An integrated approach to electrochemical impedance spectroscopy

An integrated approach to electrochemical impedance spectroscopy An integrated approach to electrochemical impedance spectroscopy

13.01.2015 Views

Available online at www.sciencedirect.com Electrochimica Acta 53 (2008) 7360–7366 An integrated approach to electrochemical impedance spectroscopy Mark E. Orazem a,∗ , Bernard Tribollet b a Department of Chemical Engineering, University of Florida, Gainesville, FL 32611, USA b UPR15 du CNRS, Laboratoire Interfaces et Systèmes Electrochimiques, Université P. et M. Curie, CP 133, 4 Place Jussieu, 75252 Paris, France Received 20 August 2007; received in revised form 25 October 2007; accepted 31 October 2007 Available online 21 December 2007 Abstract A philosophy for electrochemical impedance spectroscopy is presented which integrates experimental observation, model development, and error analysis. This approach is differentiated from the usual sequential model development for given impedance spectra by its emphasis on obtaining supporting observations to guide model selection, use of error analysis to guide regression strategies and experimental design, and use of models to guide selection of new experiments. These concepts are illustrated with two examples taken from the literature. This work illustrates that selection of models, even those based on physical principles, requires both error analysis and additional experimental verification. © 2007 Elsevier Ltd. All rights reserved. Keywords: Impedance spectroscopy; Modeling; Error analysis 1. Introduction While impedance spectroscopy can be a sensitive tool for analysis of electrochemical and electronic systems, an unambiguous interpretation of spectra cannot be obtained by examination of raw data. Instead, interpretation of spectra requires development of a model which accounts for the impedance response in terms of the desired physical properties. Model development should take into account both the impedance measurement and the physical and chemical characteristics of the system under study. It is useful to envision a flow diagram for the measurement and interpretation of experimental measurements such as impedance spectroscopy. Barsoukov and Macdonald proposed such a flow diagram for a general characterization procedure (Figure 1.2.1 in both references [1] and [2]) consisting of two blocks comprising the impedance measurement, three blocks comprising a physical (or process) model, one block for an equivalent electrical circuit, and blocks labeled curve fitting and system characterization. They suggested that impedance data may be analyzed for a given system by using either an exact mathematical model based on a plausible physical theory ∗ Corresponding author. Tel.: +1 352 392 6207; fax: +1 352 392 9513. E-mail address: meo@che.ufl.edu (M.E. Orazem). or a comparatively empirical equivalent circuit. The parameters for either model can be estimated by complex nonlinear least squares regression. The authors observed that ideal electrical circuit elements represent ideal lumped constant properties; whereas, the physical properties of electrolytic cells are often distributed. The distribution of cell properties motivates use of distributed impedance elements such as constant-phase elements (CPE). An additional problem with equivalent circuit analysis, which the authors suggest is not shared by the direct comparison to the theoretical model, is that circuit models are ambiguous and different models may provide equivalent fits to a given spectrum. The authors suggest that identification of the appropriate equivalent circuit can be achieved only by employing physical intuition and by carrying out several sets of measurements with different conditions. A similar flow diagram was presented by Huang et al. [3] for solid-oxide fuel cells (SOFCs). The diagram accounts for the actions of measuring impedance data, modeling, fitting the model, interpreting the results, and optimizing the fuel cell for power generation. The authors emphasize that the interpreting action depends more on the electrochemical expertise of the researchers than on a direct mapping from model parameters to SOFC properties. While helpful, the flow diagrams proposed by Barsoukov and Macdonald [2] and Huang et al. [3] are incomplete because they do not account for the role of independent assessment of exper- 0013-4686/$ – see front matter © 2007 Elsevier Ltd. All rights reserved. doi:10.1016/j.electacta.2007.10.075

Available online at www.sciencedirect.com<br />

Electrochimica Acta 53 (2008) 7360–7366<br />

<strong>An</strong> <strong>integrated</strong> <strong>approach</strong> <strong>to</strong> <strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong><br />

Mark E. Orazem a,∗ , Bernard Tribollet b<br />

a Department of Chemical Engineering, University of Florida, Gainesville, FL 32611, USA<br />

b UPR15 du CNRS, Labora<strong>to</strong>ire Interfaces et Systèmes Electrochimiques, Université P. et M. Curie,<br />

CP 133, 4 Place Jussieu, 75252 Paris, France<br />

Received 20 August 2007; received in revised form 25 Oc<strong>to</strong>ber 2007; accepted 31 Oc<strong>to</strong>ber 2007<br />

Available online 21 December 2007<br />

Abstract<br />

A philosophy for <strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong> is presented which integrates experimental observation, model development, and error<br />

analysis. This <strong>approach</strong> is differentiated from the usual sequential model development for given <strong>impedance</strong> spectra by its emphasis on obtaining<br />

supporting observations <strong>to</strong> guide model selection, use of error analysis <strong>to</strong> guide regression strategies and experimental design, and use of models <strong>to</strong><br />

guide selection of new experiments. These concepts are illustrated with two examples taken from the literature. This work illustrates that selection<br />

of models, even those based on physical principles, requires both error analysis and additional experimental verification.<br />

