ULTIMATE COMPUTING - Quantum Consciousness Studies

Bibliography 253
Louis, E., F. Flores and P. M. Echenique (1986). Current Saturation Through
Image Surface States in Scanning Tunneling Microscopy. Solid State
Comm., 59(7), 453–455.
Mamn, H. J., D. W. Abraham, E. Ganz and J. Clarke (1985). 2 Dimensional,
Remote Micro positioner for a Scanning Tunneling Microscope. Rev. Sci.
Instrum., 56(11), November, 2168–2170.
McCord, M. A., and R. F. W. Pease (1985). High Resolution, Low-Voltage
Probes From a Field Emission Source Close to the Target Plane. J. Vac.
Sci. Technol. B, 3(1), Jan./Feb., 198–201.
McCord, M.A. and R. F. W. Pease (1986). Lithography with the Scanning
Tunneling Microscope. J. Vac. Sci. Technol. B, 4(1), Jan/Feb., 86–88.
Miranda, R., N. Garcia, A. Baro, R. Garcia, J. L. Pena and H. Rohrer (1985)
Technological Applications of Scanning Tunneling Microscopy at
Atmospheric Pressure. Appl. Phys. Lett., 47(4), 15 August, 367–369.
Moreland, J., S. Alexander, M. Cox, R. Sonnenfeld and P. K. Hansma (1983).
Squeezable Electron Tunneling Junctions. Appl. Phys. Lett., 43(4), 15
August, 387–388.
Moreland, J. and J. W. Ekin (1985). Electron Tunneling into Superconducting
Filaments using Mechanically Adjustable Barriers. Appl. Phys. Lett.,
47(2), July, 175–177.
Moreland, J. and P. K. Hansma (1984). Electromagnetic Squeezer for
Compressing Squeezable Electron Tunneling. Rev. Sci. Instrum., 55(3),
March, 399–403.
Morita, S. K. Itaya and N. Mikoshiba (1986). Images of Barrier Layer of Anodic
Aluminum Oxide in Air Obtained with Scanning Tunneling Microscope.
Japanese J. of Applied Physics, 25(9), Sept., L743-L745.
Morita, S., T. Okada, Y. Ishigame and N. Mikoshiba (1986). Scanning Tunneling
Microscopy of Metal Surfaces in Air. In Press; presented at Scanning
Tunneling Microscopy ‘86, Santiago de Compostela, (Spain), July 14–
18,1–8.
Morita, S., T. Okada, Y. Ishigame, C. Sato and N. Mikoshiba (1986). Voltage-
Dependence of Scanning Tunneling Microscopy on Titanium Surface in
Air. Japanese J. of Applied Physics, 25(6), L516-L518.
NASA (1986). Electrochemical Process Makes Fine Needles. NASA Tech Briefs,
May/June, 135.
Newmark, P. and L. Garwin (1986). Electron Microscopy Acclaimed. Nature,
323, 23 Oct., 663.
Park, S. L. and C. F. Quate (1986). Tunneling Microscopy of Graphite in Air.
Appl. Phys. Lett., 48(2), 13 January, 112–114.
Pashley, M. D., J. B. Pethica and J. Coombs (1985). Scanning Tunneling
Microscope Studies. Surface Science, 152/153, 27–32.
Persson, B. N. J., and J. E. Demuth (1986). Inelastic Electron Tunneling from a
Metal Tip. Solid State Communications, 57(9), 769–772.
Pethica, J. B. and M. D. Pashley (1983). Scanning Tunneling Microscopy. Nature,
305, October, 666.
Pohl, D. W. (1986). Some Design Critieria in Scanning Tunneling Microscopy.
IBM J. Res. Develop., 30(4), July, 417–427.
Pohl, D. W., J. K. Gimzewski, A. Humbert and S. Veprek (1985). Surface
Topography Studies of Nanocrystalline Si by STM. Proc. SPIE, 565,
Micron and Submicron Integrated Circuit Metrology, 98–101.
Quate, C. F. (1986). Vacuum Tunneling: A New Technique for Microscopy.
Physics Today, Aug., 26–33.