NAND Flash Reliability and Performance - Micron
NAND Flash Reliability and Performance - Micron
NAND Flash Reliability and Performance - Micron
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Santa Clara, CA USA<br />
August 2007<br />
Page Layout for SLC 2KB <strong>NAND</strong><br />
<strong>Flash</strong><br />
SLC bad blocks identified by writing a non-FF value to first<br />
byte (2048) of spare area in page 0 or 1 of the block<br />
Typical<br />
2KB<br />
page<br />
Bad<br />
Blk<br />
Mark<br />
Byte<br />
2048<br />
Sector A<br />
(512 bytes)<br />
Sector A<br />
ECC<br />
(3 bytes)<br />
Bytes<br />
2049, 2050, 2051<br />
Sector B<br />
(512 bytes)<br />
Sector B<br />
ECC<br />
(3 bytes)<br />
Bytes<br />
2052, 2053, 2054<br />
Sector C<br />
ECC<br />
(3 bytes)<br />
Bytes<br />
2055, 2056, 2057<br />
Sector C<br />
(512 bytes)<br />
Sector D<br />
ECC<br />
(3 bytes)<br />
Bytes<br />
2058, 2059, 2060<br />
Sector D<br />
(512 bytes)<br />
Meta Data<br />
Spare<br />
(64<br />
bytes)<br />
Byte<br />
2111<br />
18
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