© 2007 Elsevier Ltd. All rights reserved.<br />

Keywords: Impedance <strong>spectroscopy</strong>; Modeling; Error analysis<br />

1. Introduction<br />

While <strong>impedance</strong> <strong>spectroscopy</strong> can be a sensitive <strong>to</strong>ol<br />

for analysis of <strong>electrochemical</strong> and electronic systems, an<br />

unambiguous interpretation of spectra cannot be obtained by<br />

examination of raw data. Instead, interpretation of spectra<br />

requires development of a model which accounts for the<br />

<strong>impedance</strong> response in terms of the desired physical properties.<br />

Model development should take in<strong>to</strong> account both the <strong>impedance</strong><br />

measurement and the physical and chemical characteristics of<br />

the system under study.<br />

It is useful <strong>to</strong> envision a flow diagram for the measurement<br />

and interpretation of experimental measurements such as<br />

<strong>impedance</strong> <strong>spectroscopy</strong>. Barsoukov and Macdonald proposed<br />

such a flow diagram for a general characterization procedure<br />

(Figure 1.2.1 in both references [1] and [2]) consisting of two<br />

blocks comprising the <strong>impedance</strong> measurement, three blocks<br />

comprising a physical (or process) model, one block for an<br />

equivalent electrical circuit, and blocks labeled curve fitting<br />

and system characterization. They suggested that <strong>impedance</strong><br />

data may be analyzed for a given system by using either an<br />

exact mathematical model based on a plausible physical theory<br />

∗ Corresponding author. Tel.: +1 352 392 6207; fax: +1 352 392 9513.<br />

E-mail address: meo@che.ufl.edu (M.E. Orazem).<br />

or a comparatively empirical equivalent circuit. The parameters<br />

for either model can be estimated by complex nonlinear<br />

least squares regression. The authors observed that ideal electrical<br />

circuit elements represent ideal lumped constant properties;<br />

whereas, the physical properties of electrolytic cells are often<br />

distributed. The distribution of cell properties motivates use of<br />

distributed <strong>impedance</strong> elements such as constant-phase elements<br />

(CPE). <strong>An</strong> additional problem with equivalent circuit analysis,<br />

which the authors suggest is not shared by the direct comparison<br />

<strong>to</strong> the theoretical model, is that circuit models are ambiguous<br />

and different models may provide equivalent fits <strong>to</strong> a given spectrum.<br />

The authors suggest that identification of the appropriate<br />

equivalent circuit can be achieved only by employing physical<br />

intuition and by carrying out several sets of measurements with<br />

different conditions.<br />

A similar flow diagram was presented by Huang et al. [3]<br />

for solid-oxide fuel cells (SOFCs). The diagram accounts for<br />

the actions of measuring <strong>impedance</strong> data, modeling, fitting the<br />

model, interpreting the results, and optimizing the fuel cell for<br />

power generation. The authors emphasize that the interpreting<br />

action depends more on the <strong>electrochemical</strong> expertise of the<br />

researchers than on a direct mapping from model parameters <strong>to</strong><br />

SOFC properties.<br />

While helpful, the flow diagrams proposed by Barsoukov and<br />

Macdonald [2] and Huang et al. [3] are incomplete because they<br />

do not account for the role of independent assessment of exper-<br />

0013-4686/$ – see front matter © 2007 Elsevier Ltd. All rights reserved.<br />

doi:10.1016/j.electacta.2007.10.075


M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366 7361<br />

imental error structure and because they do not emphasize the<br />

critical role of supporting experimental measurements. Orazem<br />

et al. proposed a flow diagram (Figure 6 in reference [4]) consisting<br />

of three elements: experiment, measurement model, and process<br />

model. The measurement model was intended <strong>to</strong> assess the<br />

s<strong>to</strong>chastic and bias error structure of the data; thus, their diagram<br />

accounts for the independent assessment of experimental error<br />

structure. Their diagram does not, however, account for supporting<br />

non-<strong>impedance</strong> measurements, and the use of regression<br />

analysis, while implied, is not shown explicitly. The object of<br />

this work is <strong>to</strong> formulate a comprehensive <strong>approach</strong> which can be<br />

applied <strong>to</strong> measurement and interpretation of <strong>impedance</strong> spectra.<br />

2. Integration of measurements, error analysis, and<br />

model<br />

A refined philosophical <strong>approach</strong> <strong>to</strong>ward the use of<br />

