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Lai - Keck Institute for Space Studies

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DC characteristics of 0.1um InP HEMT with improved<br />

Ohmic process<br />

Ids (m A/m m )/ gm (m S/m m )<br />

1600<br />

1400<br />

1200<br />

1000<br />

800<br />

600<br />

400<br />

200<br />

0<br />

-0.6 -0.4 -0.2 0.0 0.2 0.4 0.6<br />

Vgs (V)<br />

Rc (Ω-mm)<br />

BVgd<br />

Gmp, Vds=1V<br />

fT, Vds=1V<br />

MSG @ 26GHz, Vds=1V<br />

0.04 (Ω-mm)<br />

3.5V<br />

1400 (mS/mm)<br />

230 GHz<br />

17 dB<br />

Ids (mA/mm)<br />

Ft, 800 Mag, baseline, Gm ID, DC IV, gate photo, chip photo<br />

700<br />

600<br />

500<br />

400<br />

300<br />

200<br />

100<br />

Vgs=0.4V<br />

Vgs=0V<br />

• 20% improvement in Gmp<br />

• Low V-knee: good <strong>for</strong> low power per<strong>for</strong>mance<br />

• Well controled output conductance<br />

• Good pinch-off characteristics<br />

0<br />

0.0 0.2 0.4 0.6 0.8 1.0 1.2<br />

Vds (V)<br />

Northrop Grumman <strong>Space</strong> Technology<br />

8<br />

GaAs MANTECH, Miami, May 2004<br />

IPRM 2008

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