Wet STEM: A newdevelopment in environmental SEM for imaging ...

Wet STEM: A newdevelopment in environmental SEM for imaging ... Wet STEM: A newdevelopment in environmental SEM for imaging ...

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part of the interest of wet STEM. The specimens can indeed be maintained in their wet state, so that particles included in a layer of liquid are imaged. In this way, they are neither deformed nor collapsed, and their size can be correctly estimated. If required, their dynamic evolution can also be followed in situ, when evaporation occurs for example. Secondly, the quite lowvoltages used in SEM (1–30 kV) in comparison with TEM give access to a higher number of electrons–sample interactions, resulting in more contrasted images [11]. Finally, thanks to the development of field emission guns [12], the resolution available in SEM is nowappreciable, so that SEM imaging becomes an easy characterization method with a very high resolution, reaching 1 nm in STEM mode at an acceleration voltage of 20 kV. Thanks to the field emission gun, nano-particles or objects around 20 nm can easily be imaged in wet STEM mode, where the resolution has experimentally been shown to be lower than 5 nm (colloidal solution of Au particles). Another interest of the wet STEM mode in ESEM is the fact that it brings a newpallet of imaging possibilities. Indeed, in the case of nanoobjects included in a liquid, classical ESEM imaging shows some limits. A characteristic of wet STEM imaging method vs. classical ESEM, thanks to transmission mode, is the access to volume information in a liquid. As we image the entire volume of the liquid, we observe not only the smooth surface of the colloidal solution or some particles emerging from this liquid phase, but also objects deep inside a liquid layer, and the way particles are piled up, whilst being limited by electrons transmission. Areas of particles layers superposition can also be detected and imaged. Images interpretation sometimes leads to questions, and it is still difficult to explain every contrasts theoretically because of the complexity of the numerous diffusion mechanisms involved in images formation. This aspect still needs further investigation, through the development of Monte Carlo simulation. However, it is already possible to state some remarks about the colloidal solutions imaged. Particles imaged in this mode usually exhibit a halo or brighter contrast around the ARTICLE IN PRESS A. Bogner et al. / Ultramicroscopy 104 (2005) 290–301 299 particle. In annular dark-field conditions, the contrast can be described as a mass–thickness inverse type [13]. As a result, brighter contrasts are interpreted as thicker or higher atomic number composition areas. In this way, biggest particles look brighter, and light their environment so that a large area around big particles looks brighter, and the halo effect is enhanced for each particle. In addition, particles in colloidal state are often stabilized thanks to ionic surfactants. The presence of these negative charges may interact with diffused electrons and participate to create a halo around particles. In a TEM, high collection angles are not used because the signal would suffer from lens aberrations. Other benefits occur in our case, thanks to SEM characteristics: high angles can be used for collection resulting in an increased signal level [12,14] and lowvoltages available induce an improved contrast. Wet STEM requires thin samples in order to obtain an important transmission signal. In the case of colloidal solutions, this lowthickness eliminates the usual drift phenomenon always occurring on large size drops, which prevents imaging even with high scanning rate acquisition. Liquid is indeed maintained on small areas defined by the TEM grid, through copper squares and holes in the carbon layer. These small areas can be observed using slowscan imaging conditions, known to increase image quality especially in environmental mode. Polymers or other organic objects are very high damage-sensitive samples, moreover, in the presence of water [15], and are not adapted to several imaging of a given area. However, damage effects can be reduced by using low-dose methods [16]. Focus, astigmatism and wobblers readjustments are done away from the image, the beam then being moved on the area of interest just for the acquisition. The aim is to prevent beam damage on the area prior to the image recording. This minimizes the exposure time and the cumulated dose. In addition, as a compromise between contrast and damage, the maximum acceleration tension has been used (30 kV), because higher tension means lower electron–sample interactions [11].