<strong>impedance</strong> <strong>spectroscopy</strong> is outlined in Fig. 1 where the triangle<br />

evokes the concept of an operational amplifier for which<br />

the potential of input channels must be equal. Sequential steps<br />

are taken until the model provides a statistically adequate representation<br />

of the data <strong>to</strong> within the independently obtained<br />

s<strong>to</strong>chastic error structure. The different aspects which comprise<br />

the philosophy are presented in this section.<br />

2.1. Impedance measurement are <strong>integrated</strong> with<br />

experimental error analysis<br />

All <strong>impedance</strong> measurements should begin with measurement<br />

of a steady-state polarization curve. The steady-state<br />

polarization curve is used <strong>to</strong> guide selection of an appropriate<br />

perturbation amplitude and can provide initial hypotheses<br />

for model development. The <strong>impedance</strong> measurements can<br />

then make be performed at selected points on the polarization<br />

curve <strong>to</strong> explore the potential dependence of reaction rate constants.<br />

Impedance measurements can be performed as well as<br />

a function of other state variables such as temperature, rotation<br />

speed, reactant concentration. Impedance scans made at different<br />

points of time can be used <strong>to</strong> explore temporal changes in<br />

system parameters. Some examples include growth of oxide or<br />

corrosion-product.<br />

Fig. 1. Schematic flowchart showing the relationship between <strong>impedance</strong> measurements,<br />

error analysis, supporting observations, model development, and<br />

weighted regression analysis.<br />

The <strong>impedance</strong> measurements should also be conducted in<br />

concert with error analysis with emphasis on both s<strong>to</strong>chastic<br />

and systematic bias errors. The bias errors can be defined<br />

<strong>to</strong> be those that result in data that are inconsistent with the<br />

Kramers–Kronig relations. <strong>An</strong> empirical error analysis can<br />

be undertaken using the measurement model <strong>approach</strong> suggested<br />

by Agarwal et al. [5–7] and Orazem [8]. It should be<br />

noted, however, that this <strong>approach</strong> is not definitive because<br />

Kramers–Kronig-consistent artifacts can be caused by electrical<br />

leads and the electronics. Use of dummy cells can help identify<br />

artifacts that are consistent with the Kramers–Kronig relations.<br />

As an alternative <strong>approach</strong> for identification of s<strong>to</strong>chastic<br />

part of the error structure, Dygas and Breiter have shown<br />

that <strong>impedance</strong> instrumentation could, in principle, provide<br />

standard deviations for the <strong>impedance</strong> measurements at each<br />

frequency [9].<br />

The feedback loop shown in Fig. 1 between EIS Experiment<br />

and Error <strong>An</strong>alysis indicates that the error structure is<br />

obtained from the measured data and that knowledge of the<br />

error structure can guide improvements <strong>to</strong> the experimental<br />

design. The magnitude of perturbation, for example, should be<br />

selected <strong>to</strong> minimize s<strong>to</strong>chastic errors while avoiding inducing<br />

a nonlinear response. The frequency range should be<br />

selected <strong>to</strong> sample the system time constants, while avoiding<br />

bias errors associated with non-stationary phenomena. In short,<br />

the experimental parameters should be selected so as <strong>to</strong> minimize<br />

the s<strong>to</strong>chastic error structure while, at the same time,<br />

allowing for the maximum frequency range that is free of bias<br />

errors.<br />

2.2. Process model is developed in concert with other<br />

observations<br />

The model identified in Fig. 1 represents a process model<br />

intended <strong>to</strong> account for the hypothesized physical and chemical<br />

character of the system under study. From the perspective<br />

embodied in Fig. 1, the objective of the model is not <strong>to</strong><br />

provide a good fit with the smallest number of parameters.<br />

The objective is rather <strong>to</strong> use the model <strong>to</strong> gain physical<br />

understanding of the system. The model should be able <strong>to</strong><br />

account for, or at least be consistent with, all experimental<br />

observations. The supporting measurements therefore provide<br />

a means for model identification. The feedback loop shown in<br />

Fig. 1 between Model and Other Observations is intended <strong>to</strong><br />

illustrate that the supporting measurements guide model development<br />

and the proposed model can suggest experiments needed<br />

<strong>to</strong> validate model hypotheses. The supporting experiments<br />

can include both <strong>electrochemical</strong> and non-<strong>electrochemical</strong><br />

measurements.<br />

Numerous scanning <strong>electrochemical</strong> methods such as scanning<br />

reference electrodes, scanning tunneling microscopy, and<br />

scanning <strong>electrochemical</strong> microscopy can be used <strong>to</strong> explore<br />

surface heterogeneity. Scanning vibrating electrodes and probes<br />

can be used <strong>to</strong> measure local current distributions. Local<br />

<strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong> provides a means of<br />

exploring the distribution of surface reactivity. Measurements<br />

can be performed across the electrode at a single frequency <strong>to</strong>


7362 M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366<br />

create an image of the electrode or, alternatively, performed at<br />

a given location <strong>to</strong> create a complete spectrum. Other experiments<br />

may include in situ and ex situ surface analysis, chemical<br />

analysis of electrolytes, and both in situ and ex situ visualization<br />

and/or microscopy. Transfer-function methods such as electrohydrodynamic<br />

(EHD) <strong>impedance</strong> <strong>spectroscopy</strong> allow isolation<br />

of the phenomena that influence the <strong>electrochemical</strong> <strong>impedance</strong><br />

response [10].<br />

2.3. Regression analysis accounts for error structure<br />

The goal of the operation represented by the triangle in Fig. 1<br />

is <strong>to</strong> develop a model that provides a good representation of the<br />

