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Three - University of Arkansas Physics Department

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APPLIED PllYSICS LETTERS VOLUME 75. NUMBER 3<br />

Morphology <strong>of</strong> lnAs self-organized islands on AlAs surfaces<br />

P. ~allet,~) J. B. Smathers, and G. J. Salamob)<br />

<strong>Department</strong> <strong>of</strong> <strong>Physics</strong>, Uriiversi@ oj'drkansas, Fnyelteville, Arknrtsas 72701<br />

(Received 19 April 1999; accepted for publication 21 May 1999)<br />

We report an in situ n~olecular-bean1 epitaxy-scanning tunneling microscopy study <strong>of</strong><br />

three-dimensional (3D) sclf-organizcd lnAs islands on AlAs surfaces. The evolution <strong>of</strong> thc density<br />

and n~orphology <strong>of</strong> these islands is investigated as a function <strong>of</strong> the InAs coverage and substrate<br />

temperature. It is shown that the 2D island density is already high just prior to 3D island formation<br />

and remains constant for 3D structures as the InAs coverage is increased. This observation contrasts<br />

with the InAsJGaAs systein and makes possible the growth <strong>of</strong> very high densities <strong>of</strong> sinall quantum<br />

dots. O 1999 Anlerican Institute <strong>of</strong> <strong>Physics</strong>. [S0003-6951(99)00329-01<br />

The use <strong>of</strong> the heteroepitaxy <strong>of</strong> highly nlisn~atched inaterials<br />

to produce coherent self-assembled three-diinensional<br />

(3D) islands lying on a two-dimensional (2D) wetting layer<br />

has lead the way to a new generation <strong>of</strong> quantum functional<br />

devices.'-3 These devices are based on the extraordinary bchavior<br />

that results from carrier confinenlent in all three dimensions<br />

and are called quantum dots. Quantuin dot lasers,<br />

for example, have lower thresholds, increased modulation<br />

speed, and larger differential gain, while quanhlm dot detectors<br />

can be used at normal incidence.<br />

While the quantum dot concept sounds like there are<br />

many exciting applications, in practice, there arc some serious<br />

probleins that limit its possibilities. Onc challenge is to<br />

achieve fabrication <strong>of</strong> a large nuinber <strong>of</strong> dot structures without<br />

significant size fluctuations. Size fluctuation leads to inhon~ogeneous<br />

broadening or a shifted energy level structure<br />

for each dot, preventing formation <strong>of</strong> states that are concentrated<br />

in k space. Applications will clearly depend on the<br />

development <strong>of</strong> fabrication techniques that can control the<br />

quality, size, and uniformity <strong>of</strong> dots. For this reason, the<br />

structural characterization <strong>of</strong> self-assembled InAsIGaAs islands<br />

has been extensively pursued in the past few years.4"<br />

These investigations indicate a growth inode that is strongly<br />

depcndent on deposition conditions and interface inte~niixing.<br />

Despite the intense investigation <strong>of</strong> this system, however,<br />

many questions remain about the nature <strong>of</strong> the 2D to<br />

3D transition.<br />

While the growth <strong>of</strong> InAs islands inside a GaAs matrix<br />

has been the center <strong>of</strong> attention, careful studies have also<br />

been made in 1n~b/CJa~s,~ I~G~AS/G~AS,'~ I~G~PII~P,"<br />

~i~e/~i,'~ and 1n~sJ~l~s.l~ The InAsIAlAs quantum dots<br />

provide an especially attractive system for optical and electronic<br />

devices due to their significantly higher barrier energy.<br />

For example, the higher barrier makes possible greater tunability<br />

<strong>of</strong> the intersubband infrared transitions as well as enhanced<br />

stability at high temperatures.14<br />

In this letter, we investigate the 2D to 3D transition during<br />

the molecular-bean1 epitaxy (MBE) <strong>of</strong> InAs on AIAs. We<br />

also investigated the density and morphology <strong>of</strong> the 3D islands<br />

as a function <strong>of</strong> InAs coverage and substrate tempera-<br />

ture. We carried out our investigation using a MBE facility<br />

with an in sit11 scanning tunneling microscope (STM). Substrate<br />

ternpcratures during the growth wcre measured using<br />

an optical technique based on the wavelength dependence <strong>of</strong><br />

the band edge as a hnction <strong>of</strong> temperature. Details about the<br />

experimental apparatus can be found in Ref. 15. Samples<br />

were grown on n-type GaAs wafers. After the growth <strong>of</strong> a<br />

0.5 pm GaAs buffer layer at 580 "C, a flat GaAs surface is<br />

prcpared by annealing under an As4 flux. Thc growth <strong>of</strong><br />

AlAs is initiated at 580 OC and the substrate temperature is<br />

ramped and stabilized at 500 OC while depositing AIAs. InAs<br />

is then deposited with an As4 flux <strong>of</strong> 6.OX Torr. The<br />

growth rate is chosen to be 0.1 nionolayer per second (MLI<br />

s). We exposed the surface to both In and As fluxes during 3<br />

s following by 17 s <strong>of</strong> As only. This sequence is repeated<br />

until the desired coverage is reached. The sample is then<br />

cooled to room temperature while an As4 flux is maintained<br />

until the temperature falls below 350°C. After the sample<br />

reaches 200°C, it is transferred under vacuum to the STM<br />

chamber. Interestingly, our investigation <strong>of</strong> InAsIAlAs 3D<br />

structures shows behavior that is remarkably different from<br />

that <strong>of</strong> InAsIGaAs 3D structures, despite the fact that both<br />

AlAs and GaAs have the same lattice mismatch <strong>of</strong> 7% with<br />

InAs. This difference begins with the nature <strong>of</strong> the wetting<br />

layer. Figure l(a) shows STM images <strong>of</strong> the InAs wetting<br />

layer on GaAs after the deposition <strong>of</strong> 2.1 MLs at 500 OC. The<br />

"meandering chains" indicate a highly cormgatcd surfacc<br />

due to intennixing between indium and galliurn atoms.'"<br />

Meanwhile, under the exact same conditions, STM images<br />

")~lcch.onic mail: pbalIct@comp.uark.edu<br />

b'~lectronic ruarl: sala~no(~comp.uaik.edu<br />

FIG. I. High-resolution 35X 35 nm STM imagcs <strong>of</strong> 2.1 ML <strong>of</strong> I ds dcpositcd<br />

on (a) GaAs and (b) A1As. Thc whitc rcgions on both imagcs arc onc<br />

~nionolayer high, 2D features.<br />

0003-6951/99/75(3)/337/3/$15.00 337 0 1999 American Institute <strong>of</strong> <strong>Physics</strong><br />

Downloaded 09 Mar 2008 to 130.184.237.6. Redistribution subject to AIP Ilcense or copyright; see http://apl.aip.org/apl/copyright.jsp

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