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technical report on the nechalacho deposit, thor lake project ...

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A high R 2 (and all regressi<strong>on</strong>s had significant p-values) for <strong>the</strong> regressi<strong>on</strong>, coupled with a high<br />

p-value in <strong>the</strong> t-test reinforces <strong>the</strong> significance of <strong>the</strong> correlati<strong>on</strong> between <strong>the</strong> Nit<strong>on</strong> instrument<br />

and <strong>the</strong> laboratory results.<br />

A high R 2 coupled with a low p score <strong>on</strong> <strong>the</strong> t tests indicates that <strong>the</strong>re is poor numerical<br />

correlati<strong>on</strong> between <strong>the</strong> Nit<strong>on</strong> instrument and <strong>the</strong> laboratory results, but a good fit <strong>on</strong> a<br />

regressi<strong>on</strong> line, implying that <strong>the</strong> variati<strong>on</strong> in <strong>the</strong> Nit<strong>on</strong> reading is proporti<strong>on</strong>al to <strong>the</strong> laboratory<br />

estimate but <strong>the</strong>re is a systematic percent bias in <strong>the</strong> Nit<strong>on</strong> readings (ei<strong>the</strong>r high or low).<br />

Note that handheld XRF units can suffer precisi<strong>on</strong>, bias or general inaccuracies when<br />

measuring extremes of c<strong>on</strong>tents – ei<strong>the</strong>r very high or very low levels of an element.<br />

Aval<strong>on</strong> c<strong>on</strong>cluded that Nit<strong>on</strong> XRF analysis has been dem<strong>on</strong>strated to reflect laboratory analyses<br />

for <strong>the</strong> elements Y, Ce, Ne, Sm and Gd. Fur<strong>the</strong>rmore, with more effort in instrument calibrati<strong>on</strong>,<br />

acceptable results can be achievable for Ta and Zr. These c<strong>on</strong>clusi<strong>on</strong>s are significant in that<br />

<strong>the</strong> relative amounts of light and heavy rare earths are reas<strong>on</strong>ably represented by<br />

measurements of Ce and Y. Thus, <strong>the</strong> total rare earth grade and light rare earth (LREE)<br />

c<strong>on</strong>tent can be estimated using <strong>the</strong> Ce values and <strong>the</strong> relative proporti<strong>on</strong> of heavy rare earths<br />

(HREE) can be estimated using <strong>the</strong> Y grade. This can be supported in <strong>the</strong> case of LREE by <strong>the</strong><br />

Nd values and in <strong>the</strong> case of HREE by <strong>the</strong> Gd values.<br />

NITON HANDHELD ANALYZER FOR GRADE AND QUALITY<br />

CONTROL<br />

Given <strong>the</strong> test results summarized above for using <strong>the</strong> Nit<strong>on</strong> handheld analyzer <strong>on</strong> drill core, its<br />

use in mining grade c<strong>on</strong>trol and metallurgical m<strong>on</strong>itoring can be discussed.<br />

As noted above, at Nechalacho <strong>the</strong> rare earth mineralizati<strong>on</strong>, with <strong>the</strong> excepti<strong>on</strong> of zirc<strong>on</strong>, is<br />

invisible to <strong>the</strong> naked eye. Thus, underground grade c<strong>on</strong>trol will be dependent up<strong>on</strong> chemical<br />

analysis. It is suggested that this may be achieved for underground grade c<strong>on</strong>trol purposes by<br />

use of <strong>the</strong> handheld XRF analyzer. Use of such an instrument may enable <strong>the</strong> geologist to<br />

outline stopes <strong>on</strong> <strong>the</strong> basis of grade and also be able to recognize instantly HREE-rich and<br />

HREE-poor secti<strong>on</strong>s of <strong>the</strong> mineralizati<strong>on</strong>.<br />

Analysis of rare metals such as rare earths, niobium, tantalum and zirc<strong>on</strong>ium is more complex<br />

than base metals. As a result, routine analysis during mining operati<strong>on</strong>s could be slower and<br />

more expensive than for base metals. Instant XRF analysis may be an efficient answer for this<br />

issue. The handheld XRF analyzers are limited in power output, and hence sensitivity and<br />

accuracy, due to safety c<strong>on</strong>cerns. An alternative is use of larger equipment that utilizes <strong>the</strong><br />

same principles, but higher power output. An example is <strong>the</strong> InnovX X-50 Mobile XRF. This<br />

50kV instrument has a 200 µA beam meaning that short assay times and better detecti<strong>on</strong> limits<br />

Technical Report 43-101 – March 13, 2011 Page 11-7<br />

Prepared by Aval<strong>on</strong> Rare Metals Inc.

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