<strong>impedance</strong> measurements <strong>to</strong> within the noise level of the measurement.<br />

The error structure for the measurement clearly plays<br />

a critical role in the regression analysis. The weighting strategy<br />

for the complex nonlinear least squares regression should be<br />

based on the variance of the s<strong>to</strong>chastic errors in the data, and the<br />

frequency range used for the regression should be that which has<br />

been determined <strong>to</strong> be free of bias errors. In addition, knowledge<br />

of the variance of the s<strong>to</strong>chastic measurement errors is essential<br />

<strong>to</strong> quantify the quality of the regression.<br />

Sequential steps are taken until the model provides a statistically<br />

adequate representation of the data <strong>to</strong> within the<br />

independently obtained s<strong>to</strong>chastic error structure. The comparison<br />

between model and experiment can motivate modifications<br />

<strong>to</strong> the model or <strong>to</strong> the experimental parameters.<br />

3. Examples<br />

The systems described below illustrate the <strong>approach</strong> outlined<br />

in Fig. 1.<br />

3.1. Deep-level states in GaAs diodes<br />

Orazem et al. [11] and Jansen et al. [12] described the<br />

<strong>impedance</strong> response for an n-type GaAs Schottky diode with<br />

temperature as a parameter. The system consisted of an n-GaAs<br />

single crystal with a Ti Schottky contact at one end and a Au,<br />

Ge, Ni Schottky contact at the eutectic composition at the other<br />

end. This material has been well characterized in the literature<br />

and, in particular, has a well known EL2 deep-level state<br />

that lies 0.83–0.85 eV below the conduction band edge [13].<br />

Experimental details are provided elsewhere [11,12].<br />

The experimental data are presented in Fig. 2 (a) and (b)<br />

for the real and imaginary parts of the <strong>impedance</strong>, respectively,<br />

for temperatures ranging from 320 <strong>to</strong> 400 K. The logarithmic<br />

scale used in Fig. 2 emphasizes the scatter seen in the imaginary<br />

<strong>impedance</strong> at low frequencies. The <strong>impedance</strong> response<br />

is seen <strong>to</strong> be a strong function of temperature. The <strong>impedance</strong>plane<br />

plots shown in Fig. 3 for data collected at 320 and 340 K<br />

<strong>approach</strong> the classic semicircle associated with a single relaxation<br />

process.<br />

Jansen and Orazem showed that the <strong>impedance</strong> data could be<br />

superposed as given in Fig. 4[12]. The <strong>impedance</strong> data collected<br />

at different temperatures were normalized by the maximum<br />

mean value of the real part of the <strong>impedance</strong> and plotted against<br />

Fig. 2. Impedance data as a function of frequency for an n-GaAs/Ti Schottky<br />

diode with temperature as a parameter: (a) the real part of the <strong>impedance</strong>; and<br />

(b) the imaginary part of the <strong>impedance</strong>. Data taken from Orazem et al. [11] and<br />

Jansen et al. [12].<br />

a normalized frequency defined by<br />

f ∗ = f ( ) E<br />

f ◦ exp (1)<br />

kT<br />

where E = 0.827 eV, and the characteristic frequency f ◦ was<br />

assigned a value of 2.964 × 10 14 Hz such that the imaginary part<br />

of the normalized <strong>impedance</strong> values reached a peak value near<br />

f ∗ = 1. The data collected at different temperatures are reduced<br />

Fig. 3. Impedance data in <strong>impedance</strong>-plane format for an n-GaAs/Ti Schottky<br />

diode with temperature as a parameter. Data taken from Orazem et al. [11] and<br />

Jansen et al. [12]


M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366 7363<br />

Fig. 4. Impedance data from Fig. 2 collected for an n-GaAs/Ti Schottky diode<br />

as a function of frequency f ∗ = (f/f ◦ ) exp(E/kT ): (a) the real part of the<br />

<strong>impedance</strong>; and (b) the imaginary part of the <strong>impedance</strong>. Data taken from Jansen<br />

et al. [12]<br />

<strong>to</strong> a single line. The extent <strong>to</strong> which the data are superposed is<br />

seen more clearly on the logarithmic scale shown in Fig. 5. The<br />

superposition shown in Figs. 4 and 5 suggest that the system is<br />

controlled by a single-activation-energy-controlled process.<br />

A closer examination of Fig. 4(b) reveals that the maximum<br />

magnitude of the scaled imaginary <strong>impedance</strong> is slightly<br />

less than 0.5; whereas the corresponding value for a singleactivation-energy-controlled<br />

process should be identically 0.5.<br />

Regression analysis using the traditional weighting strategies<br />

under which the standard deviation of the experimental values<br />

was assumed <strong>to</strong> be proportional <strong>to</strong> the modulus of the <strong>impedance</strong>,<br />

