Yelo Product Catalogue 2015

YELO Product Overview PRODUCTS AND SERVICES
PRODUCT
OVERVIEW
Y1000L Y2000H CHARACTERIZATION SYSTEM
Key Benefit Productivity Productivity Accuracy
Ideal for Testing
Low power laser devices with currents up
to 1A
High power laser devices with currents up
to 400A
Design Rack Rack Bench-top or rack
Low power and high power laser devices
Capacity Up to 2,048 devices Up to 200 devices Test 1 device at a time
Types of Test/Measurement Life Test and Burn-in Life-test and Burn-in Spectrum measurement
LIV and VI measurement LIV and VI measurement LIV and VI measurement
Supported Device Types Laser diodes C and CS mounts TO-CAN
Laser bars/Laser array Photodiodes COS
Photodiodes Avalanche Photodiodes CS mount
Avalanche Photodiodes Chip on carrier (CoC) MCCP
VCSEL arrays Conduction cooled packages (CCP) CCP
VCSEL bars
TO-CAN
Photonic integrated devices
Silicon photonic devices
Semiconductor Optical Amplifiers (SOA)
Butterfly
Transmitter optical sub assembly (TOSA)
Dual in-line/Mini Dual in-line
(DiL/MiniDiL)
Chip on carrier
Bare and custom packages
Burn in for 100G and 400G networks,
QFSP and SFP+
Micro channel cooled packages (MCCP)
Single or multi laser bar array
Butterfly
Custom packages
Nearfield and Farfield measurements
Temperature Control Air cooled heater plate and air cooled Water cooled base place with peltier option Air or water cooled
Uninterruptible Power Supply (UPS) Optional Optional Optional
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