300 In addition, the lowthickness of our samples also induces a smaller interaction volume in comparison with classical SEM samples, which also means a smaller damaged volume. Most of the beam passes through, resulting in transmitted and scattered beam [14]. Moreover, in the case of sub-micrometric particles examination in conventional SEM, specially those composed of low atomic number elements, the electron beam penetrates the entire particle and the substrate below—the interaction volume is greater than the particles—in such a way that the signal quality is affected [17]. Using STEM imaging, where the specimen is changed from a bulk material to a thin film supported by a grid, detection and visualization of particles are improved, and image quality increases. 5. Conclusions The present wet STEM imaging system, new toolkit developed in ESEM, allows straightforward transmission observations of wet samples constituted by nano-objects included in a water layer. A specially good resolution can be achieved: 5 nm with a kind of resolution testing sample: gold nano-particles colloidal suspensions. The contrast is enhanced thanks to lowvoltages, and annular dark-field imaging conditions, specially interesting for lowatomic number materials. This transmission technique gives access to volume information so that we do not image only the surface of the water drop. It helps to limit drifting phenomenon of objects floating in a large amount of water, so that it allows slow-scan high-definition imaging. The main limits that make the imaging sequence more delicate are beam damage effects, enhanced in the presence of water. The huge interest of the present imaging method in the specific field of suspensions is highlighted in this paper. The size and size distribution of nanoobjects are easily determined, and suspension stability can be evaluated. In addition, even if complete image interpretation needs further investigations, contrast is well understood, and thin details can be detected on suspended nano-objects, as shown in the case of latex grafted particles. ARTICLE IN PRESS A. Bogner et al. / Ultramicroscopy 104 (2005) 290–301 Comparative approach between wet STEM images and others observations and characterization results are very interesting. Comparison between different samples also bring a lot of precious information about samples. Acknowledgements We wish to thank all the samples suppliers: A. and R. Guimara˜ es (GEMPPM and Dequi- Faenquil—Lorena, Brazil) for natural rubber latices, J. M. Asua, (Institute for Polymer Materials—San Sebastian, Spain) for mini-emulsions, F. Dalmas (GEMPPM) for carbon nanotubes, P. Oger (LST—ENS Lyon) for Pseudomonas syringae bacteria, S. Roux (LPCML—UCB Lyon 1) and P. Perriat (GEMPPM) for gold nano-particles suspensions. We present our special acknowledgements to K. Masenelli-Varlot (GEMPPM) for ultramicrotomed foils preparation. The Consortium Lyonnais de Microscopie Electronique is thanked for the access to the FEI XL 30 FEG ESEM. This work was financially supported by Total France S. A. References [1] J.L. Keddie, P. Meredith, R.A.L. Jones, A.M. Donald, Macromol. 28 (1995) 2673–2682. [2] A.M. Donald, C.B. He, C.P. Royall, M. Sferrazza, N.A. Stelmashenko, B.L. Thiel, Colloids Surf. A 174 (2000) 37–53. [3] D.J. Stokes, Adv. Eng. Mater. 3 3 (2001) 126–130. [4] R.E. Cameron, A.M. Donald, J. Microsc. 173 (1994) 227–237. [5] A.M. Donald, Nat. Mater. 2 (2003) 511–516. [6] S.M. Chabane Sari, P.J. Debouttière, R. Lamartine, F. Vocanson, C. Dujardin, G. Ledoux, S. Roux, O. Tillement, P. Perriat, J. Mater. Chem. 14 (2004) 402–407. [7] F. Dalmas, L. Chazeau, C. Gauthier, K. Masenelli-Varlot, R. Dendievel, J.-Y. Cavaillé, L. Forro, J. Polym. Sci. Part B : Polym. Phys. 43 (2005) 1186–1197. [8] M. do Amaral, A. Bogner, C. Gauthier, P.-H. Jouneau, J.M. Asua, G. Thollet, Macromol. Rapid Commun. 26 (2005) 365–368. [9] P.C. Oliveira, A. Guimarães, J.-Y. Cavaillé, L. Chazeau, R.G. Gilbert, A.M. Santos, Polymer 46–4 (2005) 1105–1111.

300<br />

In addition, the lowthickness of our samples<br />

also <strong>in</strong>duces a smaller <strong>in</strong>teraction volume <strong>in</strong><br />

comparison with classical <strong>SEM</strong> samples, which<br />

also means a smaller damaged volume. Most of<br />

the beam passes through, result<strong>in</strong>g <strong>in</strong> transmitted<br />

and scattered beam [14]. Moreover, <strong>in</strong> the case of<br />

sub-micrometric particles exam<strong>in</strong>ation <strong>in</strong> conventional<br />

<strong>SEM</strong>, specially those composed of low<br />

atomic number elements, the electron beam<br />

penetrates the entire particle and the substrate<br />

below—the <strong>in</strong>teraction volume is greater than the<br />

particles—<strong>in</strong> such a way that the signal quality is<br />

affected [17]. Us<strong>in</strong>g <strong>STEM</strong> imag<strong>in</strong>g, where the<br />

specimen is changed from a bulk material to a th<strong>in</strong><br />

film supported by a grid, detection and visualization<br />

of particles are improved, and image quality<br />

<strong>in</strong>creases.<br />

5. Conclusions<br />

The present wet <strong>STEM</strong> imag<strong>in</strong>g system, new<br />

toolkit developed <strong>in</strong> E<strong>SEM</strong>, allows straight<strong>for</strong>ward<br />

transmission observations of wet samples<br />

constituted by nano-objects <strong>in</strong>cluded <strong>in</strong> a water<br />

layer. A specially good resolution can be achieved:<br />

5 nm with a k<strong>in</strong>d of resolution test<strong>in</strong>g sample: gold<br />

nano-particles colloidal suspensions. The contrast<br />

is enhanced thanks to lowvoltages, and annular<br />

dark-field imag<strong>in</strong>g conditions, specially <strong>in</strong>terest<strong>in</strong>g<br />