σ r = σ j = α|Z|, <strong>to</strong> the magnitude of the respective components<br />

of the <strong>impedance</strong>, σ r = α r |Z r | and σ j = α j |Z j |, or independent<br />

of frequency, σ r = σ j = α, yielded one dominant RC time constant<br />

with only a hint that other parameters could be extracted.<br />

Orazem et al. [11] and Jansen et al. [12] used the measurement<br />

model <strong>approach</strong> described by Agarwal et al. [5–7] and Orazem<br />

[8] <strong>to</strong> identify the s<strong>to</strong>chastic error structure for the <strong>impedance</strong><br />

data. When the data were regressed using this error structure for<br />

a weighting strategy, additional parameters could be resolved<br />

revealing additional activation energies. Thus, while the data<br />

do superpose nicely in Figs. 4 and 5, the <strong>impedance</strong> data do in<br />

fact contain information on minor activation-energy-controlled<br />

Fig. 5. Impedance data from Fig. 2 collected for an n-GaAs/Ti Schottky diode<br />

as a function of frequency f ∗ = (f/f ◦ ) exp(E/kT ): (a) the real part of the<br />

<strong>impedance</strong>; and (b) the imaginary part of the <strong>impedance</strong>.<br />

electronic transitions [11,12]. The information concerning these<br />

transitions could be extracted by regression of an appropriate<br />

process model using a weighting strategy based on the error<br />

structure of the measurement.<br />

Two models have been proposed for the data presented above.<br />

Macdonald proposed a distributed-time-constant model which<br />

accounts for distributed relaxation processes [14]. This model<br />

fits the data very well and has the advantage that it requires<br />

a minimal number of parameters. A second model, presented<br />

in Fig. 6, accounts for discrete energy levels and provides a<br />

fit of equivalent regression quality at each temperature [11,12].<br />

In Fig. 6, C n is the space-charge capacitance, R n is a resistance<br />

that accounts for a small but finite leakage current, and<br />

the parameters R 1 ...R k and C 1 ...C k are attributed <strong>to</strong> the<br />

response of discrete deep-level energy states. Parameters corresponding<br />

<strong>to</strong> deep-level states were added sequentially <strong>to</strong> the<br />

model, subject <strong>to</strong> the constraint that the 2σ (95.4%) confidence<br />

interval for each of the regressed parameters may not<br />

include zero. Including the space charge capacitance and leakage<br />

resistance, four resis<strong>to</strong>r–capaci<strong>to</strong>r pairs could be obtained<br />

from the <strong>impedance</strong> data collected at 300, 320, and 340 K; three<br />

resis<strong>to</strong>r–11/23/2007capaci<strong>to</strong>r pairs could be obtained from the<br />

data collected at 360, 380, and 400 K; and two resis<strong>to</strong>r-capaci<strong>to</strong>r<br />

pairs could be obtained from the data collected at 420 K [12].


7364 M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366<br />

Fig. 7. Electrochemical <strong>impedance</strong> results obtained for a single-cell PEM fuel<br />

cell with current density as a parameter. Results taken from Roy et al. [18].<br />

Fig. 6. Electrical circuit corresponding <strong>to</strong> the model presented by Jansen et al.<br />

[12] in which C n is the space-charge capacitance, R n is a resistance that accounts<br />

for a small but finite leakage current, and the parameters R 1 ...R k and C 1 ...C k<br />

are attributed <strong>to</strong> the response of discrete deep-level energy states.<br />

This model has the disadvantage that up <strong>to</strong> eight parameters<br />

are required, depending on the temperature, as compared <strong>to</strong><br />

the three parameters required for the distributed-time-constant<br />

model. The question <strong>to</strong> be posed then, “which is the better model<br />

for the measurements”<br />

If the goal of the regression is <strong>to</strong> provide the most parsimonious<br />

model for the data, the model with the smallest number of<br />

parameters and a continuous distribution of activation energies<br />

is the best model. If the goal of the regression is <strong>to</strong> provide a<br />

quantitative physical description of the system for which the data<br />

were obtained, additional measurements are needed <strong>to</strong> determine<br />

whether the activation energies are discrete or continuously distributed.<br />

In this case, deep-level transient <strong>spectroscopy</strong> (DLTS)<br />

measurements indicated that the n-GaAs diode contained discrete<br />

deep-level states. In addition, the energy levels and state<br />

concentrations obtained by regression of the second model were<br />

consistent with the results obtained by DLTS [12]. Thus, the second<br />

model with a larger number of parameters provides the more<br />

useful description of the GaAs diode. The choice between the<br />

two models could not be made without the added experimental<br />

evidence.<br />

reactants [18]. The measurements were conducted in galavanostatic<br />

mode for a frequency range of 1 kHz <strong>to</strong> 1 mHz with a 10 mA<br />

peak-<strong>to</strong>-peak sinusoidal perturbation. Roy and Orazem [19] used<br />

the measurement model <strong>approach</strong> developed by Orazem and<br />

coworkers [5–8] <strong>to</strong> demonstrate that, for the fuel cell under<br />

steady-state operation, the low-frequency inductive loops seen<br />

in Fig. 7 were consistent with the Kramers–Kronig relations.<br />

Therefore, the low-frequency inductive loops could be attributed<br />

<strong>to</strong> process characteristics and not <strong>to</strong> non-stationary artifacts.<br />

