Proceedings of Topical Meeting on Optoinformatics (pdf-format, 1.21 ...
Proceedings of Topical Meeting on Optoinformatics (pdf-format, 1.21 ...
Proceedings of Topical Meeting on Optoinformatics (pdf-format, 1.21 ...
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62 OPTOINFORMATICS’05<br />
Substantial advantage <str<strong>on</strong>g>of</str<strong>on</strong>g> the proposed method above known c<strong>on</strong>sists in possibility <str<strong>on</strong>g>of</str<strong>on</strong>g><br />
c<strong>on</strong>ducting the quantitative n<strong>on</strong>-destructive c<strong>on</strong>trol <str<strong>on</strong>g>of</str<strong>on</strong>g> pitting corrosi<strong>on</strong> process <strong>on</strong> the<br />
studied specimen surface. The other advantage c<strong>on</strong>sists in possibility <str<strong>on</strong>g>of</str<strong>on</strong>g> the real time data<br />
acquisiti<strong>on</strong> about the beginning <str<strong>on</strong>g>of</str<strong>on</strong>g> pitting and development <str<strong>on</strong>g>of</str<strong>on</strong>g> microcrack.<br />
Presentati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> this paper was partially supported by ICO travel-grant program.<br />
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металів біля концентраторів напружень, Львів: Вид. ФМІ НАН України, 341,<br />
(1999).<br />
2. M. Sjödahl, Some Recent Advances in Electr<strong>on</strong>ic Speckle Photography // Opt. Las.<br />
Eng., 29, 125-144, (1998).