br />
10 MHz MAX CLK support<br />
NOR – No (erase first)<br />
EEPROM – Yes<br />
NVRAM – Yes<br />
NOR: 100K<br />
EEPROM: 1 million<br />
NVRAM: >1 million<br />
NOR: 0.5-1s (write +<br />
erase required)<br />
EEPROM: 1–5ms<br />
NVRAM: ~0.1ms<br />
Table 1: Comparison of Existing Solution vs. New PCM Solution<br />
Information<br />
Inside<br />
Requirement<br />
Memory<br />
ICs<br />
MCU/CPU<br />
Single component:<br />
128Mb P5Q<br />
Backup Power:<br />
Small capaci<strong>to</strong>r<br />
1 SPI interface required;<br />
66 MHz MAX<br />
SPI<br />
Interface<br />
P5Q Serial<br />
PCM<br />
Power Consumption<br />
Curve Monthly Event Log<br />
Calibration Paramenter<br />
Memory System<br />
Cost-effective<br />
solution with BOM<br />
consolidation<br />
Simplified system design<br />
Yes Easier data manipulation<br />
1 million High endurance<br />
0.2ms<br />
Cost-Effective, High-Density Solution<br />
Bit Alterable<br />
Write Endurance<br />
Write Speed<br />
Figure 3: Smart Grid Memory System with PCM<br />
High write performance,<br />
smaller capaci<strong>to</strong>r
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