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Wet STEM: A newdevelopment in environmental SEM for imaging ...

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292<br />

cyl<strong>in</strong>drical <strong>SEM</strong> mount, and positioned on the<br />

Peltier stage. A droplet of liquid conta<strong>in</strong><strong>in</strong>g<br />

particles or float<strong>in</strong>g objects (organic, <strong>in</strong>organic,<br />

liquid or solid) is droped on the grid with an<br />

eppendorf s micropipette. In these conditions, the<br />

<strong>in</strong>cident electron beam passes through the droplet,<br />

i.e. the liquid layer and a given amount of float<strong>in</strong>g<br />

particles. The signal is then collected by a detector,<br />

usually used <strong>for</strong> the collection of backscattered<br />

electrons (BSE), but <strong>in</strong> our case located belowthe<br />

sample. We used holey carbon coated TEM<br />

copper grids, with the carbon layer down <strong>in</strong> order<br />

to use copper squares as retention bas<strong>in</strong>s. In the<br />

carbon layer, holes of typical diameter rang<strong>in</strong>g<br />

from less than 1 to 20 mm allowma<strong>in</strong>ta<strong>in</strong><strong>in</strong>g<br />

overhang<strong>in</strong>g liquid films on very small areas. It is<br />

important to note that adequate <strong>in</strong>itial droplet<br />

parameters—i.e. volume and solid content—enable<br />

to control the amount of particles on the grid.<br />

It is possible, <strong>for</strong> <strong>in</strong>stance <strong>in</strong> the case of a latex<br />

emulsion sample, to choose to image only a<br />

monolayer of particles if required.<br />

Due to the <strong>in</strong>itial concentration of the suspension,<br />

when the droplet of smallest volume that can<br />

be droped conta<strong>in</strong>s more objects than <strong>for</strong> a<br />

monolayer on the grid, a dilution step with<br />

distilled water can be per<strong>for</strong>med.<br />

Classical E<strong>SEM</strong> detectors also available enable<br />

the control of the sample surface <strong>in</strong> SE mode and<br />

<strong>in</strong> BSE mode, us<strong>in</strong>g the gaseous SE detector<br />

GSED, and the gaseous backscattered electron<br />

detector GAD, respectively. This is very helpful<br />

<strong>for</strong> example to control the presence of liquid until<br />

the thickness is adequate to per<strong>for</strong>m transmission<br />

observations and to detect if objects are not<br />

submerged <strong>in</strong> water anymore.<br />

2.2. Purge sequence<br />

In relation with the work described <strong>in</strong> Ref. [4],<br />

an optimized pump down sequence is used <strong>in</strong> order<br />

to prevent evaporation from, and condensation on<br />

the sample droplet. Parameters like water source<br />

bottle temperature, sample temperature, <strong>in</strong>itial<br />

relative humidity rate <strong>in</strong> the microscope chamber,<br />

number of pump<strong>in</strong>g and flood<strong>in</strong>g cycles, upper<br />

and lower pressures <strong>for</strong> the purge are carefully<br />

controlled dur<strong>in</strong>g the sequence.<br />

ARTICLE IN PRESS<br />

A. Bogner et al. / Ultramicroscopy 104 (2005) 290–301<br />

2.3. Imag<strong>in</strong>g sequence<br />

The pressure and temperature can be adjusted to<br />

evaporate a small amount of water from the<br />

droplet. It allows to keep a water layer th<strong>in</strong> enough<br />

so that electrons both transmitted and scattered<br />

pass through it, and can be collected to participate<br />

to the <strong>for</strong>mation of a <strong>STEM</strong> image. Th<strong>in</strong> films of<br />

wet samples are created <strong>in</strong> situ <strong>in</strong> the E<strong>SEM</strong><br />

chamber, their thickness depend<strong>in</strong>g on the quantity<br />

of water evaporated from the <strong>in</strong>itial droplet.<br />

The solid content of the sample is controlled so<br />

that the <strong>in</strong>itial solid content and the <strong>in</strong>itial droplet<br />

volume are known. As evaporation is an endothermic<br />

reaction, it is then possible to followit<br />

by check<strong>in</strong>g the difference between the sett<strong>in</strong>g<br />

temperature and the measured one. Then the<br />

thickness of the film is kept constant thanks to<br />

an equilibrium water pressure us<strong>in</strong>g the (P,T)<br />

water diagram [5]. For <strong>in</strong>stance, a water pressure<br />

of 5.3 torr is required at a sample temperature of<br />

2 1C, so that objects rema<strong>in</strong> <strong>in</strong> a constant water<br />

layer. By controll<strong>in</strong>g the sample temperature<br />

through the Peltier stage, and us<strong>in</strong>g water vapour<br />

as the imag<strong>in</strong>g gas at a controlled pressure,<br />

samples can be kept above their saturated vapour<br />

pressure dur<strong>in</strong>g all the experiment.<br />

2.4. Imag<strong>in</strong>g mode<br />

In <strong>SEM</strong>, the detection strategy <strong>in</strong> <strong>STEM</strong> mode<br />

is based on the direct collection of electrons<br />

pass<strong>in</strong>g through the sample, by a solid-state<br />

detector (two semi-annular detectors A and B).<br />

For the configuration usually used, the <strong>in</strong>cident<br />

electron beam arrives on the limit of diodes A and<br />

B, and bright- or dark-field images can be<br />

produced with the collection of transmitted or<br />

scattered electrons, respectively. In this case, only<br />

a small area of the sample is above the limit of A<br />

and B. In the present study, we choose another<br />

possibility: annular dark-field imag<strong>in</strong>g conditions<br />

can be obta<strong>in</strong>ed if the dipolar detector is placed so<br />

that it occults the transmitted electron beam and it<br />

only collects scattered beams on a r<strong>in</strong>g constituted<br />

by both diodes A and B. Us<strong>in</strong>g this method, a<br />

more important part of the scattered electrons<br />

available is used to <strong>for</strong>m an image and more

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