Roy et al. [18] proposed that that the low-frequency inductive<br />

loops observed in PEM fuel cells could be caused by parasitic<br />

reactions in which the Pt catalyst reacts <strong>to</strong> form PtO and subsequently<br />

forms Pt + ions. They also showed that a reaction<br />

involving formation of hydrogen peroxide could yield the same<br />

inductive features. A comparison between the two models and<br />

the experimental results is shown in Fig. 8. and the corresponding<br />

values for the real and imaginary parts of the <strong>impedance</strong> are<br />

presented as a function of frequency in Fig. 9(a) and (b), respectively.<br />

The model calculations were not obtained by regression<br />

but rather by simulation using approximate parameter values.<br />

Regression was not used because the model was based on the<br />

assumption of a uniform membrane-electrode assembly (MEA);<br />

whereas, the use of a serpentine flow channel caused the reactivity<br />

of the MEA <strong>to</strong> be very nonuniform. The parameters were first<br />

selected <strong>to</strong> reproduce the current–potential curve and then the<br />

same parameters were used <strong>to</strong> calculate the <strong>impedance</strong> response<br />

3.2. Side reactions in PEM fuel cells<br />

Low-frequency inductive features [15–17] are commonly<br />

seen in <strong>impedance</strong> spectra for PEM fuel cells. Makharia et al.<br />

[15] suggested that side reactions and intermediates involved<br />

in the fuel cell operation can be possible causes of the inductive<br />

loop seen at low frequency. However, such low-frequency<br />

inductive loops could also be attributed <strong>to</strong> non-stationary behavior,<br />

or, due <strong>to</strong> the time required <strong>to</strong> make measurements at low<br />

frequencies, non-stationary behavior could influence the shapes<br />

of the low-frequency features.<br />

A typical result is presented in Fig. 7 for the <strong>impedance</strong><br />

response of a single 5 cm 2 PEMFC with hydrogen and air as<br />

Fig. 8. Comparison of the <strong>impedance</strong> response for a PEM fuel cell operated at<br />

0.2 A/cm 2 <strong>to</strong> model predictions generated using a reaction sequence involving<br />

formation of hydrogen peroxide and a reaction sequence involving formation of<br />

PtO. Results taken from Roy et al. [18]


M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366 7365<br />

with a decrease in the active catalytic surface area and a loss of<br />

Pt ions in the effluent. Cyclic voltammetry after different periods<br />

of fuel cell operation could be used <strong>to</strong> explore reduction<br />

in <strong>electrochemical</strong>ly active area. Inductively coupled plasma<br />

mass <strong>spectroscopy</strong> (ICPMS) could be used <strong>to</strong> detect residual<br />

Pt ions in the fuel cell effluent, and ex situ techniques could<br />

detect formation of PtO in the catalyst layer. A different set of<br />

experiments could be performed <strong>to</strong> explore the hypothesis that<br />

peroxide formation is responsible for the inductive loops. Platinum<br />

dissolution has been observed in PEM fuel cells, [21] and<br />

peroxide formation has been implicated in the degradation of<br />

PEM membranes [22–24]. Thus, it is likely that both reactions<br />

are taking place and contributing <strong>to</strong> the observed low-frequency<br />

inductive loops.<br />

4. Discussion<br />

Fig. 9. Comparison of the <strong>impedance</strong> response for a PEM fuel cell operated at<br />

0.2 A/cm 2 <strong>to</strong> model predictions generated using a reaction sequence involving<br />

formation of hydrogen peroxide and a reaction sequence involving formation of<br />

PtO: (a) real part of the <strong>impedance</strong>; and (b) imaginary part of the <strong>impedance</strong>.<br />

Results taken from Roy et al. [18].<br />

for each value of current density. The potential (or current)<br />

dependence of model parameters was that associated with the<br />

Tafel behavior assumed for the <strong>electrochemical</strong> reactions.<br />

While reaction parameters were not identified by regression<br />

<strong>to</strong> <strong>impedance</strong> data, the simulation presented by Roy et<br />

al. [18] demonstrates that side reactions proposed in the literature<br />

can account for low-frequency inductive loops. Indeed,<br />

the results presented in Figs. 8 and 9 show that both models<br />

can account for low-frequency inductive loops. Other models<br />

can also account for low-frequency inductive loops so long as<br />

they involve potential-dependent adsorbed intermediates [20].<br />

It is generally unders<strong>to</strong>od that equivalent circuit models are not<br />

unique and have therefore an ambiguous relationship <strong>to</strong> physical<br />

properties of the <strong>electrochemical</strong> cell. As shown by Roy<br />

et al. [18], even models based on physical and chemical processes<br />

are ambiguous. In the present case, the ambiguity arises<br />

from uncertainty as <strong>to</strong> which reactions are responsible for the<br />

low-frequency inductive features.<br />

Resolution of this ambiguity requires additional experiments.<br />

The processes and reactions hypothesized for a given model can<br />

suggest experiments <strong>to</strong> support or reject the underlying hypothesis.<br />

