26.01.2015 Views

ULTIMATE COMPUTING - Quantum Consciousness Studies

ULTIMATE COMPUTING - Quantum Consciousness Studies

ULTIMATE COMPUTING - Quantum Consciousness Studies

SHOW MORE
SHOW LESS
  • No tags were found...

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

252 Bibliography<br />

Gomer, R. (1986). Extensions of the Field Emission Fluctuation Method for the<br />

Determination of Surface Diffusion Coefficients. In Press: Applied<br />

Physics.<br />

Gomer, R. (1986). Possible Mechanisms of Atom Transfer in Scanning Tunneling<br />

Microscopy. IBM J. Res. Develop., 30(4), July, 428–430.<br />

Gomez, J., L. Vazquez, A. M. Baro, N. Garcia, C. L. Perdriel, W. E. Triaca and<br />

A. J. Arvia (1986). Scanning Tunneling Microscopy and<br />

Electrochemistry: Surface Topography of (100)-Type Electrofaceted<br />

Platinum. In press.<br />

Hamers, R. J., R. M. Tromp and J. E. Demuth (1986). Scanning Tunneling<br />

Microscopy of Si(001). Phys. Rev. B, 34(8), Oct., 5343–5357.<br />

Hansma, P. K. and J. Tersoff (1987). Scanning Tunneling Microscopy. J. Appl.<br />

Phys., 61(2), 15 Jan., R1-R23.<br />

Hosler, W., R. J. Behm, E. Ritter (1986). Defects on the Pt (100) Surface and<br />

Their Influence on Surface Reactions—A Scanning Tunneling Microscopy<br />

Study. IBM J. Res. Develop., 30(4), July, 403–410.<br />

Hsue-Yang Liu, Fu-Ren F. Fan, Charles W. Lin and A. J. Bard (1986). Scanning<br />

Electrochemical and Tunneling Ultramicroelectrode Microscope for<br />

High-Resolution Examination of Electrode Surfaces in Solution. J. Am.<br />

Chem. Soc., 108, 3838–3839.<br />

Humbert, A., J. K. Gimzewski and B. Reihl (1985). Postannealing of Coldly<br />

Condensed Ag Films: Influence of Pyridine Preadsorption. Phys. Rev. B,<br />

32(6), 15 Sept., 4252–4253.<br />

IBM (1985a). Fast Scan Piezo Drive. IBM Technical Disclosure Bulletin,<br />

27(10b), March, 5976–5977.<br />

IBM (1985b). Magnetostrictive Positioner. IBM Technical Disclosure Bulletin,<br />

27(11), April, 63–73.<br />

IBM (1985c). Replacement Mechanism for the Tips of Scanning Electron,<br />

Tunneling and Optical Microscopes. IBM Technical Disclosure Bulletin,<br />

28(1), June, 435–436.<br />

IBM (1985d). Piezo-electrostatic Rotary Drive. IBM Technical Disclosure<br />

Bulletin, 28(2), July, 504–505.<br />

Kaiser, W. J., R. C. Jaklevic (1986). Spectroscopy of Electronic States of Metals<br />

with a Scanning Tunneling Microscope. IBM J. Res. Develop., 30(4),<br />

July, 411–416.<br />

Kuk, Y. and P. J. Silverman (1986). Role of Tip Structure in Scanning Tunneling<br />

Microscopy. Appl. Phys. Lett., 48(23), June, 1597–1599.<br />

Lang, N. D. (1985) Vacuum Tunneling Current from an Absorbed Atom. Phys.<br />

Rev. Lett., 55(2), 8 July, 230–233.<br />

Lang, N. D. (1986a). The Theory of Single-Atom Imaging in the Scanning<br />

Tunneling Microscope. Phys. Rev. Lett., 56(11), 17 March, 1164–1167.<br />

Lang, N. D. (1986b). Electronic Structure and Tunneling Current for<br />

Chemisorbed Atoms. IBM J. Res. Develop., 30(4), July, 374–379.<br />

Lang, N. D. (1986c). Spectroscopy of Single Atoms in the Scanning Tunneling<br />

Microscope. Phys. Rev. Lett., 34(8), 15 Oct., 5947–5950.<br />

Lang, N. D. (1987). Apparent Size of an Atom in the Scanning Tunneling<br />

Microscope as a Function of Bias. Phys. Rev. Lett., 58(1), 5 Jan., 45–48.<br />

Liu, H.-Y., F: R. Fan, C. W. Lin and A. J. Bard (1986). Scanning Electrochemical<br />

and Tunneling Ultramicroelectrode Microscope for High-Resolution<br />

Examination of Electrode Surfaces in Solution. J. Am. Chem. Soc.,<br />

108(13), 3838–3839.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!