ULTIMATE COMPUTING - Quantum Consciousness Studies

250 Bibliography
Binnig, G., N. Garcia, H. Rohrer, J. M. Soler and F. Flores (1984). Electron-
Metal-Surface Interaction Potential With Vacuum Tunneling:
Observation of the Image Force. Physical Review B, 30(8), 4816–4818.
Bono, J. and R. H. Good, Jr. (1985). Theoretical Discussions of the Scanning
Tunneling Microscope. Surf. Sci., 151, 543–552.
Bryant, A., D. P. E. Smith, G. Binnig, W. A. Harrison and C. F. Quate (1986).
Anomalous Distance Dependence in Scanning Tunneling Microscopy.
Appl. Phys. Lett., 49(15), 13 Oct., 936–938.
Bryant, A., D. P. E. Smith and C. F. Quate (1986). Imaging in Real Time with the
Tunneling Microscope. Appl. Phys. Lett., 48(13), March, 832–834.
Buttiker, M. and R. Landauer (1986). Traversal Time for Tunneling. IBM J. Res.
Develop., 30(5), Sept., 451–454.
Chaing, S. and R. J. Wilson (1986). Scanning Tunneling Microscopy. In: R.
Feder, J. W. McGowan and D. M. Shinozaki, Examining the Submicron
World. Plenum Press, New York, 1–19.
Chiang, S. and R. J. Wilson (1986b). Construction of a UHV Scanning Tunneling
Microscope. IBM J. Res. Develop., 30(5), Sept., 515–519.
Coleman, R. V., B. Drake, P. K. Hansma and G. Slough (1985). Charge Density
Waves Observed with a Tunneling Microscope. Phys. Rev. Lett., 55(4),
July, 394–397.
Coombs, J. H. and J. B. Pethica (1986). Properties of Vacuum Tunneling
Currents: Anomalous Barrier Heights. IBM J. Res. Develop., 30(5),
Sept., 455–459.
Corb, B. W., M. Ringger and H: J. Guntherodt (1987). Microstructural
Investigation of Nd-Fe-B with the Scanning Tunneling Microscope. Appl.
Phys. Lett., 50(6), 9 Feb., 353–355.
Demuth, J. E., R. J. Hamers, R. M. Tromp and M. E. Welland (1986). A Scanning
Tunneling Microscope for Surface Science Studies. IBM J. Res. Develop.,
30(4), July, 396–402.
Demuth, J. E., R. J. Hamers, R. M. Tromp and M. E. Welland (1986). A
Simplified Scanning Tunneling Microscope for Surface Science Studies. J.
Vac. Sci. Technol. A, 4(3), May/June, 1320–1323.
Dietrich, H. P., M. Lanz and D. F. Moore (1984). Ion Beam Machining of Very
Sharp Points. IBM Tech. Disclosure Bul., 27(5), Oct., 3039–3040.
Dragoset, R. A., R. D. Young, H. P. Layer, S. R. Mielczarek, E. C. Teague and R.
J. Celotta (1986). Scanning Tunneling Microscopy Applied to Optical
Surfaces. Optics Letters, 11(9), Sept., 560–562.
Drake, B., R. Sonnenfeld, J. Schneir, P. K. Hansma, G. Solugh R. V. Coleman
(1986). A Tunneling Microscope for Operation in Air or Fluids. Rev. Sci.
Instr., 57(3), March, 441–445.
Durig, U., J. K. Gimzewski and D. W. Pohl (1986). Experimental Observation of
Forces Acting During Scanning Tunneling Microscopy. Amer. Phys.
Soc., 57(19), 10 Nov., 2403–2406.
Elrod, S. A., A. Bryant, A. L. de Lozanne, S. Park, D. Smith, C. F. Quate (1986).
Tunneling Microscopy From 300 to 4.2 K. IBM J. Res. Develop., 30(4),
July, 387–395.
Elrod, S. A., A. L. de Lozanne and C. F. Quate (1984). Low-Temperature Vacuum
Tunneling Microscopy. Appl. Phys. Lett., 45(11), 1 Dec., 1240–1242.
Farrell, H. H., M. Levinson (1985). Scanning Tunneling Microscope as a
Structure-Modifying Tool. Physical Review B, 31(6), March, 3593–3598.
Feenstra, R. M. and G. S. Oehrlein (1985). Surface Morphology of Oxidized and
Ion-Etched Silicon by Scanning Tunneling Microscopy. Applied Physics
Letters, 47(2), 15 July, 97–99.