For example, the proposed formation of PtO is consistent<br />

The example presented in Section 3.1 demonstrates the<br />

importance of coupling experimental observation, model development,<br />

and error analysis. The measurements conducted<br />

at different temperatures allowed identification of discrete<br />

activation energies for electronic transitions. Use of a weighting<br />

strategy based on the observed s<strong>to</strong>chastic error structure<br />

increased the number of parameters that could be obtained from<br />

the regression analysis. Thus, four discrete activation-energycontrolled<br />

processes could be identified, but at the expense of a<br />

corresponding model that required eight parameters. A regression<br />

of almost the same quality could be obtained under the<br />

assumption of a continuous distribution of activation energies,<br />

and this model required only three parameters. Discrimination<br />

between the two models requires additional experimental observations,<br />

such as the DLTS identification of electronic transitions<br />

involving discrete deep-level states.<br />

The example presented in Section 3.2 demonstrates the<br />

utility of the error analysis for determining consistency<br />

with the Kramers–Kronig relations. In this case, the lowfrequency<br />

inductive loops were found <strong>to</strong> be consistent with the<br />

Kramers–Kronig relations at frequencies as low as 0.001 Hz so<br />

long as the system had reached a steady-state operation. The<br />

error analysis employed regression of a measurement model.<br />

The mathematical process models that were proposed <strong>to</strong> account<br />

for the low-frequency features were based on plausible physical<br />

and chemical hypotheses. Nevertheless, the models are ambiguous<br />

and require additional measurements and observations <strong>to</strong><br />

identify the most appropriate for the system under study.<br />

The philosophy described here cannot always be followed<br />

<strong>to</strong> convergence. Often the hypothesized model is inadequate<br />

and cannot reproduce the experimental results. Even if the<br />

proposed reaction sequence is correct, surface heterogeneities<br />

may introduce complications that are difficult <strong>to</strong> model. The<br />

accessible frequency range may be limited at high frequency for<br />

systems with a very small <strong>impedance</strong>. The accessible frequency<br />

range may be limited at low frequency for systems subject<br />

<strong>to</strong> significant non-stationary behavior. The experimentalist<br />

may need <strong>to</strong> accept a large level of s<strong>to</strong>chastic noise for a<br />

system with a large <strong>impedance</strong>. In cases where the models are<br />

unable <strong>to</strong> explain all features of the experiment, the graphical


7366 M.E. Orazem, B. Tribollet / Electrochimica Acta 53 (2008) 7360–7366<br />

methods presented by Orazem et al. [25] can nevertheless yield<br />

quantitative information.<br />

5. Conclusions<br />

The philosophy embodied in Fig. 1 integrates experimental<br />

observation, model development, and error analysis. It takes in<strong>to</strong><br />

account the observations that <strong>impedance</strong> <strong>spectroscopy</strong> is not a<br />

stand-alone technique and that other observations are required <strong>to</strong><br />

validate a given interpretation of the <strong>impedance</strong> spectra. Within<br />

the context of the work presented here, the objective of modeling<br />

is not <strong>to</strong> provide a good fit with the smallest number of parameters,<br />

but, rather, <strong>to</strong> use the model <strong>to</strong> learn about the physics and<br />

chemistry of the system under study.<br />

References<br />

[1] J.R. Macdonald (Ed.), Impedance Spectroscopy: Emphasizing Solid Materials<br />

and Systems, John Wiley & Sons, New York, 1987.<br />

[2] E. Barsoukov, J.R. Macdonald (Eds.), Impedance Sprectroscopy Theory,<br />

Experiment, and Applications, 2nd ed., Wiley-Interscience, New York,<br />

2005.<br />

[3] Q.-A. Huang, R. Hui, B. Wang, J. Zhang, A review of ac <strong>impedance</strong> modeling<br />

and validation in SOFC diagnosis, Electrochim. Acta (2007) 8144.<br />

[4] M.E. Orazem, P. Agarwal, L.H. García-Rubio, Critical issues associated<br />

with interpretation of <strong>impedance</strong> spectra, J. Electroanal. Chem. Interfacial<br />

Electrochem. 378 (1994) 51.<br />

[5] P. Agarwal, M.E. Orazem, L.H. García-Rubio, Measurement models for<br />

<strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong>: I. Demonstration of applicability,<br />

J. Electrochem. Soc. 139 (7) (1992) 1917.<br />

[6] P. Agarwal, O.D. Crisalle, M.E. Orazem, L.H. García-Rubio, Measurement<br />

models for <strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong>: 2. Determination of<br />

the s<strong>to</strong>chastic contribution <strong>to</strong> the error structure, J. Electrochem. Soc.<br />

