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Lai - Keck Institute for Space Studies

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InP HEMT Production W-band MMIC<br />

Per<strong>for</strong>mance<br />

– 100 mm InP HEMT<br />

– 60 wafers/20 sites per wafer<br />

– On-wafer testing<br />

– Fixture testing NF is better<br />

than on-wafer data by 0.5 dB<br />

Noise figure (dB)<br />

5<br />

4<br />

3<br />

2<br />

1<br />

0<br />

90 92 94 96 98<br />

Frequency<br />

(GHz)<br />

10

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