Three - University of Arkansas Physics Department
Three - University of Arkansas Physics Department
Three - University of Arkansas Physics Department
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September 1,1996 I Vol. 21, No. 17 I OPTICS LETTERS 1333<br />
Self-trapping <strong>of</strong> planar optical beams by use<br />
<strong>of</strong> the photorefractive effect in 1nP:Fe<br />
M. Chauvet, S. A. Hawkins, and G. J. Salamo<br />
<strong>Department</strong> <strong>of</strong> <strong>Physics</strong>, <strong>University</strong> <strong>of</strong> <strong>Arkansas</strong>, Fayetteville, <strong>Arkansas</strong> 72701<br />
M. Segev<br />
<strong>Department</strong> <strong>of</strong> Electrical Engineering and Advanced Center for Photonics and Optoelectronic Materials,<br />
Princeton <strong>University</strong>, Princeton, New Iersey 08544<br />
D. F. Bliss and G. Bryant<br />
U.S. Air Force, Rome Laboratory, Hanscom Air Force Rase, Massachusetts 01 731<br />
Received January 24, 1996<br />
We demonstrate what we believe to be the first experimental observation <strong>of</strong> self-trapping and self-deflection <strong>of</strong><br />
a planar optical beam by the photorefractive effect in a semiconductor. The semiconductor material is indium<br />
phosphide doped with iron. We show that the observed focusing and defocusing effects follow the component<br />
<strong>of</strong> the two-wave-mixing space charge field that is in phase with the intensity pattern, whereas the spatial beam<br />
deflection effects follow the 90"-shifted component. O 1996 Optical Society <strong>of</strong> America<br />
Spatial solitons in photorefractive materials have<br />
been the subject <strong>of</strong> recent intere~tl-~ Compared<br />
with Kerr spatial198 solitons, the most distinctive<br />
features <strong>of</strong> spatial solitons are that they are observed<br />
at low light intensitie~~.~~%nd that trapping<br />
occurs in both transverse dimension^.^,^ Until now,<br />
photorefractive spatial solitons have been observed<br />
in the tungsten bronze ferroelectric o~ides~'~ and<br />
in the nonferroelectric sillenite oxide^.^ Several<br />
reasons have led us to carry out similar experiments<br />
in the photorefractive semiconductor crystal<br />
1nP:Fe. First, this material is sensitive in the range<br />
<strong>of</strong> the near-infrared wavelengths used in optical<br />
telecommunications. Second, the photorefractive<br />
effect in semiconductors has the advantage <strong>of</strong> a<br />
faster response time than that observed in either the<br />
tungsten bronze or the sillenite crystal materials.<br />
Third, the possibility <strong>of</strong> monolithic integration with<br />
other optoelectronic components (lasers, detectors) is<br />
also attractive.<br />
We experimentally demonstrate in this Letter what<br />
we believe to be the first self-trapping <strong>of</strong> optical beams<br />
in a semiconductor, using the photorefractive effect.<br />
The self-trapping is observed at steady state with a low<br />
light intensity (50 mW/cm2) and with a moderate d.c.<br />
applied field (9 kV/cm) in bulk 1nP:Fe. The output<br />
diameter is observed to be trapped at the input value<br />
after propagation <strong>of</strong> both 5 and 10 mm.<br />
To observe the self-trapping effects, we focus a<br />
continuous beam at 1.04 or at 1.3 pm with a 70-mm<br />
focal-length cylindrical lens onto the entrance face <strong>of</strong> a<br />
1nP:Fe crystal. A beam pr<strong>of</strong>ile system and an imaging<br />
lens are used to analyze the beam shape. The light<br />
beam is linearly polarized along the (110) direction and<br />
propagates along the (110) direction. Absorption is<br />
-1.5 cm-' at the 1.04-pm wavelength and0.15 cm-' at<br />
1.3 pm. A d.c. field (Eo) is applied between the (001)<br />
faces. The temperature <strong>of</strong> the crystal is stabilized<br />
at 297 K.<br />
The resonance behavior <strong>of</strong> the two-wave-mixing<br />
(TWM) gain in 1nP:Fe has been characterized both<br />
experimentally and theoreti~ally.~*l~ In this model<br />
electrons are dominantly thermally excited from Fe2+<br />
to the conduction band, whereas holes are dominantly<br />
optically excited from Fe3+ to the valence band. The<br />
resonance in the gain as a function <strong>of</strong> intensity occurs<br />
at an intensity I,,, for which the optical excitation <strong>of</strong><br />
holes is equal to the thermal excitation <strong>of</strong> electrons.<br />
In addition, the relative phase between the intensity<br />
spatial pattern and the space-charge-field pattern is<br />
also intensity and temperature dependent. The reso-<br />
\. , - I<br />
0 40 80 120 160 200<br />
Intensity (mWlcm2)<br />
Fig. 1. Real and imaginary parts <strong>of</strong> the normalized TWM<br />
space charge field in 1nP:Fe at 1.06 pm calculated with<br />
formula 18 from Ref. 10. m is the modulation rate <strong>of</strong><br />
the intensity grating. Eo = 10 kV/cm; T = 297 K;<br />
grating spacing = 10 pm; [Fez+] nTo = 0.5 x 1016 ~rn-~;<br />
[Fe3+] p~o = 6 X 1016 ~rn-~; and hole and electron<br />
photoionization cross sections an0 = 6 X 10-l8 cm2,<br />
upo = 1 X lo-'" cm2. I,,, = 38 mW/cm2.<br />
O 1996 Optical Society <strong>of</strong> America