(1995) 4149.<br />

[7] P. Agarwal, M.E. Orazem, L.H. García-Rubio, Measurement models for<br />

<strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong>: 3. Evaluation of consistency with<br />

the kramers-kronig relations, J. Electrochem. Soc. 142 (1995) 4159.<br />

[8] M.E. Orazem, A systematic <strong>approach</strong> <strong>to</strong>ward error structure identification<br />

for <strong>impedance</strong> <strong>spectroscopy</strong>, J. Electroanal. Chem. 572 (2004) 317.<br />

[9] J.R. Dygas, M.W. Breiter, Measurements of large <strong>impedance</strong>s in a wide<br />

temperature and frequency range, Electrochim. Acta 41 (7/8) (1996) 993.<br />

[10] C. Gabrielli, B. Tribollet, A transfer-function <strong>approach</strong> for a generalized<br />

<strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong>, J. Electrochem. Soc. 141 (1994)<br />

1147.<br />

[11] M.E. Orazem, P. Agarwal, A.N. Jansen, P.T. Wojcik, L.H. García-Rubio,<br />

Development of physico-chemical models for <strong>electrochemical</strong> <strong>impedance</strong><br />

<strong>spectroscopy</strong>, Electrochim. Acta 38 (1993) 1903.<br />

[12] A.N. Jansen, P.T. Wojcik, P. Agarwal, M.E. Orazem, Thermally-stimulated<br />

deep-level <strong>impedance</strong> <strong>spectroscopy</strong>: application <strong>to</strong> an n-GaAs Schottky<br />

diode, J. Electrochem. Soc. 143 (1996) 4066.<br />

[13] G.M. Martin, S. Makram-Ebeid, The mid–gap donor level el2 in GaAs, in:<br />

S.T. Pantelides (Ed.), Deep Centers in Semiconduc<strong>to</strong>rs, Gordon and Breach<br />

Science Publishers, New York, 1986, p. 455.<br />

[14] J.R. Macdonald, Power-law exponents and hidden bulk relaxation in<br />

the <strong>impedance</strong> <strong>spectroscopy</strong> of solids, J. Electroanal. Chem. 378 (1994)<br />

17.<br />

[15] R. Makharia, M.F. Mathias, D.R. Baker, Measurement of catalyst layer<br />

electrolyte resistance in PEFCs using <strong>electrochemical</strong> <strong>impedance</strong> <strong>spectroscopy</strong>,<br />

J. Electrochem. Soc. 152 (5) (2005) A970.<br />

[16] O. <strong>An</strong><strong>to</strong>ine, Y. Bultel, R. Durand, Oxygen reduction reaction kinetics and<br />

mechanism on platinum nanoparticles inside Nafion, J. Electroanal. Chem.<br />

499 (2001) 85.<br />

[17] Y. Bultel, L. Genies, O. <strong>An</strong><strong>to</strong>ine, P. Ozil, R. Durand, Modeling <strong>impedance</strong><br />

diagrams of active layers in gas diffusion electrodes: diffusion, ohmic<br />

drop effects and multistep reactions, J. Electroanal. Chem. 527 (2002)<br />

143.<br />

[18] S.K. Roy, M.E. Orazem, B. Tribollet, Interpretation of low-frequency<br />

inductive loops in PEM fuel cells, J. Electrochem. Soc. 154 (2007) B1378.<br />

[19] S.K. Roy, M.E. Orazem, Error analysis for the <strong>impedance</strong> response of PEM<br />

fuel cells, J. Electrochem. Soc. 154 (8) (2007) B883.<br />

[20] I. Epelboin, C. Gabrielli, M. Keddam, H. Takenouti, A model of the anodic<br />

behavior of iron in sulphuric acid medium, Electrochim. Acta 20 (1975)<br />

913.<br />

[21] R.M. Darling, J.P. Meyers, Kinetic model of platinum dissolution in PEM-<br />

FCs, J. Electrochem. Soc. 150 (2003) A1523.<br />

[22] C.F. Zinola, J. Rodriguez, G. Obal, Kinetic of molecular oxygen electroreduction<br />

on platinum modified by tin underpotential deposition, J. Appl.<br />

Electrochem. 31 (2001) 1293.<br />

[23] A. Damjanovic, V. Brusic, Electrode kinetic of oxygen reduction on oxidefree<br />

Pt electrode, Elec<strong>to</strong>chim. Acta 12 (1967) 615.<br />

[24] V.O. Mittal, H.R. Kunz, J.M. Fen<strong>to</strong>n, Is H 2 O 2 involved in the membrane<br />

degradation mechanism in pemfc, Electrochem. Solid State Lett. 9 (6)<br />

(2006) A229.<br />

[25] M.E. Orazem, N. Pébère, B. Tribollet, A new look at graphical representation<br />

of <strong>impedance</strong> data, J. Electrochem. Soc. 153 (2006) B129.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!