Diamond Detectors for Ionizing Radiation - HEPHY
Diamond Detectors for Ionizing Radiation - HEPHY
Diamond Detectors for Ionizing Radiation - HEPHY
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CHAPTER 5. DETECTOR MATERIAL COMPARISON 21<br />
lifetime, summed <strong>for</strong> both carriers,<br />
d c = d c;e + d c;h = v e e + v h h =( e e + h h )E : (5.1)<br />
Taking the border limits into account, the collection distance obtained from measurements<br />
is smaller than the average mean free path because at the electrodes, electrons and<br />
holes are drained and do no longer contribute to the drift path, thus reducing the total<br />
drift length or the signal induced at the electrodes, respectively.<br />
The number of charges (electron-hole pairs) generated by a MIP is [8]<br />
Q p = q p D with q p =36em ,1 : (5.2)<br />
The value of q p includes not only the primary excitation, but also the contribution of<br />
secondary interactions by eventually generated electrons. The charge collected at the<br />
electrodes is approximately represented by the ratio of the carrier drift length, or charge<br />
collection distance, to the lm thickness,<br />
Substituting Q p with the expression in eq. 5.2 results in<br />
Q c Q p<br />
d c<br />
D : (5.3)<br />
Q c q p d c : (5.4)<br />
The charge collection eciency, which is dened as the ratio of measured charge to the<br />
total generated charge, is given by<br />
cce d c<br />
D : (5.5)<br />
Eq. 5.4 tells that the charge collected at the electrodes is a function of the mean collection<br />
distance only. However, with thicker lms more charge is generated, thus more<br />
charge is collected and the charge collection increases. Thus, the charge collection distance,<br />
together with the sample thickness, state the material quality.<br />
In order to increase the signal size, the diamond lm can be grown thicker. On<br />
the other hand, tracking detectors must be kept as thin as possible. The solution that<br />
complies with both requirements is to grow a rather thick diamond lm and then remove,<br />
by lapping, material from the substrate side, where the collection distance is very low.<br />
Due to surface limits, the mean charge collection passes its maximum and decreases, if too<br />
much material is removed. It has been shown by theory and experiment [23] that there<br />
is an optimal remaining thickness <strong>for</strong> given detector parameters. The collection distance<br />
increase using this technique ranges up to 40% with present diamond samples. Fig. 5.1<br />
shows the charge collection distances of two dierent diamond samples after several steps<br />
of lapping. The measured values agree with the theory well. For the application as a<br />
tracking detector is the target to achieve a thin detector with sucient signal output.<br />
Apart from the local collection distance dependending on the depth as discussed above,<br />
the diamond lm is considered to be laterally homogeneous. Measurements have shown