<strong>for</strong> lowatomic number materials. This transmission<br />

technique gives access to volume <strong>in</strong><strong>for</strong>mation<br />

so that we do not image only the surface of the<br />

water drop. It helps to limit drift<strong>in</strong>g phenomenon<br />

of objects float<strong>in</strong>g <strong>in</strong> a large amount of water, so<br />

that it allows slow-scan high-def<strong>in</strong>ition imag<strong>in</strong>g.<br />

The ma<strong>in</strong> limits that make the imag<strong>in</strong>g sequence<br />

more delicate are beam damage effects, enhanced<br />

<strong>in</strong> the presence of water.<br />

The huge <strong>in</strong>terest of the present imag<strong>in</strong>g method<br />

<strong>in</strong> the specific field of suspensions is highlighted <strong>in</strong><br />

this paper. The size and size distribution of nanoobjects<br />

are easily determ<strong>in</strong>ed, and suspension<br />

stability can be evaluated. In addition, even if<br />

complete image <strong>in</strong>terpretation needs further <strong>in</strong>vestigations,<br />

contrast is well understood, and th<strong>in</strong><br />

details can be detected on suspended nano-objects,<br />

as shown <strong>in</strong> the case of latex grafted particles.<br />

ARTICLE IN PRESS<br />

A. Bogner et al. / Ultramicroscopy 104 (2005) 290–301<br />

Comparative approach between wet <strong>STEM</strong> images<br />

and others observations and characterization<br />

results are very <strong>in</strong>terest<strong>in</strong>g. Comparison between<br />

different samples also br<strong>in</strong>g a lot of precious<br />

<strong>in</strong><strong>for</strong>mation about samples.<br />

Acknowledgements<br />

We wish to thank all the samples suppliers:<br />

A. and R. Guimara˜ es (GEMPPM and Dequi-<br />

Faenquil—Lorena, Brazil) <strong>for</strong> natural rubber latices,<br />

J. M. Asua, (Institute <strong>for</strong> Polymer Materials—San<br />

Sebastian, Spa<strong>in</strong>) <strong>for</strong> m<strong>in</strong>i-emulsions, F. Dalmas<br />

(GEMPPM) <strong>for</strong> carbon nanotubes, P. Oger<br />

(LST—ENS Lyon) <strong>for</strong> Pseudomonas syr<strong>in</strong>gae<br />

bacteria, S. Roux (LPCML—UCB Lyon 1) and<br />

P. Perriat (GEMPPM) <strong>for</strong> gold nano-particles<br />

suspensions. We present our special acknowledgements<br />

to K. Masenelli-Varlot (GEMPPM) <strong>for</strong><br />

ultramicrotomed foils preparation.<br />

The Consortium Lyonnais de Microscopie<br />

Electronique is thanked <strong>for</strong> the access to the FEI<br />

XL 30 FEG E<strong>SEM</strong>.<br />

This work was f<strong>in</strong>ancially supported by Total<br />

France S. A.<br />

References<br />

[1] J.L. Keddie, P. Meredith, R.A.L. Jones, A.M. Donald,<br />

Macromol. 28 (1995) 2673–2682.<br />

[2] A.M. Donald, C.B. He, C.P. Royall, M. Sferrazza, N.A.<br />

Stelmashenko, B.L. Thiel, Colloids Surf. A 174 (2000)<br />

37–53.<br />

[3] D.J. Stokes, Adv. Eng. Mater. 3 3 (2001) 126–130.<br />

[4] R.E. Cameron, A.M. Donald, J. Microsc. 173 (1994)<br />

227–237.<br />

[5] A.M. Donald, Nat. Mater. 2 (2003) 511–516.<br />

[6] S.M. Chabane Sari, P.J. Debouttière, R. Lamart<strong>in</strong>e,<br />

F. Vocanson, C. Dujard<strong>in</strong>, G. Ledoux, S. Roux, O.<br />

Tillement, P. Perriat, J. Mater. Chem. 14 (2004) 402–407.<br />

[7] F. Dalmas, L. Chazeau, C. Gauthier, K. Masenelli-Varlot,<br />

R. Dendievel, J.-Y. Cavaillé, L. Forro, J. Polym. Sci. Part<br />

B : Polym. Phys. 43 (2005) 1186–1197.<br />

[8] M. do Amaral, A. Bogner, C. Gauthier, P.-H. Jouneau,<br />

J.M. Asua, G. Thollet, Macromol. Rapid Commun. 26<br />

(2005) 365–368.<br />

[9] P.C. Oliveira, A. Guimarães, J.-Y. Cavaillé, L. Chazeau,<br />

R.G. Gilbert, A.M. Santos, Polymer 46–4 (2005)<br />

1105–1111.

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